JP5627698B2 - 撮像システムおよび技法 - Google Patents

撮像システムおよび技法 Download PDF

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Publication number
JP5627698B2
JP5627698B2 JP2012534178A JP2012534178A JP5627698B2 JP 5627698 B2 JP5627698 B2 JP 5627698B2 JP 2012534178 A JP2012534178 A JP 2012534178A JP 2012534178 A JP2012534178 A JP 2012534178A JP 5627698 B2 JP5627698 B2 JP 5627698B2
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slide
focus
stage
dither
lens
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Japanese (ja)
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JP2013508746A (ja
Inventor
ロニー，グレゴリー・シー
スターク，グレン
トッド，クリス
サバタ，ビカシュ
Original Assignee
ベンタナ メディカル システムズ， インコーポレイテッド
ベンタナ メディカル システムズ， インコーポレイテッド
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/08—Catadioptric systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/02—Viewing or reading apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
    • G01N1/31—Apparatus therefor
    • G01N1/312—Apparatus therefor for samples mounted on planar substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G01N2035/00049—Transport arrangements specific to flat sample substrates, e.g. pusher blade for loading/unloading a carousel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00138—Slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0441—Rotary sample carriers, i.e. carousels for samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0491—Position sensing, encoding; closed-loop control
    • G01N2035/0493—Locating samples; identifying different tube sizes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2012534178A 2009-10-19 2010-10-18 撮像システムおよび技法 Expired - Fee Related JP5627698B2 (ja)

Applications Claiming Priority (11)

Application Number Priority Date Filing Date Title
US25299509P 2009-10-19 2009-10-19
US61/252,995 2009-10-19
US25622809P 2009-10-29 2009-10-29
US61/256,228 2009-10-29
US26125109P 2009-11-13 2009-11-13
US61/261,251 2009-11-13
US29923110P 2010-01-28 2010-01-28
US61/299,231 2010-01-28
US36734110P 2010-07-23 2010-07-23
US61/367,341 2010-07-23
PCT/US2010/002772 WO2011049608A2 (en) 2009-10-19 2010-10-18 Imaging system and techniques

Related Child Applications (3)

Application Number Title Priority Date Filing Date
JP2013260025A Division JP5819390B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法
JP2013260029A Division JP5902144B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法
JP2013260023A Division JP5819389B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法

Publications (2)

Publication Number Publication Date
JP2013508746A JP2013508746A (ja) 2013-03-07
JP5627698B2 true JP5627698B2 (ja) 2014-11-19

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JP2012534178A Expired - Fee Related JP5627698B2 (ja) 2009-10-19 2010-10-18 撮像システムおよび技法
JP2013260029A Expired - Fee Related JP5902144B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法
JP2013260023A Expired - Fee Related JP5819389B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法
JP2013260025A Active JP5819390B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法

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JP2013260029A Expired - Fee Related JP5902144B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法
JP2013260023A Expired - Fee Related JP5819389B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法
JP2013260025A Active JP5819390B2 (ja) 2009-10-19 2013-12-17 撮像システムおよび技法

Country Status (12)

Country Link
US (4) US9036255B2 (enExample)
EP (4) EP2993478B1 (enExample)
JP (4) JP5627698B2 (enExample)
KR (4) KR101423896B1 (enExample)
CN (4) CN102687061B (enExample)
AU (1) AU2010308550B2 (enExample)
BR (1) BR112012009241A2 (enExample)
CA (4) CA2842721C (enExample)
IL (4) IL218822A (enExample)
IN (1) IN2012DN02336A (enExample)
SG (3) SG187478A1 (enExample)
WO (1) WO2011049608A2 (enExample)

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