KR101134168B1 - 반도체 칩 및 그 제조 방법과, 그를 이용한 표시 패널 및그 제조 방법 - Google Patents

반도체 칩 및 그 제조 방법과, 그를 이용한 표시 패널 및그 제조 방법 Download PDF

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Publication number
KR101134168B1
KR101134168B1 KR1020050077657A KR20050077657A KR101134168B1 KR 101134168 B1 KR101134168 B1 KR 101134168B1 KR 1020050077657 A KR1020050077657 A KR 1020050077657A KR 20050077657 A KR20050077657 A KR 20050077657A KR 101134168 B1 KR101134168 B1 KR 101134168B1
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South Korea
Prior art keywords
electrode pad
organic insulating
bumps
insulating layer
substrate
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Expired - Fee Related
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KR1020050077657A
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English (en)
Korean (ko)
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KR20070023268A (ko
Inventor
조원구
강호민
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삼성전자주식회사
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Priority to KR1020050077657A priority Critical patent/KR101134168B1/ko
Priority to CN2006101215580A priority patent/CN1921095B/zh
Priority to TW095130982A priority patent/TWI419292B/zh
Priority to US11/509,482 priority patent/US7750469B2/en
Priority to JP2006227756A priority patent/JP5311531B2/ja
Publication of KR20070023268A publication Critical patent/KR20070023268A/ko
Application granted granted Critical
Publication of KR101134168B1 publication Critical patent/KR101134168B1/ko
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/131Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
    • H10W74/137Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being directly on the semiconductor body
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/012Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/012Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
    • H10W72/01231Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/012Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
    • H10W72/01251Changing the shapes of bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • H10W72/07321Aligning
    • H10W72/07327Aligning involving guiding structures, e.g. spacers or supporting members
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • H10W72/07331Connecting techniques
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/074Connecting or disconnecting of anisotropic conductive adhesives
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/231Shapes
    • H10W72/232Plan-view shape, i.e. in top view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/231Shapes
    • H10W72/234Cross-sectional shape, i.e. in side view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/251Materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/251Materials
    • H10W72/252Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/261Functions other than electrical connecting
    • HELECTRICITY
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    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/281Auxiliary members
    • H10W72/287Flow barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • H10W72/321Structures or relative sizes of die-attach connectors
    • H10W72/325Die-attach connectors having a filler embedded in a matrix
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • H10W72/351Materials of die-attach connectors
    • H10W72/352Materials of die-attach connectors comprising metals or metalloids, e.g. solders
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • H10W72/351Materials of die-attach connectors
    • H10W72/353Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
    • H10W72/354Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/921Structures or relative sizes of bond pads
    • H10W72/923Bond pads having multiple stacked layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/9415Dispositions of bond pads relative to the surface, e.g. recessed, protruding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/944Dispositions of multiple bond pads
    • H10W72/9445Top-view layouts, e.g. mirror arrays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/951Materials of bond pads
    • H10W72/952Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu

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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Wire Bonding (AREA)
  • Liquid Crystal (AREA)
  • Electroluminescent Light Sources (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
KR1020050077657A 2005-08-24 2005-08-24 반도체 칩 및 그 제조 방법과, 그를 이용한 표시 패널 및그 제조 방법 Expired - Fee Related KR101134168B1 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020050077657A KR101134168B1 (ko) 2005-08-24 2005-08-24 반도체 칩 및 그 제조 방법과, 그를 이용한 표시 패널 및그 제조 방법
CN2006101215580A CN1921095B (zh) 2005-08-24 2006-08-22 半导体芯片、显示屏板及其制造方法
TW095130982A TWI419292B (zh) 2005-08-24 2006-08-23 半導體晶片,使用該晶片之顯示面板及製造半導體晶片與使用該晶片之顯示面板的方法
US11/509,482 US7750469B2 (en) 2005-08-24 2006-08-24 Insulating layer between bumps of semiconductor chip, and display panel using the same with anisotropic conductive film between semiconductor chip and substrate
JP2006227756A JP5311531B2 (ja) 2005-08-24 2006-08-24 半導体チップの実装された表示パネル

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050077657A KR101134168B1 (ko) 2005-08-24 2005-08-24 반도체 칩 및 그 제조 방법과, 그를 이용한 표시 패널 및그 제조 방법

Publications (2)

Publication Number Publication Date
KR20070023268A KR20070023268A (ko) 2007-02-28
KR101134168B1 true KR101134168B1 (ko) 2012-04-09

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US (1) US7750469B2 (enExample)
JP (1) JP5311531B2 (enExample)
KR (1) KR101134168B1 (enExample)
CN (1) CN1921095B (enExample)
TW (1) TWI419292B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11335668B2 (en) 2019-10-30 2022-05-17 Samsung Electronics Co., Ltd. Semiconductor package and method of fabricating the same

Families Citing this family (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2841454B1 (fr) 2002-07-01 2004-10-22 Jean Pierre Delmotte "appareil de cuisson d'aliments de type barbecue avec une plaque de regulation multi-fonctionnelle"
JP2009527121A (ja) * 2006-02-15 2009-07-23 エヌエックスピー ビー ヴィ 半導体パッケージの製造方法、パッケージ基板、および集積回路(ic)デバイス
JP2008166381A (ja) * 2006-12-27 2008-07-17 Sanyo Electric Co Ltd 半導体装置及びその製造方法
KR100810242B1 (ko) * 2007-02-13 2008-03-06 삼성전자주식회사 반도체 다이 패키지와 그를 이용한 내장형 인쇄회로 기판
JP2009282285A (ja) * 2008-05-22 2009-12-03 Mitsubishi Electric Corp 画像表示装置、およびその実装検査方法
JP2011009363A (ja) * 2009-06-24 2011-01-13 Nec Corp 半導体装置及びその製造方法並びにこれを用いた複合回路装置
TWI412107B (zh) * 2009-10-02 2013-10-11 財團法人工業技術研究院 凸塊結構、晶片封裝結構及該凸塊結構之製備方法
TWI445147B (zh) * 2009-10-14 2014-07-11 日月光半導體製造股份有限公司 半導體元件
CN102044513A (zh) * 2009-10-21 2011-05-04 日月光半导体制造股份有限公司 半导体组件
TW201117336A (en) * 2009-11-05 2011-05-16 Raydium Semiconductor Corp Electronic chip and substrate providing insulation protection between conducting nodes
TW201121006A (en) * 2009-12-03 2011-06-16 Hannstar Display Corp Connection structure for chip-on-glass driver IC and connection method therefor
US8426251B2 (en) * 2010-01-07 2013-04-23 Infineon Technologies Ag Semiconductor device
CN102237329B (zh) * 2010-04-27 2013-08-21 瑞鼎科技股份有限公司 芯片结构及其芯片接合结构与制造方法
US9070851B2 (en) 2010-09-24 2015-06-30 Seoul Semiconductor Co., Ltd. Wafer-level light emitting diode package and method of fabricating the same
TWI478303B (zh) 2010-09-27 2015-03-21 日月光半導體製造股份有限公司 具有金屬柱之晶片及具有金屬柱之晶片之封裝結構
CN102064135B (zh) * 2010-10-21 2015-07-22 日月光半导体制造股份有限公司 具有金属柱的芯片及具有金属柱的芯片的封装结构
KR101822012B1 (ko) * 2010-12-07 2018-01-26 삼성디스플레이 주식회사 유기전계발광 표시 장치 및 그 제조 방법
TWM408126U (en) * 2010-12-10 2011-07-21 Chunghwa Picture Tubes Ltd Conductive pad structure, chip package structure and active device array substrate
JP5370599B2 (ja) * 2011-01-26 2013-12-18 株式会社村田製作所 電子部品モジュールおよび電子部品素子
KR20130013515A (ko) * 2011-07-28 2013-02-06 삼성디스플레이 주식회사 유기 발광 표시 장치
TWI531835B (zh) 2011-11-15 2016-05-01 友達光電股份有限公司 顯示面板
US9368437B2 (en) 2011-12-31 2016-06-14 Intel Corporation High density package interconnects
US9257276B2 (en) 2011-12-31 2016-02-09 Intel Corporation Organic thin film passivation of metal interconnections
JP2014053597A (ja) * 2012-08-09 2014-03-20 Hitachi Chemical Co Ltd チップ型電子部品及び接続構造体
US10622310B2 (en) 2012-09-26 2020-04-14 Ping-Jung Yang Method for fabricating glass substrate package
US9293438B2 (en) 2013-07-03 2016-03-22 Harris Corporation Method for making electronic device with cover layer with openings and related devices
CN108321142B (zh) * 2013-07-26 2020-08-28 日月光半导体制造股份有限公司 半导体封装件及其的制造方法
JP6324746B2 (ja) * 2014-02-03 2018-05-16 デクセリアルズ株式会社 接続体、接続体の製造方法、電子機器
CN104900543B (zh) * 2014-03-06 2018-02-06 中芯国际集成电路制造(上海)有限公司 一种半导体器件及其制备方法
US9666814B2 (en) 2014-03-07 2017-05-30 Samsung Display Co., Ltd. Display device and method of manufacturing the same
JP2016018879A (ja) * 2014-07-08 2016-02-01 株式会社東芝 半導体装置および半導体装置の製造方法
US9698134B2 (en) * 2014-11-27 2017-07-04 Sct Technology, Ltd. Method for manufacturing a light emitted diode display
CN104966676B (zh) * 2015-07-08 2018-04-27 上海新微技术研发中心有限公司 共晶键合方法
TWI675440B (zh) * 2015-09-16 2019-10-21 楊秉榮 玻璃基板封裝及其製造方法
KR102393315B1 (ko) * 2015-09-30 2022-04-29 엘지디스플레이 주식회사 디스플레이 장치
CN205944139U (zh) 2016-03-30 2017-02-08 首尔伟傲世有限公司 紫外线发光二极管封装件以及包含此的发光二极管模块
KR102539031B1 (ko) * 2016-04-28 2023-06-02 삼성디스플레이 주식회사 표시 장치
KR102654925B1 (ko) * 2016-06-21 2024-04-05 삼성디스플레이 주식회사 디스플레이 장치 및 이의 제조 방법
KR102666884B1 (ko) * 2016-07-15 2024-05-17 삼성디스플레이 주식회사 표시 장치 및 그의 제조 방법
CN106019663A (zh) * 2016-07-29 2016-10-12 京东方科技集团股份有限公司 集成电路器件及制作方法、电路板、显示面板、显示装置
KR102638304B1 (ko) * 2016-08-02 2024-02-20 삼성디스플레이 주식회사 표시장치
KR102615177B1 (ko) * 2016-10-06 2023-12-20 삼성디스플레이 주식회사 평판표시장치
KR102785987B1 (ko) * 2016-10-13 2025-03-24 삼성디스플레이 주식회사 표시 패널
WO2018159186A1 (ja) * 2017-02-28 2018-09-07 富士フイルム株式会社 半導体デバイス、積層体ならびに半導体デバイスの製造方法および積層体の製造方法
KR102341124B1 (ko) * 2017-09-26 2021-12-22 삼성디스플레이 주식회사 전자패널, 표시장치, 및 그 제조 방법
CN109659304A (zh) * 2017-10-12 2019-04-19 上海和辉光电有限公司 一种阵列基板、显示面板及显示装置
US10283471B1 (en) * 2017-11-06 2019-05-07 Taiwan Semiconductor Manufacturing Co., Ltd. Micro-connection structure and manufacturing method thereof
CN109860224B (zh) * 2017-11-30 2021-05-14 京东方科技集团股份有限公司 显示基板及其制作方法、显示面板、显示装置
KR102452462B1 (ko) * 2017-12-26 2022-10-06 엘지디스플레이 주식회사 표시장치
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JP7185252B2 (ja) 2018-01-31 2022-12-07 三国電子有限会社 接続構造体の作製方法
JP7046351B2 (ja) 2018-01-31 2022-04-04 三国電子有限会社 接続構造体の作製方法
JP7160302B2 (ja) * 2018-01-31 2022-10-25 三国電子有限会社 接続構造体および接続構造体の作製方法
KR102512724B1 (ko) * 2018-04-19 2023-03-23 삼성디스플레이 주식회사 표시장치 및 이의 제조방법
KR20200005096A (ko) * 2018-07-05 2020-01-15 엘지전자 주식회사 반도체 발광 소자를 이용한 디스플레이 장치 및 이의 제조방법
CN109188790B (zh) * 2018-09-13 2022-04-15 京东方科技集团股份有限公司 基板及其制作方法、显示装置
CN114097015A (zh) * 2019-07-12 2022-02-25 夏普株式会社 显示装置
KR102888782B1 (ko) * 2019-10-11 2025-11-24 삼성디스플레이 주식회사 접착 부재, 이를 포함한 표시장치, 및 표시장치의 제조 방법
KR20210065580A (ko) * 2019-11-27 2021-06-04 엘지디스플레이 주식회사 플렉서블 표시장치
US11456349B2 (en) * 2019-12-31 2022-09-27 Samsung Display Co., Ltd. Display device having flexible film with window portion
KR20210150649A (ko) * 2020-06-03 2021-12-13 삼성디스플레이 주식회사 표시장치
CN111640722B (zh) * 2020-06-11 2022-07-05 厦门通富微电子有限公司 一种芯片封装方法和芯片封装器件
CN111554582B (zh) * 2020-06-11 2022-07-15 厦门通富微电子有限公司 一种芯片封装方法和芯片封装器件
US11991824B2 (en) 2020-08-28 2024-05-21 Unimicron Technology Corp. Circuit board structure and manufacturing method thereof
GB202408216D0 (en) * 2024-06-10 2024-07-24 Flexenable Tech Limited Driver chip on organic polymer substrate

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060115720A (ko) * 2003-08-28 2006-11-09 가부시키가이샤후지쿠라 반도체 패키지 및 그 제조 방법
KR20070119530A (ko) * 2006-06-14 2007-12-20 샤프 가부시키가이샤 Ic 칩 실장 패키지, 및 이것을 사용한 화상 표시 장치

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH095769A (ja) * 1995-06-21 1997-01-10 Rohm Co Ltd 電子素子の配線接続構造
JPH10144727A (ja) * 1996-11-14 1998-05-29 Matsushita Electric Ind Co Ltd 半導体素子の実装方法および半導体素子を実装した電子装置
US5903056A (en) * 1997-04-21 1999-05-11 Lucent Technologies Inc. Conductive polymer film bonding technique
DE69811296D1 (de) * 1997-07-11 2003-03-20 Bosch Gmbh Robert Erhöhte Haftung der Unterseitenbeschichtung von Flip-Chips
JPH11297889A (ja) * 1998-04-16 1999-10-29 Sony Corp 半導体パッケージおよび実装基板、ならびにこれらを用いた実装方法
US5943597A (en) * 1998-06-15 1999-08-24 Motorola, Inc. Bumped semiconductor device having a trench for stress relief
US7034404B1 (en) * 1999-02-25 2006-04-25 Nitto Denko Corporation Resin composition for semiconductor encapsulation, semiconductor device obtained with the same, and process for producing semiconductor device
US6451875B1 (en) * 1999-10-12 2002-09-17 Sony Chemicals Corporation Connecting material for anisotropically electroconductive connection
JP2001267370A (ja) * 2000-03-14 2001-09-28 Hitachi Ltd 半導体実装装置および方法
US6677664B2 (en) * 2000-04-25 2004-01-13 Fujitsu Hitachi Plasma Display Limited Display driver integrated circuit and flexible wiring board using a flat panel display metal chassis
JP2001358171A (ja) * 2000-06-12 2001-12-26 Canon Inc 半導体素子実装構造
US6489573B2 (en) * 2000-06-16 2002-12-03 Acer Display Technology Electrode bonding structure for reducing the thermal expansion of the flexible printed circuit board during the bonding process
TW479304B (en) * 2001-02-06 2002-03-11 Acer Display Tech Inc Semiconductor apparatus and its manufacturing method, and liquid crystal display using semiconductor apparatus
KR100456064B1 (ko) 2001-07-06 2004-11-08 한국과학기술원 극미세 피치 cog 기술용 이방성 전도성 필름
JP3810064B2 (ja) * 2002-03-15 2006-08-16 松下電器産業株式会社 液晶表示装置
JP2003332384A (ja) * 2002-05-13 2003-11-21 Matsushita Electric Ind Co Ltd 半導体装置およびその製造方法
US6744142B2 (en) * 2002-06-19 2004-06-01 National Central University Flip chip interconnection structure and process of making the same
WO2004051732A1 (en) * 2002-11-29 2004-06-17 Infineon Technologies Ag Attachment of flip-chips to substrates
JP4115832B2 (ja) * 2002-12-27 2008-07-09 東芝松下ディスプレイテクノロジー株式会社 半導体素子及び液晶表示パネル
JP2005109023A (ja) * 2003-09-29 2005-04-21 Optrex Corp 半導体チップ及びそれを実装した液晶表示装置
JP2005109187A (ja) * 2003-09-30 2005-04-21 Tdk Corp フリップチップ実装回路基板およびその製造方法ならびに集積回路装置
US20050104225A1 (en) * 2003-11-19 2005-05-19 Yuan-Chang Huang Conductive bumps with insulating sidewalls and method for fabricating
TWI262347B (en) * 2004-08-02 2006-09-21 Hannstar Display Corp Electrical conducting structure and liquid crystal display device comprising the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060115720A (ko) * 2003-08-28 2006-11-09 가부시키가이샤후지쿠라 반도체 패키지 및 그 제조 방법
KR20070119530A (ko) * 2006-06-14 2007-12-20 샤프 가부시키가이샤 Ic 칩 실장 패키지, 및 이것을 사용한 화상 표시 장치

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11335668B2 (en) 2019-10-30 2022-05-17 Samsung Electronics Co., Ltd. Semiconductor package and method of fabricating the same
US11769755B2 (en) 2019-10-30 2023-09-26 Samsung Electronics Co., Ltd. Semiconductor package and method of fabricating the same
US12119329B2 (en) 2019-10-30 2024-10-15 Samsung Electronics Co., Ltd. Semiconductor package and method of fabricating the same

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US20070045841A1 (en) 2007-03-01
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