DE602007001549D1 - Substrathaltevorrichtung - Google Patents
SubstrathaltevorrichtungInfo
- Publication number
- DE602007001549D1 DE602007001549D1 DE602007001549T DE602007001549T DE602007001549D1 DE 602007001549 D1 DE602007001549 D1 DE 602007001549D1 DE 602007001549 T DE602007001549 T DE 602007001549T DE 602007001549 T DE602007001549 T DE 602007001549T DE 602007001549 D1 DE602007001549 D1 DE 602007001549D1
- Authority
- DE
- Germany
- Prior art keywords
- substrate holder
- holder
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006097296A JP4814677B2 (ja) | 2006-03-31 | 2006-03-31 | 基板保持装置および研磨装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602007001549D1 true DE602007001549D1 (de) | 2009-08-27 |
Family
ID=37986414
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602007001549T Active DE602007001549D1 (de) | 2006-03-31 | 2007-03-30 | Substrathaltevorrichtung |
Country Status (7)
Country | Link |
---|---|
US (4) | US7967665B2 (de) |
EP (2) | EP1839812B1 (de) |
JP (3) | JP4814677B2 (de) |
KR (3) | KR101081415B1 (de) |
CN (1) | CN101045286B (de) |
DE (1) | DE602007001549D1 (de) |
TW (3) | TWI617389B (de) |
Families Citing this family (42)
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TWI674171B (zh) | 2012-01-31 | 2019-10-11 | 日商荏原製作所股份有限公司 | 基板保持裝置、研磨裝置、及研磨方法 |
JP5976522B2 (ja) * | 2012-05-31 | 2016-08-23 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
US10702972B2 (en) * | 2012-05-31 | 2020-07-07 | Ebara Corporation | Polishing apparatus |
US9067295B2 (en) * | 2012-07-25 | 2015-06-30 | Applied Materials, Inc. | Monitoring retaining ring thickness and pressure control |
JP6158637B2 (ja) * | 2012-08-28 | 2017-07-05 | 株式会社荏原製作所 | 弾性膜及び基板保持装置 |
KR101410358B1 (ko) * | 2013-02-25 | 2014-06-20 | 삼성전자주식회사 | 화학적 기계적 연마장치용 멤브레인 및 화학적 기계적 연마장치용 연마헤드 |
JP6403981B2 (ja) | 2013-11-13 | 2018-10-10 | 株式会社荏原製作所 | 基板保持装置、研磨装置、研磨方法、およびリテーナリング |
CN103878679B (zh) * | 2014-03-06 | 2016-05-18 | 浙江工业大学 | 一种双自由度平面抛光装置 |
US9844800B2 (en) * | 2014-04-23 | 2017-12-19 | Applied Materials, Inc. | Systems, methods and apparatus for post-chemical mechanical planarization substrate cleaning |
TWI656944B (zh) * | 2014-05-14 | 2019-04-21 | 日商荏原製作所股份有限公司 | 研磨裝置 |
JP6216686B2 (ja) | 2014-05-30 | 2017-10-18 | 株式会社荏原製作所 | 研磨装置 |
US9878421B2 (en) * | 2014-06-16 | 2018-01-30 | Applied Materials, Inc. | Chemical mechanical polishing retaining ring with integrated sensor |
JP2016004903A (ja) | 2014-06-17 | 2016-01-12 | 株式会社東芝 | 研磨装置、研磨方法、及び半導体装置の製造方法 |
KR102173323B1 (ko) | 2014-06-23 | 2020-11-04 | 삼성전자주식회사 | 캐리어 헤드, 화학적 기계식 연마 장치 및 웨이퍼 연마 방법 |
CN104400609B (zh) * | 2014-12-17 | 2017-02-22 | 周桂英 | 位移装置及抛光设备 |
US9902038B2 (en) | 2015-02-05 | 2018-02-27 | Toshiba Memory Corporation | Polishing apparatus, polishing method, and semiconductor manufacturing method |
JP7141222B2 (ja) * | 2017-04-12 | 2022-09-22 | 株式会社荏原製作所 | 弾性膜、基板保持装置、及び研磨装置 |
JP6941046B2 (ja) * | 2017-12-20 | 2021-09-29 | 株式会社荏原製作所 | 研磨ヘッドおよび研磨装置 |
JP7049984B2 (ja) | 2018-12-27 | 2022-04-07 | 株式会社荏原製作所 | 研磨装置および静止リングの傾きを制御する方法 |
JP7178259B2 (ja) | 2018-12-27 | 2022-11-25 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
KR20210006550A (ko) | 2019-07-08 | 2021-01-19 | 삼성전자주식회사 | 회전체 모듈 및 이를 구비하는 화학 기계적 연마 장치 |
JP2021070097A (ja) * | 2019-10-31 | 2021-05-06 | 株式会社荏原製作所 | 基板処理システムおよび記録媒体 |
JP7339811B2 (ja) * | 2019-08-27 | 2023-09-06 | 株式会社荏原製作所 | リテーナリングに局所荷重を伝達するローラーの異常検出方法および研磨装置 |
CN112548848B (zh) * | 2019-09-26 | 2022-09-23 | 清华大学 | 一种承载头和化学机械抛光设备 |
WO2022187249A1 (en) * | 2021-03-04 | 2022-09-09 | Applied Materials, Inc. | Polishing carrier head with floating edge control |
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2006
- 2006-03-31 JP JP2006097296A patent/JP4814677B2/ja active Active
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2007
- 2007-03-29 CN CN200710089026.8A patent/CN101045286B/zh active Active
- 2007-03-29 US US11/730,142 patent/US7967665B2/en active Active
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