GB0014587D0 - X-ray reflectivity apparatus and method - Google Patents
X-ray reflectivity apparatus and methodInfo
- Publication number
- GB0014587D0 GB0014587D0 GB0014587A GB0014587A GB0014587D0 GB 0014587 D0 GB0014587 D0 GB 0014587D0 GB 0014587 A GB0014587 A GB 0014587A GB 0014587 A GB0014587 A GB 0014587A GB 0014587 D0 GB0014587 D0 GB 0014587D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- ray reflectivity
- reflectivity apparatus
- ray
- reflectivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0014587A GB0014587D0 (en) | 2000-06-14 | 2000-06-14 | X-ray reflectivity apparatus and method |
EP01934187A EP1311835A2 (en) | 2000-06-14 | 2001-06-01 | X-ray reflectivity apparatus and method |
CA002412634A CA2412634A1 (en) | 2000-06-14 | 2001-06-01 | X-ray reflectivity apparatus and method |
JP2002510921A JP2004503771A (en) | 2000-06-14 | 2001-06-01 | X-ray reflectivity apparatus and method |
PCT/GB2001/002441 WO2001096841A2 (en) | 2000-06-14 | 2001-06-01 | X-ray reflectivity apparatus and method |
NO20025951A NO20025951L (en) | 2000-06-14 | 2002-12-11 | X-ray reflectivity apparatus and method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0014587A GB0014587D0 (en) | 2000-06-14 | 2000-06-14 | X-ray reflectivity apparatus and method |
Publications (1)
Publication Number | Publication Date |
---|---|
GB0014587D0 true GB0014587D0 (en) | 2000-08-09 |
Family
ID=9893678
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0014587A Ceased GB0014587D0 (en) | 2000-06-14 | 2000-06-14 | X-ray reflectivity apparatus and method |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1311835A2 (en) |
JP (1) | JP2004503771A (en) |
CA (1) | CA2412634A1 (en) |
GB (1) | GB0014587D0 (en) |
NO (1) | NO20025951L (en) |
WO (1) | WO2001096841A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6718008B1 (en) * | 2002-04-22 | 2004-04-06 | Bruker Axs, Inc. | X-ray diffraction screening system with retractable x-ray shield |
JP3731207B2 (en) * | 2003-09-17 | 2006-01-05 | 株式会社リガク | X-ray analyzer |
FR2866709A1 (en) * | 2004-02-19 | 2005-08-26 | Production Et De Rech S Appliq | Specimen characteristics e.g. roughness, measuring device, has interception unit to intercept X-rays of beam height greater than selected value, in order to limit extension of measuring zone along direction of propagation of incident X-rays |
US10151713B2 (en) | 2015-05-21 | 2018-12-11 | Industrial Technology Research Institute | X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4352017A (en) * | 1980-09-22 | 1982-09-28 | Rca Corporation | Apparatus for determining the quality of a semiconductor surface |
US4821301A (en) * | 1986-02-28 | 1989-04-11 | Duke University | X-ray reflection method and apparatus for chemical analysis of thin surface layers |
JPH0394104A (en) * | 1989-09-06 | 1991-04-18 | Toshiba Corp | Film thickness measuring method and film thickness measuring device and film forming device using it |
DE4137673C2 (en) * | 1991-11-15 | 2001-08-02 | Bruker Axs Analytical X Ray Sy | X-ray reflectometer |
US5619548A (en) * | 1995-08-11 | 1997-04-08 | Oryx Instruments And Materials Corp. | X-ray thickness gauge |
RU2199110C2 (en) * | 1997-04-24 | 2003-02-20 | Баранов Александр Михайлович | Procedure testing parameters of film coats and surfaces in process of their change and device for is implementation |
RU2194272C2 (en) * | 1998-04-29 | 2002-12-10 | Баранов Александр Михайлович | Method and device for real-time inspection of film coatings and surfaces |
US6754305B1 (en) * | 1999-08-02 | 2004-06-22 | Therma-Wave, Inc. | Measurement of thin films and barrier layers on patterned wafers with X-ray reflectometry |
-
2000
- 2000-06-14 GB GB0014587A patent/GB0014587D0/en not_active Ceased
-
2001
- 2001-06-01 JP JP2002510921A patent/JP2004503771A/en active Pending
- 2001-06-01 WO PCT/GB2001/002441 patent/WO2001096841A2/en not_active Application Discontinuation
- 2001-06-01 EP EP01934187A patent/EP1311835A2/en not_active Withdrawn
- 2001-06-01 CA CA002412634A patent/CA2412634A1/en not_active Abandoned
-
2002
- 2002-12-11 NO NO20025951A patent/NO20025951L/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP1311835A2 (en) | 2003-05-21 |
NO20025951L (en) | 2003-01-16 |
CA2412634A1 (en) | 2001-12-20 |
JP2004503771A (en) | 2004-02-05 |
NO20025951D0 (en) | 2002-12-11 |
WO2001096841A3 (en) | 2002-05-10 |
WO2001096841A2 (en) | 2001-12-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AT | Applications terminated before publication under section 16(1) |