JP4147594B2 - アクティブマトリクス基板、液晶表示装置および電子機器 - Google Patents

アクティブマトリクス基板、液晶表示装置および電子機器 Download PDF

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Publication number
JP4147594B2
JP4147594B2 JP02956897A JP2956897A JP4147594B2 JP 4147594 B2 JP4147594 B2 JP 4147594B2 JP 02956897 A JP02956897 A JP 02956897A JP 2956897 A JP2956897 A JP 2956897A JP 4147594 B2 JP4147594 B2 JP 4147594B2
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JP
Japan
Prior art keywords
active matrix
data line
inspection
matrix substrate
line driver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP02956897A
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English (en)
Japanese (ja)
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JPH10214065A5 (enExample
JPH10214065A (ja
Inventor
洋二郎 松枝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP02956897A priority Critical patent/JP4147594B2/ja
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to US09/155,310 priority patent/US6281700B1/en
Priority to EP05075723A priority patent/EP1548699A3/en
Priority to KR1020057012381A priority patent/KR100614016B1/ko
Priority to PCT/JP1998/000405 priority patent/WO1998033166A1/ja
Priority to EP98901073A priority patent/EP0895220B1/en
Priority to DE69830954T priority patent/DE69830954T2/de
Priority to TW087101187A priority patent/TW374146B/zh
Publication of JPH10214065A publication Critical patent/JPH10214065A/ja
Priority to KR1019980707748A priority patent/KR100638534B1/ko
Priority to US09/923,445 priority patent/US6525556B2/en
Priority to US10/338,823 priority patent/US6794892B2/en
Publication of JPH10214065A5 publication Critical patent/JPH10214065A5/ja
Application granted granted Critical
Publication of JP4147594B2 publication Critical patent/JP4147594B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/2007—Display of intermediate tones
    • G09G3/2011—Display of intermediate tones by amplitude modulation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3685—Details of drivers for data electrodes
    • G09G3/3688—Details of drivers for data electrodes suitable for active matrices only
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1339—Gaskets; Spacers; Sealing of cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13454—Drivers integrated on the active matrix substrate
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2310/00—Command of the display device
    • G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
    • G09G2310/0243—Details of the generation of driving signals
    • G09G2310/0259—Details of the generation of driving signals with use of an analog or digital ramp generator in the column driver or in the pixel circuit
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2310/00—Command of the display device
    • G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
    • G09G2310/0264—Details of driving circuits
    • G09G2310/027—Details of drivers for data electrodes, the drivers handling digital grey scale data, e.g. use of D/A converters
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/2007—Display of intermediate tones
    • G09G3/2014—Display of intermediate tones by modulation of the duration of a single pulse during which the logic level remains constant
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/76—Simultaneous conversion using switching tree
    • H03M1/765—Simultaneous conversion using switching tree using a single level of switches which are controlled by unary decoded digital signals
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/82—Digital/analogue converters with intermediate conversion to time interval
    • H03M1/822—Digital/analogue converters with intermediate conversion to time interval using pulse width modulation

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP02956897A 1997-01-29 1997-01-29 アクティブマトリクス基板、液晶表示装置および電子機器 Expired - Lifetime JP4147594B2 (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP02956897A JP4147594B2 (ja) 1997-01-29 1997-01-29 アクティブマトリクス基板、液晶表示装置および電子機器
EP05075723A EP1548699A3 (en) 1997-01-29 1998-01-29 Method for inspecting active matrix substrate, active matrix substrate, liquid crystal display device and electronic equipment
KR1020057012381A KR100614016B1 (ko) 1997-01-29 1998-01-29 액티브 매트릭스 기판 및 전자 기기
PCT/JP1998/000405 WO1998033166A1 (en) 1997-01-29 1998-01-29 Method for inspecting active matrix board, active matrix board, liquid crystal device and electronic equipment
EP98901073A EP0895220B1 (en) 1997-01-29 1998-01-29 Method for inspecting active matrix substrate, active matrix substrate, liquid crystal display device and electronic equipment
DE69830954T DE69830954T2 (de) 1997-01-29 1998-01-29 Überprüfungsverfahren für Substrat mit aktiver Matrix, Substrat mit aktiver Matrix, Flüssigkristallanzeigevorrichtung und elektronische Apparatur
US09/155,310 US6281700B1 (en) 1997-01-29 1998-01-29 Active matrix substrate inspecting method, active matrix substrate, liquid crystal device, and electronic apparatus
TW087101187A TW374146B (en) 1997-01-29 1998-02-02 Method for detecting active matrix type substrate, active matrix substrate, liquid crystal device and electric machine
KR1019980707748A KR100638534B1 (ko) 1997-01-29 1998-09-29 액티브매트릭스기판의검사방법,액티브매트릭스기판,액정장치및전자기기
US09/923,445 US6525556B2 (en) 1997-01-29 2001-08-08 Active matrix substrate inspecting method, active matrix substrate, liquid crystal device, and electronic apparatus
US10/338,823 US6794892B2 (en) 1997-01-29 2003-01-09 Active matrix substrate inspecting method, active matrix substrate, liquid crystal device, and electronic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02956897A JP4147594B2 (ja) 1997-01-29 1997-01-29 アクティブマトリクス基板、液晶表示装置および電子機器

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2004014744A Division JP3791526B2 (ja) 2004-01-22 2004-01-22 アクティブマトリクス基板、液晶装置および電子機器

Publications (3)

Publication Number Publication Date
JPH10214065A JPH10214065A (ja) 1998-08-11
JPH10214065A5 JPH10214065A5 (enExample) 2004-12-24
JP4147594B2 true JP4147594B2 (ja) 2008-09-10

Family

ID=12279738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02956897A Expired - Lifetime JP4147594B2 (ja) 1997-01-29 1997-01-29 アクティブマトリクス基板、液晶表示装置および電子機器

Country Status (7)

Country Link
US (3) US6281700B1 (enExample)
EP (2) EP1548699A3 (enExample)
JP (1) JP4147594B2 (enExample)
KR (2) KR100614016B1 (enExample)
DE (1) DE69830954T2 (enExample)
TW (1) TW374146B (enExample)
WO (1) WO1998033166A1 (enExample)

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Publication number Priority date Publication date Assignee Title
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US6392354B1 (en) 1998-05-20 2002-05-21 Seiko Epson Corporation Electro-optical element driving circuit, electro-optical device, and electronic device
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US7301520B2 (en) 2000-02-22 2007-11-27 Semiconductor Energy Laboratory Co., Ltd. Image display device and driver circuit therefor
JP3736399B2 (ja) * 2000-09-20 2006-01-18 セイコーエプソン株式会社 アクティブマトリクス型表示装置の駆動回路及び電子機器及び電気光学装置の駆動方法及び電気光学装置
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JP4562938B2 (ja) * 2001-03-30 2010-10-13 シャープ株式会社 液晶表示装置
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JP2003050380A (ja) * 2001-08-07 2003-02-21 Toshiba Corp アレイ基板の検査方法
EP1298800A1 (en) * 2001-09-28 2003-04-02 STMicroelectronics Limited Ramp generator
JP2003195810A (ja) * 2001-12-28 2003-07-09 Casio Comput Co Ltd 駆動回路、駆動装置及び光学要素の駆動方法
JP3880416B2 (ja) 2002-02-13 2007-02-14 シャープ株式会社 アクティブマトリクス基板
JP4653775B2 (ja) * 2002-04-26 2011-03-16 東芝モバイルディスプレイ株式会社 Ｅｌ表示装置の検査方法
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KR100638304B1 (ko) 2002-04-26 2006-10-26 도시바 마쯔시따 디스플레이 테크놀로지 컴퍼니, 리미티드 Ｅｌ 표시 패널의 드라이버 회로
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US7528643B2 (en) * 2003-02-12 2009-05-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, electronic device having the same, and driving method of the same
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JP4507676B2 (ja) * 2004-04-16 2010-07-21 セイコーエプソン株式会社 電荷除去回路、電気光学装置および電子機器
JP2006038988A (ja) * 2004-07-23 2006-02-09 Seiko Epson Corp 電気光学装置、電子機器、および実装構造体
JP2006178029A (ja) * 2004-12-21 2006-07-06 Seiko Epson Corp 電気光学装置、その検査方法、駆動装置および電子機器
JP2006178030A (ja) * 2004-12-21 2006-07-06 Seiko Epson Corp 電気光学装置、その駆動方法、駆動装置および電子機器
JP2006184518A (ja) * 2004-12-27 2006-07-13 Shimadzu Corp Ｔｆｔアレイ検査装置
JP4345743B2 (ja) 2005-02-14 2009-10-14 セイコーエプソン株式会社 電気光学装置
KR101192769B1 (ko) 2005-06-03 2012-10-18 엘지디스플레이 주식회사 액정표시장치
KR101129438B1 (ko) * 2005-06-10 2012-03-27 삼성전자주식회사 표시 기판, 이를 구비한 표시 패널의 검사 장치 및 방법
US8674968B2 (en) * 2005-06-29 2014-03-18 Mstar Semiconductor, Inc. Touch sensing method and associated circuit
TWI326067B (en) * 2005-06-29 2010-06-11 Mstar Semiconductor Inc Flat display device, controller, and method for displaying images
JP4561647B2 (ja) * 2006-02-02 2010-10-13 セイコーエプソン株式会社 電気光学装置用基板、電気光学装置および検査方法
KR101337459B1 (ko) * 2006-02-03 2013-12-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치 및 그 표시장치를 구비한 전자기기
JP2007333495A (ja) * 2006-06-14 2007-12-27 Nec Corp 検査システムおよびその検査回路、半導体装置、表示装置ならびに半導体装置の検査方法
JP4155316B2 (ja) * 2006-06-30 2008-09-24 ソニー株式会社 Ｄ／ａ変換回路、液晶駆動回路及び液晶表示装置
JP2008015366A (ja) * 2006-07-07 2008-01-24 Toshiba Matsushita Display Technology Co Ltd 表示装置および表示装置の検査方法
KR100843148B1 (ko) * 2006-12-22 2008-07-02 삼성전자주식회사 액정 표시 장치, 액정 표시 장치의 테스트용 커넥터 및이의 테스트 방법
TWI313754B (en) * 2007-01-03 2009-08-21 Au Optronics Corp A method for testing liquid crystal display panels
KR100857676B1 (ko) * 2007-02-02 2008-09-08 삼성에스디아이 주식회사 디지털-아날로그 변환기 및 이를 이용한 데이터 구동부와평판 표시장치
KR101471144B1 (ko) * 2007-06-20 2014-12-09 삼성디스플레이 주식회사 스토리지 전압의 검출 방법, 검출된 스토리지 전압을이용하는 표시 장치 및 이의 구동 방법
JP2009092965A (ja) * 2007-10-10 2009-04-30 Eastman Kodak Co 表示パネルの不良検出方法および表示パネル
CN101855663A (zh) * 2008-01-09 2010-10-06 夏普株式会社 显示装置
JP5428299B2 (ja) * 2008-03-18 2014-02-26 セイコーエプソン株式会社 電気光学装置及び電子機器
KR100924143B1 (ko) * 2008-04-02 2009-10-28 삼성모바일디스플레이주식회사 평판표시장치 및 그의 구동 방법
TWI379116B (en) * 2008-05-30 2012-12-11 Chimei Innolux Corp Liquid crystal display high-voltage testing circuit and method of testing liquid crystal display
CN101719352B (zh) 2008-10-09 2012-07-25 北京京东方光电科技有限公司 液晶盒成盒后检测装置和方法
US8947337B2 (en) 2010-02-11 2015-02-03 Semiconductor Energy Laboratory Co., Ltd. Display device
JP5445239B2 (ja) 2010-03-10 2014-03-19 セイコーエプソン株式会社 電気光学装置及び電子機器
US9030221B2 (en) * 2011-09-20 2015-05-12 United Microelectronics Corporation Circuit structure of test-key and test method thereof
JP2014032292A (ja) * 2012-08-02 2014-02-20 Yazaki Corp 表示装置
KR102312291B1 (ko) * 2015-02-24 2021-10-15 삼성디스플레이 주식회사 표시장치 및 그의 검사방법
KR102564466B1 (ko) * 2016-09-30 2023-08-07 엘지디스플레이 주식회사 신호라인 검사회로가 구비된 영상 표시패널 및 이를 포함한 영상 표시장치
TWI625532B (zh) * 2017-03-21 2018-06-01 失效偵測系統及其方法
JP7012548B2 (ja) * 2018-02-07 2022-01-28 シャープ株式会社 表示装置及び表示システム
JP6705469B2 (ja) 2018-05-23 2020-06-03 セイコーエプソン株式会社 電気光学装置、電子機器
JP7143185B2 (ja) * 2018-11-09 2022-09-28 キヤノン株式会社 画像形成装置
WO2021216513A1 (en) 2020-04-20 2021-10-28 Gentex Corporation System and method for display fault monitoring
KR20230139930A (ko) * 2022-03-28 2023-10-06 삼성디스플레이 주식회사 표시 장치의 검사 방법
WO2024129081A1 (en) 2022-12-15 2024-06-20 Google Llc Display device with variable power consumption

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US553215A (en) * 1896-01-14 Sleigh-runner
JPS6180226A (ja) * 1984-09-28 1986-04-23 Toshiba Corp アクテイブ・マトリツクス駆動装置
JPH0638187B2 (ja) * 1985-12-04 1994-05-18 株式会社日立製作所 液晶表示装置
JPS649375A (en) * 1987-07-01 1989-01-12 Seiko Epson Corp Inspecting method of active matrix panel
JPH067239B2 (ja) 1987-08-14 1994-01-26 セイコー電子工業株式会社 電気光学装置
JPH02154292A (ja) * 1988-12-07 1990-06-13 Matsushita Electric Ind Co Ltd アクティブマトリックスアレイとその検査方法
JPH02245794A (ja) * 1989-03-17 1990-10-01 Matsushita Electric Ind Co Ltd 液晶パネル駆動用集積回路
JP2761128B2 (ja) * 1990-10-31 1998-06-04 富士通株式会社 液晶表示装置
JP2743683B2 (ja) * 1991-04-26 1998-04-22 松下電器産業株式会社 液晶駆動装置
JP2792634B2 (ja) * 1991-06-28 1998-09-03 シャープ株式会社 アクティブマトリクス基板の検査方法
DE69333753T2 (de) 1992-02-27 2006-05-11 Canon K.K. Flüssigkristallanzeigevorrichtung
US5377030A (en) * 1992-03-30 1994-12-27 Sony Corporation Method for testing active matrix liquid crystal by measuring voltage due to charge in a supplemental capacitor
JP2758103B2 (ja) * 1992-04-08 1998-05-28 シャープ株式会社 アクティブマトリクス基板及びその製造方法
US5532615A (en) * 1992-11-25 1996-07-02 Sharp Kabushiki Kaisha Inspecting method, inspecting apparatus, and defect correcting method
JP3086936B2 (ja) 1993-05-12 2000-09-11 セイコーインスツルメンツ株式会社 光弁装置
TW277129B (enExample) * 1993-12-24 1996-06-01 Sharp Kk
JP2672260B2 (ja) * 1994-06-07 1997-11-05 トーケン工業株式会社 Ｔｆｔ−ｌｃｄの検査方法
EP0760508B1 (en) * 1995-02-01 2005-11-09 Seiko Epson Corporation Liquid crystal display device, and method of its driving
CN1316747C (zh) * 1996-02-09 2007-05-16 精工爱普生株式会社 D/a变换器、d/a变换方法、液晶屏用基片和液晶显示装置
JP4147594B2 (ja) * 1997-01-29 2008-09-10 セイコーエプソン株式会社 アクティブマトリクス基板、液晶表示装置および電子機器

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