TWI401447B - 用於遠距地緩衝測試波道之方法及裝置 - Google Patents

用於遠距地緩衝測試波道之方法及裝置 Download PDF

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Publication number
TWI401447B
TWI401447B TW094131190A TW94131190A TWI401447B TW I401447 B TWI401447 B TW I401447B TW 094131190 A TW094131190 A TW 094131190A TW 94131190 A TW94131190 A TW 94131190A TW I401447 B TWI401447 B TW I401447B
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TW
Taiwan
Prior art keywords
buffer
test
buffers
isolation
delay
Prior art date
Application number
TW094131190A
Other languages
English (en)
Chinese (zh)
Other versions
TW200624841A (en
Inventor
Charles A Miller
Original Assignee
Formfactor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Formfactor Inc filed Critical Formfactor Inc
Publication of TW200624841A publication Critical patent/TW200624841A/zh
Application granted granted Critical
Publication of TWI401447B publication Critical patent/TWI401447B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
TW094131190A 2004-09-09 2005-09-09 用於遠距地緩衝測試波道之方法及裝置 TWI401447B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/937,470 US7453258B2 (en) 2004-09-09 2004-09-09 Method and apparatus for remotely buffering test channels

Publications (2)

Publication Number Publication Date
TW200624841A TW200624841A (en) 2006-07-16
TWI401447B true TWI401447B (zh) 2013-07-11

Family

ID=35995565

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094131190A TWI401447B (zh) 2004-09-09 2005-09-09 用於遠距地緩衝測試波道之方法及裝置

Country Status (7)

Country Link
US (2) US7453258B2 (enExample)
EP (1) EP1794607A2 (enExample)
JP (1) JP4950051B2 (enExample)
KR (1) KR101207090B1 (enExample)
CN (2) CN102053221A (enExample)
TW (1) TWI401447B (enExample)
WO (1) WO2006029340A2 (enExample)

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WO2013000860A1 (en) 2011-06-29 2013-01-03 Dow Global Technologies Llc Flame resistant composition, fiber reinforced polyurethane based composite article comprising the flame resistant composition and its use
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CN104931759B (zh) * 2014-03-21 2018-07-06 中芯国际集成电路制造(上海)有限公司 一种标准单元漏电流的测试电路及测试方法
US9696376B2 (en) * 2015-03-12 2017-07-04 Globalfoundries Inc. Leakage testing of integrated circuits using a logarithmic transducer and a voltmeter
US10302677B2 (en) * 2015-04-29 2019-05-28 Kla-Tencor Corporation Multiple pin probes with support for performing parallel measurements
KR102576210B1 (ko) 2016-07-05 2023-09-08 삼성전자주식회사 반도체 장치
JP6782134B2 (ja) * 2016-09-26 2020-11-11 ラピスセミコンダクタ株式会社 スキャン回路、集合スキャン回路、半導体装置、および半導体装置の検査方法
KR102336181B1 (ko) 2017-06-07 2021-12-07 삼성전자주식회사 누설 전류 측정 회로, 이를 포함하는 집적 회로 및 시스템
US20190250208A1 (en) * 2018-02-09 2019-08-15 Qualcomm Incorporated Apparatus and method for detecting damage to an integrated circuit
KR102549004B1 (ko) * 2018-06-22 2023-06-29 삼성디스플레이 주식회사 점등 검사 장치, 점등 검사 방법 및 점등 검사 시스템
KR102801426B1 (ko) * 2020-08-19 2025-04-29 삼성전자주식회사 수신 회로, 이를 포함하는 인쇄 회로 기판 및 인터페이스 회로
KR102849291B1 (ko) * 2020-09-22 2025-08-25 삼성전자주식회사 프로브 장치, 테스트 장치, 및 반도체 장치의 테스트 방법
US11313903B2 (en) * 2020-09-30 2022-04-26 Analog Devices, Inc. Pin driver and test equipment calibration
CN113866589A (zh) * 2021-09-03 2021-12-31 长江存储科技有限责任公司 芯片测试装置及芯片测试方法

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US5966318A (en) * 1996-12-17 1999-10-12 Raytheon Company Nondestructive readout memory utilizing ferroelectric capacitors isolated from bitlines by buffer amplifiers
TW493083B (en) * 2000-02-01 2002-07-01 Winbond Electronics Corp Testing method for buried strap and deep trench leakage current
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US20040153860A1 (en) * 1989-06-30 2004-08-05 Whetsel Lee Doyle Circuit with expected data memory coupled to serial input lead

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US20040153860A1 (en) * 1989-06-30 2004-08-05 Whetsel Lee Doyle Circuit with expected data memory coupled to serial input lead
TW354372B (en) * 1996-10-04 1999-03-11 Philips Electronics Nv Method for inspecting an integrated circuit method for inspecting an integrated circuit, wherein the circuit includes a plurality of modules, and a method for determining the first supplying current at the signal supplying line of the first module circuit
US5966318A (en) * 1996-12-17 1999-10-12 Raytheon Company Nondestructive readout memory utilizing ferroelectric capacitors isolated from bitlines by buffer amplifiers
US6442674B1 (en) * 1998-12-30 2002-08-27 Intel Corporation Method and system for bypassing a fill buffer located along a first instruction path
TW493083B (en) * 2000-02-01 2002-07-01 Winbond Electronics Corp Testing method for buried strap and deep trench leakage current

Also Published As

Publication number Publication date
JP2008512682A (ja) 2008-04-24
KR101207090B1 (ko) 2012-11-30
US20090132190A1 (en) 2009-05-21
WO2006029340A2 (en) 2006-03-16
WO2006029340A3 (en) 2007-07-26
CN102053221A (zh) 2011-05-11
US7453258B2 (en) 2008-11-18
KR20070100695A (ko) 2007-10-11
US20060049820A1 (en) 2006-03-09
US7825652B2 (en) 2010-11-02
JP4950051B2 (ja) 2012-06-13
EP1794607A2 (en) 2007-06-13
CN101115998B (zh) 2011-01-05
TW200624841A (en) 2006-07-16
CN101115998A (zh) 2008-01-30

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