CN102053221A - 用于远程缓冲测试通道的方法和装置 - Google Patents

用于远程缓冲测试通道的方法和装置 Download PDF

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Publication number
CN102053221A
CN102053221A CN201010536273XA CN201010536273A CN102053221A CN 102053221 A CN102053221 A CN 102053221A CN 201010536273X A CN201010536273X A CN 201010536273XA CN 201010536273 A CN201010536273 A CN 201010536273A CN 102053221 A CN102053221 A CN 102053221A
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CN
China
Prior art keywords
delay
buffer
impact damper
circuit
voltage
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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CN201010536273XA
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English (en)
Chinese (zh)
Inventor
C.A.米勒
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FormFactor Inc
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FormFactor Inc
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Application filed by FormFactor Inc filed Critical FormFactor Inc
Publication of CN102053221A publication Critical patent/CN102053221A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
CN201010536273XA 2004-09-09 2005-09-08 用于远程缓冲测试通道的方法和装置 Pending CN102053221A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/937,470 US7453258B2 (en) 2004-09-09 2004-09-09 Method and apparatus for remotely buffering test channels
US10/937,470 2004-09-09

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN2005800297017A Division CN101115998B (zh) 2004-09-09 2005-09-08 用于远程缓冲测试通道的方法和装置

Publications (1)

Publication Number Publication Date
CN102053221A true CN102053221A (zh) 2011-05-11

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ID=35995565

Family Applications (2)

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CN201010536273XA Pending CN102053221A (zh) 2004-09-09 2005-09-08 用于远程缓冲测试通道的方法和装置
CN2005800297017A Expired - Fee Related CN101115998B (zh) 2004-09-09 2005-09-08 用于远程缓冲测试通道的方法和装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN2005800297017A Expired - Fee Related CN101115998B (zh) 2004-09-09 2005-09-08 用于远程缓冲测试通道的方法和装置

Country Status (7)

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US (2) US7453258B2 (enExample)
EP (1) EP1794607A2 (enExample)
JP (1) JP4950051B2 (enExample)
KR (1) KR101207090B1 (enExample)
CN (2) CN102053221A (enExample)
TW (1) TWI401447B (enExample)
WO (1) WO2006029340A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113866589A (zh) * 2021-09-03 2021-12-31 长江存储科技有限责任公司 芯片测试装置及芯片测试方法
CN114325532A (zh) * 2020-09-30 2022-04-12 美国亚德诺半导体公司 引脚驱动器和测试设备校准

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JP6782134B2 (ja) * 2016-09-26 2020-11-11 ラピスセミコンダクタ株式会社 スキャン回路、集合スキャン回路、半導体装置、および半導体装置の検査方法
KR102336181B1 (ko) 2017-06-07 2021-12-07 삼성전자주식회사 누설 전류 측정 회로, 이를 포함하는 집적 회로 및 시스템
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KR102801426B1 (ko) * 2020-08-19 2025-04-29 삼성전자주식회사 수신 회로, 이를 포함하는 인쇄 회로 기판 및 인터페이스 회로
KR102849291B1 (ko) * 2020-09-22 2025-08-25 삼성전자주식회사 프로브 장치, 테스트 장치, 및 반도체 장치의 테스트 방법

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114325532A (zh) * 2020-09-30 2022-04-12 美国亚德诺半导体公司 引脚驱动器和测试设备校准
CN114325532B (zh) * 2020-09-30 2024-03-22 美国亚德诺半导体公司 引脚驱动器和测试设备校准
CN113866589A (zh) * 2021-09-03 2021-12-31 长江存储科技有限责任公司 芯片测试装置及芯片测试方法

Also Published As

Publication number Publication date
JP2008512682A (ja) 2008-04-24
KR101207090B1 (ko) 2012-11-30
US20090132190A1 (en) 2009-05-21
WO2006029340A2 (en) 2006-03-16
WO2006029340A3 (en) 2007-07-26
TWI401447B (zh) 2013-07-11
US7453258B2 (en) 2008-11-18
KR20070100695A (ko) 2007-10-11
US20060049820A1 (en) 2006-03-09
US7825652B2 (en) 2010-11-02
JP4950051B2 (ja) 2012-06-13
EP1794607A2 (en) 2007-06-13
CN101115998B (zh) 2011-01-05
TW200624841A (en) 2006-07-16
CN101115998A (zh) 2008-01-30

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Application publication date: 20110511