KR100846184B1 - 리소그래피 투영 장치, 가스 퍼징 방법, 디바이스 제조방법 및 퍼지 가스 공급 시스템 - Google Patents
리소그래피 투영 장치, 가스 퍼징 방법, 디바이스 제조방법 및 퍼지 가스 공급 시스템 Download PDFInfo
- Publication number
- KR100846184B1 KR100846184B1 KR1020067001345A KR20067001345A KR100846184B1 KR 100846184 B1 KR100846184 B1 KR 100846184B1 KR 1020067001345 A KR1020067001345 A KR 1020067001345A KR 20067001345 A KR20067001345 A KR 20067001345A KR 100846184 B1 KR100846184 B1 KR 100846184B1
- Authority
- KR
- South Korea
- Prior art keywords
- purge gas
- moisture
- projection apparatus
- lithographic projection
- gas mixture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0006—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means to keep optical surfaces clean, e.g. by preventing or removing dirt, stains, contamination, condensation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70933—Purge, e.g. exchanging fluid or gas to remove pollutants
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Computer Networks & Wireless Communication (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Toxicology (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
- Air Humidification (AREA)
- Fuel Cell (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/623,180 US7384149B2 (en) | 2003-07-21 | 2003-07-21 | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
| US10/623,180 | 2003-07-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20060058686A KR20060058686A (ko) | 2006-05-30 |
| KR100846184B1 true KR100846184B1 (ko) | 2008-07-14 |
Family
ID=34079792
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067001345A Expired - Fee Related KR100846184B1 (ko) | 2003-07-21 | 2004-07-20 | 리소그래피 투영 장치, 가스 퍼징 방법, 디바이스 제조방법 및 퍼지 가스 공급 시스템 |
| KR1020077023567A Abandoned KR20070106805A (ko) | 2003-07-21 | 2004-07-21 | 리소그래피 투영 장치, 세정 가스 공급 시스템 및 가스세정 방법 |
| KR1020067001321A Expired - Fee Related KR101077683B1 (ko) | 2003-07-21 | 2004-07-21 | 리소그래피 투영 장치, 세정 가스 공급 시스템 및 가스세정 방법 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020077023567A Abandoned KR20070106805A (ko) | 2003-07-21 | 2004-07-21 | 리소그래피 투영 장치, 세정 가스 공급 시스템 및 가스세정 방법 |
| KR1020067001321A Expired - Fee Related KR101077683B1 (ko) | 2003-07-21 | 2004-07-21 | 리소그래피 투영 장치, 세정 가스 공급 시스템 및 가스세정 방법 |
Country Status (9)
| Country | Link |
|---|---|
| US (4) | US7384149B2 (enExample) |
| EP (3) | EP1649325B1 (enExample) |
| JP (4) | JP4487108B2 (enExample) |
| KR (3) | KR100846184B1 (enExample) |
| CN (3) | CN1853142B (enExample) |
| DE (1) | DE602004027497D1 (enExample) |
| SG (1) | SG141460A1 (enExample) |
| TW (3) | TWI251130B (enExample) |
| WO (2) | WO2005008339A2 (enExample) |
Families Citing this family (124)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100585476B1 (ko) | 2002-11-12 | 2006-06-07 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조방법 |
| CN100568101C (zh) | 2002-11-12 | 2009-12-09 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
| US10503084B2 (en) | 2002-11-12 | 2019-12-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7372541B2 (en) | 2002-11-12 | 2008-05-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US9482966B2 (en) | 2002-11-12 | 2016-11-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| SG158745A1 (en) | 2002-12-10 | 2010-02-26 | Nikon Corp | Exposure apparatus and method for producing device |
| KR101036114B1 (ko) | 2002-12-10 | 2011-05-23 | 가부시키가이샤 니콘 | 노광장치 및 노광방법, 디바이스 제조방법 |
| US7948604B2 (en) | 2002-12-10 | 2011-05-24 | Nikon Corporation | Exposure apparatus and method for producing device |
| JP4352874B2 (ja) | 2002-12-10 | 2009-10-28 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| AU2003289239A1 (en) | 2002-12-10 | 2004-06-30 | Nikon Corporation | Exposure system and device producing method |
| EP1571694A4 (en) | 2002-12-10 | 2008-10-15 | Nikon Corp | EXPOSURE APPARATUS AND METHOD FOR MANUFACTURING THE DEVICE |
| US7242455B2 (en) | 2002-12-10 | 2007-07-10 | Nikon Corporation | Exposure apparatus and method for producing device |
| DE10261775A1 (de) | 2002-12-20 | 2004-07-01 | Carl Zeiss Smt Ag | Vorrichtung zur optischen Vermessung eines Abbildungssystems |
| CN104678715B (zh) | 2003-02-26 | 2017-05-17 | 株式会社尼康 | 曝光方法以及器件制造方法 |
| JP4353179B2 (ja) | 2003-03-25 | 2009-10-28 | 株式会社ニコン | 露光装置、露光方法、及びデバイス製造方法 |
| ATE426914T1 (de) | 2003-04-07 | 2009-04-15 | Nikon Corp | Belichtungsgerat und verfahren zur herstellung einer vorrichtung |
| KR20110104084A (ko) | 2003-04-09 | 2011-09-21 | 가부시키가이샤 니콘 | 액침 리소그래피 유체 제어 시스템 |
| SG141425A1 (en) | 2003-04-10 | 2008-04-28 | Nikon Corp | Environmental system including vacuum scavange for an immersion lithography apparatus |
| KR101238142B1 (ko) | 2003-04-10 | 2013-02-28 | 가부시키가이샤 니콘 | 액침 리소그래피 장치용 운반 영역을 포함하는 환경 시스템 |
| JP4488005B2 (ja) | 2003-04-10 | 2010-06-23 | 株式会社ニコン | 液浸リソグラフィ装置用の液体を捕集するための流出通路 |
| JP4837556B2 (ja) | 2003-04-11 | 2011-12-14 | 株式会社ニコン | 液浸リソグラフィにおける光学素子の洗浄方法 |
| WO2004092830A2 (en) | 2003-04-11 | 2004-10-28 | Nikon Corporation | Liquid jet and recovery system for immersion lithography |
| KR101697896B1 (ko) | 2003-04-11 | 2017-01-18 | 가부시키가이샤 니콘 | 액침 리소그래피 머신에서 웨이퍼 교환동안 투영 렌즈 아래의 갭에서 액침 액체를 유지하는 장치 및 방법 |
| SG194246A1 (en) | 2003-04-17 | 2013-11-29 | Nikon Corp | Optical arrangement of autofocus elements for use with immersion lithography |
| TWI295414B (en) | 2003-05-13 | 2008-04-01 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| KR20060009356A (ko) | 2003-05-15 | 2006-01-31 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| TWI612557B (zh) | 2003-05-23 | 2018-01-21 | Nikon Corp | 曝光方法及曝光裝置以及元件製造方法 |
| TW200509205A (en) | 2003-05-23 | 2005-03-01 | Nippon Kogaku Kk | Exposure method and device-manufacturing method |
| CN101614966B (zh) | 2003-05-28 | 2015-06-17 | 株式会社尼康 | 曝光方法、曝光装置以及器件制造方法 |
| US7189291B2 (en) * | 2003-06-02 | 2007-03-13 | Entegris, Inc. | Method for the removal of airborne molecular contaminants using oxygen gas mixtures |
| US7213963B2 (en) | 2003-06-09 | 2007-05-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7684008B2 (en) | 2003-06-11 | 2010-03-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7317504B2 (en) | 2004-04-08 | 2008-01-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101520591B1 (ko) | 2003-06-13 | 2015-05-14 | 가부시키가이샤 니콘 | 노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법 |
| JP4437474B2 (ja) | 2003-06-19 | 2010-03-24 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| US7236232B2 (en) | 2003-07-01 | 2007-06-26 | Nikon Corporation | Using isotopically specified fluids as optical elements |
| JP4697138B2 (ja) | 2003-07-08 | 2011-06-08 | 株式会社ニコン | 液浸リソグラフィ装置、液浸リソグラフィ方法、デバイス製造方法 |
| WO2005006418A1 (ja) | 2003-07-09 | 2005-01-20 | Nikon Corporation | 露光装置及びデバイス製造方法 |
| WO2005006416A1 (ja) | 2003-07-09 | 2005-01-20 | Nikon Corporation | 結合装置、露光装置、及びデバイス製造方法 |
| EP2264531B1 (en) | 2003-07-09 | 2013-01-16 | Nikon Corporation | Exposure apparatus and device manufacturing method |
| US7384149B2 (en) * | 2003-07-21 | 2008-06-10 | Asml Netherlands B.V. | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
| US20060285091A1 (en) | 2003-07-21 | 2006-12-21 | Parekh Bipin S | Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system related application |
| EP3346485A1 (en) | 2003-07-25 | 2018-07-11 | Nikon Corporation | Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method |
| US7175968B2 (en) | 2003-07-28 | 2007-02-13 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and a substrate |
| KR101642670B1 (ko) | 2003-07-28 | 2016-07-25 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법, 그리고 노광 장치의 제어 방법 |
| EP1503244A1 (en) | 2003-07-28 | 2005-02-02 | ASML Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
| US7326522B2 (en) | 2004-02-11 | 2008-02-05 | Asml Netherlands B.V. | Device manufacturing method and a substrate |
| US7779781B2 (en) | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| CN100407371C (zh) | 2003-08-29 | 2008-07-30 | 株式会社尼康 | 曝光装置和器件加工方法 |
| TWI263859B (en) | 2003-08-29 | 2006-10-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| KR101308826B1 (ko) | 2003-09-03 | 2013-09-13 | 가부시키가이샤 니콘 | 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법 |
| JP4444920B2 (ja) | 2003-09-19 | 2010-03-31 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| KR101664642B1 (ko) | 2003-09-29 | 2016-10-11 | 가부시키가이샤 니콘 | 노광장치, 노광방법 및 디바이스 제조방법 |
| EP1672682A4 (en) | 2003-10-08 | 2008-10-15 | Zao Nikon Co Ltd | SUBSTRATE TRANSPORT DEVICE AND METHOD, EXPOSURE DEVICE AND METHOD AND COMPONENT MANUFACTURING METHOD |
| WO2005036621A1 (ja) | 2003-10-08 | 2005-04-21 | Zao Nikon Co., Ltd. | 基板搬送装置及び基板搬送方法、露光装置及び露光方法、デバイス製造方法 |
| JP2005136364A (ja) | 2003-10-08 | 2005-05-26 | Zao Nikon Co Ltd | 基板搬送装置、露光装置、並びにデバイス製造方法 |
| TW201738932A (zh) | 2003-10-09 | 2017-11-01 | Nippon Kogaku Kk | 曝光裝置及曝光方法、元件製造方法 |
| US7411653B2 (en) | 2003-10-28 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus |
| US7352433B2 (en) | 2003-10-28 | 2008-04-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4295712B2 (ja) | 2003-11-14 | 2009-07-15 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置製造方法 |
| TWI605315B (zh) | 2003-12-03 | 2017-11-11 | Nippon Kogaku Kk | Exposure device, exposure method, and device manufacturing method |
| JP4720506B2 (ja) | 2003-12-15 | 2011-07-13 | 株式会社ニコン | ステージ装置、露光装置、及び露光方法 |
| US7394521B2 (en) | 2003-12-23 | 2008-07-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| CN1938646B (zh) | 2004-01-20 | 2010-12-15 | 卡尔蔡司Smt股份公司 | 曝光装置和用于投影透镜的测量装置 |
| US7589822B2 (en) | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
| US7990516B2 (en) | 2004-02-03 | 2011-08-02 | Nikon Corporation | Immersion exposure apparatus and device manufacturing method with liquid detection apparatus |
| TWI486719B (zh) | 2004-03-25 | 2015-06-01 | 尼康股份有限公司 | 曝光方法 |
| US7898642B2 (en) | 2004-04-14 | 2011-03-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| WO2005111722A2 (en) | 2004-05-04 | 2005-11-24 | Nikon Corporation | Apparatus and method for providing fluid for immersion lithography |
| US7616383B2 (en) | 2004-05-18 | 2009-11-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| WO2005119368A2 (en) | 2004-06-04 | 2005-12-15 | Carl Zeiss Smt Ag | System for measuring the image quality of an optical imaging system |
| CN103605262B (zh) | 2004-06-09 | 2016-06-29 | 株式会社尼康 | 曝光装置及其维护方法、以及元件制造方法 |
| US7463330B2 (en) | 2004-07-07 | 2008-12-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101342330B1 (ko) | 2004-07-12 | 2013-12-16 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| EP1801853A4 (en) | 2004-08-18 | 2008-06-04 | Nikon Corp | EXPOSURE DEVICE AND COMPONENT MANUFACTURING METHOD |
| US7701550B2 (en) | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7397533B2 (en) | 2004-12-07 | 2008-07-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7880860B2 (en) | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| SG124351A1 (en) | 2005-01-14 | 2006-08-30 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| EP1681597B1 (en) | 2005-01-14 | 2010-03-10 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US20090262316A1 (en) | 2005-01-31 | 2009-10-22 | Nikon Corporation | Exposure apparatus and method for producing device |
| US8692973B2 (en) | 2005-01-31 | 2014-04-08 | Nikon Corporation | Exposure apparatus and method for producing device |
| US7282701B2 (en) | 2005-02-28 | 2007-10-16 | Asml Netherlands B.V. | Sensor for use in a lithographic apparatus |
| US20060199274A1 (en) * | 2005-03-01 | 2006-09-07 | Canon Kabushiki Kaisha | Atmosphere conditioning method, exposure apparatus, and device manufacturing method |
| JP4072543B2 (ja) * | 2005-03-18 | 2008-04-09 | キヤノン株式会社 | 液浸露光装置及びデバイス製造方法 |
| USRE43576E1 (en) | 2005-04-08 | 2012-08-14 | Asml Netherlands B.V. | Dual stage lithographic apparatus and device manufacturing method |
| WO2007019105A1 (en) * | 2005-08-03 | 2007-02-15 | Entegris, Inc. | A transfer container |
| US7986395B2 (en) * | 2005-10-24 | 2011-07-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion lithography apparatus and methods |
| US7420194B2 (en) | 2005-12-27 | 2008-09-02 | Asml Netherlands B.V. | Lithographic apparatus and substrate edge seal |
| US7528387B2 (en) * | 2005-12-29 | 2009-05-05 | Interuniversitair Microelektronica Centrum (Imec) | Methods and systems for characterising and optimising immersion lithographic processing |
| US7649611B2 (en) | 2005-12-30 | 2010-01-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7253875B1 (en) * | 2006-03-03 | 2007-08-07 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| WO2007126967A2 (en) | 2006-04-03 | 2007-11-08 | Entegris, Inc. | Atmospheric pressure microwave plasma treated porous membranes |
| DE102006021797A1 (de) | 2006-05-09 | 2007-11-15 | Carl Zeiss Smt Ag | Optische Abbildungseinrichtung mit thermischer Dämpfung |
| WO2007149513A2 (en) | 2006-06-19 | 2007-12-27 | Entegris, Inc. | System for purging reticle storage |
| US8564759B2 (en) * | 2006-06-29 | 2013-10-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and method for immersion lithography |
| US7933000B2 (en) * | 2006-11-16 | 2011-04-26 | Asml Netherlands B.V. | Device manufacturing method, method for holding a patterning device and lithographic apparatus including an applicator for applying molecules onto a clamp area of a patterning device |
| US7866637B2 (en) | 2007-01-26 | 2011-01-11 | Asml Netherlands B.V. | Humidifying apparatus, lithographic apparatus and humidifying method |
| US8817226B2 (en) | 2007-02-15 | 2014-08-26 | Asml Holding N.V. | Systems and methods for insitu lens cleaning using ozone in immersion lithography |
| US8654305B2 (en) | 2007-02-15 | 2014-02-18 | Asml Holding N.V. | Systems and methods for insitu lens cleaning in immersion lithography |
| US8237911B2 (en) | 2007-03-15 | 2012-08-07 | Nikon Corporation | Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine |
| NL1036181A1 (nl) * | 2007-11-30 | 2009-06-04 | Asml Netherlands Bv | A lithographic apparatus, a projection system and a device manufacturing method. |
| JP5097166B2 (ja) | 2008-05-28 | 2012-12-12 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置の動作方法 |
| US8500871B2 (en) * | 2009-08-21 | 2013-08-06 | Toray Industries, Inc. | Water-vapor-permeable membrane, hollow-fiber membrane, and hollow-fiber membrane module |
| TWI450324B (zh) * | 2010-01-25 | 2014-08-21 | Gudeng Prec Ind Co Ltd | 微影設備之光罩清潔方法及微影設備之光罩清潔系統 |
| EP2381310B1 (en) | 2010-04-22 | 2015-05-06 | ASML Netherlands BV | Fluid handling structure and lithographic apparatus |
| US9867917B2 (en) * | 2010-12-28 | 2018-01-16 | Toray Industries, Inc. | Medical material and hollow fiber membrane module |
| GB2502476A (en) * | 2011-02-15 | 2013-11-27 | Schlumberger Holdings | Method and apparatus for protecting downhole components with inert atmosphere |
| JP5864752B2 (ja) * | 2011-08-31 | 2016-02-17 | エーエスエムエル ネザーランズ ビー.ブイ. | 焦点補正を決定する方法、リソグラフィ処理セル及びデバイス製造方法 |
| KR102227564B1 (ko) * | 2014-01-20 | 2021-03-15 | 삼성디스플레이 주식회사 | 포토레지스트 조성물 |
| US10005018B2 (en) * | 2016-09-02 | 2018-06-26 | Battelle Memorial Institute | Xenon collection method and system |
| JP6767257B2 (ja) * | 2016-12-22 | 2020-10-14 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
| JP7193459B2 (ja) * | 2017-01-06 | 2022-12-20 | エーエスエムエル ネザーランズ ビー.ブイ. | 極端紫外線源(euv源) |
| DE102017207030A1 (de) * | 2017-04-26 | 2018-10-31 | Carl Zeiss Smt Gmbh | Verfahren zur Reinigung von optischen Elementen für den ultravioletten Wellenlängenbereich |
| NL2022981A (en) * | 2018-05-28 | 2019-12-02 | Asml Netherlands Bv | Lithographic apparatus |
| US12025919B2 (en) * | 2018-11-30 | 2024-07-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of storing photoresist coated substrates and semiconductor substrate container arrangement |
| US11626285B2 (en) | 2019-09-10 | 2023-04-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of manufacturing a semiconductor device |
| KR102868514B1 (ko) * | 2019-11-04 | 2025-10-02 | 허니웰 인터내셔널 인코포레이티드 | 가스 감지에서 잘못된 알람 이벤트를 검출하기 위한 방법 및 시스템 |
| EP3832391A1 (en) | 2019-12-03 | 2021-06-09 | ASML Netherlands B.V. | Clamp assembly |
| WO2021126594A1 (en) * | 2019-12-20 | 2021-06-24 | Cymer, Llc | Gas purge systems for a laser source |
| DE102020204545A1 (de) * | 2020-04-08 | 2021-10-14 | Carl Zeiss Smt Gmbh | Verfahren und vorrichtung zum trocknen eines bauteilinnenraums |
| DE102023200132A1 (de) | 2022-05-04 | 2023-11-09 | Carl Zeiss Smt Gmbh | Einrichtung zur Entfernung von gasförmigen Kontaminationen und Vorrichtung, insbesondere Lithographiesystem, mit einer solchen Einrichtung |
| EP4666131A1 (en) | 2023-02-13 | 2025-12-24 | ASML Netherlands B.V. | Gas supply module, fluid handling system, lithographic apparatus and device manufacturing method |
| CN116169322A (zh) * | 2023-02-28 | 2023-05-26 | 格罗夫氢能源科技集团有限公司 | 一种燃料电池进气温湿度调节装置及系统 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4704348A (en) * | 1981-04-24 | 1987-11-03 | Hitachi, Ltd. | Exposure of uniform fine pattern on photoresist |
| US5892572A (en) | 1993-10-28 | 1999-04-06 | Nikon Corporation | Projection exposure apparatus and method |
Family Cites Families (74)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19910441C1 (de) | 1999-03-10 | 2000-06-21 | Fraunhofer Ges Forschung | Luftbefeuchtung |
| EP0009543B1 (en) * | 1978-07-12 | 1982-12-08 | Richard R. Dr. Jackson | Nested hollow fiber humidifier |
| JPS62130321U (enExample) * | 1986-02-07 | 1987-08-18 | ||
| US4902456A (en) | 1988-05-04 | 1990-02-20 | Millipore Corporation | Fluorocarbon membranes and process for making fluorocarbon membranes |
| US5523193A (en) | 1988-05-31 | 1996-06-04 | Texas Instruments Incorporated | Method and apparatus for patterning and imaging member |
| US5116396A (en) * | 1989-05-12 | 1992-05-26 | Union Carbide Industrial Gases Technology Corporation | Hybrid prepurifier for cryogenic air separation plants |
| DE59105735D1 (de) | 1990-05-02 | 1995-07-20 | Fraunhofer Ges Forschung | Belichtungsvorrichtung. |
| US5229872A (en) | 1992-01-21 | 1993-07-20 | Hughes Aircraft Company | Exposure device including an electrically aligned electronic mask for micropatterning |
| JPH0636993A (ja) * | 1992-05-21 | 1994-02-10 | Canon Inc | 露光装置及び半導体素子の製造方法 |
| US5240472A (en) | 1992-05-29 | 1993-08-31 | Air Products And Chemicls, Inc. | Moisture removal from a wet gas |
| US5348691A (en) * | 1993-06-11 | 1994-09-20 | United Technologies Corporation | Atmosphere membrane humidifier and method and system for producing humidified air |
| IT1264661B1 (it) | 1993-07-05 | 1996-10-04 | Ausimont Spa | Copolimeri termoprocessabilin del tetrafluoroetilene |
| US5996976A (en) * | 1993-07-13 | 1999-12-07 | Lynntech, Inc. | Gas humidification system using water permeable membranes |
| US5528905A (en) | 1994-03-25 | 1996-06-25 | Essex Invention S.A. | Contactor, particularly a vapour exchanger for the control of the air hygrometric content, and a device for air handling |
| DE69528652D1 (de) | 1994-06-22 | 2002-11-28 | Fls Miljoe As Valby | Vorrichtung zur massenübertragung |
| JPH08266631A (ja) * | 1995-03-31 | 1996-10-15 | Asahi Glass Co Ltd | 呼吸用気体の加湿装置 |
| US6545746B1 (en) * | 1996-03-04 | 2003-04-08 | Nikon Corporation | Projection exposure apparatus |
| WO1997033205A1 (en) | 1996-03-06 | 1997-09-12 | Philips Electronics N.V. | Differential interferometer system and lithographic step-and-scan apparatus provided with such a system |
| KR100542414B1 (ko) * | 1996-03-27 | 2006-05-10 | 가부시키가이샤 니콘 | 노광장치및공조장치 |
| JPH09275054A (ja) * | 1996-04-03 | 1997-10-21 | Nikon Corp | 半導体製造装置 |
| DE69735016T2 (de) | 1996-12-24 | 2006-08-17 | Asml Netherlands B.V. | Lithographisches Gerät mit zwei Objekthaltern |
| KR100459813B1 (ko) | 1997-01-29 | 2004-12-04 | 마이크로닉 레이저 시스템즈 에이비 | 집속된 레이저 광선에 의해 감광 물질로 코팅된 기판상에 구조체를 형성시키는 방법 및 장치 |
| SE509062C2 (sv) | 1997-02-28 | 1998-11-30 | Micronic Laser Systems Ab | Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster |
| EP0900412B1 (en) | 1997-03-10 | 2005-04-06 | ASML Netherlands B.V. | Lithographic apparatus comprising a positioning device having two object holders |
| TW463238B (en) * | 1997-04-18 | 2001-11-11 | Nippon Kogaku Kk | Method and device for exposure control, method and device for exposure, and method of manufacturing the device |
| US5910292A (en) * | 1997-08-19 | 1999-06-08 | Aeronex, Inc. | Method for water removal from corrosive gas streams |
| US6059859A (en) * | 1997-09-19 | 2000-05-09 | Aeronex, Inc. | Method, composition and apparatus for water removal from non-corrosive gas streams |
| NL1008352C2 (nl) | 1998-02-19 | 1999-08-20 | Stichting Tech Wetenschapp | Inrichting, geschikt voor extreem ultraviolet lithografie, omvattende een stralingsbron en een verwerkingsorgaan voor het verwerken van de van de stralingsbron afkomstige straling, alsmede een filter voor het onderdrukken van ongewenste atomaire en microscopische deeltjes welke door een stralingsbron zijn uitgezonden. |
| US6089282A (en) * | 1998-05-08 | 2000-07-18 | Aeronex, Inc. | Method for recovery and reuse of gas |
| WO2000013767A1 (en) | 1998-09-09 | 2000-03-16 | Pall Corporation | Fluid treatment elements, methods for cleaning fluid treatment elements and methods for treating fluids |
| US6254936B1 (en) * | 1998-09-14 | 2001-07-03 | Silicon Valley Group, Inc. | Environment exchange control for material on a wafer surface |
| US6235641B1 (en) | 1998-10-30 | 2001-05-22 | Fsi International Inc. | Method and system to control the concentration of dissolved gas in a liquid |
| AU3477100A (en) | 1999-01-29 | 2000-08-18 | Mykrolis Corporation | Method for manufacturing hollow fiber membranes |
| AU3477000A (en) * | 1999-01-29 | 2000-08-18 | Millipore Corporation | Hollow fiber membrane contactor |
| US6802972B1 (en) | 1999-01-29 | 2004-10-12 | Mykrolis Corporation | Microporous hollow fiber membranes from perfluorinated thermoplastic polymers |
| US6582496B1 (en) * | 2000-01-28 | 2003-06-24 | Mykrolis Corporation | Hollow fiber membrane contactor |
| US6149817A (en) | 1999-03-08 | 2000-11-21 | Celgard Inc. | Shell-less hollow fiber membrane fluid contactor |
| JP2000262997A (ja) * | 1999-03-17 | 2000-09-26 | Sumitomo Heavy Ind Ltd | エアロゾル洗浄装置 |
| US6394109B1 (en) * | 1999-04-13 | 2002-05-28 | Applied Materials, Inc. | Method and apparatus for removing carbon contamination in a sub-atmospheric charged particle beam lithography system |
| WO2000074120A1 (en) * | 1999-05-28 | 2000-12-07 | Nikon Corporation | Exposure method and apparatus |
| JP3927344B2 (ja) * | 2000-01-19 | 2007-06-06 | 本田技研工業株式会社 | 加湿装置 |
| JP2001308003A (ja) * | 2000-02-15 | 2001-11-02 | Nikon Corp | 露光方法及び装置、並びにデバイス製造方法 |
| JP3869999B2 (ja) * | 2000-03-30 | 2007-01-17 | キヤノン株式会社 | 露光装置および半導体デバイス製造方法 |
| US6558475B1 (en) * | 2000-04-10 | 2003-05-06 | International Business Machines Corporation | Process for cleaning a workpiece using supercritical carbon dioxide |
| EP2269710A1 (en) * | 2000-05-05 | 2011-01-05 | Entegris, Inc. | Filters employing both acidic polymers and physical-adsorption media |
| US6432204B1 (en) * | 2000-05-17 | 2002-08-13 | Tokyo Electron Limited | Temperature and humidity controlled processing system |
| US6402818B1 (en) | 2000-06-02 | 2002-06-11 | Celgard Inc. | Degassing a liquid with a membrane contactor |
| JP2001349585A (ja) * | 2000-06-07 | 2001-12-21 | Orion Mach Co Ltd | 吸湿性中空繊維を使用する高分子膜加湿器 |
| JP2001358055A (ja) | 2000-06-15 | 2001-12-26 | Nikon Corp | 露光装置及びデバイス製造方法 |
| US6305097B1 (en) * | 2000-06-29 | 2001-10-23 | Texas Instruments Incorporated | Apparatus for in-situ reticle cleaning at photolithography tool |
| JP2002158170A (ja) * | 2000-09-08 | 2002-05-31 | Nikon Corp | 露光装置及びデバイス製造方法 |
| JP4610715B2 (ja) | 2000-11-06 | 2011-01-12 | Nok株式会社 | 加湿装置 |
| JP2002158154A (ja) * | 2000-11-16 | 2002-05-31 | Canon Inc | 露光装置 |
| DE10059910C2 (de) | 2000-12-01 | 2003-01-16 | Daimler Chrysler Ag | Vorrichtung zur kontinuierlichen Befeuchtung und Entfeuchtung der Zuluft von Fertigungsprozessen oder Raumlufttechnik-Anlagen |
| US20020136939A1 (en) | 2001-02-15 | 2002-09-26 | Grieve M. James | Fuel cell and battery voltage controlling method and system |
| JP3765531B2 (ja) | 2001-03-30 | 2006-04-12 | 本田技研工業株式会社 | 加湿モジュール |
| US6391090B1 (en) | 2001-04-02 | 2002-05-21 | Aeronex, Inc. | Method for purification of lens gases used in photolithography |
| US6842998B2 (en) * | 2001-04-06 | 2005-01-18 | Akrion Llc | Membrane dryer |
| US6616841B2 (en) | 2001-06-21 | 2003-09-09 | Celgard Inc. | Hollow fiber membrane contactor |
| US6514313B1 (en) * | 2001-06-22 | 2003-02-04 | Aeronex, Inc. | Gas purification system and method |
| US6828569B2 (en) * | 2001-11-19 | 2004-12-07 | Asml Netherlands B.V. | Lithographic projection apparatus, device manufacturing method and device manufactured thereby |
| US6724460B2 (en) * | 2001-11-19 | 2004-04-20 | Asml Netherlands B.V. | Lithographic projection apparatus, device manufacturing method, device manufactured thereby, cleaning unit and method of cleaning contaminated objects |
| US20030162305A1 (en) * | 2002-02-25 | 2003-08-28 | Daniel Alvarez | Gas contaminant detection and quantification method |
| US6638341B1 (en) * | 2002-06-14 | 2003-10-28 | Aeronex, Inc. | Method for rapid activation or preconditioning of porous gas purification substrates |
| US7455721B2 (en) * | 2002-07-18 | 2008-11-25 | Daimler Ag | Device and method for humidifying a gas flow |
| KR101036114B1 (ko) | 2002-12-10 | 2011-05-23 | 가부시키가이샤 니콘 | 노광장치 및 노광방법, 디바이스 제조방법 |
| TW200506334A (en) * | 2003-02-21 | 2005-02-16 | Mykrolis Corp | Purifier information retrieval system |
| US7189291B2 (en) * | 2003-06-02 | 2007-03-13 | Entegris, Inc. | Method for the removal of airborne molecular contaminants using oxygen gas mixtures |
| US6867844B2 (en) | 2003-06-19 | 2005-03-15 | Asml Holding N.V. | Immersion photolithography system and method using microchannel nozzles |
| US20060285091A1 (en) | 2003-07-21 | 2006-12-21 | Parekh Bipin S | Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system related application |
| US7384149B2 (en) * | 2003-07-21 | 2008-06-10 | Asml Netherlands B.V. | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
| US7779781B2 (en) * | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7701550B2 (en) | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US11206499B2 (en) | 2016-08-18 | 2021-12-21 | Qualcomm Incorporated | Hearable device comprising integrated device and wireless functionality |
-
2003
- 2003-07-21 US US10/623,180 patent/US7384149B2/en not_active Expired - Lifetime
-
2004
- 2004-07-20 WO PCT/NL2004/000519 patent/WO2005008339A2/en not_active Ceased
- 2004-07-20 TW TW093121654A patent/TWI251130B/zh not_active IP Right Cessation
- 2004-07-20 EP EP04774827A patent/EP1649325B1/en not_active Expired - Lifetime
- 2004-07-20 CN CN2004800266052A patent/CN1853142B/zh not_active Expired - Lifetime
- 2004-07-20 JP JP2006521023A patent/JP4487108B2/ja not_active Expired - Lifetime
- 2004-07-20 KR KR1020067001345A patent/KR100846184B1/ko not_active Expired - Fee Related
- 2004-07-20 US US10/894,365 patent/US7113254B2/en not_active Expired - Lifetime
- 2004-07-21 KR KR1020077023567A patent/KR20070106805A/ko not_active Abandoned
- 2004-07-21 CN CN200480021018A patent/CN100590530C/zh not_active Expired - Fee Related
- 2004-07-21 JP JP2006521216A patent/JP2006528431A/ja not_active Withdrawn
- 2004-07-21 US US10/565,486 patent/US7879137B2/en not_active Expired - Fee Related
- 2004-07-21 TW TW093121732A patent/TW200511389A/zh unknown
- 2004-07-21 EP EP04757185A patent/EP1646915B1/en not_active Expired - Lifetime
- 2004-07-21 TW TW096131640A patent/TW200801848A/zh unknown
- 2004-07-21 KR KR1020067001321A patent/KR101077683B1/ko not_active Expired - Fee Related
- 2004-07-21 EP EP10162412A patent/EP2211233A2/en not_active Withdrawn
- 2004-07-21 DE DE602004027497T patent/DE602004027497D1/de not_active Expired - Lifetime
- 2004-07-21 SG SG200802367-3A patent/SG141460A1/en unknown
- 2004-07-21 WO PCT/US2004/023490 patent/WO2005010619A2/en not_active Ceased
- 2004-07-21 CN CN2007101812213A patent/CN101144986B/zh not_active Expired - Fee Related
-
2006
- 2006-09-25 US US11/525,934 patent/US7450215B2/en not_active Expired - Lifetime
-
2007
- 2007-11-19 JP JP2007299182A patent/JP2008160080A/ja not_active Withdrawn
-
2011
- 2011-10-27 JP JP2011235682A patent/JP2012074712A/ja not_active Withdrawn
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4704348A (en) * | 1981-04-24 | 1987-11-03 | Hitachi, Ltd. | Exposure of uniform fine pattern on photoresist |
| US5892572A (en) | 1993-10-28 | 1999-04-06 | Nikon Corporation | Projection exposure apparatus and method |
Also Published As
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100846184B1 (ko) | 리소그래피 투영 장치, 가스 퍼징 방법, 디바이스 제조방법 및 퍼지 가스 공급 시스템 | |
| KR100622096B1 (ko) | 리소그래피장치 및 디바이스제조방법 | |
| JP4194831B2 (ja) | デバイス製造方法 | |
| KR100706076B1 (ko) | 리소그래피 투영장치, 디바이스 제조방법, 그 디바이스,오염된 물체를 세정하는 세정 유닛 및 방법 | |
| JP5055310B2 (ja) | リソグラフィ機器、放射システム、汚染物質トラップ、デバイスの製造方法、及び汚染物質トラップ内で汚染物質を捕らえる方法 | |
| JP4067078B2 (ja) | リソグラフィ投影装置およびデバイス製造方法 | |
| KR100825452B1 (ko) | 리소그래피장치와 디바이스제조방법 및 방사선시스템 | |
| KR100554878B1 (ko) | 리소그래피 장치, 디바이스 제조방법 및 이것에 의해제조된 디바이스 | |
| KR100706921B1 (ko) | 리소그래피 장치 및 디바이스의 제조 방법 | |
| KR100748446B1 (ko) | 가스 플러싱 시스템을 포함하는 리소그래피장치 | |
| KR100706930B1 (ko) | 리소그래피 장치 및 디바이스 제조방법 | |
| JP2005294834A (ja) | リソグラフィック装置及びデバイス製造方法 | |
| KR101528577B1 (ko) | 리소그래피 장치, 투영 시스템 및 디바이스 제조 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| N231 | Notification of change of applicant | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U12-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| FPAY | Annual fee payment |
Payment date: 20130628 Year of fee payment: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| FPAY | Annual fee payment |
Payment date: 20140701 Year of fee payment: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| FPAY | Annual fee payment |
Payment date: 20150626 Year of fee payment: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| FPAY | Annual fee payment |
Payment date: 20160705 Year of fee payment: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20170709 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20170709 |