JP4083018B2 - プロセスプラントにおける劣化レベルを推定・利用する基準技術 - Google Patents
プロセスプラントにおける劣化レベルを推定・利用する基準技術 Download PDFInfo
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Description
また、資産活用エキスパート50は、制御ルーチン62へデータを送信しうるし、制御ルーチン62からデータを受信しうる。この制御ルーチン62は、プロセス制御装置またはこれらの制御装置に関連するインターフェイス、オプチマイザ55、ビジネスアプリケーション63、保守アプリケーション66などに実装されうる。
12、14 プロセス制御システム
12A オペレータインターフェイス
12B 制御装置
14A オペレータインターフェイス
14B 制御装置
15 フィールドデバイス
16 デバイス
18、22 保守コンピュータ
20 回転装置
23 監視・診断アプリケーション、振動解析プログラム
24 電力生成・分配システム
25 電力生成・分配装置
26 電力生成システム
27 電力制御・診断アプリケーション
30 コンピュータシステム
32 バス
35 ビジネスシステムコンピュータ
36 保守計画コンピュータ
37 プラントワイドLAN
38 コーポレイトWAN
40 コンピュータシステム
50 資産活用エキスパート
51 指標生成ソフトウェア
52 制御エキスパート
54 作業指示生成ルーチン
55 オプチマイザルーチン
55A、55B 制御最適化ルーチン
56 数学的ソフトウェアモデル
58 ユーザインターフェイスルーチン
62 制御ルーチン
63 ビジネスアプリケーション
65 制御診断エキスパート、予測プロセス制御装置
66 保守システムアプリケーション
68 新モデル
82 領域モデル
84 原料供給源
88 プリプロセッサモデル
90 蒸留プロセス
92 C2クラッカ
100 蒸留カラム
100T 頂部
100B 底部
102 リフラックスドラム
103 入力
104 リボイラ
200 基準線
202、204、206、208 ポイント
229、269 監視ルーチン
500 ユニット
550 指標名および数値
575 ループ
600 プロセス領域
610 タンク
675 モータ
680、780 ポップアップウインドウ
700 実効率データ
710 最大効率データ
750 グラフィカルビュー
760 バナー
770 情報ボタン
785 応答カテゴリー
900、901、902、903 プロセスプラント
900A〜903A サーバ
910 遠隔監視施設
912 サーバ
914 プロセッサ
916 モデル
918 オプチマイザ
920 データ解析ツール
Claims (35)
- プロセスプラント内のプロセスエンティティの劣化レベルを利用する方法であって、
前記プロセスエンティティに関連する一または複数のプロセスパラメータに基づき、前記プロセスエンティティの第一の時点での劣化レベルを推定することと、
前記プロセスエンティティの前記第一の時点での前記推定劣化レベルと、前記プロセスエンティティの前記第一の時点での所定の所望劣化レベルとを比較することと、
前記第一に時点の後、前記プロセスエンティティの第二の時点での推定劣化レベルを、前記プロセスエンティティの該第二の時点での所定の所望劣化レベルとほぼ等しくさせるべく、前記比較に基づき前記プロセスエンティティの動作を変更することとを有しており、
前記プロセスエンティティの前記第二の時点での所定の所望劣化レベルが、前記プロセスエンティティの前記第一の時点での所定の所望劣化レベルより大きく、
前記プロセスエンティティは、物理的要素、論理的要素、物理的要素群、論理的要素群、及び物理的及び論理的要素群を含むものである方法。 - 前記劣化レベルを推定することには、前記プロセスエンティティの前記劣化レベルを推定すべく前記プロセスエンティティのモデルを利用することが含まれる、請求項1記載の方法。
- 前記推定すること、前記比較すること、および前記変更することは、異なる時間における前記プロセスエンティティの動作中において、さまざまな時間で繰り返される、請求項1記載の方法。
- 複数のポイントを含む基準線を指定するステップをさらに有しており、各ポイントが異なる時間における前記プロセスエンティティの所定の所望劣化レベルを定義し、
前記比較するステップには、前記プロセスエンティティの前記第一の時点での前記所定の所望劣化レベルを決定すべく前記基準線を利用することが含まれ、
前記プロセスエンティティの動作を変更することには、前記プロセスエンティティの前記第二の時点での前記所定の所望劣化レベルを決定すべく前記基準線を利用するステップが含まれる、請求項1記載の方法。 - 前記第一の時点または前記第二の時点のうちの一つの時点での前記所定の所望劣化レベルを変更すべく、前記プロセスエンティティの動作中に前記基準線を変更することがさらに含まれる、請求項4記載の方法。
- 前記基準線が前記プロセスエンティティの良い状態と悪い状態との間に複数のポイントを定義する、請求項4記載の方法。
- 前記プロセスエンティティの動作を変更することには、前記プロセスエンティティの動作を変更すべく最適化プロシージャを利用することが含まれる、請求項1記載の方法。
- 前記劣化レベルを推定することには、前記プロセスプラント内の加熱炉のコークス化レベルを推定することが含まれる、請求項1記載の方法。
- 前記プロセスエンティティの動作を変更することには、前記加熱炉を通過する流量を変更することが含まれる、請求項8記載の方法。
- 前記プロセスエンティティの動作を変更することには、前記加熱炉に関連する温度を変更することが含まれる、請求項8記載の方法。
- 前記プロセスエンティティの動作を変更することには、前記加熱炉内に注入する蒸気の量を変更することが含まれる、請求項8記載の方法。
- 前記プロセスエンティティの使用率を定義する指標を生産すべく、前記比較の結果を利用することがさらに含まれる、請求項1記載の方法。
- 前記プロセスエンティティの動作を変更することには、前記プロセスエンティティの前記第一の時点での前記推定劣化レベルと前記第二の時点での前記所定の所望劣化レベルとの間のラインを定義し、前記プロセスエンティティの動作を変更すべく該ラインを基準として利用することが含まれる、請求項1記載の方法。
- 前記プロセスエンティティの動作を変更すべく前記ラインを利用することには、前記ラインの勾配を決定し、前記プロセスエンティティの動作を変更すべく前記ラインの前記勾配を基準として利用することが含まれる、請求項13記載の方法。
- 前記劣化レベルを推定することには、複数のデータソースから前記プロセスパラメータを表すデータを収集することが含まれる、請求項1記載の方法。
- 前記データを収集することには、プロセス制御データを収集するとともにプロセス保守データを収集することが含まれる、請求項15記載の方法。
- 複数のプロセスデバイスに通信可能に接続されたプロセッサを有するプロセスプラント内のプロセスエンティティの劣化レベルを利用するように構成されたプロセス制御システムにおいて、
前記メモリ上に格納され、前記第プロセスエンティティに関連する一または複数のプロセスパラメータに基づき、前記プロセスエンティティの第一の時点での劣化レベルを推定すべくプロセッサ上で実行されるように構成された第一のルーチンと、
前記メモリ上に格納され、前記プロセスエンティティの前記第一の時点での前記推定劣化レベルと、前記プロセスエンティティの前記第一の時点での所定の所望劣化レベルとを比較すべく、プロセッサ上で実行されるように構成された第二のルーチンと、
前記メモリ上に格納され、前記第一の時点の後、前記プロセスエンティティの第二の時点での前記推定劣化レベルを、前記第二の時点での所定の所望劣化レベルとほぼ等しくさせるべく、前記第二のルーチンの前記比較に基づき、前記プロセスエンティティの動作の変更を決定すべくプロセッサ上で実行されるように構成された第三のルーチンとを備えており、
前記第二の時点での前記所定の所望劣化レベルは、前記第一の時点での前記所定の所望劣化レベルよりも大きく、
前記プロセスエンティティは、物理的要素、論理的要素、物理的要素群、論理的要素群、及び物理的及び論理的要素群を含むものである、プロセス制御システム。 - 前記第一のルーチンは、前記プロセスエンティティのモデルを有し、前記プロセスエンティティの前記劣化レベルを推定すべく前記プロセスエンティティの前記モデルを活用するように構成された、請求項17記載のプロセス制御システム。
- 前記第一のルーチン、前記第二のルーチン、および前記第三のルーチンが前記プロセスエンティティの動作中にさまざまな異なる時間で動作するように構成された、請求項17記載のプロセス制御システム。
- 前記メモリに格納された基準線をさらに備えており、該基準線が複数のポイントを有し、各ポイントが異なる時間での前記プロセスエンティティの所定の所望劣化レベルを定義し、前記第二のルーチンが前記プロセスエンティティの前記第一の時点での前記所定の所望劣化レベルを決定すべく前記基準線を利用するように構成され、前記第三のルーチンが前記プロセスエンティティの前記第二の時点での前記所定の所望劣化レベルを判定すべく前記基準線を利用するように構成された、請求項17記載のプロセス制御システム。
- 前記メモリに格納され、前記第一の時点または前記第二の時点のうちの一つの時点での前記所定の所望劣化レベルを変更するために、前記プロセスエンティティの動作中に前記基準線をユーザが変更することができるようにすべく前記プロセッサ上で実行されるように構成された第四のルーチンをさらに有するように構成された、請求項20記載のプロセス制御システム。
- 前記基準線が前記プロセスエンティティの良い状態と悪い状態との間に複数のポイントを定義するように構成された、請求項20記載のプロセス制御システム。
- 前記第三のルーチンには、前記プロセスエンティティの前記第二の時点での前記推定劣化レベルを、前記プロセスエンティティの前記第二の時点での前記所定の所望劣化レベルにほぼ等しくさせるべく前記プロセスエンティティの動作を変更する方法の表示を生成するように構成された最適化ルーチンが含まれるように構成された、請求項17記載のプロセス制御システム。
- 前記メモリに格納され、前記プロセスエンティティの使用率を定義する指標を生産するために前記第二のルーチンによって判定された比較の結果を利用すべく前記プロセッサ上で実行されるように構成された第四のルーチンをさらに有するように構成された、請求項17記載のプロセス制御システム。
- 前記第三のルーチンが前記プロセスエンティティの前記第一の時点での前記推定劣化レベルと前記第二の時点での前記所定の所望劣化レベルとの間にラインを定義するとともに、前記プロセスエンティティの動作を変更すべく前記定義されたラインを利用するように構成された、請求項17記載のプロセス制御システム。
- プロセスプラント内のプロセスエンティティの劣化レベルを利用する方法であって、
前記プロセスエンティティに関連する一または複数のプロセスパラメータに基づき前記プロセスエンティティの第一の時点での劣化レベルを推定することと、
前記プロセスエンティティの前記第一の時点での前記推定劣化レベルと前記プロセスエンティティの前記第一の時点での所定の所望劣化レベルとを比較することと、
前記プロセスエンティティの使用率を定義する指標を生成すべく前記比較の結果を利用することとを有し、
前記プロセスエンティティは、物理的要素、論理的要素、物理的要素群、論理的要素群、及び物理的及び論理的要素群を含むものである方法。 - 前記使用指標に基づき前記プロセスエンティティの動作を変更することをさらに有する、請求項26記載の方法。
- 前記変更することには、前記第一の時点の後、前記使用指標を第二の時点における所定の量にせしめるように前記プロセスエンティティの動作を変更することが含まれる、請求項27記載の方法。
- 前記劣化レベルを推定することには、前記プロセスエンティティの前記劣化レベルを推定すべく前記プロセスエンティティのモデルの利用することが含まれる、請求項26記載の方法。
- 前記推定すること、前記比較すること、および前記利用することが、異なる時間における前記プロセスエンティティの動作中にさまざまな時間で繰り返される、請求項26記載の方法。
- 複数のポイントを有する基準線を指定することをさらに有しており、各ポイントが異なる時間における前記プロセスの所定劣化レベルを定義し、前記比較することには、前記プロセスエンティティの第一の時点での前記所定の所望劣化レベルを決定すべく前記基準線を利用することが含まれる、請求項26記載の方法。
- 前記基準線が前記プロセスエンティティの良い状態と悪い状態との間に複数のポイントを定義する、請求項31記載の方法。
- 前記劣化レベルを推定することには、プロセス内で加熱炉のコークス化レベルの推定することが含まれる、請求項26記載の方法。
- 前記劣化レベルを推定することには、複数のデータソースから前記プロセスパラメータを示すデータを収集することが含まれる、請求項26記載の方法。
- 前記データを収集することには、プロセス制御データを収集するとともにプロセス保守データを収集することが含まれる、請求項34記載の方法。
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