JP4911980B2 - 減圧処理装置 - Google Patents
減圧処理装置 Download PDFInfo
- Publication number
- JP4911980B2 JP4911980B2 JP2006025660A JP2006025660A JP4911980B2 JP 4911980 B2 JP4911980 B2 JP 4911980B2 JP 2006025660 A JP2006025660 A JP 2006025660A JP 2006025660 A JP2006025660 A JP 2006025660A JP 4911980 B2 JP4911980 B2 JP 4911980B2
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- JP
- Japan
- Prior art keywords
- exhaust
- processing
- processing apparatus
- gas
- chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006025660A JP4911980B2 (ja) | 2006-02-02 | 2006-02-02 | 減圧処理装置 |
| PCT/JP2007/051722 WO2007088940A1 (ja) | 2006-02-02 | 2007-02-01 | 減圧処理装置 |
| TW096103733A TW200737289A (en) | 2006-02-02 | 2007-02-01 | Pressure reducing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006025660A JP4911980B2 (ja) | 2006-02-02 | 2006-02-02 | 減圧処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007208042A JP2007208042A (ja) | 2007-08-16 |
| JP2007208042A5 JP2007208042A5 (cg-RX-API-DMAC7.html) | 2009-03-12 |
| JP4911980B2 true JP4911980B2 (ja) | 2012-04-04 |
Family
ID=38327509
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006025660A Expired - Fee Related JP4911980B2 (ja) | 2006-02-02 | 2006-02-02 | 減圧処理装置 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP4911980B2 (cg-RX-API-DMAC7.html) |
| TW (1) | TW200737289A (cg-RX-API-DMAC7.html) |
| WO (1) | WO2007088940A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (236)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100930320B1 (ko) * | 2007-11-27 | 2009-12-08 | 주식회사 미래보 | 반도체 공정에서의 잔류 케미칼 및 부산물 포집장치 |
| JP5352103B2 (ja) * | 2008-03-27 | 2013-11-27 | 東京エレクトロン株式会社 | 熱処理装置および処理システム |
| JP5171969B2 (ja) * | 2011-01-13 | 2013-03-27 | 東京エレクトロン株式会社 | 基板処理装置 |
| US20130023129A1 (en) | 2011-07-20 | 2013-01-24 | Asm America, Inc. | Pressure transmitter for a semiconductor processing environment |
| JP5728341B2 (ja) * | 2011-09-13 | 2015-06-03 | 東京エレクトロン株式会社 | 排気トラップ |
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| JP2000045073A (ja) * | 1998-07-29 | 2000-02-15 | Kokusai Electric Co Ltd | 排気トラップ及び処理装置 |
| JP2000256856A (ja) * | 1999-03-11 | 2000-09-19 | Tokyo Electron Ltd | 処理装置及び処理装置用真空排気システム及び減圧cvd装置及び減圧cvd装置用真空排気システム及びトラップ装置 |
| US20030072703A1 (en) * | 2001-09-13 | 2003-04-17 | Toshikazu Sugiura | Method for removing the harmful effects of organic halogen compound gas, apparatus for removing the harmful effects of organic halogen compound gas, system for fabricating semiconductor devices, and method for fabricating semiconductor devices |
| JP2003124127A (ja) * | 2001-10-12 | 2003-04-25 | Seiko Epson Corp | 半導体製造装置及びその排気配管及びメンテナンス方法 |
| US6858532B2 (en) * | 2002-12-10 | 2005-02-22 | International Business Machines Corporation | Low defect pre-emitter and pre-base oxide etch for bipolar transistors and related tooling |
| JP2004200364A (ja) * | 2002-12-18 | 2004-07-15 | Seiko Epson Corp | 排ガス処理装置および排ガス処理方法 |
| JP2004305950A (ja) * | 2003-04-09 | 2004-11-04 | Tokyo Electron Ltd | 排気トラップ、排気トラップのクリーニング方法、及び、反応処理装置 |
| JP2005093526A (ja) * | 2003-09-12 | 2005-04-07 | Sharp Corp | 半導体製造装置 |
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| JP2007208042A (ja) | 2007-08-16 |
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