JP4950051B2 - 遠隔でテストチャンネルをバッファリングする装置 - Google Patents

遠隔でテストチャンネルをバッファリングする装置 Download PDF

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Publication number
JP4950051B2
JP4950051B2 JP2007531379A JP2007531379A JP4950051B2 JP 4950051 B2 JP4950051 B2 JP 4950051B2 JP 2007531379 A JP2007531379 A JP 2007531379A JP 2007531379 A JP2007531379 A JP 2007531379A JP 4950051 B2 JP4950051 B2 JP 4950051B2
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buffer
test
isolation
delay
output
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JP2008512682A (ja
JP2008512682A5 (enExample
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チャールズ エー． ミラー，
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フォームファクター， インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2007531379A 2004-09-09 2005-09-08 遠隔でテストチャンネルをバッファリングする装置 Expired - Fee Related JP4950051B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/937,470 US7453258B2 (en) 2004-09-09 2004-09-09 Method and apparatus for remotely buffering test channels
US10/937,470 2004-09-09
PCT/US2005/032202 WO2006029340A2 (en) 2004-09-09 2005-09-08 Method and apparatus for remotely buffering test channels

Publications (3)

Publication Number Publication Date
JP2008512682A JP2008512682A (ja) 2008-04-24
JP2008512682A5 JP2008512682A5 (enExample) 2008-10-23
JP4950051B2 true JP4950051B2 (ja) 2012-06-13

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Family Applications (1)

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JP2007531379A Expired - Fee Related JP4950051B2 (ja) 2004-09-09 2005-09-08 遠隔でテストチャンネルをバッファリングする装置

Country Status (7)

Country Link
US (2) US7453258B2 (enExample)
EP (1) EP1794607A2 (enExample)
JP (1) JP4950051B2 (enExample)
KR (1) KR101207090B1 (enExample)
CN (2) CN102053221A (enExample)
TW (1) TWI401447B (enExample)
WO (1) WO2006029340A2 (enExample)

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WO2013000860A1 (en) 2011-06-29 2013-01-03 Dow Global Technologies Llc Flame resistant composition, fiber reinforced polyurethane based composite article comprising the flame resistant composition and its use
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CN104931759B (zh) * 2014-03-21 2018-07-06 中芯国际集成电路制造(上海)有限公司 一种标准单元漏电流的测试电路及测试方法
US9696376B2 (en) * 2015-03-12 2017-07-04 Globalfoundries Inc. Leakage testing of integrated circuits using a logarithmic transducer and a voltmeter
US10302677B2 (en) * 2015-04-29 2019-05-28 Kla-Tencor Corporation Multiple pin probes with support for performing parallel measurements
KR102576210B1 (ko) 2016-07-05 2023-09-08 삼성전자주식회사 반도체 장치
JP6782134B2 (ja) * 2016-09-26 2020-11-11 ラピスセミコンダクタ株式会社 スキャン回路、集合スキャン回路、半導体装置、および半導体装置の検査方法
KR102336181B1 (ko) 2017-06-07 2021-12-07 삼성전자주식회사 누설 전류 측정 회로, 이를 포함하는 집적 회로 및 시스템
US20190250208A1 (en) * 2018-02-09 2019-08-15 Qualcomm Incorporated Apparatus and method for detecting damage to an integrated circuit
KR102549004B1 (ko) * 2018-06-22 2023-06-29 삼성디스플레이 주식회사 점등 검사 장치, 점등 검사 방법 및 점등 검사 시스템
KR102801426B1 (ko) * 2020-08-19 2025-04-29 삼성전자주식회사 수신 회로, 이를 포함하는 인쇄 회로 기판 및 인터페이스 회로
KR102849291B1 (ko) * 2020-09-22 2025-08-25 삼성전자주식회사 프로브 장치, 테스트 장치, 및 반도체 장치의 테스트 방법
US11313903B2 (en) * 2020-09-30 2022-04-26 Analog Devices, Inc. Pin driver and test equipment calibration
CN113866589A (zh) * 2021-09-03 2021-12-31 长江存储科技有限责任公司 芯片测试装置及芯片测试方法

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Also Published As

Publication number Publication date
JP2008512682A (ja) 2008-04-24
KR101207090B1 (ko) 2012-11-30
US20090132190A1 (en) 2009-05-21
WO2006029340A2 (en) 2006-03-16
WO2006029340A3 (en) 2007-07-26
TWI401447B (zh) 2013-07-11
CN102053221A (zh) 2011-05-11
US7453258B2 (en) 2008-11-18
KR20070100695A (ko) 2007-10-11
US20060049820A1 (en) 2006-03-09
US7825652B2 (en) 2010-11-02
EP1794607A2 (en) 2007-06-13
CN101115998B (zh) 2011-01-05
TW200624841A (en) 2006-07-16
CN101115998A (zh) 2008-01-30

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