DE102019206090A1 - Siliziumcarbid-Halbleitervorrichtung, Leistungswandler und Verfahren zum Herstellen einer Siliziumcarbid-Halbleitervorrichtung - Google Patents
Siliziumcarbid-Halbleitervorrichtung, Leistungswandler und Verfahren zum Herstellen einer Siliziumcarbid-Halbleitervorrichtung Download PDFInfo
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- DE102019206090A1 DE102019206090A1 DE102019206090.0A DE102019206090A DE102019206090A1 DE 102019206090 A1 DE102019206090 A1 DE 102019206090A1 DE 102019206090 A DE102019206090 A DE 102019206090A DE 102019206090 A1 DE102019206090 A1 DE 102019206090A1
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- H10D30/0291—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs
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- H10D30/0291—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs
- H10D30/0295—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs using recessing of the source electrodes
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- H10D30/0291—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs
- H10D30/0297—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs using recessing of the gate electrodes, e.g. to form trench gate electrodes
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- H10D30/66—Vertical DMOS [VDMOS] FETs
- H10D30/668—Vertical DMOS [VDMOS] FETs having trench gate electrodes, e.g. UMOS transistors
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- H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
- H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
- H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]
- H10D62/106—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] having supplementary regions doped oppositely to or in rectifying contact with regions of the semiconductor bodies, e.g. guard rings with PN or Schottky junctions
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- H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
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- H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]
- H10D62/106—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] having supplementary regions doped oppositely to or in rectifying contact with regions of the semiconductor bodies, e.g. guard rings with PN or Schottky junctions
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018-090470 | 2018-05-09 | ||
| JP2018090470A JP7068916B2 (ja) | 2018-05-09 | 2018-05-09 | 炭化珪素半導体装置、電力変換装置、および炭化珪素半導体装置の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102019206090A1 true DE102019206090A1 (de) | 2019-11-14 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102019206090.0A Pending DE102019206090A1 (de) | 2018-05-09 | 2019-04-29 | Siliziumcarbid-Halbleitervorrichtung, Leistungswandler und Verfahren zum Herstellen einer Siliziumcarbid-Halbleitervorrichtung |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US20190348524A1 (https=) |
| JP (1) | JP7068916B2 (https=) |
| CN (1) | CN110473903B (https=) |
| DE (1) | DE102019206090A1 (https=) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112018002873T5 (de) | 2017-06-06 | 2020-02-27 | Mitsubishi Electric Corporation | Halbleitereinheit und leistungswandler |
| WO2021106152A1 (ja) * | 2019-11-28 | 2021-06-03 | 三菱電機株式会社 | 炭化珪素半導体装置、電力変換装置および炭化珪素半導体装置の製造方法 |
| JP7354868B2 (ja) * | 2020-02-13 | 2023-10-03 | 株式会社デンソー | スイッチング素子 |
| JP7735083B2 (ja) * | 2020-05-22 | 2025-09-08 | ヒュンダイ・モービス・カンパニー・リミテッド | パワー半導体素子およびその製造方法 |
| US11961903B2 (en) * | 2020-05-26 | 2024-04-16 | Hyundai Mobis Co., Ltd. | Power semiconductor device and method of fabricating the same |
| JP2021190647A (ja) * | 2020-06-04 | 2021-12-13 | 豊田合成株式会社 | 半導体装置とその製造方法 |
| CN111755525A (zh) * | 2020-07-24 | 2020-10-09 | 华羿微电子股份有限公司 | 一种Trench MOS功率器件及制备方法 |
| US11004940B1 (en) * | 2020-07-31 | 2021-05-11 | Genesic Semiconductor Inc. | Manufacture of power devices having increased cross over current |
| US11764295B2 (en) | 2020-11-09 | 2023-09-19 | Wolfspeed, Inc. | Gate trench power semiconductor devices having improved deep shield connection patterns |
| JP7585794B2 (ja) | 2021-01-07 | 2024-11-19 | 三菱電機株式会社 | 半導体装置 |
| US11616123B2 (en) * | 2021-02-12 | 2023-03-28 | Alpha And Omega Semiconductor International Lp | Enhancement on-state power semiconductor device characteristics utilizing new cell geometries |
| WO2022270245A1 (ja) * | 2021-06-23 | 2022-12-29 | 住友電気工業株式会社 | 炭化珪素半導体装置 |
| CN114267739A (zh) * | 2022-01-05 | 2022-04-01 | 北京昕感科技有限责任公司 | 一种双沟槽型SiC MOSFET元胞结构、器件及制造方法 |
| US12419089B2 (en) * | 2022-05-27 | 2025-09-16 | Fast SiC Semiconductor Incorporated | Silicon carbide semiconductor device |
| CN115224111A (zh) * | 2022-07-26 | 2022-10-21 | 中芯越州集成电路制造(绍兴)有限公司 | 沟槽栅器件的制备方法及沟槽栅器件 |
| CN119586348A (zh) * | 2022-07-29 | 2025-03-07 | 三菱电机株式会社 | 半导体装置、电力变换装置以及半导体装置的制造方法 |
| CN115084247A (zh) * | 2022-08-22 | 2022-09-20 | 泰科天润半导体科技(北京)有限公司 | 一种双沟槽型碳化硅mosfet的制造方法 |
| CN115241277B (zh) * | 2022-09-22 | 2023-01-10 | 深圳芯能半导体技术有限公司 | 一种隔离型沟槽mos器件及其制备方法 |
| CN116799036B (zh) * | 2023-06-11 | 2026-03-31 | 湖北九峰山实验室 | 宽禁带半导体沟槽mosfet器件结构及其制作方法 |
| US20250133769A1 (en) * | 2023-10-24 | 2025-04-24 | Taipei Anjet Corporation | Three-dimensional (3d) trenched metal-oxide-semiconductor field-effect transistor (mosfet) device and method for fabricating the same |
| CN117894846B (zh) * | 2023-12-28 | 2024-07-19 | 南京第三代半导体技术创新中心有限公司 | 低功耗平面栅型碳化硅mosfet功率器件及其制造方法 |
| CN119092547A (zh) * | 2024-08-30 | 2024-12-06 | 长飞先进半导体(武汉)有限公司 | 功率器件及制备方法、功率模块、功率转换电路和车辆 |
| CN119208383B (zh) * | 2024-11-26 | 2025-05-02 | 安徽长飞先进半导体股份有限公司 | 半导体器件及制备方法、功率模块、功率转换电路和车辆 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5471075A (en) * | 1994-05-26 | 1995-11-28 | North Carolina State University | Dual-channel emitter switched thyristor with trench gate |
| JP2010245256A (ja) * | 2009-04-06 | 2010-10-28 | Renesas Electronics Corp | 半導体装置およびその製造方法 |
| CN102034715A (zh) * | 2010-10-12 | 2011-04-27 | 上海宏力半导体制造有限公司 | 功率金属氧化物半导体场效应晶体管的制作方法 |
| CN103262248B (zh) * | 2010-12-10 | 2016-07-13 | 三菱电机株式会社 | 半导体装置及其制造方法 |
| CN102956481B (zh) * | 2011-08-18 | 2015-08-19 | 科轩微电子股份有限公司 | 具有源极沟槽的沟槽式功率半导体元件的制造方法 |
| CN103367144A (zh) * | 2012-03-26 | 2013-10-23 | 马克斯半导体股份有限公司 | 沟槽式井区电场屏蔽功率mosfet结构及制作方法 |
| JP6061181B2 (ja) * | 2012-08-20 | 2017-01-18 | ローム株式会社 | 半導体装置 |
| KR101439310B1 (ko) * | 2012-11-21 | 2014-09-11 | 도요타 지도샤(주) | 반도체 장치 |
| KR101920717B1 (ko) | 2013-01-14 | 2018-11-21 | 삼성전자주식회사 | 이중 병렬 채널 구조를 갖는 반도체 소자 및 상기 반도체 소자의 제조 방법 |
| JP5864784B2 (ja) | 2013-01-24 | 2016-02-17 | トヨタ自動車株式会社 | 半導体装置及び半導体装置の製造方法 |
| CN107251198B (zh) * | 2015-01-27 | 2020-08-14 | Abb电网瑞士股份公司 | 绝缘栅功率半导体装置以及用于制造这种装置的方法 |
| US10157986B2 (en) | 2015-03-30 | 2018-12-18 | Mitsubishi Electric Corporation | Silicon carbide semiconductor device and method for manufacturing same |
| JP6115678B1 (ja) * | 2016-02-01 | 2017-04-19 | 富士電機株式会社 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
| JP2019096631A (ja) * | 2016-04-07 | 2019-06-20 | 三菱電機株式会社 | 半導体装置および電力変換装置 |
| US20170338302A1 (en) * | 2016-05-23 | 2017-11-23 | Infineon Technologies Ag | Power Semiconductor Device with Charge Balance Design |
| JP6919159B2 (ja) * | 2016-07-29 | 2021-08-18 | 富士電機株式会社 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
| JP6640691B2 (ja) * | 2016-09-21 | 2020-02-05 | 株式会社東芝 | 半導体装置及びその製造方法 |
| US20180138300A1 (en) | 2016-11-17 | 2018-05-17 | Sanken Electric Co., Ltd. | Semiconductor device and method of manufacturing the same |
-
2018
- 2018-05-09 JP JP2018090470A patent/JP7068916B2/ja active Active
-
2019
- 2019-04-01 US US16/371,948 patent/US20190348524A1/en not_active Abandoned
- 2019-04-29 DE DE102019206090.0A patent/DE102019206090A1/de active Pending
- 2019-04-30 CN CN201910363080.XA patent/CN110473903B/zh active Active
-
2022
- 2022-04-27 US US17/660,947 patent/US11984492B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US11984492B2 (en) | 2024-05-14 |
| CN110473903B (zh) | 2023-07-25 |
| CN110473903A (zh) | 2019-11-19 |
| US20220254904A1 (en) | 2022-08-11 |
| JP2019197792A (ja) | 2019-11-14 |
| JP7068916B2 (ja) | 2022-05-17 |
| US20190348524A1 (en) | 2019-11-14 |
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