KR101176817B1 - 노광장치 및 디바이스 제조방법 - Google Patents
노광장치 및 디바이스 제조방법 Download PDFInfo
- Publication number
- KR101176817B1 KR101176817B1 KR1020057019039A KR20057019039A KR101176817B1 KR 101176817 B1 KR101176817 B1 KR 101176817B1 KR 1020057019039 A KR1020057019039 A KR 1020057019039A KR 20057019039 A KR20057019039 A KR 20057019039A KR 101176817 B1 KR101176817 B1 KR 101176817B1
- Authority
- KR
- South Korea
- Prior art keywords
- liquid
- substrate
- optical system
- projection optical
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Control Of Vending Devices And Auxiliary Devices For Vending Devices (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003103145 | 2003-04-07 | ||
| JPJP-P-2003-00103145 | 2003-04-07 | ||
| PCT/JP2004/004969 WO2004090956A1 (ja) | 2003-04-07 | 2004-04-06 | 露光装置及びデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20050118721A KR20050118721A (ko) | 2005-12-19 |
| KR101176817B1 true KR101176817B1 (ko) | 2012-08-24 |
Family
ID=33156817
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020057019039A Expired - Fee Related KR101176817B1 (ko) | 2003-04-07 | 2004-04-06 | 노광장치 및 디바이스 제조방법 |
Country Status (8)
| Country | Link |
|---|---|
| US (4) | US7480029B2 (enExample) |
| EP (1) | EP1612850B1 (enExample) |
| JP (2) | JP4902201B2 (enExample) |
| KR (1) | KR101176817B1 (enExample) |
| AT (1) | ATE426914T1 (enExample) |
| DE (1) | DE602004020200D1 (enExample) |
| TW (1) | TWI385706B (enExample) |
| WO (1) | WO2004090956A1 (enExample) |
Families Citing this family (63)
| Publication number | Priority date | Publication date | Assignee | Title |
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| ATE426914T1 (de) * | 2003-04-07 | 2009-04-15 | Nikon Corp | Belichtungsgerat und verfahren zur herstellung einer vorrichtung |
| EP3226073A3 (en) | 2003-04-09 | 2017-10-11 | Nikon Corporation | Exposure method and apparatus, and method for fabricating device |
| EP2667253B1 (en) | 2003-04-10 | 2015-06-10 | Nikon Corporation | Environmental system including vacuum scavenge for an immersion lithography apparatus |
| KR101745223B1 (ko) | 2003-04-10 | 2017-06-08 | 가부시키가이샤 니콘 | 액침 리소그래피 장치용 운반 영역을 포함하는 환경 시스템 |
| SG10201603067VA (en) | 2003-04-11 | 2016-05-30 | Nikon Corp | Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly |
| US7684008B2 (en) | 2003-06-11 | 2010-03-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US6867844B2 (en) | 2003-06-19 | 2005-03-15 | Asml Holding N.V. | Immersion photolithography system and method using microchannel nozzles |
| TWI433212B (zh) | 2003-06-19 | 2014-04-01 | 尼康股份有限公司 | An exposure apparatus, an exposure method, and an element manufacturing method |
| US6809794B1 (en) * | 2003-06-27 | 2004-10-26 | Asml Holding N.V. | Immersion photolithography system and method using inverted wafer-projection optics interface |
| DE60308161T2 (de) | 2003-06-27 | 2007-08-09 | Asml Netherlands B.V. | Lithographischer Apparat und Verfahren zur Herstellung eines Artikels |
| EP1646075B1 (en) | 2003-07-09 | 2011-06-15 | Nikon Corporation | Exposure apparatus and device manufacturing method |
| US7370659B2 (en) | 2003-08-06 | 2008-05-13 | Micron Technology, Inc. | Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines |
| TWI245163B (en) | 2003-08-29 | 2005-12-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| KR101371917B1 (ko) * | 2003-09-03 | 2014-03-07 | 가부시키가이샤 니콘 | 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법 |
| TWI511179B (zh) | 2003-10-28 | 2015-12-01 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造方法 |
| US7411653B2 (en) | 2003-10-28 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus |
| JP4295712B2 (ja) | 2003-11-14 | 2009-07-15 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置製造方法 |
| TWI512335B (zh) | 2003-11-20 | 2015-12-11 | 尼康股份有限公司 | 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法 |
| JP4323946B2 (ja) * | 2003-12-19 | 2009-09-02 | キヤノン株式会社 | 露光装置 |
| US7589822B2 (en) | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
| TWI511182B (zh) | 2004-02-06 | 2015-12-01 | 尼康股份有限公司 | 光學照明裝置、曝光裝置、曝光方法以及元件製造方法 |
| CN100592210C (zh) * | 2004-02-13 | 2010-02-24 | 卡尔蔡司Smt股份公司 | 微平版印刷投影曝光装置的投影物镜 |
| TWI402893B (zh) | 2004-03-25 | 2013-07-21 | 尼康股份有限公司 | 曝光方法 |
| KR101162938B1 (ko) * | 2004-04-19 | 2012-07-05 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| EP1747499A2 (en) | 2004-05-04 | 2007-01-31 | Nikon Corporation | Apparatus and method for providing fluid for immersion lithography |
| US7304715B2 (en) * | 2004-08-13 | 2007-12-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7701550B2 (en) | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7379155B2 (en) | 2004-10-18 | 2008-05-27 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7161654B2 (en) * | 2004-12-02 | 2007-01-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4784513B2 (ja) * | 2004-12-06 | 2011-10-05 | 株式会社ニコン | メンテナンス方法、メンテナンス機器、露光装置、及びデバイス製造方法 |
| US7180571B2 (en) * | 2004-12-08 | 2007-02-20 | Asml Netherlands B.V. | Lithographic projection apparatus and actuator |
| SG124351A1 (en) * | 2005-01-14 | 2006-08-30 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| US8692973B2 (en) | 2005-01-31 | 2014-04-08 | Nikon Corporation | Exposure apparatus and method for producing device |
| KR20180125636A (ko) | 2005-01-31 | 2018-11-23 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| CN102360170B (zh) | 2005-02-10 | 2014-03-12 | Asml荷兰有限公司 | 浸没液体、曝光装置及曝光方法 |
| US7324185B2 (en) | 2005-03-04 | 2008-01-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7411654B2 (en) * | 2005-04-05 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US20060232753A1 (en) | 2005-04-19 | 2006-10-19 | Asml Holding N.V. | Liquid immersion lithography system with tilted liquid flow |
| US8248577B2 (en) | 2005-05-03 | 2012-08-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101762083B1 (ko) | 2005-05-12 | 2017-07-26 | 가부시키가이샤 니콘 | 투영 광학계, 노광 장치 및 노광 방법 |
| DE102005024163A1 (de) | 2005-05-23 | 2006-11-30 | Carl Zeiss Smt Ag | Optisches System einer mikrolithographischen Projektionsbelichtungsanlage |
| US7583358B2 (en) | 2005-07-25 | 2009-09-01 | Micron Technology, Inc. | Systems and methods for retrieving residual liquid during immersion lens photolithography |
| US7456928B2 (en) | 2005-08-29 | 2008-11-25 | Micron Technology, Inc. | Systems and methods for controlling ambient pressure during processing of microfeature workpieces, including during immersion lithography |
| JP2007088339A (ja) * | 2005-09-26 | 2007-04-05 | Nikon Corp | 露光装置、及びデバイス製造方法 |
| US20070127002A1 (en) * | 2005-11-09 | 2007-06-07 | Nikon Corporation | Exposure apparatus and method, and device manufacturing method |
| KR20080066836A (ko) | 2005-11-09 | 2008-07-16 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
| JPWO2007055199A1 (ja) | 2005-11-09 | 2009-04-30 | 株式会社ニコン | 露光装置及び方法、並びにデバイス製造方法 |
| EP1962328B1 (en) | 2005-11-14 | 2013-01-16 | Nikon Corporation | Exposure apparatus, exposure method, and device fabricating method |
| US7773195B2 (en) | 2005-11-29 | 2010-08-10 | Asml Holding N.V. | System and method to increase surface tension and contact angle in immersion lithography |
| JP5194799B2 (ja) | 2005-12-06 | 2013-05-08 | 株式会社ニコン | 露光方法、露光装置、及びデバイス製造方法 |
| US8472004B2 (en) | 2006-01-18 | 2013-06-25 | Micron Technology, Inc. | Immersion photolithography scanner |
| JP4889331B2 (ja) * | 2006-03-22 | 2012-03-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
| US9477158B2 (en) * | 2006-04-14 | 2016-10-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US8451427B2 (en) | 2007-09-14 | 2013-05-28 | Nikon Corporation | Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method |
| JP5267029B2 (ja) | 2007-10-12 | 2013-08-21 | 株式会社ニコン | 照明光学装置、露光装置及びデバイスの製造方法 |
| WO2009050976A1 (en) | 2007-10-16 | 2009-04-23 | Nikon Corporation | Illumination optical system, exposure apparatus, and device manufacturing method |
| EP2179329A1 (en) | 2007-10-16 | 2010-04-28 | Nikon Corporation | Illumination optical system, exposure apparatus, and device manufacturing method |
| US8379187B2 (en) | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
| CN101910817B (zh) | 2008-05-28 | 2016-03-09 | 株式会社尼康 | 照明光学系统、曝光装置以及器件制造方法 |
| DE102008050868A1 (de) * | 2008-09-30 | 2010-04-08 | M+W Zander Products Gmbh | Einrichtung zur Temperaturstabilisierung von Flüssigkeiten, vorzugsweise von ultrareinem Wasser, bei der Herstellung von Chips sowie Verfahren zur Temperaturstabilisierung von Flüssigkeiten zur Anwendung bei der Herstellung von Chips |
| US20110153387A1 (en) * | 2009-12-17 | 2011-06-23 | Google Inc. | Customizing surveys |
| DE112014005277T5 (de) * | 2014-06-12 | 2016-10-06 | Fuji Electric Co., Ltd. | Vorrichtung zum Einbringen von Verunreinigungen, Verfahren zum Einbringen von Verunreinigungen und Verfahren zur Herstellung eines Halbleiterelements |
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- 2004-04-06 JP JP2005505289A patent/JP4902201B2/ja not_active Expired - Fee Related
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| JP2000012453A (ja) | 1998-06-18 | 2000-01-14 | Nikon Corp | 露光装置及びその使用方法、露光方法、並びにマスクの製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010183109A (ja) | 2010-08-19 |
| EP1612850A1 (en) | 2006-01-04 |
| US7480029B2 (en) | 2009-01-20 |
| DE602004020200D1 (de) | 2009-05-07 |
| JPWO2004090956A1 (ja) | 2006-07-06 |
| EP1612850A4 (en) | 2008-01-09 |
| US20060023188A1 (en) | 2006-02-02 |
| WO2004090956A1 (ja) | 2004-10-21 |
| US8111375B2 (en) | 2012-02-07 |
| US8537331B2 (en) | 2013-09-17 |
| US20070064209A1 (en) | 2007-03-22 |
| US20060033901A1 (en) | 2006-02-16 |
| US20080291410A1 (en) | 2008-11-27 |
| ATE426914T1 (de) | 2009-04-15 |
| JP5287791B2 (ja) | 2013-09-11 |
| KR20050118721A (ko) | 2005-12-19 |
| EP1612850B1 (en) | 2009-03-25 |
| JP4902201B2 (ja) | 2012-03-21 |
| TW200503071A (en) | 2005-01-16 |
| TWI385706B (zh) | 2013-02-11 |
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