JPS52128190A - Inspection device for x ray fluoroscopic adhering layer - Google Patents

Inspection device for x ray fluoroscopic adhering layer

Info

Publication number
JPS52128190A
JPS52128190A JP4570076A JP4570076A JPS52128190A JP S52128190 A JPS52128190 A JP S52128190A JP 4570076 A JP4570076 A JP 4570076A JP 4570076 A JP4570076 A JP 4570076A JP S52128190 A JPS52128190 A JP S52128190A
Authority
JP
Japan
Prior art keywords
inspection device
ray fluoroscopic
adhering layer
ray
ray quantity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4570076A
Other languages
Japanese (ja)
Inventor
Keizo Baba
Masayuki Naruse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP4570076A priority Critical patent/JPS52128190A/en
Publication of JPS52128190A publication Critical patent/JPS52128190A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Abstract

PURPOSE:To perform the objective judgement of the state of soldering, by means of providing a reference memory section which memroizes X ray quantity after the transmission of X ray through judgement criterion sample and arithmetic section 10 which compares and calculates the X ray quantity being measured with X ray quantity being memorized.
JP4570076A 1976-04-21 1976-04-21 Inspection device for x ray fluoroscopic adhering layer Pending JPS52128190A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4570076A JPS52128190A (en) 1976-04-21 1976-04-21 Inspection device for x ray fluoroscopic adhering layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4570076A JPS52128190A (en) 1976-04-21 1976-04-21 Inspection device for x ray fluoroscopic adhering layer

Publications (1)

Publication Number Publication Date
JPS52128190A true JPS52128190A (en) 1977-10-27

Family

ID=12726641

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4570076A Pending JPS52128190A (en) 1976-04-21 1976-04-21 Inspection device for x ray fluoroscopic adhering layer

Country Status (1)

Country Link
JP (1) JPS52128190A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56132550A (en) * 1980-03-21 1981-10-16 Nippon Steel Corp Diagnostic method for deterioration of insulation for winding of electric machine
EP0236001A2 (en) * 1986-02-20 1987-09-09 Irt Corporation Method and apparatus for performing automated circuit board quality inspection
KR100830378B1 (en) * 2000-11-07 2008-05-20 가부시끼가이샤 이시다 X-ray INSPECTION APPARATUS

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56132550A (en) * 1980-03-21 1981-10-16 Nippon Steel Corp Diagnostic method for deterioration of insulation for winding of electric machine
JPH0136060B2 (en) * 1980-03-21 1989-07-28 Nippon Steel Corp
EP0236001A2 (en) * 1986-02-20 1987-09-09 Irt Corporation Method and apparatus for performing automated circuit board quality inspection
US4809308A (en) * 1986-02-20 1989-02-28 Irt Corporation Method and apparatus for performing automated circuit board solder quality inspections
USRE35423E (en) * 1986-02-20 1997-01-14 Thermospectra Corporation Method and apparatus for performing automated circuit board solder quality inspections
KR100830378B1 (en) * 2000-11-07 2008-05-20 가부시끼가이샤 이시다 X-ray INSPECTION APPARATUS

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