DE3772411D1 - Verfahren und vorrichtung zur ausfuehrung der gueteuntersuchung von gedruckten schaltungen. - Google Patents

Verfahren und vorrichtung zur ausfuehrung der gueteuntersuchung von gedruckten schaltungen.

Info

Publication number
DE3772411D1
DE3772411D1 DE8787301332T DE3772411T DE3772411D1 DE 3772411 D1 DE3772411 D1 DE 3772411D1 DE 8787301332 T DE8787301332 T DE 8787301332T DE 3772411 T DE3772411 T DE 3772411T DE 3772411 D1 DE3772411 D1 DE 3772411D1
Authority
DE
Germany
Prior art keywords
circuit board
rays
imaging system
transmitted
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787301332T
Other languages
English (en)
Inventor
John Adams
Paul Axford
Philip H Bowles
San Diego California Va Nguyen
Charles Preskitt
Ed Ross
Doug Thompson
Paul Turner
Amoroso, Jr
Mike Juha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
THERMOSPECTRA CORP. D.B.A. NIS NICOLET IMAGING SYS
Original Assignee
Irt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=25260392&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3772411(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Irt Corp filed Critical Irt Corp
Application granted granted Critical
Publication of DE3772411D1 publication Critical patent/DE3772411D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/304—Contactless testing of printed or hybrid circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G06T2207/10121—Fluoroscopy
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S378/00—X-ray or gamma ray systems or devices
    • Y10S378/901—Computer tomography program or processor
DE8787301332T 1986-02-20 1987-02-17 Verfahren und vorrichtung zur ausfuehrung der gueteuntersuchung von gedruckten schaltungen. Expired - Lifetime DE3772411D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/831,997 US4809308A (en) 1986-02-20 1986-02-20 Method and apparatus for performing automated circuit board solder quality inspections

Publications (1)

Publication Number Publication Date
DE3772411D1 true DE3772411D1 (de) 1991-10-02

Family

ID=25260392

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787301332T Expired - Lifetime DE3772411D1 (de) 1986-02-20 1987-02-17 Verfahren und vorrichtung zur ausfuehrung der gueteuntersuchung von gedruckten schaltungen.

Country Status (6)

Country Link
US (2) US4809308A (de)
EP (1) EP0236001B1 (de)
JP (1) JP2790804B2 (de)
KR (1) KR870008499A (de)
AT (1) ATE66744T1 (de)
DE (1) DE3772411D1 (de)

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* Cited by examiner, † Cited by third party
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EP0236001A2 (de) 1987-09-09
EP0236001B1 (de) 1991-08-28
JP2790804B2 (ja) 1998-08-27
EP0236001A3 (en) 1988-08-10
USRE35423E (en) 1997-01-14
ATE66744T1 (de) 1991-09-15
JPS62219632A (ja) 1987-09-26
KR870008499A (ko) 1987-09-26
US4809308A (en) 1989-02-28

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