TW200830486A - Semiconductor device - Google Patents
Semiconductor device Download PDFInfo
- Publication number
- TW200830486A TW200830486A TW096133978A TW96133978A TW200830486A TW 200830486 A TW200830486 A TW 200830486A TW 096133978 A TW096133978 A TW 096133978A TW 96133978 A TW96133978 A TW 96133978A TW 200830486 A TW200830486 A TW 200830486A
- Authority
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- Prior art keywords
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- glass transition
- resin composition
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/145—Organic substrates, e.g. plastic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49894—Materials of the insulating layers or coatings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00011—Not relevant to the scope of the group, the symbol of which is combined with the symbol of this group
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0102—Calcium [Ca]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01057—Lanthanum [La]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/303—Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
- H05K3/305—Affixing by adhesive
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4602—Manufacturing multilayer circuits characterized by a special circuit board as base or central core whereon additional circuit layers are built or additional circuit boards are laminated
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006248473 | 2006-09-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200830486A true TW200830486A (en) | 2008-07-16 |
| TWI374523B TWI374523B (enExample) | 2012-10-11 |
Family
ID=39183681
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096133978A TW200830486A (en) | 2006-09-13 | 2007-09-12 | Semiconductor device |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US8008767B2 (enExample) |
| EP (1) | EP1956648A4 (enExample) |
| JP (2) | JP4802246B2 (enExample) |
| KR (2) | KR20080091086A (enExample) |
| CN (1) | CN101356643B (enExample) |
| CA (1) | CA2630824C (enExample) |
| SG (1) | SG160403A1 (enExample) |
| TW (1) | TW200830486A (enExample) |
| WO (1) | WO2008032620A1 (enExample) |
Families Citing this family (32)
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| US9941245B2 (en) * | 2007-09-25 | 2018-04-10 | Intel Corporation | Integrated circuit packages including high density bump-less build up layers and a lesser density core or coreless substrate |
| JP5408131B2 (ja) * | 2008-06-12 | 2014-02-05 | 住友ベークライト株式会社 | 半導体素子搭載基板 |
| US8399773B2 (en) * | 2009-01-27 | 2013-03-19 | Shocking Technologies, Inc. | Substrates having voltage switchable dielectric materials |
| US8502399B2 (en) * | 2009-06-22 | 2013-08-06 | Sumitomo Bakelite Co., Ltd. | Resin composition for encapsulating semiconductor and semiconductor device |
| CN101735562B (zh) * | 2009-12-11 | 2012-09-26 | 广东生益科技股份有限公司 | 环氧树脂组合物及其制备方法及采用其制作的层压材料及覆铜箔层压板 |
| JP2011222946A (ja) * | 2010-03-26 | 2011-11-04 | Sumitomo Bakelite Co Ltd | 回路基板、半導体装置、回路基板の製造方法および半導体装置の製造方法 |
| JP5593897B2 (ja) * | 2010-07-12 | 2014-09-24 | 住友ベークライト株式会社 | 回路基板、半導体装置、回路基板の製造方法および半導体装置の製造方法 |
| JP2012049423A (ja) * | 2010-08-30 | 2012-03-08 | Sumitomo Bakelite Co Ltd | 回路基板、半導体装置、回路基板の製造方法および半導体装置の製造方法 |
| KR101728203B1 (ko) | 2010-09-30 | 2017-04-18 | 히타치가세이가부시끼가이샤 | 접착제 조성물, 반도체 장치의 제조 방법 및 반도체 장치 |
| KR101464454B1 (ko) * | 2010-10-22 | 2014-11-21 | 히타치가세이가부시끼가이샤 | 접착제 조성물, 반도체 장치의 제조 방법 및 반도체 장치 |
| US20120156474A1 (en) * | 2010-12-20 | 2012-06-21 | E. I. Du Pont De Nemours And Company | Article having curable coating comprising imidazolium monocarboxylate salt |
| US8969732B2 (en) * | 2011-09-28 | 2015-03-03 | Ibiden Co., Ltd. | Printed wiring board |
| JP6281184B2 (ja) * | 2012-03-14 | 2018-02-21 | 住友ベークライト株式会社 | 金属張積層板、プリント配線基板、半導体パッケージ、および半導体装置 |
| US9196356B2 (en) * | 2013-03-14 | 2015-11-24 | Globalfoundries Singapore Pte. Ltd. | Stackable non-volatile memory |
| US9218875B2 (en) | 2013-03-14 | 2015-12-22 | Globalfoundries Singapore Pte. Ltd. | Resistive non-volatile memory |
| KR102130547B1 (ko) * | 2013-03-27 | 2020-07-07 | 삼성디스플레이 주식회사 | 가요성 기판 및 이를 포함하는 가요성 표시 장치 |
| US9155191B2 (en) | 2013-05-31 | 2015-10-06 | Qualcomm Incorporated | Substrate comprising inorganic material that lowers the coefficient of thermal expansion (CTE) and reduces warpage |
| KR102116962B1 (ko) | 2013-06-25 | 2020-05-29 | 삼성전자주식회사 | 반도체 패키지 |
| US9778510B2 (en) * | 2013-10-08 | 2017-10-03 | Samsung Electronics Co., Ltd. | Nanocrystal polymer composites and production methods thereof |
| MX2016011858A (es) * | 2014-03-28 | 2016-12-02 | Huntsman Advanced Mat Licensing (Switzerland) Gmbh | Un procedimiento para la preparacion de un articulo de material compuesto con fibra reforzada, los articulos compuestos obtenidos y el uso de los mismos. |
| JP6212011B2 (ja) * | 2014-09-17 | 2017-10-11 | 東芝メモリ株式会社 | 半導体製造装置 |
| TWI526129B (zh) * | 2014-11-05 | 2016-03-11 | Elite Material Co Ltd | Multilayer printed circuit boards with dimensional stability |
| US20170287838A1 (en) | 2016-04-02 | 2017-10-05 | Intel Corporation | Electrical interconnect bridge |
| JP6793517B2 (ja) * | 2016-10-17 | 2020-12-02 | 株式会社ダイセル | シート状プリプレグ |
| US20190259731A1 (en) * | 2016-11-09 | 2019-08-22 | Unisem (M) Berhad | Substrate based fan-out wafer level packaging |
| US20180130768A1 (en) * | 2016-11-09 | 2018-05-10 | Unisem (M) Berhad | Substrate Based Fan-Out Wafer Level Packaging |
| JP6991014B2 (ja) * | 2017-08-29 | 2022-01-12 | キオクシア株式会社 | 半導体装置 |
| KR102397902B1 (ko) * | 2018-01-29 | 2022-05-13 | 삼성전자주식회사 | 반도체 패키지 |
| JP7135364B2 (ja) * | 2018-03-23 | 2022-09-13 | 三菱マテリアル株式会社 | 絶縁回路基板、及び、絶縁回路基板の製造方法 |
| JP7289108B2 (ja) * | 2019-02-21 | 2023-06-09 | パナソニックIpマネジメント株式会社 | 半導体封止材料及び半導体装置 |
| EP4007458B1 (en) * | 2019-07-31 | 2023-08-09 | Fuji Corporation | Method for manufacturing circuit wiring by three-dimensional additive manufacturing |
| JP7346150B2 (ja) | 2019-08-09 | 2023-09-19 | キヤノン株式会社 | インクジェット記録ヘッドおよびインクジェット記録装置 |
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| US7285321B2 (en) * | 2003-11-12 | 2007-10-23 | E.I. Du Pont De Nemours And Company | Multilayer substrates having at least two dissimilar polyimide layers, useful for electronics-type applications, and compositions relating thereto |
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| JP2005236067A (ja) | 2004-02-20 | 2005-09-02 | Dainippon Printing Co Ltd | 配線基板と配線基板の製造方法、および半導パッケージ |
| JP2005236220A (ja) | 2004-02-23 | 2005-09-02 | Dainippon Printing Co Ltd | 配線基板と配線基板の製造方法、および半導パッケージ |
| JP2005254680A (ja) | 2004-03-12 | 2005-09-22 | Sumitomo Bakelite Co Ltd | 積層板の連続製造方法および装置 |
| JP4108643B2 (ja) * | 2004-05-12 | 2008-06-25 | 日本電気株式会社 | 配線基板及びそれを用いた半導体パッケージ |
| CN100531528C (zh) * | 2004-05-27 | 2009-08-19 | 揖斐电株式会社 | 多层印刷配线板 |
| JP4449608B2 (ja) | 2004-07-09 | 2010-04-14 | 凸版印刷株式会社 | 半導体装置 |
| JP2006080356A (ja) | 2004-09-10 | 2006-03-23 | Toshiba Corp | 半導体装置及びその製造方法 |
| US7335608B2 (en) | 2004-09-22 | 2008-02-26 | Intel Corporation | Materials, structures and methods for microelectronic packaging |
| US7459782B1 (en) * | 2005-10-05 | 2008-12-02 | Altera Corporation | Stiffener for flip chip BGA package |
| US20070298260A1 (en) * | 2006-06-22 | 2007-12-27 | Kuppusamy Kanakarajan | Multi-layer laminate substrates useful in electronic type applications |
-
2007
- 2007-09-05 CN CN2007800014055A patent/CN101356643B/zh not_active Expired - Fee Related
- 2007-09-05 WO PCT/JP2007/067283 patent/WO2008032620A1/ja not_active Ceased
- 2007-09-05 US US12/094,775 patent/US8008767B2/en not_active Expired - Fee Related
- 2007-09-05 SG SG201001798-6A patent/SG160403A1/en unknown
- 2007-09-05 KR KR1020087012391A patent/KR20080091086A/ko not_active Ceased
- 2007-09-05 CA CA2630824A patent/CA2630824C/en not_active Expired - Fee Related
- 2007-09-05 JP JP2008534303A patent/JP4802246B2/ja not_active Expired - Fee Related
- 2007-09-05 KR KR1020107028065A patent/KR101195408B1/ko not_active Expired - Fee Related
- 2007-09-05 EP EP07806726A patent/EP1956648A4/en not_active Withdrawn
- 2007-09-12 TW TW096133978A patent/TW200830486A/zh not_active IP Right Cessation
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2009
- 2009-07-10 JP JP2009163904A patent/JP2010004050A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP1956648A4 (en) | 2011-09-21 |
| EP1956648A1 (en) | 2008-08-13 |
| TWI374523B (enExample) | 2012-10-11 |
| KR101195408B1 (ko) | 2012-10-29 |
| JP4802246B2 (ja) | 2011-10-26 |
| SG160403A1 (en) | 2010-04-29 |
| CN101356643A (zh) | 2009-01-28 |
| US8008767B2 (en) | 2011-08-30 |
| US20090267212A1 (en) | 2009-10-29 |
| KR20080091086A (ko) | 2008-10-09 |
| JP2010004050A (ja) | 2010-01-07 |
| CA2630824C (en) | 2013-01-08 |
| KR20110000761A (ko) | 2011-01-05 |
| CA2630824A1 (en) | 2008-03-20 |
| WO2008032620A1 (en) | 2008-03-20 |
| CN101356643B (zh) | 2012-04-25 |
| JPWO2008032620A1 (ja) | 2010-01-21 |
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