JP3731207B2 - Ｘ線分析装置 - Google Patents

Ｘ線分析装置 Download PDF

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Publication number
JP3731207B2
JP3731207B2 JP2003324609A JP2003324609A JP3731207B2 JP 3731207 B2 JP3731207 B2 JP 3731207B2 JP 2003324609 A JP2003324609 A JP 2003324609A JP 2003324609 A JP2003324609 A JP 2003324609A JP 3731207 B2 JP3731207 B2 JP 3731207B2
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JP
Japan
Prior art keywords
ray
semiconductor
detection means
sample
ray detection
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Expired - Fee Related
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JP2003324609A
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English (en)
Japanese (ja)
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JP2005091142A (ja
Inventor
武慶 田口
武雄 田島
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Rigaku Corp
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Rigaku Corp
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Application filed by Rigaku Corp filed Critical Rigaku Corp
Priority to JP2003324609A priority Critical patent/JP3731207B2/ja
Priority to US10/911,564 priority patent/US7145983B2/en
Priority to EP04254894.1A priority patent/EP1517137B1/en
Priority to CN2004100748606A priority patent/CN1598554B/zh
Publication of JP2005091142A publication Critical patent/JP2005091142A/ja
Application granted granted Critical
Publication of JP3731207B2 publication Critical patent/JP3731207B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
JP2003324609A 2003-09-17 2003-09-17 Ｘ線分析装置 Expired - Fee Related JP3731207B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2003324609A JP3731207B2 (ja) 2003-09-17 2003-09-17 Ｘ線分析装置
US10/911,564 US7145983B2 (en) 2003-09-17 2004-08-05 X-ray analysis apparatus
EP04254894.1A EP1517137B1 (en) 2003-09-17 2004-08-13 X-ray analysis apparatus
CN2004100748606A CN1598554B (zh) 2003-09-17 2004-08-30 X光分析设备

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003324609A JP3731207B2 (ja) 2003-09-17 2003-09-17 Ｘ線分析装置

Publications (2)

Publication Number Publication Date
JP2005091142A JP2005091142A (ja) 2005-04-07
JP3731207B2 true JP3731207B2 (ja) 2006-01-05

Family

ID=34191308

Family Applications (1)

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JP2003324609A Expired - Fee Related JP3731207B2 (ja) 2003-09-17 2003-09-17 Ｘ線分析装置

Country Status (4)

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US (1) US7145983B2 (zh)
EP (1) EP1517137B1 (zh)
JP (1) JP3731207B2 (zh)
CN (1) CN1598554B (zh)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3759524B2 (ja) * 2003-10-17 2006-03-29 株式会社リガク Ｘ線分析装置
CN100485373C (zh) * 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法
JP4074874B2 (ja) 2005-06-30 2008-04-16 株式会社リガク Ｘ線回折装置
EP1925932B1 (en) * 2005-08-29 2017-02-22 Rigaku Corporation Vertical/horizontal small-angle x-ray scattering device and measuring method for small-angle x-ray scattering
JP4908119B2 (ja) * 2005-10-19 2012-04-04 株式会社リガク 蛍光ｘ線分析装置
JP4909154B2 (ja) * 2007-03-30 2012-04-04 株式会社リガク 結晶粒の極点図測定方法およびその装置
JP4823125B2 (ja) * 2007-03-30 2011-11-24 株式会社リガク Ｘ線結晶方位測定装置及びｘ線結晶方位測定方法
US7801272B2 (en) * 2007-09-28 2010-09-21 Rigaku Corporation X-ray diffraction apparatus and X-ray diffraction method
US8903043B2 (en) * 2011-10-24 2014-12-02 Bruker Axs, Inc. Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode
JP6685078B2 (ja) * 2013-03-15 2020-04-22 プロト マニュファクチャリング リミテッド Ｘ線回折装置およびｘ線回折装置駆動方法
JP5920593B2 (ja) * 2013-04-15 2016-05-18 パルステック工業株式会社 Ｘ線回折測定システム
JP6033160B2 (ja) * 2013-04-17 2016-11-30 株式会社リガク Ｘ線回折装置、ｘ線回折測定方法および制御プログラム
JP6182758B2 (ja) * 2013-11-15 2017-08-23 株式会社リガク 放射線検出器、これを用いたｘ線分析装置および放射線検出方法
JP6266574B2 (ja) * 2015-09-10 2018-01-24 株式会社日立ハイテクサイエンス Ｘ線検査方法及びｘ線検査装置
JP6497784B2 (ja) * 2016-05-24 2019-04-10 株式会社リガク 結晶相同定方法、結晶相同定装置、及びｘ線回折測定システム
EP3605074A4 (en) * 2017-03-30 2021-03-10 Rigaku Corporation X-RAY ANALYSIS ASSISTANCE DEVICE AND X-RAY ANALYSIS PROCESS
CN106908462A (zh) * 2017-04-28 2017-06-30 重庆理工大学 一种高精度较大载荷同心双轴分度测角转台装置
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2077546U (zh) * 1990-05-24 1991-05-22 中国科学院物理研究所 两用x-射线双晶衍射仪
JP3291406B2 (ja) * 1995-02-09 2002-06-10 株式会社モリタ製作所 パノラマｘ線撮影装置
US5742658A (en) * 1996-05-23 1998-04-21 Advanced Micro Devices, Inc. Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer
JP3687243B2 (ja) * 1997-01-08 2005-08-24 株式会社ニコン パターン検査装置
US5998802A (en) * 1997-01-31 1999-12-07 Agfa-Gevaert Method for obtaining an electrical representation of a radiation image using CCD sensors
DE59813247D1 (de) * 1997-02-17 2006-01-05 Sirona Dental Systems Gmbh Verfahren und Einrichtung zur Erstellung von Röntgenaufnahmen von Körperteilen eines Menschen
JP3561738B2 (ja) * 1998-06-02 2004-09-02 株式会社リガク Ｂｒａｇｇ反射自動選出方法および装置並びに結晶方位自動決定方法およびシステム
JPH11345585A (ja) * 1998-06-03 1999-12-14 Nikon Corp 電子ビームによる検査装置および検査方法
CN1245895A (zh) * 1998-08-25 2000-03-01 北京师范大学 使用整体x光透镜的位置灵敏x射线谱仪
JP3387834B2 (ja) 1998-10-29 2003-03-17 キヤノン株式会社 Ｘ線露光方法およびデバイス製造方法
JP4239350B2 (ja) * 2000-03-13 2009-03-18 株式会社ニコン 荷電粒子ビーム装置
GB0014587D0 (en) * 2000-06-14 2000-08-09 Europ Economic Community X-ray reflectivity apparatus and method
JP2002116158A (ja) 2000-10-05 2002-04-19 Rigaku Corp Ｘ線測定方法及びｘ線装置
NL1019287C1 (nl) 2000-11-08 2002-01-23 Koninkl Philips Electronics Nv R÷ntgenanalysetoestel met een vaste stof plaatsgevoelige r÷ntgendetector.
JP2003149180A (ja) * 2001-11-13 2003-05-21 Japan Synchrotron Radiation Research Inst １次元または２次元検出器を用いた粉末ｘ線回折データ測定方法
JP3759524B2 (ja) * 2003-10-17 2006-03-29 株式会社リガク Ｘ線分析装置

Also Published As

Publication number Publication date
EP1517137B1 (en) 2013-10-02
US7145983B2 (en) 2006-12-05
CN1598554A (zh) 2005-03-23
US20050058247A1 (en) 2005-03-17
EP1517137A2 (en) 2005-03-23
JP2005091142A (ja) 2005-04-07
CN1598554B (zh) 2011-08-10
EP1517137A3 (en) 2005-04-13

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