JP2019528225A5 - - Google Patents
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- Publication number
- JP2019528225A5 JP2019528225A5 JP2019505361A JP2019505361A JP2019528225A5 JP 2019528225 A5 JP2019528225 A5 JP 2019528225A5 JP 2019505361 A JP2019505361 A JP 2019505361A JP 2019505361 A JP2019505361 A JP 2019505361A JP 2019528225 A5 JP2019528225 A5 JP 2019528225A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- additional layer
- transferring
- preparing
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 claims 2
- 238000005520 cutting process Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662370169P | 2016-08-02 | 2016-08-02 | |
| US62/370,169 | 2016-08-02 | ||
| US201662378126P | 2016-08-22 | 2016-08-22 | |
| US62/378,126 | 2016-08-22 | ||
| US15/662,201 | 2017-07-27 | ||
| US15/662,201 US10186630B2 (en) | 2016-08-02 | 2017-07-27 | Seed wafer for GaN thickening using gas- or liquid-phase epitaxy |
| PCT/IB2017/054668 WO2018025166A1 (en) | 2016-08-02 | 2017-07-31 | Seed wafer for gan thickening using gas- or liquid-phase epitaxy |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2019528225A JP2019528225A (ja) | 2019-10-10 |
| JP2019528225A5 true JP2019528225A5 (enExample) | 2020-09-10 |
Family
ID=61069988
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019505361A Pending JP2019528225A (ja) | 2016-08-02 | 2017-07-31 | 気相または液相エピタキシーを使用したGaN肥厚化用のシードウエハ |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US10186630B2 (enExample) |
| EP (1) | EP3494248A1 (enExample) |
| JP (1) | JP2019528225A (enExample) |
| KR (1) | KR20190036538A (enExample) |
| CN (1) | CN109790642A (enExample) |
| WO (1) | WO2018025166A1 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20180019169A1 (en) * | 2016-07-12 | 2018-01-18 | QMAT, Inc. | Backing substrate stabilizing donor substrate for implant or reclamation |
| FR3063176A1 (fr) * | 2017-02-17 | 2018-08-24 | Soitec | Masquage d'une zone au bord d'un substrat donneur lors d'une etape d'implantation ionique |
| US10020212B1 (en) * | 2017-10-09 | 2018-07-10 | Oculus Vr, Llc | Micro-LED pick and place using metallic gallium |
| US10510532B1 (en) * | 2018-05-29 | 2019-12-17 | Industry-University Cooperation Foundation Hanyang University | Method for manufacturing gallium nitride substrate using the multi ion implantation |
| CN108878266B (zh) * | 2018-07-03 | 2020-09-08 | 北京大学 | 一种在多晶或非晶衬底上生长单晶氮化镓薄膜的方法 |
| CN111785609B (zh) * | 2019-04-04 | 2023-06-23 | 世界先进积体电路股份有限公司 | 半导体结构及其制造方法 |
| JP7567786B2 (ja) | 2019-05-30 | 2024-10-16 | 三菱ケミカル株式会社 | GaN基板ウエハおよびその製造方法 |
| EP3754731A1 (en) * | 2019-06-21 | 2020-12-23 | Aledia | Method for local removal of semiconductor wires |
| US11011391B2 (en) * | 2019-07-03 | 2021-05-18 | Vanguard International Semiconductor Corporation | Semiconductor structure and method for fabricating the same |
| CN110600435A (zh) * | 2019-09-05 | 2019-12-20 | 方天琦 | 多层复合基板结构及其制备方法 |
| JP2023539399A (ja) * | 2020-03-20 | 2023-09-14 | ザ リージェンツ オブ ザ ユニヴァシティ オブ ミシガン | 半導体デバイスの製造方法 |
| CN111668353B (zh) * | 2020-06-19 | 2021-12-17 | 錼创显示科技股份有限公司 | 发光半导体结构及半导体基板 |
| TWI728846B (zh) | 2020-06-19 | 2021-05-21 | 錼創顯示科技股份有限公司 | 發光半導體結構及發光半導體基板 |
| CN116802790A (zh) * | 2021-04-23 | 2023-09-22 | 华为技术有限公司 | 一种hemt器件及其制作方法、电子设备 |
| TWI785763B (zh) * | 2021-08-27 | 2022-12-01 | 合晶科技股份有限公司 | 複合基板及其製造方法 |
| CN114864380B (zh) * | 2022-04-22 | 2025-02-21 | 江苏第三代半导体研究院有限公司 | 降低裂纹的外延方法及其外延片 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1988608A (en) | 1934-04-18 | 1935-01-22 | William A Ogg | Zinc smelting |
| US5985742A (en) | 1997-05-12 | 1999-11-16 | Silicon Genesis Corporation | Controlled cleavage process and device for patterned films |
| FR2835096B1 (fr) * | 2002-01-22 | 2005-02-18 | Procede de fabrication d'un substrat auto-porte en materiau semi-conducteur monocristallin | |
| JP3749498B2 (ja) * | 2002-03-26 | 2006-03-01 | スタンレー電気株式会社 | 結晶成長用基板およびZnO系化合物半導体デバイス |
| FR2857983B1 (fr) * | 2003-07-24 | 2005-09-02 | Soitec Silicon On Insulator | Procede de fabrication d'une couche epitaxiee |
| JP4479657B2 (ja) * | 2003-10-27 | 2010-06-09 | 住友電気工業株式会社 | 窒化ガリウム系半導体基板の製造方法 |
| TW200707799A (en) * | 2005-04-21 | 2007-02-16 | Aonex Technologies Inc | Bonded intermediate substrate and method of making same |
| DE102006004870A1 (de) * | 2006-02-02 | 2007-08-16 | Siltronic Ag | Halbleiterschichtstruktur und Verfahren zur Herstellung einer Halbleiterschichtstruktur |
| US7863157B2 (en) | 2006-03-17 | 2011-01-04 | Silicon Genesis Corporation | Method and structure for fabricating solar cells using a layer transfer process |
| WO2007118121A2 (en) | 2006-04-05 | 2007-10-18 | Silicon Genesis Corporation | Method and structure for fabricating solar cells using a layer transfer process |
| US7811900B2 (en) | 2006-09-08 | 2010-10-12 | Silicon Genesis Corporation | Method and structure for fabricating solar cells using a thick layer transfer process |
| US8124499B2 (en) | 2006-11-06 | 2012-02-28 | Silicon Genesis Corporation | Method and structure for thick layer transfer using a linear accelerator |
| US20080128641A1 (en) | 2006-11-08 | 2008-06-05 | Silicon Genesis Corporation | Apparatus and method for introducing particles using a radio frequency quadrupole linear accelerator for semiconductor materials |
| US7910458B2 (en) | 2007-01-29 | 2011-03-22 | Silicon Genesis Corporation | Method and structure using selected implant angles using a linear accelerator process for manufacture of free standing films of materials |
| US20090278233A1 (en) * | 2007-07-26 | 2009-11-12 | Pinnington Thomas Henry | Bonded intermediate substrate and method of making same |
| US20090206275A1 (en) | 2007-10-03 | 2009-08-20 | Silcon Genesis Corporation | Accelerator particle beam apparatus and method for low contaminate processing |
| JP5297219B2 (ja) * | 2008-02-29 | 2013-09-25 | 信越化学工業株式会社 | 単結晶薄膜を有する基板の製造方法 |
| JP5040977B2 (ja) * | 2009-09-24 | 2012-10-03 | 住友電気工業株式会社 | 窒化物半導体基板、半導体装置およびそれらの製造方法 |
| US9099526B2 (en) * | 2010-02-16 | 2015-08-04 | Monolithic 3D Inc. | Integrated circuit device and structure |
| US20110254134A1 (en) * | 2010-04-19 | 2011-10-20 | Theeradetch Detchprohm | Method of Group III Metal - Nitride Material Growth Using Metal Organic Vapor Phase Epitaxy |
| FI20115255A0 (fi) | 2011-03-14 | 2011-03-14 | Optogan Oy | Yhdistelmäpuolijohdesubstraatti, puolijohdelaite, ja valmistusmenetelmä |
| US9269858B2 (en) | 2011-08-31 | 2016-02-23 | Micron Technology, Inc. | Engineered substrates for semiconductor devices and associated systems and methods |
| US9257339B2 (en) * | 2012-05-04 | 2016-02-09 | Silicon Genesis Corporation | Techniques for forming optoelectronic devices |
| US9466758B2 (en) * | 2012-07-25 | 2016-10-11 | Ananda H. Kumar | Composite substrates of silicon and ceramic |
| US9082692B2 (en) | 2013-01-02 | 2015-07-14 | Micron Technology, Inc. | Engineered substrate assemblies with epitaxial templates and related systems, methods, and devices |
| CN103074672A (zh) * | 2013-01-06 | 2013-05-01 | 向勇 | 一种单晶硅的气相外延生长方法 |
| WO2014113503A1 (en) * | 2013-01-16 | 2014-07-24 | QMAT, Inc. | Techniques for forming optoelectronic devices |
| US9574287B2 (en) * | 2013-09-26 | 2017-02-21 | Globalfoundries Inc. | Gallium nitride material and device deposition on graphene terminated wafer and method of forming the same |
| US9472518B2 (en) | 2014-04-04 | 2016-10-18 | Micron Technology, Inc. | Semiconductor structures including carrier wafers and methods of using such semiconductor structures |
| US9716023B2 (en) | 2014-07-15 | 2017-07-25 | Micron Technology, Inc. | Methods for temporarily bonding a device wafer to a carrier wafer, and related assemblies |
| WO2016106231A1 (en) * | 2014-12-22 | 2016-06-30 | Sunedison Semiconductor Limited | Manufacture of group iiia-nitride layers on semiconductor on insulator structures |
| EP3311422A4 (en) * | 2015-06-19 | 2019-06-12 | Qmat, Inc. | Bond and release layer transfer process |
-
2017
- 2017-07-27 US US15/662,201 patent/US10186630B2/en active Active - Reinstated
- 2017-07-31 KR KR1020197004750A patent/KR20190036538A/ko not_active Withdrawn
- 2017-07-31 CN CN201780061091.1A patent/CN109790642A/zh active Pending
- 2017-07-31 EP EP17761588.7A patent/EP3494248A1/en not_active Withdrawn
- 2017-07-31 JP JP2019505361A patent/JP2019528225A/ja active Pending
- 2017-07-31 WO PCT/IB2017/054668 patent/WO2018025166A1/en not_active Ceased
-
2018
- 2018-12-07 US US16/213,948 patent/US20190288158A1/en not_active Abandoned
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