JP4212558B2 - 半導体集積回路装置 - Google Patents
半導体集積回路装置 Download PDFInfo
- Publication number
- JP4212558B2 JP4212558B2 JP2004571838A JP2004571838A JP4212558B2 JP 4212558 B2 JP4212558 B2 JP 4212558B2 JP 2004571838 A JP2004571838 A JP 2004571838A JP 2004571838 A JP2004571838 A JP 2004571838A JP 4212558 B2 JP4212558 B2 JP 4212558B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- power supply
- voltage
- semiconductor integrated
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4072—Circuits for initialization, powering up or down, clearing memory or presetting
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4085—Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0083—Converters characterised by their input or output configuration
- H02M1/009—Converters characterised by their input or output configuration having two or more independently controlled outputs
Description
図3に示されるように、レベル変換回路311(312)は、複数のpMOSトランジスタ3111〜3116および複数のnMOSトランジスタ3117〜3122で構成されている。ここで、トランジスタ3111、3117、3115,3121および3116,3122はCMOSインバータを構成している。なお、参照符号n11はインバータ3111,3117の出力ノードを示し、また、n12はインバータ3115,3121の入力ノードを示している。
図4は本発明に係る半導体集積回路装置の要部の構成を概念的に示すブロック図である。図4において、参照符号1は昇圧電源回路、2は降圧電源回路、3は制御回路、そして、4は内部回路を示している。また、参照符号VDDは高電位電源電圧(例えば、1.8V±0.2V)、VSSは低電位電源電圧(例えば、0V)、VPP1およびVPP2は昇圧電圧(昇圧電源回路1の出力電圧:例えば、3.2〜3.6V)、VIIは降圧電圧(降圧電源回路2の出力電圧:例えば、1.6〜1.8V)、そして、VGは降圧電源回路2における内部電圧を示している。
図7に示されるように、昇圧電源回路1は、第1のスイッチ11、第2のスイッチ12、遅延回路13、および、レベル変換回路14を備える。第1および第2のスイッチ11,12は、レベル変換回路14の出力信号/CNT(/CNT’)によって制御される。ここで、第1のスイッチ11に供給される制御信号/CNT’は、第2のスイッチ12に供給される制御信号/CNTを遅延回路13で遅延した信号とされている。
Claims (5)
- 昇圧電圧を発生する昇圧電源回路、
該昇圧電圧により駆動される内部回路、
前記昇圧電圧を降圧し、降圧電圧を出力する降圧電源回路、および、
前記降圧電圧を受け取って前記内部回路を制御する制御回路を有し、
前記昇圧電源回路は、前記内部回路用の第1の出力端子と、前記降圧電源回路用の第2の出力端子とを備え、
前記昇圧電源回路は、
前記第1の出力端子に対して直列に接続された第1のスイッチと、
前記第2の出力端子に対して直列に接続された第2のスイッチと、
前記第1のスイッチをオンするタイミングを、前記第2のスイッチをオンするタイミングよりも遅らせる遅延回路と、
を備えることを特徴とする半導体集積回路装置。 - 請求項1に記載の半導体集積回路装置において、
前記昇圧電源回路は、前記第1の端子から出力される前記昇圧電圧の変動に関わらず、前記第2の端子から出力される前記昇圧電圧を所定のレベルで出力する出力電圧制御部を備えること
を特徴とする半導体集積回路装置。 - 請求項2に記載の半導体集積回路装置において、
前記出力電圧制御部は、さらに、前記第1のスイッチの後段に設けられた平滑用の第1の容量と、前記第2のスイッチの後段に設けられた平滑用の第2の容量とを備えること
を特徴とする半導体集積回路装置。 - 請求項2に記載の半導体集積回路装置において、
前記出力電圧制御部は、さらに、前記第1のスイッチと直列に設けられた順方向の第1のダイオードと、前記第2のスイッチと直列に設けられた順方向の第2のダイオードとのうちの少なくとも一方を備えること
を特徴とする半導体集積回路装置。 - 請求項1に記載の半導体集積回路装置において、
前記第1および第2の出力端子は、該半導体集積回路装置の起動時にのみ分離され、一旦起動した後は電気的に短絡されること
を特徴とする半導体集積回路装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2003/005961 WO2004102780A1 (ja) | 2003-05-13 | 2003-05-13 | 半導体集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2004102780A1 JPWO2004102780A1 (ja) | 2006-07-13 |
JP4212558B2 true JP4212558B2 (ja) | 2009-01-21 |
Family
ID=33446522
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004571838A Expired - Fee Related JP4212558B2 (ja) | 2003-05-13 | 2003-05-13 | 半導体集積回路装置 |
Country Status (6)
Country | Link |
---|---|
US (2) | US7113027B2 (ja) |
EP (2) | EP2256910B1 (ja) |
JP (1) | JP4212558B2 (ja) |
CN (1) | CN100423421C (ja) |
DE (1) | DE60335147D1 (ja) |
WO (1) | WO2004102780A1 (ja) |
Families Citing this family (16)
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US7274618B2 (en) * | 2005-06-24 | 2007-09-25 | Monolithic System Technology, Inc. | Word line driver for DRAM embedded in a logic process |
US7499307B2 (en) * | 2005-06-24 | 2009-03-03 | Mosys, Inc. | Scalable embedded DRAM array |
US7366926B2 (en) * | 2006-06-13 | 2008-04-29 | Montage Technology Group Limited | On-chip supply regulators |
JP5351029B2 (ja) * | 2007-09-04 | 2013-11-27 | 株式会社アドバンテスト | 電源安定化回路、電子デバイス、および、試験装置 |
KR101202429B1 (ko) * | 2007-10-11 | 2012-11-16 | 삼성전자주식회사 | 저항체를 이용한 비휘발성 메모리 장치 |
KR101420828B1 (ko) * | 2007-11-08 | 2014-07-21 | 삼성전자주식회사 | 전압 공급 장치 및 그것을 포함한 불휘발성 메모리 장치 |
JP2011053957A (ja) * | 2009-09-02 | 2011-03-17 | Toshiba Corp | 参照電流生成回路 |
TWI487233B (zh) * | 2012-11-09 | 2015-06-01 | Alchip Technologies Ltd | 耐高壓輸入輸出電路 |
CN103812495B (zh) * | 2012-11-13 | 2016-12-07 | 世芯电子(上海)有限公司 | 耐高压输入输出电路 |
US9367076B2 (en) * | 2014-03-13 | 2016-06-14 | Kabushiki Kaisha Toshiba | Semiconductor device |
CN104049665B (zh) * | 2014-06-05 | 2015-09-02 | 无锡中星微电子有限公司 | 电容放大电路及采用该电容放大电路的电压调节电路 |
CN104848700A (zh) * | 2015-05-15 | 2015-08-19 | 成都中冶节能环保工程有限公司 | 基于电源调整电路的热感型焦炉余热回收发电系统 |
CN104848703A (zh) * | 2015-05-17 | 2015-08-19 | 成都中冶节能环保工程有限公司 | 基于电源整压电路的热保护型焦炉余热发电系统 |
KR20160149845A (ko) * | 2015-06-19 | 2016-12-28 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 |
JP6962851B2 (ja) * | 2018-03-30 | 2021-11-05 | エイブリック株式会社 | 電源供給回路 |
CN109639127A (zh) * | 2018-12-21 | 2019-04-16 | 惠科股份有限公司 | 电源启动调节电路和供电电路 |
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JPS5612859A (en) * | 1979-07-12 | 1981-02-07 | Casio Comput Co Ltd | Boosting circuit |
JPH0778472A (ja) * | 1993-09-10 | 1995-03-20 | Toshiba Corp | 半導体集積回路 |
JP3155879B2 (ja) | 1994-02-25 | 2001-04-16 | 株式会社東芝 | 半導体集積回路装置 |
TW423162B (en) * | 1997-02-27 | 2001-02-21 | Toshiba Corp | Power voltage supplying circuit and semiconductor memory including the same |
JP2000040394A (ja) * | 1998-07-21 | 2000-02-08 | Fujitsu Ltd | 半導体装置 |
JP3800843B2 (ja) * | 1998-12-28 | 2006-07-26 | カシオ計算機株式会社 | 変圧制御回路及び変圧制御方法 |
JP3402259B2 (ja) * | 1999-06-04 | 2003-05-06 | 松下電器産業株式会社 | 昇圧回路 |
DE60015972T2 (de) * | 1999-06-25 | 2005-11-10 | The Board Of Trustees Of The University Of Illinois, Chicago | Batterie mit eingebautem dynamisch geschalteten kapazitiven leistungsumwandler |
JP2003517160A (ja) * | 1999-12-13 | 2003-05-20 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 切換えモード電源および表示装置 |
JP4441964B2 (ja) * | 1999-12-16 | 2010-03-31 | 富士通株式会社 | 直流電圧変換回路 |
JP3872927B2 (ja) * | 2000-03-22 | 2007-01-24 | 株式会社東芝 | 昇圧回路 |
JP4149637B2 (ja) * | 2000-05-25 | 2008-09-10 | 株式会社東芝 | 半導体装置 |
US6469482B1 (en) * | 2000-06-30 | 2002-10-22 | Intel Corporation | Inductive charge pump circuit for providing voltages useful for flash memory and other applications |
JP2002100192A (ja) * | 2000-09-22 | 2002-04-05 | Toshiba Corp | 不揮発性半導体メモリ |
US6452438B1 (en) * | 2000-12-28 | 2002-09-17 | Intel Corporation | Triple well no body effect negative charge pump |
JP2002208290A (ja) * | 2001-01-09 | 2002-07-26 | Mitsubishi Electric Corp | チャージポンプ回路およびこれを用いた不揮発性メモリの動作方法 |
JP2003203488A (ja) * | 2001-12-28 | 2003-07-18 | Mitsubishi Electric Corp | 不揮発性半導体メモリ |
JP3700173B2 (ja) * | 2002-05-28 | 2005-09-28 | ソニー株式会社 | 電圧変換制御回路及び方法 |
US6937517B2 (en) * | 2002-07-18 | 2005-08-30 | Micron Technology, Inc. | Clock regulation scheme for varying loads |
TW200505162A (en) * | 2003-04-14 | 2005-02-01 | Sanyo Electric Co | Charge pump circuit |
JP3675455B2 (ja) * | 2003-06-19 | 2005-07-27 | セイコーエプソン株式会社 | 昇圧回路、半導体装置及び表示装置 |
-
2003
- 2003-05-13 CN CNB038248255A patent/CN100423421C/zh not_active Expired - Fee Related
- 2003-05-13 DE DE60335147T patent/DE60335147D1/de not_active Expired - Lifetime
- 2003-05-13 EP EP10177109A patent/EP2256910B1/en not_active Expired - Fee Related
- 2003-05-13 JP JP2004571838A patent/JP4212558B2/ja not_active Expired - Fee Related
- 2003-05-13 WO PCT/JP2003/005961 patent/WO2004102780A1/ja active Application Filing
- 2003-05-13 EP EP03728065A patent/EP1624558B1/en not_active Expired - Fee Related
-
2005
- 2005-04-13 US US11/104,501 patent/US7113027B2/en not_active Expired - Fee Related
-
2006
- 2006-08-16 US US11/504,675 patent/US7508252B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1624558A1 (en) | 2006-02-08 |
US7508252B2 (en) | 2009-03-24 |
EP2256910B1 (en) | 2012-12-05 |
WO2004102780A1 (ja) | 2004-11-25 |
EP2256910A1 (en) | 2010-12-01 |
JPWO2004102780A1 (ja) | 2006-07-13 |
US20060273848A1 (en) | 2006-12-07 |
CN100423421C (zh) | 2008-10-01 |
US7113027B2 (en) | 2006-09-26 |
US20050201186A1 (en) | 2005-09-15 |
CN1695291A (zh) | 2005-11-09 |
EP1624558B1 (en) | 2010-11-24 |
EP1624558A4 (en) | 2008-12-17 |
DE60335147D1 (de) | 2011-01-05 |
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