SG141460A1 - Lithographic projection apparatus, purge gas supply system and gas purging method - Google Patents
Lithographic projection apparatus, purge gas supply system and gas purging methodInfo
- Publication number
- SG141460A1 SG141460A1 SG200802367-3A SG2008023673A SG141460A1 SG 141460 A1 SG141460 A1 SG 141460A1 SG 2008023673 A SG2008023673 A SG 2008023673A SG 141460 A1 SG141460 A1 SG 141460A1
- Authority
- SG
- Singapore
- Prior art keywords
- purge gas
- supply system
- projection apparatus
- lithographic projection
- gas supply
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/18—Coatings for keeping optical surfaces clean, e.g. hydrophobic or photo-catalytic films
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0006—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means to keep optical surfaces clean, e.g. by preventing or removing dirt, stains, contamination, condensation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70933—Purge, e.g. exchanging fluid or gas to remove pollutants
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70991—Connection with other apparatus, e.g. multiple exposure stations, particular arrangement of exposure apparatus and pre-exposure and/or post-exposure apparatus; Shared apparatus, e.g. having shared radiation source, shared mask or workpiece stage, shared base-plate; Utilities, e.g. cable, pipe or wireless arrangements for data, power, fluids or vacuum
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Optics & Photonics (AREA)
- Toxicology (AREA)
- Computer Networks & Wireless Communication (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
- Fuel Cell (AREA)
- Air Humidification (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/623,180 US7384149B2 (en) | 2003-07-21 | 2003-07-21 | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG141460A1 true SG141460A1 (en) | 2008-04-28 |
Family
ID=34079792
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200802367-3A SG141460A1 (en) | 2003-07-21 | 2004-07-21 | Lithographic projection apparatus, purge gas supply system and gas purging method |
Country Status (9)
| Country | Link |
|---|---|
| US (4) | US7384149B2 (enExample) |
| EP (3) | EP1649325B1 (enExample) |
| JP (4) | JP4487108B2 (enExample) |
| KR (3) | KR100846184B1 (enExample) |
| CN (3) | CN1853142B (enExample) |
| DE (1) | DE602004027497D1 (enExample) |
| SG (1) | SG141460A1 (enExample) |
| TW (3) | TWI251130B (enExample) |
| WO (2) | WO2005008339A2 (enExample) |
Families Citing this family (124)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7372541B2 (en) | 2002-11-12 | 2008-05-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US9482966B2 (en) | 2002-11-12 | 2016-11-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| SG135052A1 (en) | 2002-11-12 | 2007-09-28 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| US10503084B2 (en) | 2002-11-12 | 2019-12-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| CN100568101C (zh) | 2002-11-12 | 2009-12-09 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
| KR20120127755A (ko) | 2002-12-10 | 2012-11-23 | 가부시키가이샤 니콘 | 노광장치 및 디바이스 제조방법 |
| AU2003289271A1 (en) | 2002-12-10 | 2004-06-30 | Nikon Corporation | Exposure apparatus, exposure method and method for manufacturing device |
| CN101872135B (zh) | 2002-12-10 | 2013-07-31 | 株式会社尼康 | 曝光设备和器件制造法 |
| US7948604B2 (en) | 2002-12-10 | 2011-05-24 | Nikon Corporation | Exposure apparatus and method for producing device |
| KR101085372B1 (ko) | 2002-12-10 | 2011-11-21 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| US7242455B2 (en) | 2002-12-10 | 2007-07-10 | Nikon Corporation | Exposure apparatus and method for producing device |
| JP4352874B2 (ja) | 2002-12-10 | 2009-10-28 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| DE10261775A1 (de) | 2002-12-20 | 2004-07-01 | Carl Zeiss Smt Ag | Vorrichtung zur optischen Vermessung eines Abbildungssystems |
| KR101921572B1 (ko) | 2003-02-26 | 2018-11-26 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
| WO2004086470A1 (ja) | 2003-03-25 | 2004-10-07 | Nikon Corporation | 露光装置及びデバイス製造方法 |
| EP1612850B1 (en) | 2003-04-07 | 2009-03-25 | Nikon Corporation | Exposure apparatus and method for manufacturing a device |
| KR101177331B1 (ko) | 2003-04-09 | 2012-08-30 | 가부시키가이샤 니콘 | 액침 리소그래피 유체 제어 시스템 |
| SG2014015184A (en) | 2003-04-10 | 2015-06-29 | Nippon Kogaku Kk | Environmental system including vacuum scavange for an immersion lithography apparatus |
| KR101177330B1 (ko) | 2003-04-10 | 2012-08-30 | 가부시키가이샤 니콘 | 액침 리소그래피 장치 |
| WO2004093160A2 (en) | 2003-04-10 | 2004-10-28 | Nikon Corporation | Run-off path to collect liquid for an immersion lithography apparatus |
| SG139733A1 (en) | 2003-04-11 | 2008-02-29 | Nikon Corp | Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly |
| SG185136A1 (en) | 2003-04-11 | 2012-11-29 | Nikon Corp | Cleanup method for optics in immersion lithography |
| WO2004092830A2 (en) | 2003-04-11 | 2004-10-28 | Nikon Corporation | Liquid jet and recovery system for immersion lithography |
| EP1614000B1 (en) | 2003-04-17 | 2012-01-18 | Nikon Corporation | Immersion lithographic apparatus |
| TWI295414B (en) | 2003-05-13 | 2008-04-01 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| EP1624481A4 (en) | 2003-05-15 | 2008-01-30 | Nikon Corp | EXPOSURE DEVICE AND METHOD FOR MANUFACTURING COMPONENTS |
| TWI474380B (zh) | 2003-05-23 | 2015-02-21 | 尼康股份有限公司 | A method of manufacturing an exposure apparatus and an element |
| TW201415536A (zh) | 2003-05-23 | 2014-04-16 | 尼康股份有限公司 | 曝光方法及曝光裝置以及元件製造方法 |
| CN100541717C (zh) | 2003-05-28 | 2009-09-16 | 株式会社尼康 | 曝光方法、曝光装置以及器件制造方法 |
| US6913654B2 (en) * | 2003-06-02 | 2005-07-05 | Mykrolis Corporation | Method for the removal of airborne molecular contaminants using water gas mixtures |
| US7213963B2 (en) | 2003-06-09 | 2007-05-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| EP2261742A3 (en) | 2003-06-11 | 2011-05-25 | ASML Netherlands BV | Lithographic apparatus and device manufacturing method. |
| US7317504B2 (en) | 2004-04-08 | 2008-01-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| EP2738792B1 (en) | 2003-06-13 | 2015-08-05 | Nikon Corporation | Exposure method, substrate stage, exposure apparatus, and device manufacturing method |
| KR101931923B1 (ko) | 2003-06-19 | 2018-12-21 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조방법 |
| EP1639391A4 (en) | 2003-07-01 | 2009-04-29 | Nikon Corp | USE OF ISOTOPICALLY SPECIFIED FLUIDS AS OPTICAL ELEMENTS |
| EP3179309A1 (en) | 2003-07-08 | 2017-06-14 | Nikon Corporation | Wafer table for immersion lithography |
| EP1643543B1 (en) | 2003-07-09 | 2010-11-24 | Nikon Corporation | Exposure apparatus and method for manufacturing device |
| KR101296501B1 (ko) | 2003-07-09 | 2013-08-13 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| ATE513309T1 (de) | 2003-07-09 | 2011-07-15 | Nikon Corp | Belichtungsvorrichtung und verfahren zur bauelementeherstellung |
| US7384149B2 (en) * | 2003-07-21 | 2008-06-10 | Asml Netherlands B.V. | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
| US20060285091A1 (en) * | 2003-07-21 | 2006-12-21 | Parekh Bipin S | Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system related application |
| JP4524669B2 (ja) | 2003-07-25 | 2010-08-18 | 株式会社ニコン | 投影光学系の検査方法および検査装置 |
| US7175968B2 (en) | 2003-07-28 | 2007-02-13 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and a substrate |
| KR101642670B1 (ko) | 2003-07-28 | 2016-07-25 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법, 그리고 노광 장치의 제어 방법 |
| EP1503244A1 (en) | 2003-07-28 | 2005-02-02 | ASML Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
| US7326522B2 (en) | 2004-02-11 | 2008-02-05 | Asml Netherlands B.V. | Device manufacturing method and a substrate |
| US7779781B2 (en) | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101242886B1 (ko) | 2003-08-29 | 2013-03-12 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| TWI263859B (en) | 2003-08-29 | 2006-10-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| KR101523180B1 (ko) | 2003-09-03 | 2015-05-26 | 가부시키가이샤 니콘 | 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법 |
| JP4444920B2 (ja) | 2003-09-19 | 2010-03-31 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| TWI610342B (zh) | 2003-09-29 | 2018-01-01 | 尼康股份有限公司 | 曝光裝置及曝光方法、以及元件製造方法 |
| KR101111364B1 (ko) | 2003-10-08 | 2012-02-27 | 가부시키가이샤 자오 니콘 | 기판 반송 장치 및 기판 반송 방법, 노광 장치 및 노광방법, 디바이스 제조 방법 |
| EP1672682A4 (en) | 2003-10-08 | 2008-10-15 | Zao Nikon Co Ltd | SUBSTRATE TRANSPORT DEVICE AND METHOD, EXPOSURE DEVICE AND METHOD AND COMPONENT MANUFACTURING METHOD |
| JP2005136364A (ja) | 2003-10-08 | 2005-05-26 | Zao Nikon Co Ltd | 基板搬送装置、露光装置、並びにデバイス製造方法 |
| TWI598934B (zh) | 2003-10-09 | 2017-09-11 | 尼康股份有限公司 | Exposure apparatus, exposure method, and device manufacturing method |
| US7352433B2 (en) | 2003-10-28 | 2008-04-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7411653B2 (en) | 2003-10-28 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus |
| JP4295712B2 (ja) | 2003-11-14 | 2009-07-15 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置製造方法 |
| EP3370115A1 (en) | 2003-12-03 | 2018-09-05 | Nikon Corporation | Exposure apparatus, exposure method and method for producing a device |
| KR101941351B1 (ko) | 2003-12-15 | 2019-01-22 | 가부시키가이샤 니콘 | 스테이지 장치, 노광 장치, 및 노광 방법 |
| US7394521B2 (en) | 2003-12-23 | 2008-07-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| WO2005071491A2 (en) | 2004-01-20 | 2005-08-04 | Carl Zeiss Smt Ag | Exposure apparatus and measuring device for a projection lens |
| US7589822B2 (en) | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
| KR101377815B1 (ko) | 2004-02-03 | 2014-03-26 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| US8111373B2 (en) | 2004-03-25 | 2012-02-07 | Nikon Corporation | Exposure apparatus and device fabrication method |
| US7898642B2 (en) | 2004-04-14 | 2011-03-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US8054448B2 (en) | 2004-05-04 | 2011-11-08 | Nikon Corporation | Apparatus and method for providing fluid for immersion lithography |
| US7616383B2 (en) | 2004-05-18 | 2009-11-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101368523B1 (ko) | 2004-06-04 | 2014-02-27 | 칼 짜이스 에스엠테 게엠베하 | 광학적 결상 시스템의 결상 품질을 측정하기 위한 시스템 |
| CN103605262B (zh) | 2004-06-09 | 2016-06-29 | 株式会社尼康 | 曝光装置及其维护方法、以及元件制造方法 |
| US7463330B2 (en) | 2004-07-07 | 2008-12-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101433491B1 (ko) | 2004-07-12 | 2014-08-22 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| US8305553B2 (en) | 2004-08-18 | 2012-11-06 | Nikon Corporation | Exposure apparatus and device manufacturing method |
| US7701550B2 (en) | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7397533B2 (en) | 2004-12-07 | 2008-07-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7880860B2 (en) | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| DE602006012746D1 (de) | 2005-01-14 | 2010-04-22 | Asml Netherlands Bv | Lithografische Vorrichtung und Herstellungsverfahren |
| SG124351A1 (en) | 2005-01-14 | 2006-08-30 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| EP3079164A1 (en) | 2005-01-31 | 2016-10-12 | Nikon Corporation | Exposure apparatus and method for producing device |
| US8692973B2 (en) | 2005-01-31 | 2014-04-08 | Nikon Corporation | Exposure apparatus and method for producing device |
| US7282701B2 (en) | 2005-02-28 | 2007-10-16 | Asml Netherlands B.V. | Sensor for use in a lithographic apparatus |
| US20060199274A1 (en) * | 2005-03-01 | 2006-09-07 | Canon Kabushiki Kaisha | Atmosphere conditioning method, exposure apparatus, and device manufacturing method |
| JP4072543B2 (ja) * | 2005-03-18 | 2008-04-09 | キヤノン株式会社 | 液浸露光装置及びデバイス製造方法 |
| USRE43576E1 (en) | 2005-04-08 | 2012-08-14 | Asml Netherlands B.V. | Dual stage lithographic apparatus and device manufacturing method |
| WO2007019105A1 (en) * | 2005-08-03 | 2007-02-15 | Entegris, Inc. | A transfer container |
| US7986395B2 (en) * | 2005-10-24 | 2011-07-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion lithography apparatus and methods |
| US7420194B2 (en) * | 2005-12-27 | 2008-09-02 | Asml Netherlands B.V. | Lithographic apparatus and substrate edge seal |
| US7528387B2 (en) * | 2005-12-29 | 2009-05-05 | Interuniversitair Microelektronica Centrum (Imec) | Methods and systems for characterising and optimising immersion lithographic processing |
| US7649611B2 (en) | 2005-12-30 | 2010-01-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7253875B1 (en) * | 2006-03-03 | 2007-08-07 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP5567327B2 (ja) | 2006-04-03 | 2014-08-06 | インテグリス・インコーポレーテッド | 常圧マイクロ波プラズマ処理多孔性膜 |
| DE102006021797A1 (de) | 2006-05-09 | 2007-11-15 | Carl Zeiss Smt Ag | Optische Abbildungseinrichtung mit thermischer Dämpfung |
| US8776841B2 (en) | 2006-06-19 | 2014-07-15 | Entegris, Inc. | System for purging reticle storage |
| US8564759B2 (en) * | 2006-06-29 | 2013-10-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and method for immersion lithography |
| US7933000B2 (en) * | 2006-11-16 | 2011-04-26 | Asml Netherlands B.V. | Device manufacturing method, method for holding a patterning device and lithographic apparatus including an applicator for applying molecules onto a clamp area of a patterning device |
| US7866637B2 (en) | 2007-01-26 | 2011-01-11 | Asml Netherlands B.V. | Humidifying apparatus, lithographic apparatus and humidifying method |
| US8654305B2 (en) | 2007-02-15 | 2014-02-18 | Asml Holding N.V. | Systems and methods for insitu lens cleaning in immersion lithography |
| US8817226B2 (en) | 2007-02-15 | 2014-08-26 | Asml Holding N.V. | Systems and methods for insitu lens cleaning using ozone in immersion lithography |
| US8237911B2 (en) | 2007-03-15 | 2012-08-07 | Nikon Corporation | Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine |
| NL1036181A1 (nl) * | 2007-11-30 | 2009-06-04 | Asml Netherlands Bv | A lithographic apparatus, a projection system and a device manufacturing method. |
| JP5097166B2 (ja) | 2008-05-28 | 2012-12-12 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置の動作方法 |
| CN102481524B (zh) * | 2009-08-21 | 2014-06-18 | 东丽株式会社 | 水蒸气透过性膜、中空纱膜和中空纱膜组件 |
| TWI450324B (zh) * | 2010-01-25 | 2014-08-21 | 家登精密工業股份有限公司 | 微影設備之光罩清潔方法及微影設備之光罩清潔系統 |
| EP2381310B1 (en) | 2010-04-22 | 2015-05-06 | ASML Netherlands BV | Fluid handling structure and lithographic apparatus |
| US9867917B2 (en) * | 2010-12-28 | 2018-01-16 | Toray Industries, Inc. | Medical material and hollow fiber membrane module |
| US20140102796A1 (en) * | 2011-02-15 | 2014-04-17 | Schlumberger Technology Corporation | Method And Apparatus For Protecting Downhole Components With Inert Atmosphere |
| JP5864752B2 (ja) * | 2011-08-31 | 2016-02-17 | エーエスエムエル ネザーランズ ビー.ブイ. | 焦点補正を決定する方法、リソグラフィ処理セル及びデバイス製造方法 |
| KR102227564B1 (ko) * | 2014-01-20 | 2021-03-15 | 삼성디스플레이 주식회사 | 포토레지스트 조성물 |
| US10005018B2 (en) * | 2016-09-02 | 2018-06-26 | Battelle Memorial Institute | Xenon collection method and system |
| JP6767257B2 (ja) * | 2016-12-22 | 2020-10-14 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
| JP7193459B2 (ja) * | 2017-01-06 | 2022-12-20 | エーエスエムエル ネザーランズ ビー.ブイ. | 極端紫外線源(euv源) |
| DE102017207030A1 (de) * | 2017-04-26 | 2018-10-31 | Carl Zeiss Smt Gmbh | Verfahren zur Reinigung von optischen Elementen für den ultravioletten Wellenlängenbereich |
| WO2019228710A1 (en) * | 2018-05-28 | 2019-12-05 | Asml Netherlands B.V. | Lithographic apparatus |
| US12025919B2 (en) * | 2018-11-30 | 2024-07-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of storing photoresist coated substrates and semiconductor substrate container arrangement |
| US11626285B2 (en) | 2019-09-10 | 2023-04-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of manufacturing a semiconductor device |
| KR102868514B1 (ko) * | 2019-11-04 | 2025-10-02 | 허니웰 인터내셔널 인코포레이티드 | 가스 감지에서 잘못된 알람 이벤트를 검출하기 위한 방법 및 시스템 |
| EP3832391A1 (en) * | 2019-12-03 | 2021-06-09 | ASML Netherlands B.V. | Clamp assembly |
| KR102695305B1 (ko) * | 2019-12-20 | 2024-08-13 | 사이머 엘엘씨 | 레이저 소스용 가스 퍼지 시스템 |
| DE102020204545A1 (de) * | 2020-04-08 | 2021-10-14 | Carl Zeiss Smt Gmbh | Verfahren und vorrichtung zum trocknen eines bauteilinnenraums |
| DE102023200132A1 (de) | 2022-05-04 | 2023-11-09 | Carl Zeiss Smt Gmbh | Einrichtung zur Entfernung von gasförmigen Kontaminationen und Vorrichtung, insbesondere Lithographiesystem, mit einer solchen Einrichtung |
| JP2026505272A (ja) | 2023-02-13 | 2026-02-13 | エーエスエムエル ネザーランズ ビー.ブイ. | ガス供給モジュール、流体ハンドリングシステム、リソグラフィ装置及びデバイス製造方法 |
| CN116169322B (zh) * | 2023-02-28 | 2026-01-06 | 格罗夫氢能源科技集团有限公司 | 一种燃料电池进气温湿度调节装置及系统 |
Family Cites Families (76)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19910441C1 (de) * | 1999-03-10 | 2000-06-21 | Fraunhofer Ges Forschung | Luftbefeuchtung |
| EP0009543B1 (en) * | 1978-07-12 | 1982-12-08 | Richard R. Dr. Jackson | Nested hollow fiber humidifier |
| DD160756A3 (de) | 1981-04-24 | 1984-02-29 | Gudrun Dietz | Anordnung zur verbesserung fotochemischer umsetzungsprozesse in fotoresistschichten |
| JPS62130321U (enExample) | 1986-02-07 | 1987-08-18 | ||
| US4902456A (en) | 1988-05-04 | 1990-02-20 | Millipore Corporation | Fluorocarbon membranes and process for making fluorocarbon membranes |
| US5523193A (en) | 1988-05-31 | 1996-06-04 | Texas Instruments Incorporated | Method and apparatus for patterning and imaging member |
| US5116396A (en) * | 1989-05-12 | 1992-05-26 | Union Carbide Industrial Gases Technology Corporation | Hybrid prepurifier for cryogenic air separation plants |
| US5296891A (en) | 1990-05-02 | 1994-03-22 | Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. | Illumination device |
| US5229872A (en) | 1992-01-21 | 1993-07-20 | Hughes Aircraft Company | Exposure device including an electrically aligned electronic mask for micropatterning |
| JPH0636993A (ja) | 1992-05-21 | 1994-02-10 | Canon Inc | 露光装置及び半導体素子の製造方法 |
| US5240472A (en) * | 1992-05-29 | 1993-08-31 | Air Products And Chemicls, Inc. | Moisture removal from a wet gas |
| US5348691A (en) * | 1993-06-11 | 1994-09-20 | United Technologies Corporation | Atmosphere membrane humidifier and method and system for producing humidified air |
| IT1264661B1 (it) | 1993-07-05 | 1996-10-04 | Ausimont Spa | Copolimeri termoprocessabilin del tetrafluoroetilene |
| US5996976A (en) * | 1993-07-13 | 1999-12-07 | Lynntech, Inc. | Gas humidification system using water permeable membranes |
| JP3500619B2 (ja) | 1993-10-28 | 2004-02-23 | 株式会社ニコン | 投影露光装置 |
| US5528905A (en) | 1994-03-25 | 1996-06-25 | Essex Invention S.A. | Contactor, particularly a vapour exchanger for the control of the air hygrometric content, and a device for air handling |
| EP0766594B1 (en) | 1994-06-22 | 2002-10-23 | Fls Miljo A/S | Mass transfer apparatus |
| JPH08266631A (ja) * | 1995-03-31 | 1996-10-15 | Asahi Glass Co Ltd | 呼吸用気体の加湿装置 |
| US6545746B1 (en) * | 1996-03-04 | 2003-04-08 | Nikon Corporation | Projection exposure apparatus |
| EP0824722B1 (en) | 1996-03-06 | 2001-07-25 | Asm Lithography B.V. | Differential interferometer system and lithographic step-and-scan apparatus provided with such a system |
| KR100542414B1 (ko) | 1996-03-27 | 2006-05-10 | 가부시키가이샤 니콘 | 노광장치및공조장치 |
| JPH09275054A (ja) * | 1996-04-03 | 1997-10-21 | Nikon Corp | 半導体製造装置 |
| KR100512450B1 (ko) | 1996-12-24 | 2006-01-27 | 에이에스엠엘 네델란즈 비.브이. | 두개의물체홀더를가진이차원적으로안정화된위치설정장치와이런위치설정장치를구비한리소그래픽장치 |
| AU2048097A (en) | 1997-01-29 | 1998-08-18 | Micronic Laser Systems Ab | Method and apparatus for the production of a structure by focused laser radiation on a photosensitively coated substrate |
| SE509062C2 (sv) | 1997-02-28 | 1998-11-30 | Micronic Laser Systems Ab | Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster |
| EP0900412B1 (en) | 1997-03-10 | 2005-04-06 | ASML Netherlands B.V. | Lithographic apparatus comprising a positioning device having two object holders |
| IL132431A0 (en) * | 1997-04-18 | 2001-03-19 | Nikon Corp | Method and device for exposure control method and device for exposure and method of manufacture of device |
| US5910292A (en) | 1997-08-19 | 1999-06-08 | Aeronex, Inc. | Method for water removal from corrosive gas streams |
| US6059859A (en) | 1997-09-19 | 2000-05-09 | Aeronex, Inc. | Method, composition and apparatus for water removal from non-corrosive gas streams |
| NL1008352C2 (nl) | 1998-02-19 | 1999-08-20 | Stichting Tech Wetenschapp | Inrichting, geschikt voor extreem ultraviolet lithografie, omvattende een stralingsbron en een verwerkingsorgaan voor het verwerken van de van de stralingsbron afkomstige straling, alsmede een filter voor het onderdrukken van ongewenste atomaire en microscopische deeltjes welke door een stralingsbron zijn uitgezonden. |
| US6089282A (en) | 1998-05-08 | 2000-07-18 | Aeronex, Inc. | Method for recovery and reuse of gas |
| DE69934701T2 (de) | 1998-09-09 | 2007-11-15 | Pall Corp. | Verfahren zur Behandlung von Fluida |
| US6254936B1 (en) | 1998-09-14 | 2001-07-03 | Silicon Valley Group, Inc. | Environment exchange control for material on a wafer surface |
| US6235641B1 (en) | 1998-10-30 | 2001-05-22 | Fsi International Inc. | Method and system to control the concentration of dissolved gas in a liquid |
| DE60020675T2 (de) * | 1999-01-29 | 2006-05-04 | Mykrolis Corp., Bedford | Verfahren zur herstellung von hohlfiber-membranen |
| US6582496B1 (en) | 2000-01-28 | 2003-06-24 | Mykrolis Corporation | Hollow fiber membrane contactor |
| US6802972B1 (en) * | 1999-01-29 | 2004-10-12 | Mykrolis Corporation | Microporous hollow fiber membranes from perfluorinated thermoplastic polymers |
| DE60029087T2 (de) * | 1999-01-29 | 2007-05-31 | Entegris, Inc., Chaska | Stoffaustauschapparat mit hohlfibermembran |
| US6149817A (en) | 1999-03-08 | 2000-11-21 | Celgard Inc. | Shell-less hollow fiber membrane fluid contactor |
| JP2000262997A (ja) * | 1999-03-17 | 2000-09-26 | Sumitomo Heavy Ind Ltd | エアロゾル洗浄装置 |
| US6394109B1 (en) * | 1999-04-13 | 2002-05-28 | Applied Materials, Inc. | Method and apparatus for removing carbon contamination in a sub-atmospheric charged particle beam lithography system |
| KR20020036951A (ko) | 1999-05-28 | 2002-05-17 | 시마무라 테루오 | 노광방법 및 장치 |
| JP3927344B2 (ja) * | 2000-01-19 | 2007-06-06 | 本田技研工業株式会社 | 加湿装置 |
| JP2001308003A (ja) * | 2000-02-15 | 2001-11-02 | Nikon Corp | 露光方法及び装置、並びにデバイス製造方法 |
| JP3869999B2 (ja) | 2000-03-30 | 2007-01-17 | キヤノン株式会社 | 露光装置および半導体デバイス製造方法 |
| US6558475B1 (en) * | 2000-04-10 | 2003-05-06 | International Business Machines Corporation | Process for cleaning a workpiece using supercritical carbon dioxide |
| EP2269710A1 (en) * | 2000-05-05 | 2011-01-05 | Entegris, Inc. | Filters employing both acidic polymers and physical-adsorption media |
| US6432204B1 (en) * | 2000-05-17 | 2002-08-13 | Tokyo Electron Limited | Temperature and humidity controlled processing system |
| US6402818B1 (en) | 2000-06-02 | 2002-06-11 | Celgard Inc. | Degassing a liquid with a membrane contactor |
| JP2001349585A (ja) | 2000-06-07 | 2001-12-21 | Orion Mach Co Ltd | 吸湿性中空繊維を使用する高分子膜加湿器 |
| JP2001358055A (ja) | 2000-06-15 | 2001-12-26 | Nikon Corp | 露光装置及びデバイス製造方法 |
| US6305097B1 (en) * | 2000-06-29 | 2001-10-23 | Texas Instruments Incorporated | Apparatus for in-situ reticle cleaning at photolithography tool |
| JP2002158170A (ja) | 2000-09-08 | 2002-05-31 | Nikon Corp | 露光装置及びデバイス製造方法 |
| JP4610715B2 (ja) | 2000-11-06 | 2011-01-12 | Nok株式会社 | 加湿装置 |
| JP2002158154A (ja) | 2000-11-16 | 2002-05-31 | Canon Inc | 露光装置 |
| DE10059910C2 (de) * | 2000-12-01 | 2003-01-16 | Daimler Chrysler Ag | Vorrichtung zur kontinuierlichen Befeuchtung und Entfeuchtung der Zuluft von Fertigungsprozessen oder Raumlufttechnik-Anlagen |
| US20020136939A1 (en) | 2001-02-15 | 2002-09-26 | Grieve M. James | Fuel cell and battery voltage controlling method and system |
| JP3765531B2 (ja) | 2001-03-30 | 2006-04-12 | 本田技研工業株式会社 | 加湿モジュール |
| US6391090B1 (en) | 2001-04-02 | 2002-05-21 | Aeronex, Inc. | Method for purification of lens gases used in photolithography |
| US6842998B2 (en) * | 2001-04-06 | 2005-01-18 | Akrion Llc | Membrane dryer |
| US6616841B2 (en) | 2001-06-21 | 2003-09-09 | Celgard Inc. | Hollow fiber membrane contactor |
| US6514313B1 (en) | 2001-06-22 | 2003-02-04 | Aeronex, Inc. | Gas purification system and method |
| US6828569B2 (en) * | 2001-11-19 | 2004-12-07 | Asml Netherlands B.V. | Lithographic projection apparatus, device manufacturing method and device manufactured thereby |
| US6724460B2 (en) * | 2001-11-19 | 2004-04-20 | Asml Netherlands B.V. | Lithographic projection apparatus, device manufacturing method, device manufactured thereby, cleaning unit and method of cleaning contaminated objects |
| US20030162305A1 (en) | 2002-02-25 | 2003-08-28 | Daniel Alvarez | Gas contaminant detection and quantification method |
| US6638341B1 (en) | 2002-06-14 | 2003-10-28 | Aeronex, Inc. | Method for rapid activation or preconditioning of porous gas purification substrates |
| US7455721B2 (en) * | 2002-07-18 | 2008-11-25 | Daimler Ag | Device and method for humidifying a gas flow |
| AU2003289271A1 (en) | 2002-12-10 | 2004-06-30 | Nikon Corporation | Exposure apparatus, exposure method and method for manufacturing device |
| TW200506334A (en) | 2003-02-21 | 2005-02-16 | Mykrolis Corp | Purifier information retrieval system |
| US6913654B2 (en) | 2003-06-02 | 2005-07-05 | Mykrolis Corporation | Method for the removal of airborne molecular contaminants using water gas mixtures |
| US6867844B2 (en) | 2003-06-19 | 2005-03-15 | Asml Holding N.V. | Immersion photolithography system and method using microchannel nozzles |
| US20060285091A1 (en) | 2003-07-21 | 2006-12-21 | Parekh Bipin S | Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system related application |
| US7384149B2 (en) | 2003-07-21 | 2008-06-10 | Asml Netherlands B.V. | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
| US7779781B2 (en) | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7701550B2 (en) | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US11206499B2 (en) | 2016-08-18 | 2021-12-21 | Qualcomm Incorporated | Hearable device comprising integrated device and wireless functionality |
-
2003
- 2003-07-21 US US10/623,180 patent/US7384149B2/en not_active Expired - Lifetime
-
2004
- 2004-07-20 TW TW093121654A patent/TWI251130B/zh not_active IP Right Cessation
- 2004-07-20 KR KR1020067001345A patent/KR100846184B1/ko not_active Expired - Fee Related
- 2004-07-20 EP EP04774827A patent/EP1649325B1/en not_active Expired - Lifetime
- 2004-07-20 US US10/894,365 patent/US7113254B2/en not_active Expired - Lifetime
- 2004-07-20 JP JP2006521023A patent/JP4487108B2/ja not_active Expired - Lifetime
- 2004-07-20 CN CN2004800266052A patent/CN1853142B/zh not_active Expired - Lifetime
- 2004-07-20 WO PCT/NL2004/000519 patent/WO2005008339A2/en not_active Ceased
- 2004-07-21 EP EP04757185A patent/EP1646915B1/en not_active Expired - Lifetime
- 2004-07-21 CN CN200480021018A patent/CN100590530C/zh not_active Expired - Fee Related
- 2004-07-21 JP JP2006521216A patent/JP2006528431A/ja not_active Withdrawn
- 2004-07-21 KR KR1020077023567A patent/KR20070106805A/ko not_active Abandoned
- 2004-07-21 TW TW096131640A patent/TW200801848A/zh unknown
- 2004-07-21 WO PCT/US2004/023490 patent/WO2005010619A2/en not_active Ceased
- 2004-07-21 KR KR1020067001321A patent/KR101077683B1/ko not_active Expired - Fee Related
- 2004-07-21 EP EP10162412A patent/EP2211233A2/en not_active Withdrawn
- 2004-07-21 CN CN2007101812213A patent/CN101144986B/zh not_active Expired - Fee Related
- 2004-07-21 SG SG200802367-3A patent/SG141460A1/en unknown
- 2004-07-21 US US10/565,486 patent/US7879137B2/en not_active Expired - Fee Related
- 2004-07-21 TW TW093121732A patent/TW200511389A/zh unknown
- 2004-07-21 DE DE602004027497T patent/DE602004027497D1/de not_active Expired - Lifetime
-
2006
- 2006-09-25 US US11/525,934 patent/US7450215B2/en not_active Expired - Lifetime
-
2007
- 2007-11-19 JP JP2007299182A patent/JP2008160080A/ja not_active Withdrawn
-
2011
- 2011-10-27 JP JP2011235682A patent/JP2012074712A/ja not_active Withdrawn
Also Published As
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW200745727A (en) | Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system | |
| TW200801848A (en) | Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system | |
| TW200628994A (en) | Lithographic apparatus and device manufacturing method | |
| WO2005117018A3 (en) | Internally replenished enclosure | |
| CA2325299A1 (en) | Air separation module using a fast start valve for fast warm up of a permeable membrane separation module | |
| MY141634A (en) | Hydrogen generating fuel cell cartridges | |
| AU2003278411A1 (en) | Polyimide blends for gas separation membranes | |
| TW200703762A (en) | Hydrogen generating fuel cell cartridges | |
| SE0002037L (sv) | Metod för att driva en förbränningsanläggning samt en förbränningsanläggning | |
| ATE222793T1 (de) | Vorrichtung und verfahren zur gas-flüssigkeit mebran-absorption unter hohem druck | |
| CA2509879A1 (en) | Reactant gas humidification apparatus and reactant gas humidification method | |
| WO2003099421A8 (en) | Gas purification system | |
| ATE512729T1 (de) | Injektor und schaumerzeugungssystem mit diesem injektor | |
| NZ336014A (en) | Method and device for bringing a gas and liquid into contact with one another | |
| WO2002004083A3 (en) | Surface modified membranes and methods for producing the same | |
| AU2001229307A1 (en) | Method and apparatus for gas-assisted suppressed chromatography | |
| WO2007076154A8 (en) | Recovery of water vapor using a water vapor permeable mixed ion conducting membrane | |
| ATE544509T1 (de) | Vorrichtung zur mischung eines flüssigmediums | |
| SE0200589L (sv) | System för generering av vätgasbränsle till en bränslecell | |
| WO2008014460A3 (en) | Apparatus, system, and method for generating hydrogen from a chemical hydride | |
| WO2005052571A3 (en) | System for the generation of a reference gas by the evaporation of a liquid in said gas | |
| TW200722909A (en) | Method of forming etching mask | |
| WO2003021701A3 (en) | Apparatus for supplying an oxygen-containing gas to a fuel cell system | |
| TW200710274A (en) | Dry etching method | |
| ATE354872T1 (de) | Verfahren zum betrieb einer brennstoffzellenanlage sowie brennstoffzellenanlage |