JP2006512774A5 - - Google Patents
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- JP2006512774A5 JP2006512774A5 JP2004565751A JP2004565751A JP2006512774A5 JP 2006512774 A5 JP2006512774 A5 JP 2006512774A5 JP 2004565751 A JP2004565751 A JP 2004565751A JP 2004565751 A JP2004565751 A JP 2004565751A JP 2006512774 A5 JP2006512774 A5 JP 2006512774A5
- Authority
- JP
- Japan
- Prior art keywords
- region
- well region
- semiconductor device
- well
- conductive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims 29
- 230000005669 field effect Effects 0.000 claims 6
- 229910044991 metal oxide Inorganic materials 0.000 claims 6
- 150000004706 metal oxides Chemical class 0.000 claims 6
- 239000000758 substrate Substances 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/334,272 US6936898B2 (en) | 2002-12-31 | 2002-12-31 | Diagonal deep well region for routing body-bias voltage for MOSFETS in surface well regions |
| US10/334,272 | 2002-12-31 | ||
| PCT/US2003/041402 WO2004061967A2 (en) | 2002-12-31 | 2003-12-29 | Well regions of semiconductor devices |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006512774A JP2006512774A (ja) | 2006-04-13 |
| JP2006512774A5 true JP2006512774A5 (enExample) | 2007-02-15 |
| JP4688501B2 JP4688501B2 (ja) | 2011-05-25 |
Family
ID=32654999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004565751A Expired - Fee Related JP4688501B2 (ja) | 2002-12-31 | 2003-12-29 | 半導体デバイスのウェル領域 |
Country Status (5)
| Country | Link |
|---|---|
| US (9) | US6936898B2 (enExample) |
| JP (1) | JP4688501B2 (enExample) |
| CN (2) | CN101604663B (enExample) |
| AU (1) | AU2003300399A1 (enExample) |
| WO (1) | WO2004061967A2 (enExample) |
Families Citing this family (47)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7180322B1 (en) | 2002-04-16 | 2007-02-20 | Transmeta Corporation | Closed loop feedback control of integrated circuits |
| US7941675B2 (en) | 2002-12-31 | 2011-05-10 | Burr James B | Adaptive power control |
| US7949864B1 (en) * | 2002-12-31 | 2011-05-24 | Vjekoslav Svilan | Balanced adaptive body bias control |
| US7228242B2 (en) | 2002-12-31 | 2007-06-05 | Transmeta Corporation | Adaptive power control based on pre package characterization of integrated circuits |
| US7953990B2 (en) | 2002-12-31 | 2011-05-31 | Stewart Thomas E | Adaptive power control based on post package characterization of integrated circuits |
| US7205758B1 (en) | 2004-02-02 | 2007-04-17 | Transmeta Corporation | Systems and methods for adjusting threshold voltage |
| US7323367B1 (en) | 2002-12-31 | 2008-01-29 | Transmeta Corporation | Diagonal deep well region for routing body-bias voltage for MOSFETS in surface well regions |
| US6936898B2 (en) * | 2002-12-31 | 2005-08-30 | Transmeta Corporation | Diagonal deep well region for routing body-bias voltage for MOSFETS in surface well regions |
| WO2004070832A1 (ja) * | 2003-02-04 | 2004-08-19 | Matsushita Electric Industrial Co., Ltd. | 半導体集積回路装置 |
| KR100536612B1 (ko) * | 2003-10-09 | 2005-12-14 | 삼성전자주식회사 | 소프트 에러율 내성 및 래치업 내성을 증진시키기 위한 웰구조를 갖는 반도체 장치 및 그 제조 방법 |
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| US7049699B1 (en) * | 2003-11-12 | 2006-05-23 | Transmeta Corporation | Low RC structures for routing body-bias voltage |
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| US7692477B1 (en) | 2003-12-23 | 2010-04-06 | Tien-Min Chen | Precise control component for a substrate potential regulation circuit |
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| US7645673B1 (en) | 2004-02-03 | 2010-01-12 | Michael Pelham | Method for generating a deep N-well pattern for an integrated circuit design |
| US7759740B1 (en) * | 2004-03-23 | 2010-07-20 | Masleid Robert P | Deep well regions for routing body-bias voltage to mosfets in surface well regions having separation wells of p-type between the segmented deep n wells |
| US7388260B1 (en) | 2004-03-31 | 2008-06-17 | Transmeta Corporation | Structure for spanning gap in body-bias voltage routing structure |
| US7313779B1 (en) | 2004-10-12 | 2007-12-25 | Transmeta Corporation | Method and system for tiling a bias design to facilitate efficient design rule checking |
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| US7598573B2 (en) * | 2004-11-16 | 2009-10-06 | Robert Paul Masleid | Systems and methods for voltage distribution via multiple epitaxial layers |
| US7667288B2 (en) * | 2004-11-16 | 2010-02-23 | Masleid Robert P | Systems and methods for voltage distribution via epitaxial layers |
| JP2007005763A (ja) * | 2005-05-26 | 2007-01-11 | Fujitsu Ltd | 半導体装置及びその製造方法及びに半導体装置の設計方法 |
| US7217962B1 (en) * | 2005-06-30 | 2007-05-15 | Transmeta Corporation | Wire mesh patterns for semiconductor devices |
| US7661086B1 (en) | 2005-06-30 | 2010-02-09 | Scott Pitkethly | Enhanced clock signal flexible distribution system and method |
| US7730440B2 (en) * | 2005-06-30 | 2010-06-01 | Scott Pitkethly | Clock signal distribution system and method |
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| JP4777082B2 (ja) * | 2006-02-13 | 2011-09-21 | 富士通セミコンダクター株式会社 | 半導体装置及びその製造方法 |
| JP2007214490A (ja) * | 2006-02-13 | 2007-08-23 | Fujitsu Ltd | 半導体装置及びその製造方法 |
| JP4819548B2 (ja) | 2006-03-30 | 2011-11-24 | 富士通セミコンダクター株式会社 | 半導体装置 |
| US8451951B2 (en) * | 2008-08-15 | 2013-05-28 | Ntt Docomo, Inc. | Channel classification and rate adaptation for SU-MIMO systems |
| US8735797B2 (en) * | 2009-12-08 | 2014-05-27 | Zena Technologies, Inc. | Nanowire photo-detector grown on a back-side illuminated image sensor |
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| KR101699033B1 (ko) * | 2009-11-30 | 2017-01-24 | 에스케이하이닉스 주식회사 | 출력 드라이버 |
| KR102052307B1 (ko) * | 2011-11-09 | 2019-12-04 | 스카이워크스 솔루션즈, 인코포레이티드 | 전계 효과 트랜지스터 구조 및 관련된 무선-주파수 스위치 |
| JP5875355B2 (ja) * | 2011-12-12 | 2016-03-02 | ルネサスエレクトロニクス株式会社 | 回路シミュレーション方法 |
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| KR20240053079A (ko) | 2021-05-25 | 2024-04-23 | 이노사이언스 (쑤저우) 테크놀로지 컴퍼니 리미티드 | 질화물-기반 반도체 양방향 스위칭 디바이스 및 그 제조방법 |
| US12046603B2 (en) * | 2021-11-23 | 2024-07-23 | Globalfoundries U.S. Inc. | Semiconductor structure including sectioned well region |
| US11929399B2 (en) | 2022-03-07 | 2024-03-12 | Globalfoundries U.S. Inc. | Deep nwell contact structures |
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-
2002
- 2002-12-31 US US10/334,272 patent/US6936898B2/en not_active Expired - Lifetime
-
2003
- 2003-10-10 US US10/683,732 patent/US7098512B1/en not_active Expired - Lifetime
- 2003-12-29 AU AU2003300399A patent/AU2003300399A1/en not_active Abandoned
- 2003-12-29 CN CN2009101409382A patent/CN101604663B/zh not_active Expired - Fee Related
- 2003-12-29 WO PCT/US2003/041402 patent/WO2004061967A2/en not_active Ceased
- 2003-12-29 JP JP2004565751A patent/JP4688501B2/ja not_active Expired - Fee Related
- 2003-12-29 CN CNB2003801080465A patent/CN100502005C/zh not_active Expired - Fee Related
-
2004
- 2004-01-26 US US10/765,316 patent/US7332763B1/en not_active Expired - Lifetime
-
2005
- 2005-08-08 US US11/199,896 patent/US7211478B1/en not_active Expired - Lifetime
-
2006
- 2006-06-08 US US11/449,952 patent/US7645664B1/en not_active Expired - Lifetime
-
2008
- 2008-02-11 US US12/069,670 patent/US9251865B2/en active Active
- 2008-02-19 US US12/033,840 patent/US8415730B2/en active Active
-
2009
- 2009-11-30 US US12/628,011 patent/US7863688B2/en not_active Expired - Fee Related
-
2016
- 2016-02-02 US US15/013,900 patent/US20170194421A9/en not_active Abandoned
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