KR20140133873A - 저항 측정 시스템 및 이것을 사용하는 방법 - Google Patents

저항 측정 시스템 및 이것을 사용하는 방법 Download PDF

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KR20140133873A
KR20140133873A KR20147026275A KR20147026275A KR20140133873A KR 20140133873 A KR20140133873 A KR 20140133873A KR 20147026275 A KR20147026275 A KR 20147026275A KR 20147026275 A KR20147026275 A KR 20147026275A KR 20140133873 A KR20140133873 A KR 20140133873A
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cns
substrate
resistance
growth
contact
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해리 씨. 말레키
랜디 엘. 가이글러
코리 에이. 플레이셔
한 리우
브랜든 케이. 말렛
사무엘 제이. 마르쿨라
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어플라이드 나노스트럭처드 솔루션스, 엘엘씨.
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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B32/00Carbon; Compounds thereof
    • C01B32/15Nano-sized carbon materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Composite Materials (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR20147026275A 2012-03-07 2013-03-05 저항 측정 시스템 및 이것을 사용하는 방법 Withdrawn KR20140133873A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/414,669 US9085464B2 (en) 2012-03-07 2012-03-07 Resistance measurement system and method of using the same
US13/414,669 2012-03-07
PCT/US2013/029196 WO2013134312A2 (en) 2012-03-07 2013-03-05 Resistance measurement system and method of using the same

Publications (1)

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KR20140133873A true KR20140133873A (ko) 2014-11-20

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KR20147026275A Withdrawn KR20140133873A (ko) 2012-03-07 2013-03-05 저항 측정 시스템 및 이것을 사용하는 방법

Country Status (9)

Country Link
US (1) US9085464B2 (OSRAM)
EP (1) EP2822706A2 (OSRAM)
JP (1) JP2015523541A (OSRAM)
KR (1) KR20140133873A (OSRAM)
AU (1) AU2013230042A1 (OSRAM)
CA (1) CA2865987A1 (OSRAM)
IN (1) IN2014DN07025A (OSRAM)
WO (1) WO2013134312A2 (OSRAM)
ZA (1) ZA201406032B (OSRAM)

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CN104718170A (zh) 2012-09-04 2015-06-17 Ocv智识资本有限责任公司 碳强化的增强纤维在含水或非水介质内的分散
JP6804487B2 (ja) 2018-05-09 2020-12-23 第一工業製薬株式会社 熱可塑性ポリウレタン樹脂製造用2液硬化型組成物、熱可塑性ポリウレタン樹脂および繊維強化樹脂
JP7299005B2 (ja) * 2018-09-27 2023-06-27 セーレン株式会社 導電性繊維糸の電気抵抗測定装置
CN109336096B (zh) * 2018-10-19 2023-09-26 深圳市纳设智能装备有限公司 一种开放式连续生长碳纳米材料的设备及制备方法
CN112748154B (zh) * 2020-09-15 2023-05-16 湖南工程学院 弹力竹节纱的规格参数检测装置及规格参数检测方法
US12332203B2 (en) 2022-10-06 2025-06-17 Eastman Kodak Company Media conductivity measurement system

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