KR880005746A - 반도체집적회로 - Google Patents
반도체집적회로 Download PDFInfo
- Publication number
- KR880005746A KR880005746A KR870010908A KR870010908A KR880005746A KR 880005746 A KR880005746 A KR 880005746A KR 870010908 A KR870010908 A KR 870010908A KR 870010908 A KR870010908 A KR 870010908A KR 880005746 A KR880005746 A KR 880005746A
- Authority
- KR
- South Korea
- Prior art keywords
- integrated circuit
- semiconductor integrated
- input signal
- capacitor means
- generate
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title description 3
- 239000003990 capacitor Substances 0.000 claims 3
- 230000003111 delayed effect Effects 0.000 claims 1
- 238000007599 discharging Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/26—Time-delay networks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/125—Discriminating pulses
- H03K5/1252—Suppression or limitation of noise or interference
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
- H03K2005/0015—Layout of the delay element
- H03K2005/00195—Layout of the delay element using FET's
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제4도는 본 발명의 제1실시에 따라 반도체집적회로에 적용시킬 수 있는 지연회로를 나타낸 도면.
제5도는 제4도에 도시된 지연회로의 신호파형을 나타낸 도면.
제6도는 본 발명의 제2실시예에 따른 반도체집적회로를 나타낸 도면.
Claims (1)
- 캐패시터수단을 구비하고 있으면서, 입력신호가 소정의 방향으로 변화하는 경우에는 그 입력신호에 기초해서 상기 캐패시터수단을 충전시키거나 방전시키므로써 그 입력신호에 대하여 소정시간만큼 지연된 출력신호를 발생시키도록 되어 있는 지연수단과; 상기 입력신호가 상기 소정의 방향과 반대방향으로 변화하는 경우에는 상기 캐패시터수단을 충전시키거나 방전시켜서 출력신호를 발생시키도록 되어 있는 제어수단을 포함하여 구성된 것을 특징으로 하는 반도체집적회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23344686 | 1986-10-01 | ||
JP61-233446 | 1986-10-01 | ||
JP233446 | 1986-10-01 | ||
JP62-246763 | 1987-09-30 | ||
JP62246763A JP2557411B2 (ja) | 1986-10-01 | 1987-09-30 | 半導体集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR880005746A true KR880005746A (ko) | 1988-06-30 |
KR970000560B1 KR970000560B1 (ko) | 1997-01-13 |
Family
ID=16955170
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019870010908A KR970000560B1 (ko) | 1986-10-01 | 1987-09-30 | 반도체집적회로 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5055706A (ko) |
JP (1) | JP2557411B2 (ko) |
KR (1) | KR970000560B1 (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5764093A (en) * | 1981-11-28 | 1998-06-09 | Advantest Corporation | Variable delay circuit |
KR910002033B1 (ko) * | 1988-07-11 | 1991-03-30 | 삼성전자 주식회사 | 메모리 셀의 센스앰프 구동회로 |
US5719812A (en) * | 1988-11-16 | 1998-02-17 | Fujitsu Limited | Semiconductor memory including bit line reset circuitry and a pulse generator having output delay time dependent on type of transition in an input signal |
US5160863A (en) * | 1989-06-30 | 1992-11-03 | Dallas Semiconductor Corporation | Delay circuit using primarily a transistor's parasitic capacitance |
US5287534A (en) * | 1990-01-04 | 1994-02-15 | Digital Equipment Corporation | Correcting crossover distortion produced when analog signal thresholds are used to remove noise from signal |
US5163168A (en) * | 1990-03-30 | 1992-11-10 | Matsushita Electric Industrial Co., Ltd. | Pulse signal generator and redundancy selection signal generator |
JP2621612B2 (ja) * | 1990-08-11 | 1997-06-18 | 日本電気株式会社 | 半導体集積回路 |
US5229657A (en) * | 1991-05-01 | 1993-07-20 | Vlsi Technology, Inc. | Method and apparatus for controlling simultaneous switching output noise in boundary scan paths |
KR970005124B1 (ko) * | 1991-08-14 | 1997-04-12 | 가부시끼가이샤 아드반테스트 | 가변지연회로 |
US5389843A (en) * | 1992-08-28 | 1995-02-14 | Tektronix, Inc. | Simplified structure for programmable delays |
EP0637134B1 (en) * | 1993-07-30 | 1998-09-23 | STMicroelectronics, Inc. | Inverter with variable impedance delay element |
US5396110A (en) * | 1993-09-03 | 1995-03-07 | Texas Instruments Incorporated | Pulse generator circuit and method |
GB2289178B (en) * | 1993-11-09 | 1998-05-20 | Motorola Inc | Circuit and method for generating a delayed output signal |
JPH07154221A (ja) * | 1993-11-25 | 1995-06-16 | Nec Corp | 遅延回路 |
US5479132A (en) * | 1994-06-06 | 1995-12-26 | Ramtron International Corporation | Noise and glitch suppressing filter with feedback |
JPH09223952A (ja) * | 1996-02-15 | 1997-08-26 | Mitsubishi Electric Corp | 可変遅延回路とこれを用いたリング発振器及びパルス幅可変回路 |
US5764090A (en) * | 1996-08-26 | 1998-06-09 | United Microelectronics Corporation | Write-control circuit for high-speed static random-access-memory (SRAM) devices |
US5896054A (en) * | 1996-12-05 | 1999-04-20 | Motorola, Inc. | Clock driver |
JP3338758B2 (ja) * | 1997-02-06 | 2002-10-28 | 日本電気株式会社 | 遅延回路 |
JPH10303709A (ja) * | 1997-04-25 | 1998-11-13 | Advantest Corp | パルス幅整形回路 |
JP3926011B2 (ja) | 1997-12-24 | 2007-06-06 | 株式会社ルネサステクノロジ | 半導体装置の設計方法 |
US6573772B1 (en) * | 2000-06-30 | 2003-06-03 | Intel Corporation | Method and apparatus for locking self-timed pulsed clock |
JP3866594B2 (ja) * | 2002-03-15 | 2007-01-10 | Necエレクトロニクス株式会社 | 遅延回路と半導体記憶装置及び半導体記憶装置の制御方法 |
US20070106375A1 (en) * | 2005-11-07 | 2007-05-10 | Carlos Vonderwalde | Bifurcated stent assembly |
JP6297575B2 (ja) * | 2013-08-19 | 2018-03-20 | 国立研究開発法人科学技術振興機構 | 再構成可能な遅延回路、並びにその遅延回路を用いた遅延モニタ回路、ばらつき補正回路、ばらつき測定方法及びばらつき補正方法 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4860447U (ko) * | 1971-11-09 | 1973-08-01 | ||
US3996481A (en) * | 1974-11-19 | 1976-12-07 | International Business Machines Corporation | FET load gate compensator |
US3971960A (en) * | 1975-03-05 | 1976-07-27 | Motorola, Inc. | Flip-flop false output rejection circuit |
JPS528864A (en) * | 1975-07-09 | 1977-01-24 | Seiko Instr & Electronics Ltd | Oscillator-frequency divider circuit with level shifter of electronic watch |
JPS5245247A (en) * | 1975-10-08 | 1977-04-09 | Hitachi Ltd | Pulse width convertor circuit |
JPS55114018A (en) * | 1979-02-23 | 1980-09-03 | Nippon Telegr & Teleph Corp <Ntt> | Correctable delay unit |
US4300065A (en) * | 1979-07-02 | 1981-11-10 | Motorola, Inc. | Power on reset circuit |
JPS5651662A (en) * | 1979-10-05 | 1981-05-09 | Kanto Kagaku Kk | Qualitative and quantitative analytical method for saccharides |
JPS5915212B2 (ja) * | 1979-11-29 | 1984-04-07 | 富士通株式会社 | 発振回路 |
JPS5711526A (en) * | 1980-06-25 | 1982-01-21 | Nec Corp | Latch circuit |
JPS58111429A (ja) * | 1981-12-24 | 1983-07-02 | Nec Corp | 遅延回路 |
JPS58140649A (ja) * | 1982-02-16 | 1983-08-20 | Fujitsu Ltd | 電圧検出回路 |
JPS595488A (ja) * | 1982-07-01 | 1984-01-12 | Fujitsu Ltd | 半導体装置 |
US4508978A (en) * | 1982-09-16 | 1985-04-02 | Texas Instruments Incorporated | Reduction of gate oxide breakdown for booted nodes in MOS integrated circuits |
US4583008A (en) * | 1983-02-25 | 1986-04-15 | Harris Corporation | Retriggerable edge detector for edge-actuated internally clocked parts |
JP2564787B2 (ja) * | 1983-12-23 | 1996-12-18 | 富士通株式会社 | ゲートアレー大規模集積回路装置及びその製造方法 |
DD220474A1 (de) * | 1984-01-02 | 1985-03-27 | Mikroelektronik Zt Forsch Tech | Integrierte verzoegerungsschaltung |
US4786824A (en) * | 1984-05-24 | 1988-11-22 | Kabushiki Kaisha Toshiba | Input signal level detecting circuit |
US4707626A (en) * | 1984-07-26 | 1987-11-17 | Texas Instruments Incorporated | Internal time-out circuit for CMOS dynamic RAM |
JPS61104397A (ja) * | 1984-10-24 | 1986-05-22 | Hitachi Ltd | 半導体記憶装置 |
JPS60111126U (ja) * | 1984-12-06 | 1985-07-27 | 富士通株式会社 | リセツト付遅延回路 |
JPS61208919A (ja) * | 1985-03-13 | 1986-09-17 | Toshiba Corp | 集積回路内蔵型低域通過フイルタ |
US4634905A (en) * | 1985-09-23 | 1987-01-06 | Motorola, Inc. | Power-on-reset circuit having a differential comparator with intrinsic offset voltage |
IT1204808B (it) * | 1986-02-18 | 1989-03-10 | Sgs Microelettronica Spa | Circuito di reset all'accensione per reti logiche in tecnologia mos,particolarmente per periferiche di microprocessori |
JPS63129863A (ja) * | 1986-11-14 | 1988-06-02 | Toko Inc | スイツチング電源装置 |
-
1987
- 1987-09-30 JP JP62246763A patent/JP2557411B2/ja not_active Expired - Fee Related
- 1987-09-30 KR KR1019870010908A patent/KR970000560B1/ko not_active IP Right Cessation
-
1989
- 1989-02-17 US US07/311,798 patent/US5055706A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR970000560B1 (ko) | 1997-01-13 |
US5055706A (en) | 1991-10-08 |
JP2557411B2 (ja) | 1996-11-27 |
JPS63226111A (ja) | 1988-09-20 |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20070629 Year of fee payment: 11 |
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LAPS | Lapse due to unpaid annual fee |