JP2017092464A5 - - Google Patents

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JP2017092464A5
JP2017092464A5 JP2016214727A JP2016214727A JP2017092464A5 JP 2017092464 A5 JP2017092464 A5 JP 2017092464A5 JP 2016214727 A JP2016214727 A JP 2016214727A JP 2016214727 A JP2016214727 A JP 2016214727A JP 2017092464 A5 JP2017092464 A5 JP 2017092464A5
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Japan
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patent document
die
semiconductor die
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JP2016214727A
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JP6971012B2 (ja
JP2017092464A (ja
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Priority claimed from US15/234,563 external-priority patent/US10121759B2/en
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JP2016214727A 2015-11-04 2016-11-02 ワイヤーボンディングのためのボンダー上の自動オーバーハングダイ最適化ツールと関連する方法 Active JP6971012B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201562250745P 2015-11-04 2015-11-04
US62/250,745 2015-11-04
US15/234,563 2016-08-11
US15/234,563 US10121759B2 (en) 2015-11-04 2016-08-11 On-bonder automatic overhang die optimization tool for wire bonding and related methods

Publications (3)

Publication Number Publication Date
JP2017092464A JP2017092464A (ja) 2017-05-25
JP2017092464A5 true JP2017092464A5 (enExample) 2019-11-21
JP6971012B2 JP6971012B2 (ja) 2021-11-24

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JP2016214727A Active JP6971012B2 (ja) 2015-11-04 2016-11-02 ワイヤーボンディングのためのボンダー上の自動オーバーハングダイ最適化ツールと関連する方法

Country Status (6)

Country Link
US (2) US10121759B2 (enExample)
JP (1) JP6971012B2 (enExample)
KR (1) KR102593242B1 (enExample)
CN (2) CN107030415B (enExample)
SG (2) SG10201608922TA (enExample)
TW (2) TWI712094B (enExample)

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Publication number Priority date Publication date Assignee Title
CN109560024B (zh) * 2018-11-06 2020-11-06 武汉新芯集成电路制造有限公司 一种晶圆键合装置及其校正方法
US11581285B2 (en) * 2019-06-04 2023-02-14 Kulicke And Soffa Industries, Inc. Methods of detecting bonding between a bonding wire and a bonding location on a wire bonding machine
WO2021202211A1 (en) * 2020-03-29 2021-10-07 Kulicke And Soffa Industries, Inc. Methods of optimizing clamping of a semiconductor element against a support structure on a wire bonding machine, and related methods
US11515284B2 (en) * 2020-07-14 2022-11-29 Semiconductor Components Industries, Llc Multi-segment wire-bond
JP7794821B2 (ja) 2020-11-05 2026-01-06 クリック アンド ソッファ インダストリーズ、インク. ワイヤボンディング装置におけるボンディング力の精度を監視する方法を含む、ワイヤボンディング装置を動作させる方法、および関連する方法
JP7834780B2 (ja) * 2021-05-20 2026-03-24 クリック アンド ソッファ インダストリーズ、インク. ウェッジボンディング装置のカッター高さを決定および/または校正する方法、および関連するウェッジボンディング装置
US12489003B2 (en) * 2021-05-25 2025-12-02 Yamaha Robotics Co., Ltd. Wire bonding system, inspection device, wire bonding method, and recording medium
KR20260035274A (ko) * 2023-07-11 2026-03-12 쿨리케 앤드 소파 인더스트리즈, 인코포레이티드 반도체 요소에서 크랙을 검출하는 방법, 및 관련 와이어 본딩 시스템

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JP3178567B2 (ja) * 1993-07-16 2001-06-18 株式会社カイジョー ワイヤボンディング装置及びその方法
JPH07183321A (ja) * 1993-12-24 1995-07-21 Kaijo Corp ワイヤボンディング装置
JP2001267352A (ja) * 2000-03-16 2001-09-28 Mitsubishi Electric Corp ワイヤボンディング装置およびその制御方法
JP4547330B2 (ja) 2005-12-28 2010-09-22 株式会社新川 ワイヤボンディング装置、ボンディング制御プログラム及びボンディング方法
US7511961B2 (en) * 2006-10-26 2009-03-31 Infineon Technologies Ag Base plate for a power semiconductor module
JP4786500B2 (ja) * 2006-10-26 2011-10-05 株式会社東芝 ワイヤボンディング装置及びワイヤボンディング方法
WO2008140541A1 (en) 2007-05-16 2008-11-20 Kulicke And Soffa Industries, Inc. Wire bonding methods and bonding force calibration
JP4425319B1 (ja) * 2008-09-10 2010-03-03 株式会社新川 ボンディング方法、ボンディング装置及び製造方法
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JP4658224B2 (ja) * 2010-01-26 2011-03-23 株式会社新川 ワイヤボンディング装置
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CN109616408B (zh) * 2013-05-29 2023-07-25 Ev 集团 E·索尔纳有限责任公司 用以接合衬底的装置及方法
US10510576B2 (en) * 2013-10-14 2019-12-17 Corning Incorporated Carrier-bonding methods and articles for semiconductor and interposer processing
US9165902B2 (en) * 2013-12-17 2015-10-20 Kulicke And Soffa Industries, Inc. Methods of operating bonding machines for bonding semiconductor elements, and bonding machines
JP2015153907A (ja) * 2014-02-14 2015-08-24 株式会社新川 半導体装置の製造方法及びワイヤボンディング装置
JP2016092192A (ja) * 2014-11-04 2016-05-23 株式会社デンソー 電子装置の製造方法

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