KR100461220B1 - 반도체 장치 및 그의 제조방법 - Google Patents
반도체 장치 및 그의 제조방법 Download PDFInfo
- Publication number
- KR100461220B1 KR100461220B1 KR10-2002-0004305A KR20020004305A KR100461220B1 KR 100461220 B1 KR100461220 B1 KR 100461220B1 KR 20020004305 A KR20020004305 A KR 20020004305A KR 100461220 B1 KR100461220 B1 KR 100461220B1
- Authority
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- South Korea
- Prior art keywords
- semiconductor chip
- semiconductor
- semiconductor device
- substrate
- bonding wire
- Prior art date
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 447
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- 235000012431 wafers Nutrition 0.000 description 27
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- 239000010409 thin film Substances 0.000 description 1
Classifications
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- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
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Abstract
Description
Claims (22)
- 기판,상기 기판 상에 적층된 복수의 반도체 칩,각각의 반도체 칩에 대하여, 상기 반도체 칩에 형성된 전극단자와 상기 기판을 전기적으로 접속하는 하나 이상의 본딩 와이어,상기 하나 이상의 본딩 와이어와, 상기 하나 이상의 본딩 와이어와 전기적으로 접속된 반도체 칩 상에 적층된 반도체 칩 사이에 형성되어 있는 절연층, 및상기의 복수의 반도체 칩 사이에 형성된 접착층을 구비하며,상기 절연층과 상기 접착층은 상기 본딩 와이어가 전기적으로 접속된 전극 단자의 영역 상에 제공되는 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 절연층은 폴리이미드계 수지인 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 절연층의 두께는 15㎛ 이상 30㎛ 이하의 범위내인 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 전극 단자는, 반도체 칩의, 기판과는 반대측의 면에 형성되어 있는 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 반도체 칩의 전극 단자가 형성되는 영역은, 상기 반도체 칩에 적층된 반도체 칩과 중첩되어 있는 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 기판상에 적층된 모든 반도체 칩의 외형은 동일한 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 기판에 직접 탑재되어 있는 반도체 칩의 전극 단자에 접속되어 있는 본딩 와이어는, 상기 반도체 칩에 적층되어 있는 반도체 칩의, 상기 기판에 직접 탑재되어 있는 반도체 칩과 중첩되지 않는 영역과 기판 사이에 형성되는 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 전극 단자에는 범프가 형성되어 있고, 상기 본딩 와이어는 리버스 와이어 본딩법을 이용하여 접속하는 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 기판에 적층된 상기 복수의 반도체 칩 및 상기 본딩 와이어는 밀봉수지에 의해 밀봉되고, 상기 기판의 상기 복수의 반도체 칩이 적층된 면과 반대측의 면에 외부 단자가 형성되는 것을 특징으로 하는 반도체 장치.
- 삭제
- 제 1 항에 있어서, 상기 접착층은 상기 절연층과 상기 기판측의 상기 반도체 칩 사이에 형성하는 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 접착층은 열경화성 수지인 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 접착층은 에폭시계 수지인 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 접착층의 두께는, 상기 본딩 와이어의, 이 본딩 와이어가 상기 전극 단자를 통하여 접속된 상기 반도체 칩의 면으로부터의 높이보다 큰 것을 특징으로 하는 반도체 장치.
- 제 1 항에 있어서, 상기 반도체 칩의 상기 전극 단자가 형성되는 면의 해당전극단자를 제외한 영역에는, 절연성 수지층이 형성되는 것을 특징으로 하는 반도체 장치.
- 제 15 항에 있어서, 상기 절연성 수지층은 폴리이미드계 수지인 것을 특징으로 하는 반도체 장치.
- 절연층과 접착층으로 이루어진 시트를, 반도체 칩이 분할되기 전의 웨이퍼에, 이 시트의 절연층측이 이 웨이퍼에 접하도록 부착하는 시트 부착 공정과,상기 시트가 부착된 웨이퍼를 다이싱에 의하여 반도체 칩으로 분할하는 분할 공정과,상기 접착층에 의해, 이 접착층이 부착된 반도체 칩을, 본딩 와이어에 의해 기판과 전기적으로 접속되어 있는 반도체 칩에 접착하는 접착 공정을 포함하며,기판,기판 상에 적층되어 있는 복수의 반도체 칩,반도체 칩의 각각에 형성되어 있는 전극 단자와, 기판을 전기적으로 접속하는 본딩 와이어, 및본딩 와이어와, 이 본딩 와이어가 접속되어 있는 반도체 칩의 이 본딩 와이어측에 적층되어 있는 반도체 칩과의 사이에 형성되어 있는 절연층을 구비하는 반도체 장치의 제조방법.
- 제 17 항에 있어서, 상기 부착 공정 전에, 웨이퍼의 이면을 연마하는 연마공정을 더 포함하는 것을 특징으로 하는 반도체 장치의 제조방법.
- 제 17 항에 있어서, 상기 부착 공정에 있어서, 절연층 및 접착층의 두께가 균일한 시트를 상기 웨이퍼에 부착하는 것을 특징으로 하는 반도체 장치의 제조방법.
- 제 17 항에 있어서, 상기 접착 공정에 있어서, 상기 접착층에 의해, 기판에 전기적으로 접속되어 있는 반도체 칩에 형성되어 있는 전극 단자를 피복하도록 접착하는 것을 특징으로 하는 반도체 장치의 제조방법.
- 제 17 항에 있어서, 상기 접착 공정은, 기판에 전기적으로 접속되어 있는 반도체 칩과 본딩 와이어를, 접착층의 연화ㆍ용융이 시작되는 온도로 하여 행하는 것을 특징으로 하는 반도체 장치의 제조방법.
- 절연층으로 이루어진 절연층 시트를 반도체 칩이 분할되기 전의 웨이퍼에 부착하는 절연층 부착 공정과,상기 절연층 부착 공정 후에, 접착층으로 이루어진 접착층 시트를 상기 웨이퍼의 상기 절연층 시트가 부착된 면에 부착시키는 접착층 부착 공정과,상기 절연층 시트 및 접착층 시트가 부착된 웨이퍼를 다이싱에 의해 반도체 칩으로 분할하는 분할 공정과,상기 접착층에 의해, 이 접착층이 부착된 반도체 칩을, 본딩 와이어에 의해 기판과 전기적으로 접속되어 있는 반도체 칩에 접착하는 접착 공정을 포함하며,기판,기판 상에 적층되어 있는 복수의 반도체 칩,반도체 칩의 각각에 배치되어 있는 전극 단자와, 기판을 전기적으로 접속하는 본딩 와이어, 및본딩 와이어와, 이 본딩 와이어가 접속되어 있는 반도체 칩의 이 본딩 와이어측에 적층되어 있는 반도체 칩 사이에 형성된 절연층을 구비하는 반도체 장치의 제조방법.
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Also Published As
Publication number | Publication date |
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JP2002222913A (ja) | 2002-08-09 |
KR20020062857A (ko) | 2002-07-31 |
US6657290B2 (en) | 2003-12-02 |
US20020096755A1 (en) | 2002-07-25 |
JP3913481B2 (ja) | 2007-05-09 |
TW544902B (en) | 2003-08-01 |
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