CN1625926B - 用于将元件置入于基座中的方法 - Google Patents

用于将元件置入于基座中的方法 Download PDF

Info

Publication number
CN1625926B
CN1625926B CN038030985A CN03803098A CN1625926B CN 1625926 B CN1625926 B CN 1625926B CN 038030985 A CN038030985 A CN 038030985A CN 03803098 A CN03803098 A CN 03803098A CN 1625926 B CN1625926 B CN 1625926B
Authority
CN
China
Prior art keywords
pedestal
described method
make
substrate
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN038030985A
Other languages
English (en)
Other versions
CN1625926A (zh
Inventor
R·托米宁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Imberatec Co ltd
Original Assignee
Imbera Electronics Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=8563008&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=CN1625926(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Imbera Electronics Oy filed Critical Imbera Electronics Oy
Publication of CN1625926A publication Critical patent/CN1625926A/zh
Application granted granted Critical
Publication of CN1625926B publication Critical patent/CN1625926B/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • H05K1/0218Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5389Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L24/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/82Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by forming build-up interconnects at chip-level, e.g. for high density interconnects [HDI]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
    • H05K1/185Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/182Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
    • H05K1/185Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
    • H05K1/188Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit manufactured by mounting on or attaching to a structure having a conductive layer, e.g. a metal foil, such that the terminals of the component are connected to or adjacent to the conductive layer before embedding, and by using the conductive layer, which is patterned after embedding, at least partially for connecting the component
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L2224/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • H01L2224/241Disposition
    • H01L2224/24135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/24137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L2224/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • H01L2224/241Disposition
    • H01L2224/24151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/24221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/24225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/24227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the HDI interconnect not connecting to the same level of the item at which the semiconductor or solid-state body is mounted, e.g. the semiconductor or solid-state body being mounted in a cavity or on a protrusion of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/82Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by forming build-up interconnects at chip-level, e.g. for high density interconnects [HDI]
    • H01L2224/82009Pre-treatment of the connector or the bonding area
    • H01L2224/8203Reshaping, e.g. forming vias
    • H01L2224/82035Reshaping, e.g. forming vias by heating means
    • H01L2224/82039Reshaping, e.g. forming vias by heating means using a laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/921Connecting a surface with connectors of different types
    • H01L2224/9212Sequential connecting processes
    • H01L2224/92142Sequential connecting processes the first connecting process involving a layer connector
    • H01L2224/92144Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a build-up interconnect
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01005Boron [B]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01015Phosphorus [P]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01019Potassium [K]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01027Cobalt [Co]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01029Copper [Cu]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01057Lanthanum [La]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01061Promethium [Pm]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/014Solder alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12042LASER
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1517Multilayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09818Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/09981Metallised walls
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10674Flip chip
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/06Lamination
    • H05K2203/061Lamination of previously made multilayered subassemblies
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/06Lamination
    • H05K2203/063Lamination of preperforated insulating layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/14Related to the order of processing steps
    • H05K2203/1461Applying or finishing the circuit pattern after another process, e.g. after filling of vias with conductive paste, after making printed resistors
    • H05K2203/1469Circuit made after mounting or encapsulation of the components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections
    • H05K3/429Plated through-holes specially for multilayer circuits, e.g. having connections to inner circuit layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4602Manufacturing multilayer circuits characterized by a special circuit board as base or central core whereon additional circuit layers are built or additional circuit boards are laminated
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4611Manufacturing multilayer circuits by laminating two or more circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4652Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern

Abstract

本出版物公开了一种方法,其中将形成了部分电子电路的半导体元件或者至少某些半导体元件在基座的制造过程中置入于一基座如一电路板中,这时,或者说,基座结构的部分环绕着半导体元件制造。根据本发明,半导体元件的馈通在基座中制作以便使得孔在基座的第一和第二表面之间延伸。在孔已经制作完成之后,一聚合物膜散布于基座结构的第二表面上以便使得聚合物膜也从基座结构的第二表面侧覆盖着为半导体元件制作的通孔。在聚合物膜硬化之前,或者在部分硬化之后,从基座的第一表面的方向将半导体元件置放于在基座中所制作的孔中。半导体元件被压在聚合物膜上以便使得它们附着于聚合物膜上。在这之后,聚合物膜进行最后的硬化。

Description

用于将元件置入于基座中的方法
本发明涉及一种用于将一个或更多元件置入于一基座中的方法。
利用本发明涉及的方法加工的基座在电子产品中用作电元件,通常为半导体元件,尤其是微电路所用的基座。基座的任务是为元件提供一机械附连基座并提供与基座上或基座外部的其它元件的所需电连接。基座可为一电路板,因此作为本发明的目的的方法紧密涉及电路板制造技术。基座也可为某些其它基座,例如用于封装一个或多个元件的基座,或者一整个功能模块的基座。
其中,电路板制造技术不同于微电路制造之处在于微电路制造技术中所用的衬底为一半导体材料,而电路板的基座材料为绝缘体。微电路制造技术通常还比电路板制造技术昂贵得多。
电路板制造技术不同于封装技术在于封装技术用于形成一便于其操作处理的环绕着半导体元件的封装。半导体元件的封装的表面具有接触部分,通常为突起,它们容许封装好的元件能够简便地安装于电路板上。半导体封装还包含导体,电压可以通过导体而连接于实际的半导体上,将封装外部的突出接触部分连接于半导体元件表面上的接触区域上。
然而,利用常规技术制造的元件的封装占用了大量的空间。电子装置的微型化引导人们试图除去半导体元件的封装。举例来说,为此目的,已发展了所谓的倒装片技术,其中将不带封装的半导体元件直接装配于电路板表面上。然而,在倒装片技术中存在许多困难。举例来说,可能会产生关于连接可靠性的问题,特别是当在电路板和半导体元件之间产生机械应力的情况下。机械应力必须通过在芯片和电路板之间增添适当的未充满情况而得以均匀开。这个程序减缓了过程并且增大了制造成本。应力尤其产生于使用柔性电路板和电路板大大弯曲的情况下。
本发明的目的是创建一种方法,利用这种方法可以可靠经济地将未封装的微电路置入于一基座中。
本发明基于将半导体元件或者至少部分半导体元件在板的制作过程中置入于一基座如一电路板中,其中,或者说,基座结构的部分环绕着半导体元件制造。根据本发明,半导体元件的馈通在基座中制作以便使得孔在基座的第一和第二表面之间延伸。在孔已经制作完成之后,一聚合物膜散布于基座结构的第二表面上以便使得聚合物膜也从基座结构的第二侧覆盖着为半导体元件制作的馈通。在聚合物膜硬化之前,或者在部分硬化之后,从基座的第一侧的方向将半导体元件置放于已经制作完成的孔中。半导体元件被压在聚合物膜上以便使得它们附着于聚合物膜上。在这之后,聚合物膜进行最后的硬化。根据本发明,在元件置放于孔中之前,在基座中制作一导电图案,并且元件置于孔中的方式使得元件相对于基板上所制作的导电图案对准。
更具体而言,根据本发明的方法的特征在于权利要求1的特征部分所述的内容。
借助于本发明获得了显著的优点。这是因为,借助于本发明,可以制造一种半导体元件置入其内部的电路板。本发明还使得可以制造一种环绕着元件的小型、可靠的元件封装。
本发明还可以有大量的实施例,它们提供了显著的附加优点。
举例来说,借助于本发明的优选实施例,元件封装阶段、电路板制造阶段、以及半导体元件的装配和触点制作阶段可以组合起来形成单个整体。各个过程阶段的组合带来了重要的逻辑优点并且使得能够制造更小、更可靠的电子模块。另一个优点在于这种制造方法可以大部分利用一般所用的电路板制造和装配技术。
根据本发明的一个优选实施例,这种复合式过程的整体性比例如使用倒装片技术来制造电路板并将元件附连于电路板上更为简便。利用这些优选实施例,与常规型方案相比,可以得到以下优点:
不需要软焊来与元件形成触点,而是可通过在半导体元件的接触区域顶部上生长导体来制造电触点。这就意味着不需要使用熔化的金属来连接元件,因此不会在金属之间形成化合物。金属之间的化合物一般为脆性,因此与通过软焊制作的连接相比,可靠性得以提高。特别是在小连接处,连接中的金属化合物的脆性会引起大问题。根据一个优选实施例,在无焊方案中可比软焊方案中得到明显更小的结构。无焊触点制作方法还存在的优点在于不需要高温来形成触点。过程温度更低就容许在选择电路板、元件封装或电子模块的其它材料时具有更大选择。在这种方法中,电路板、元件、和直接连接于元件上的导电层的温度可保持于20-85℃的范围内。只有当需要对所使用的聚合物膜进行固化处理(聚合处理)时才会需要较高的温度,例如大约150℃。然而,在整个过程中,基板和元件的温度可保持于200℃以下。如果本方法使用通过其它方法,例如化学方法或电磁辐射方法而非通过高温作用硬化的聚合物膜,则在一个优选实施例中,在整个过程中,基板和元件的温度可保持于100℃以下。
由于使用本方法使得能够制造更小的结构,因此元件相距可更为紧密。各元件之间的导体也就可以更短,而电子电路的电属性就由于例如减少了损失、干扰和延迟时间而得以改进。
本方法还使得能够制造三维结构,因为基板和嵌于基板中的元件可相互叠放地装配。
在本方法中,还可以减少不同金属之间的界面。
这种方法容许一种无铅过程。
本发明还容许其它优选实施例。关于本发明,举例来说,可使用柔性电路板。另外,这个过程容许电路板互相叠放地装配。
借助于本发明,还可以制造极薄的结构,其中半导体元件不管其厚度如何都完全保护于一基座例如电路板内。
由于半导体元件可完全置于电路板内部,因此电路板与半导体元件之间的连接方式在机械上来说既耐久又可靠。
在下文中,将借助于实例并参照附图对本发明进行研究。
图1示出了根据本发明的一个过程的一组剖面。
图2示出了根据本发明的第二过程的一组剖面。
图3示出了一种可能的接触成形方法的示意图。
图4示出了根据本发明的第三过程的一组剖面。
图1中所示的这组插图示出了根据本发明的一种可能过程。在下文中,将分阶段对图1的过程进行研究。
阶段A(图1A):
在阶段A中,为电路板制造过程选择一适合的基板1。基板1可为例如玻璃纤维加强环氧树脂板,如FR4型板。由于实例过程不需要高温,在实例过程中,基板1因此就可为一种有机板。因此基板1可选择一种价格便宜的柔性有机板。通常,基板1选择一种已经涂有导电材料2通常为铜的板。当然,也可使用无机板。
阶段B(图1B):
在阶段B中,在基板中为电触点制作通孔3。孔3可以例如利用电路板制造中所用的某些已知方法,如机械钻孔法来制作。
阶段C(图1C):
在阶段C中,金属生长于在阶段B中制作的通孔中。在实例过程中,金属4还生长于电路板的顶部上,从而也增大了导电层2的厚度。
所生长的导电材料4为铜,或具有足够导电性的某些其它材料。铜的金属化过程可以通过用一薄层化学铜来涂敷孔然后使用电化学铜生长方法来继续涂敷过程而进行。在实例中使用了化学铜,因为其也将在聚合物顶部上形成表面并且在电化学涂敷过程中起电导体的作用。因此,金属就可使用一种湿化学方法来生长,因而生长方法非常廉价。另外,举例来说,导电层4也可以通过向通孔中充以导电膏来制作。
阶段D(图1D):
在阶段D中,对电路板表面上的导电层制作图案。这可以通过使用众所周知的电路板制造方法来进行。举例来说,导电层的图案根据在阶段B中制作的孔来对准。
举例来说,导线图案的制造可以通过在金属4的表面上层压一光刻聚合物膜来进行,所需的导电图案通过引导光穿过一图案掩模而形成于该聚合物膜上。在暴露之后,将聚合物膜进行显示,这时从其上除去所需区域并且位于聚合物下方的铜4露出。接着,在膜下方露出的铜被蚀刻掉,从而留下所需的导电图案。聚合物起所谓的蚀刻掩模的作用,而开口5形成于金属层4中,在开口5的底脚处露出电路板的基板。在这之后,也将聚合物膜从铜4之上除去。
阶段E(图1E):
在阶段E中,在基板中为微电路制作孔6。这些孔延伸穿过整个基板,从第一表面1a延伸至第二表面1b。举例来说,这些孔可以通过利用一铣床进行机械铣削而制作。举例来说,孔6也可以通过冲压加工而制作。孔6相对于电路板的导电图案4对准。在阶段B中制作的孔3也可用于帮助对准,但是这种对准方式也是相对于导电图案4来进行,因为导电图案4关于孔3具有特定的位置。
阶段F(图1F):
在阶段F中,在基板的第二表面1b上并在孔6上方制作一形成了一电绝缘的聚合物膜7。聚合物膜7的制作方式使得其具有足够的刚性以便保持其形状的主要特征,然而其并未硬化,因此可以通过将各个元件压入薄膜中而将它们附连于其上。聚合物膜还应当具有足够的刚性以便在以下过程阶段中,能够使压入膜中的元件保持基本上不可相对于基座运动。
举例来说,在阶段F中制作的聚合物膜可为一预浸处理型膜。
如果需要的话,一金属涂层8也可在阶段F中制作于聚合物膜7的顶部上。
在实例过程中,阶段F通过在电路板表面上层压一薄聚合物膜(例如,大约40μm)而执行,在其之上为一层铜(例如,大约5μm)。层压过程借助于压力和热来进行。在实例过程中,膜因此就是一种RCC(树脂涂敷的铜)箔。然后层压过程必须执行至未完成状态,以便使得聚合物并未完全硬化。这通过将层压温度设置成足够低并且/或者缩短热处理的持续时间来实现。
阶段G(图1G):
在阶段G中,微电路板18从基板的第一表面1a的这一侧装配于孔6中。装配过程可以使用一精密装配机来进行,微电路18相对于电路板的导电图案对准。象在阶段E中那样,在阶段B中制作的孔可以用来帮助对准。
微电路18的安装方式使得它们在孔6的“底部”中粘附于聚合物膜7上。进行装配的最适用方法是使用一个力来使得微电路18稍微推压入聚合物膜7内部,因此使得微电路18更好地保持就位。如果所装配的微电路18具有穿入聚合物膜7内部的接触突起9,则也有利于这个过程。
图3示出了一种有意思的替代实施例,其中微电路的接触突起9如此之长以致它们正好穿过聚合物膜7延伸至金属涂层8。在那种情况下,就不需要在聚合物膜7中制作孔(阶段K)以便在微电路中制作触点,因为孔在装配元件时形成。此外,孔的金属化阶段(阶段L)也可得以简化,因为接触突起9自动地形成穿过聚合物膜7的导体柱。在图3的实施例中,接触突起也可为尖锐形状,以便提高它们的刺穿能力。如果接触突起9足够长并且足够尖锐,则它们也可刺穿金属涂层8并且原则上在微电路18与金属涂层8之间形成一电触点。
阶段H(未示出):
在阶段H中,聚合物膜7借助于固化处理而硬化。固化处理基本上包括一热处理,但是这个过程也可采用除了加热以便使聚合物硬化的某些其它处理方法。如果需要的话,阶段H也可以省去,特别是在聚合物通过热处理而进行固化的情况下。然而,在这个阶段对聚合物进行硬化可防止在阶段I中微电路相对于基座运动。
阶段I(图1I):
在阶段I中,通过将为微电路制作的孔中充以填充材料10而将微电路固定于电路板的基板上。在实例过程中,这个阶段通过将铸造环氧树脂从电路板的第一表面(1a)散布于孔中并散布于微电路顶部上而进行。环氧树脂利用一刮刀来刮平并且通过在一高压锅中进行固化而得以硬化。同时,如果这个过程不包括阶段H的话,聚合物膜7也得以硬化。
阶段J(图1J):
在阶段J中,一聚合物膜11形成于电路板的第一表面(1a)上,随后一薄金属涂层12形成于聚合物膜之上。
在实例过程中,阶段J通过在电路板表面上层压一薄聚合物膜(例如,大约40μm)而执行,在其之上为一层铜(例如,大约5μm)。层压过程借助于压力和热来进行。在实例过程中,膜因此就是一种RCC(树脂涂敷的铜)箔。
举例来说,聚合物膜也可通过将呈液体形式的聚合物散布于电路板上来制作。因此,层压过程对阶段J来说并非必要。必要的是要将一绝缘层,通常为一聚合物膜,制作于电路板上,该电路板包含置入的元件,特别是置入的微电路。根据本发明,聚合物膜自身可为填充聚合物膜或非填充聚合物膜。聚合物膜也可涂敷上金属,但是这并非必要,因为导电表面也可以在以后制作于已经附连于电路板上的聚合物层之上。
阶段J使得可以在实例过程中使用在电路板制造中所用的常规型制造方法和工作阶段,然而仍能够将微电路和其它元件埋于电路板内。
阶段K(图1K):
在阶段K中,在聚合物膜7和11中(同时在导电箔8和12中)制作孔13,通过孔13可以与导电图案和电路板的馈通(导电材料4)以及与微电路建立接触。
举例来说,孔13可以使用激光或其它适用的方法来制作。在阶段D中制作的导电图案,或者在阶段B中制作的通孔可以用来进行对准。
阶段L(图1L):
阶段L与阶段C相对应。在阶段L中,在孔13中和电路板的表面上制作一导电层14。
在实例过程中,首先使用三阶段表面去污处理来清洁馈通(孔13)。在这之后,通过首先在聚合物上形成一催化SnPd表面然后在表面上沉积一薄层(大约2Fm)化学铜,而对馈通进行金属化。铜14的厚度通过电化学沉积处理而增大。
另外,馈通也可以充以导电膏或者利用某些其它适用的微通金属化方法来制作。
阶段M(图1M):
在阶段M中,按照与阶段D中相同的方式来形成一导电图案。
阶段N和O(图1N和10):
在阶段N和O中,一光刻聚合物14散布于电路板表面上并在聚合物14中形成所需的图案(按照与阶段D和M中类似的方式)。暴露过的聚合物膜显示出来,但是保持于电路板上的聚合物膜图案并未除去。
阶段P(图1P):
在阶段P中,对在先前阶段中形成的聚合物膜图案的连接区域进行涂敷16。举例来说,涂层16可以带有Ni/Au涂层或OSP(有机表面保护)。
图1的实例示出了一个过程,其可用来开发本发明。因此,本发明决不受限于上述的过程,相反,本发明包括很大一组不同的过程及其最终产品,在权利要求书的最大可能的范围内并考虑到等价解释。特别地,本发明决不受限于实例中所示的布图,相反,对于本发明所属领域的普通技术人员来说,很显然,根据本发明的过程可以用来制造许多种与此处所公开的实例大不相同的电路板。因此,图中的微电路和连接只是用于对制造过程进行示例说明。
因此,可以对以上所公开的实例的方法做出为数众多的改变,而不会偏离根据本发明的思想。这些改变可以涉及不同阶段中所述的制造方法,或者,举例来说,涉及各个阶段的相互顺序。例如,阶段B同样可以在阶段D之后进行,即程序可为将钻头对准于图案上,而非将图案对准于所钻的孔上。相应地,阶段D和E的顺序也可以倒换过来。然后就在形成导电图案之前制作元件孔6。在那种情况下,导电图案就相对于孔6(以及孔3)对准。不管阶段B、D和E的执行顺序,在阶段F中制作的聚合物膜7都覆盖着孔6和形成于基板的第二表面1b上的导电图案。
觉得需要的阶段也可以加入以上所公开的实例的过程中。举例来说,可以将一箔层压于电路板的第一侧(1a)上,该箔在阶段H中所进行的铸造过程中保护着电路板的表面。这种保护箔制造成覆盖着除了孔6之外的所有其它区域。保护箔在利用刮刀散布铸造环氧树脂时使电路板的表面保持清洁。保护箔可以在阶段I之前在适当的阶段中制作并且在铸造完成之后立即从电路板表面上除去。
借助于这种方法,还可以制造有待附连于电路板上的元件封装。这种封装也可包括若干互相电连接起来的半导体元件。
这种方法还可用于制造整个电模块。图1中所示的过程也可按照以下方式应用,即只在微电路的接触表面所处的电路板的第二侧(1b)上制作导电结构。
举例来说,在这种方法使得可以制造的电路板或电模块中,所用的基板的厚度处于50至200微米的范围内,而微电路的厚度处于50至150微米的范围内。举例来说,导体的间距可以在50至250微米的范围内变化,而微馈通的直径可为例如15至50微米。因此,一层式构造中的单块板的总厚度将会大约为100至300微米。
本发明还可以按照以下方式应用,即使得电路板互相叠放地进行装配,从而形成一多层式电路结构,在该多层式电路结构中,若干根据图1制造的电路板互相叠放地设置并且相互电连接在一起。互相叠放的电路板也可为如下这种电路板,其中导电结构只形成于电路板的第二侧1b上,但是其仍包括馈通,电触点也可通过这些馈通从电路板的第一侧形成于微电路上。图2示出了一种这样的过程。
图2示出了电路板之间的互相连接。在下文中,按阶段对这个过程进行描述。
阶段2A(图2A):
图2A示出了互相叠放的电路板。举例来说,最下面的电路板可以在图1的改变过的过程的阶段J之后获得。在这种情况下,图1的过程就通过省去阶段1C而改变。
举例来说,中间和上面的电路板可以在图1的改变过的过程的阶段M之后获得。在这种情况下,图1的过程通过省去阶段1C并且只在电路板的第二侧(1b)上执行阶段J、K和L而改变。
除了电路板之外,图2A还示出了置于电路板之间的预浸处理环氧树脂层21。
阶段2B(图2B):
在阶段2B中,电路板借助于预浸处理环氧树脂层21层压在一起。此外,在电路板的上表面上制作一涂有金属的聚合物膜22。这个过程与图1的过程的阶段J相对应。在实例过程中,涂有金属的聚合物膜22也位于电路板的上表面上。
阶段2C(图2C):
在阶段2C中,为了形成触点,在电路板中钻出孔23。
在阶段2C之后,举例来说,过程可以如下继续进行:
阶段2D:
在阶段2D中,导电材料按照与阶段1C相同的方式生长于电路板顶部上和通孔23中。
阶段2E:
在阶段2E中,按照与阶段1D中相同的方式对电路板表面上的导电层制作图案。
阶段2F:
在阶段2F中,按照与阶段1N和10中相同的方式,一光刻聚合物散布于电路板表面上并在聚合物中形成所需的图案。暴露过的聚合物膜显示出来,但是保持于电路板上的聚合物膜图案并未除去。
阶段2G:
在阶段2G中,按照与阶段1P中相同的方式,对在先前阶段中形成的聚合物膜图案的连接区域进行金属化。
以图2的实例为基础,很显然,这种方法也可用于制造许多种三维电路结构。举例来说,这种方法可以用于使得若干存储电路相互叠放,从而形成一包含若干存储电路的封装,其中存储电路互相连接并且形成一工作整体。这种封装可称为三维多片模块。这种模块中的芯片可以自由选择并且芯片之间的触点可以根据选定的电路简便地制作。
本发明还使得电磁保护装置能够环绕着置入于基座中的元件制作。这是因为图1的方法可改成使得在阶段1E中所示的孔6可连同在阶段1B中所进行的孔3的制作一起制作。在那种情况下,在阶段1C中制作的导电层4也将覆盖着为元件制作的孔6的侧壁。图4A示出了在按照上述方式改变的过程中的阶段1F之后的基座结构的剖面。
在图4A中所示的中间阶段之后,可以通过按照与阶段1G相似的方式装配微电路,象阶段1H中那样将聚合物膜硬化,并且按照与阶段1I相似的方式来附连微电路而得以继续进行这个过程。在此之后,可以按照与阶段1J相似的方式在电路板的第一表面上形成聚合物和金属箔。图4B示出了在这些过程阶段之后基座结构的一个实例剖面。
在图4B中所示的中间阶段之后,可以通过在聚合物膜中制作与阶段1K的孔相似的孔以制作触点而得以继续进行这个过程。在此之后,可以按照与阶段1L相似的方式在孔中和板表面上制作一导电层。图4C示出了在这些过程阶段之后基座结构的一个实例剖面。为了清楚起见,在孔中和板表面上按照与阶段1L相似的方式制作的导电层用黑色突出显示。
在图4C中所示的中间阶段之后,可以通过象在阶段1M中那样对板表面上的导电层制作图案并且象在阶段1N中一样涂敷板表面而得以继续进行这个过程。在这些阶段之后,通过几乎没有破损的金属箔来包围着微电路,这些金属箔形成了一有效的保护装置以防由电磁相互作用所引起的干扰。这种构造示于图4D中。在图4D中所示的中间阶段之后,执行与阶段10和1P相对应的阶段,在其中一保护箔和连接制作于电路板表面上。
在图4D中,用黑色突出显示了保护着微电路的金属层的剖面。此外,微电路的基底用网纹突出显示。网纹用于提醒为微电路制作的孔的所有侧面都由金属箔所覆盖。因此,微电路就由没有破损的金属箔沿侧向包围着。除此以外,一金属板可设计于微电路上方,其在制作电路板的导电图案时一起制作。类似地,在微电路之下制作一尽可能完整的金属箔。举例来说,在微电路之下制作触点意味着必须在金属箔中制作小间隙,如图4D中所示。然而,这些间隙可以制成沿侧向很窄或者相应地沿垂直方向很薄,以便使得它们不会削弱防止电磁干扰的保护效果。
在研究图4D的实例时,还必须考虑到最终结构还包括与图中所示的平面成直角延伸的部件。这种成直角延伸的结构由连接于图4D的左手微电路的左手边上的隆起触点上的导体来表示,其从沿侧向包围着微电路的金属箔与微电路之下的导电层之间向观察者延伸。
因此,图4D所示的方案就提供了一种具有良好电磁干扰防护性能的微电路。由于保护装置直接环绕着微电路制作,因此这种构造还能防止包含于电路板中的元件之间产生的相互干扰。大多数电磁保护结构也可以接地,因为沿侧向包围着微电路的金属箔可与电路上方的金属板保持电连接。而电路板的连接又可以设计成使得金属板通过电路板的导电结构接地。

Claims (26)

1.一种用于将至少一个元件置入于一基座中的方法,该元件在其第一表面上具有接触区域,这种方法包括:
取得基座的基板,该基板具有一第一表面和一第二表面,
在基板上制作导电图案并且为该至少一个元件制作至少一个孔,以便使得每个孔在第一表面和第二表面之间延伸穿过基板,
将一绝缘聚合物层散布于基板的第二表面上,以便使得绝缘聚合物层覆盖着为元件所制作的至少一个孔,
将至少一个元件置于至少一个孔中,以便使得该元件的接触区域相对于在基板上所制作的导电图案对准并且该元件的第一表面压靠在绝缘聚合物层上,以及
将绝缘聚合物层硬化。
2.根据权利要求1所述的方法,其中元件的第一表面被压于未硬化的绝缘聚合物层中。
3.根据权利要求1所述的方法,其中元件的第一表面被压于部分硬化的绝缘聚合物层中。
4.根据权利要求1-3中任一项所述的方法,其中绝缘聚合物层通过将一树脂涂敷的铜箔置于基板的第二表面上而制造。
5.根据权利要求1-3中任一项所述的方法,其中绝缘聚合物层通过将一预浸处理环氧树脂膜散布于基板的第二表面上而制造。
6.根据权利要求1-3中任一项所述的方法,其中绝缘材料在为元件制作的孔的侧壁上生长,以便环绕着元件形成干扰保护。
7.根据权利要求1-3中任一项所述的方法,其中元件的接触区域具有与其相连接的接触突起,并且元件置于孔中的方式使得接触突起推压入绝缘聚合物层的内部。
8.根据权利要求1-3中任一项所述的方法,其中元件的接触区域具有与其相连接的接触突起,接触突起的高度至少同绝缘聚合物层的厚度一样大,并且元件置于孔中的方式使得接触突起穿过了绝缘聚合物层。
9.根据权利要求1-3中任一项所述的方法,其中
在硬化的绝缘聚合物层中为元件制作接触开口,以及
在接触开口中和绝缘聚合物层的顶部上制作用于与元件形成电接触的导体。
10.根据权利要求1-3中任一项所述的方法,其中在基板的至少第二表面(1b)上制作导电图案,并且其中待散布于基板的第二表面(1b)上的绝缘聚合物层的散布方式使得其覆盖着在第二表面(1b)上制作的导电图案。
11.根据权利要求1-3中任一项所述的方法,其中元件的第一表面被推压入绝缘聚合物层中,该绝缘聚合物层与由导电层形成的导电图案相接触。
12.根据权利要求1-3中任一项所述的方法,其中至少一个组导电图案位于绝缘聚合物层与电路板的基板之间,元件的第一表面被推压靠在该绝缘聚合物层上。
13.根据权利要求1-3中任一项所述的方法,其中基板由绝缘材料构成。
14.根据权利要求1-3中任一项所述的方法,其中元件通过利用填充材料填充制作于基板上的孔而固定就位。
15.根据权利要求1-3中任一项所述的方法,其中元件为一微电路,并且在将微电路置于基板上所制作的孔中之后,从基板的第一表面的方向形成与微电路的电触点。
16.根据权利要求1-3中任一项所述的方法,其中通过在元件的接触区域中或在其接触突起的顶部上生长导电材料而形成与元件的电触点。
17.根据权利要求1-3中任一项所述的方法,其中元件为一微电路,并且在将微电路置于基板上所制作的孔中之后,使用电路板制造技术而无需焊料来形成与微电路的电触点。
18.根据权利要求1-3中任一项所述的方法,其中一个以上的元件置入于基座中,并且在基板中为每一个待置入于基座中的元件制作一分离的孔,并且每一个待置入于基座中的元件位于其自己的孔中。
19.根据权利要求1-3中任一项所述的方法,其中制造了一多层式结构,其中有至少四个导电层互相叠放起来。
20.根据权利要求1-3中任一项所述的方法,其中制造了一第一基座和至少一个第二基座,至少两个微电路置入于该第一基座中,并且至少两个微电路置入于该至少一个第二基座中,并且这些基座互相叠放地装配和固定以便使得基座相对彼此对准。
21.根据权利要求1-3中任一项所述的方法,其中
制造第一和第二基座以及一中间层,
第二基座置于第一基座上方并且第二基座相对于第一基座对准,
中间层置于第一和第二基座之间,以及
第一和第二基座借助于中间层而互相层叠。
22.根据权利要求21所述的方法,其中
制造至少一个第三基座并为每个第三基座制造一中间层,
每个第三基座又置于第一和第二基座上方并且每个第三基座相对于下方的基座之一对准,
一中间层置于每个第三基座下方,以及
第一、第二和每个第三基座借助于中间层而互相层叠。
23.根据权利要求21中任一项所述的方法,其中穿过互相叠放地固定的各基座钻出馈通孔,并且在所钻的孔中制作导体以便将每个基座的电子电路互相连接起来从而形成一工作整体。
24.根据权利要求1-3中任一项所述的方法,其中,在处理过程中,电路板、元件、或直接连接于元件上的导电层的温度低于200℃。
25.根据权利要求24所述的方法,其中,在处理过程中,电路板、元件、或直接连接于元件上的导电层的温度处于20-85℃的范围内。
26.一种电子模块,其利用根据权利要求1-25中任一项所述的方法制造。
CN038030985A 2002-01-31 2003-01-28 用于将元件置入于基座中的方法 Expired - Lifetime CN1625926B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI20020191 2002-01-31
FI20020191A FI119215B (fi) 2002-01-31 2002-01-31 Menetelmä komponentin upottamiseksi alustaan ja elektroniikkamoduuli
PCT/FI2003/000065 WO2003065779A1 (en) 2002-01-31 2003-01-28 Method for embedding a component in a base

Publications (2)

Publication Number Publication Date
CN1625926A CN1625926A (zh) 2005-06-08
CN1625926B true CN1625926B (zh) 2010-05-26

Family

ID=8563008

Family Applications (1)

Application Number Title Priority Date Filing Date
CN038030985A Expired - Lifetime CN1625926B (zh) 2002-01-31 2003-01-28 用于将元件置入于基座中的方法

Country Status (7)

Country Link
US (4) US7294529B2 (zh)
EP (1) EP1477048B1 (zh)
CN (1) CN1625926B (zh)
AT (1) ATE513453T1 (zh)
FI (1) FI119215B (zh)
RU (1) RU2327311C2 (zh)
WO (1) WO2003065779A1 (zh)

Families Citing this family (107)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3617647B2 (ja) * 2002-11-08 2005-02-09 沖電気工業株式会社 半導体装置及びその製造方法
US8222723B2 (en) * 2003-04-01 2012-07-17 Imbera Electronics Oy Electric module having a conductive pattern layer
US6940705B2 (en) * 2003-07-25 2005-09-06 Taiwan Semiconductor Manufacturing Company, Ltd. Capacitor with enhanced performance and method of manufacture
US7078742B2 (en) 2003-07-25 2006-07-18 Taiwan Semiconductor Manufacturing Co., Ltd. Strained-channel semiconductor structure and method of fabricating the same
US6936881B2 (en) 2003-07-25 2005-08-30 Taiwan Semiconductor Manufacturing Company, Ltd. Capacitor that includes high permittivity capacitor dielectric
US7112495B2 (en) 2003-08-15 2006-09-26 Taiwan Semiconductor Manufacturing Company, Ltd. Structure and method of a strained channel transistor and a second semiconductor component in an integrated circuit
FI20031341A (fi) 2003-09-18 2005-03-19 Imbera Electronics Oy Menetelmä elektroniikkamoduulin valmistamiseksi
US7888201B2 (en) 2003-11-04 2011-02-15 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor-on-insulator SRAM configured using partially-depleted and fully-depleted transistors
FI117814B (fi) 2004-06-15 2007-02-28 Imbera Electronics Oy Menetelmä elektroniikkamoduulin valmistamiseksi
FI117812B (fi) * 2004-08-05 2007-02-28 Imbera Electronics Oy Komponentin sisältävän kerroksen valmistaminen
US8487194B2 (en) * 2004-08-05 2013-07-16 Imbera Electronics Oy Circuit board including an embedded component
KR100594299B1 (ko) * 2004-10-29 2006-06-30 삼성전자주식회사 유연성 인쇄 회로 및 이것이 구비된 하드 디스크 드라이브
TWI256694B (en) * 2004-11-19 2006-06-11 Ind Tech Res Inst Structure with embedded active components and manufacturing method thereof
US20090008792A1 (en) * 2004-11-19 2009-01-08 Industrial Technology Research Institute Three-dimensional chip-stack package and active component on a substrate
FI117369B (fi) * 2004-11-26 2006-09-15 Imbera Electronics Oy Menetelmä elektroniikkamoduulin valmistamiseksi
FI119714B (fi) 2005-06-16 2009-02-13 Imbera Electronics Oy Piirilevyrakenne ja menetelmä piirilevyrakenteen valmistamiseksi
FI122128B (fi) * 2005-06-16 2011-08-31 Imbera Electronics Oy Menetelmä piirilevyrakenteen valmistamiseksi
US8225499B2 (en) 2005-06-16 2012-07-24 Imbera Electronics Oy Method for manufacturing a circuit board structure, and a circuit board structure
US8072059B2 (en) * 2006-04-19 2011-12-06 Stats Chippac, Ltd. Semiconductor device and method of forming UBM fixed relative to interconnect structure for alignment of semiconductor die
US8546929B2 (en) * 2006-04-19 2013-10-01 Stats Chippac Ltd. Embedded integrated circuit package-on-package system
US7859098B2 (en) * 2006-04-19 2010-12-28 Stats Chippac Ltd. Embedded integrated circuit package system
JP3942190B1 (ja) * 2006-04-25 2007-07-11 国立大学法人九州工業大学 両面電極構造の半導体装置及びその製造方法
US8558278B2 (en) 2007-01-16 2013-10-15 Taiwan Semiconductor Manufacturing Company, Ltd. Strained transistor with optimized drive current and method of forming
DE102007024189A1 (de) * 2007-05-24 2008-11-27 Robert Bosch Gmbh Verfahren zur Herstellung einer elektronischen Baugruppe
CN101690434B (zh) * 2007-06-26 2011-08-17 株式会社村田制作所 元器件内置基板的制造方法
TWI360207B (en) 2007-10-22 2012-03-11 Advanced Semiconductor Eng Chip package structure and method of manufacturing
US7943961B2 (en) 2008-03-13 2011-05-17 Taiwan Semiconductor Manufacturing Company, Ltd. Strain bars in stressed layers of MOS devices
DE102008000842A1 (de) * 2008-03-27 2009-10-01 Robert Bosch Gmbh Verfahren zur Herstellung einer elektronischen Baugruppe
US8259454B2 (en) * 2008-04-14 2012-09-04 General Electric Company Interconnect structure including hybrid frame panel
US8264085B2 (en) 2008-05-05 2012-09-11 Infineon Technologies Ag Semiconductor device package interconnections
AT10247U8 (de) 2008-05-30 2008-12-15 Austria Tech & System Tech Verfahren zur integration wenigstens eines elektronischen bauteils in eine leiterplatte sowie leiterplatte
US7808051B2 (en) 2008-09-29 2010-10-05 Taiwan Semiconductor Manufacturing Company, Ltd. Standard cell without OD space effect in Y-direction
KR101055471B1 (ko) * 2008-09-29 2011-08-08 삼성전기주식회사 전자소자 내장형 인쇄회로기판 및 그 제조방법
US8114708B2 (en) * 2008-09-30 2012-02-14 General Electric Company System and method for pre-patterned embedded chip build-up
DE102008043122A1 (de) * 2008-10-23 2010-04-29 Robert Bosch Gmbh Elektrische Schaltungsanordnung sowie Verfahren zum Herstellen einer elektrischen Schaltungsanordnung
WO2010048653A2 (de) 2008-10-30 2010-05-06 At & S Austria Technologie & Systemtechnik Aktiengesellschaft Verfahren zur integration eines elektronischen bauteils in eine leiterplatte
US8124449B2 (en) 2008-12-02 2012-02-28 Infineon Technologies Ag Device including a semiconductor chip and metal foils
US7935570B2 (en) * 2008-12-10 2011-05-03 Stats Chippac, Ltd. Semiconductor device and method of embedding integrated passive devices into the package electrically interconnected using conductive pillars
TWI417993B (zh) * 2009-02-04 2013-12-01 Unimicron Technology Corp 具凹穴結構的封裝基板、半導體封裝體及其製作方法
US7977785B2 (en) * 2009-03-05 2011-07-12 Freescale Semiconductor, Inc. Electronic device including dies, a dielectric layer, and a encapsulating layer
US8049114B2 (en) * 2009-03-22 2011-11-01 Unimicron Technology Corp. Package substrate with a cavity, semiconductor package and fabrication method thereof
JP5372579B2 (ja) * 2009-04-10 2013-12-18 新光電気工業株式会社 半導体装置及びその製造方法、並びに電子装置
TWI456715B (zh) 2009-06-19 2014-10-11 Advanced Semiconductor Eng 晶片封裝結構及其製造方法
KR101170878B1 (ko) * 2009-06-29 2012-08-02 삼성전기주식회사 반도체 칩 패키지 및 그의 제조방법
DE102009032219A1 (de) * 2009-07-06 2011-02-24 Institut Für Mikroelektronik Stuttgart Verfahren zum Herstellen einer integrierten Schaltung und resultierender Folienchip
JP5296636B2 (ja) * 2009-08-21 2013-09-25 新光電気工業株式会社 半導体パッケージの製造方法
US8569894B2 (en) 2010-01-13 2013-10-29 Advanced Semiconductor Engineering, Inc. Semiconductor package with single sided substrate design and manufacturing methods thereof
US8320134B2 (en) 2010-02-05 2012-11-27 Advanced Semiconductor Engineering, Inc. Embedded component substrate and manufacturing methods thereof
TWI411075B (zh) 2010-03-22 2013-10-01 Advanced Semiconductor Eng 半導體封裝件及其製造方法
WO2012005394A1 (en) * 2010-07-09 2012-01-12 Lg Innotek Co., Ltd. Printed circuit board and method of manufacturing the same
US8735735B2 (en) 2010-07-23 2014-05-27 Ge Embedded Electronics Oy Electronic module with embedded jumper conductor
US8941222B2 (en) 2010-11-11 2015-01-27 Advanced Semiconductor Engineering Inc. Wafer level semiconductor package and manufacturing methods thereof
US8680683B1 (en) 2010-11-30 2014-03-25 Triquint Semiconductor, Inc. Wafer level package with embedded passive components and method of manufacturing
US9406658B2 (en) 2010-12-17 2016-08-02 Advanced Semiconductor Engineering, Inc. Embedded component device and manufacturing methods thereof
AT13055U1 (de) 2011-01-26 2013-05-15 Austria Tech & System Tech Verfahren zur integration eines elektronischen bauteils in eine leiterplatte oder ein leiterplatten-zwischenprodukt sowie leiterplatte oder leiterplatten-zwischenprodukt
US8923008B2 (en) * 2011-03-08 2014-12-30 Ibiden Co., Ltd. Circuit board and method for manufacturing circuit board
US8487426B2 (en) 2011-03-15 2013-07-16 Advanced Semiconductor Engineering, Inc. Semiconductor package with embedded die and manufacturing methods thereof
US8603858B2 (en) 2011-07-12 2013-12-10 Infineon Technologies Ag Method for manufacturing a semiconductor package
AT13432U1 (de) 2011-08-31 2013-12-15 Austria Tech & System Tech Verfahren zur integration eines bauteils in eine leiterplatte oder ein leiterplatten-zwischenprodukt sowie leiterplatte oder leiterplatten-zwischenprodukt
AT13436U1 (de) 2011-08-31 2013-12-15 Austria Tech & System Tech Verfahren zur integration eines bauteils in eine leiterplatte oder ein leiterplatten-zwischenprodukt sowie leiterplatte oder leiterplatten-zwischenprodukt
US11445617B2 (en) * 2011-10-31 2022-09-13 Unimicron Technology Corp. Package structure and manufacturing method thereof
KR101233640B1 (ko) 2011-11-28 2013-02-15 대덕전자 주식회사 내장형 인쇄회로기판의 수율 향상방법
DE102011089415A1 (de) * 2011-12-21 2013-06-27 Siemens Aktiengesellschaft Schaltungsträger mit einem Leitpfad und einer elektrischen Schirmung und Verfahren zu dessen Herstellung
DE102011089927A1 (de) * 2011-12-27 2013-06-27 Robert Bosch Gmbh Kontaktsystem mit einem Verbindungsmittel und Verfahren
US10327333B2 (en) * 2012-03-01 2019-06-18 Koninklijke Philips N.V. Electronic circuit arrangement and method of manufacturing the same
US9281260B2 (en) * 2012-03-08 2016-03-08 Infineon Technologies Ag Semiconductor packages and methods of forming the same
US8901730B2 (en) 2012-05-03 2014-12-02 Taiwan Semiconductor Manufacturing Company, Ltd. Methods and apparatus for package on package devices
TWI540768B (zh) * 2012-12-21 2016-07-01 鴻海精密工業股份有限公司 發光晶片組合及其製造方法
AT514074B1 (de) 2013-04-02 2014-10-15 Austria Tech & System Tech Verfahren zum Herstellen eines Leiterplattenelements
US9793218B2 (en) * 2013-05-14 2017-10-17 Meiko Electronics Co., Ltd. Method for manufacturing device embedded substrate, and device embedded substrate
US8912663B1 (en) 2013-06-28 2014-12-16 Delta Electronics, Inc. Embedded package structure and method for manufacturing thereof
US8828807B1 (en) 2013-07-17 2014-09-09 Infineon Technologies Ag Method of packaging integrated circuits and a molded substrate with non-functional placeholders embedded in a molding compound
US20150041993A1 (en) * 2013-08-06 2015-02-12 Infineon Technologies Ag Method for manufacturing a chip arrangement, and a chip arrangement
US9275878B2 (en) 2013-10-01 2016-03-01 Infineon Technologies Ag Metal redistribution layer for molded substrates
US9171795B2 (en) * 2013-12-16 2015-10-27 Stats Chippac Ltd. Integrated circuit packaging system with embedded component and method of manufacture thereof
DE102014101366B3 (de) * 2014-02-04 2015-05-13 Infineon Technologies Ag Chip-Montage an über Chip hinausstehender Adhäsions- bzw. Dielektrikumsschicht auf Substrat
US10542917B2 (en) 2014-02-10 2020-01-28 Battelle Memorial Institute Printed circuit board with embedded sensor
SG10201400396WA (en) 2014-03-05 2015-10-29 Delta Electronics Int’L Singapore Pte Ltd Package structure and stacked package module with the same
SG10201400390YA (en) 2014-03-05 2015-10-29 Delta Electronics Int L Singapore Pte Ltd Package structure
RU2572588C1 (ru) * 2014-08-19 2016-01-20 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет "Московский институт электронной техники" Способ изготовления электронных узлов на гибком носителе без процессов пайки и сварки
CN104241219B (zh) 2014-08-26 2019-06-21 日月光半导体制造股份有限公司 元件嵌入式封装结构和其制造方法
RU2576666C1 (ru) * 2014-08-28 2016-03-10 Публичное акционерное общество "Радиофизика" Способ монтажа мощного полупроводникового элемента
TWI778938B (zh) 2015-03-16 2022-10-01 美商艾馬克科技公司 半導體裝置和製造其之方法
KR101678418B1 (ko) * 2015-03-16 2016-11-23 한국생산기술연구원 3차원 레이저 스캐닝 시스템
RU2597210C1 (ru) * 2015-05-28 2016-09-10 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет "Московский институт электронной техники" Способ изготовления микроэлектронного узла на пластичном основании
WO2017095419A1 (en) * 2015-12-03 2017-06-08 Intel Corporation A hybrid microelectronic substrate and methods for fabricating the same
WO2017099750A1 (en) 2015-12-09 2017-06-15 Intel Corporation Hybrid microelectronic substrate and methods for fabricating the same
CN107295747B (zh) 2016-03-31 2021-03-12 奥特斯(中国)有限公司 器件载体及制造器件载体的方法
CN107295746B (zh) 2016-03-31 2021-06-15 奥特斯(中国)有限公司 器件载体及其制造方法
KR20170112363A (ko) * 2016-03-31 2017-10-12 삼성전기주식회사 전자부품 패키지 및 그 제조방법
RU2639720C2 (ru) * 2016-06-14 2017-12-22 Федеральное государственное унитарное предприятие "Научно-производственный центр автоматики и приборостроения имени академика Н.А. Пилюгина" (ФГУП "НПЦАП") Печатная плата с внутренним монтажом элементов и способ ее изготовления
JP6625491B2 (ja) * 2016-06-29 2019-12-25 新光電気工業株式会社 配線基板、半導体装置、配線基板の製造方法
US9887167B1 (en) 2016-09-19 2018-02-06 Advanced Semiconductor Engineering, Inc. Embedded component package structure and method of manufacturing the same
JP6711229B2 (ja) 2016-09-30 2020-06-17 日亜化学工業株式会社 プリント基板の製造方法及び発光装置の製造方法
US10700035B2 (en) 2016-11-04 2020-06-30 General Electric Company Stacked electronics package and method of manufacturing thereof
US9966361B1 (en) 2016-11-04 2018-05-08 General Electric Company Electronics package having a multi-thickness conductor layer and method of manufacturing thereof
US9966371B1 (en) 2016-11-04 2018-05-08 General Electric Company Electronics package having a multi-thickness conductor layer and method of manufacturing thereof
US10312194B2 (en) 2016-11-04 2019-06-04 General Electric Company Stacked electronics package and method of manufacturing thereof
US10206286B2 (en) * 2017-06-26 2019-02-12 Infineon Technologies Austria Ag Embedding into printed circuit board with drilling
US10446521B2 (en) * 2017-11-07 2019-10-15 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated fan-out package and method of fabricating an integrated fan-out package
SG10201802515PA (en) 2018-03-27 2019-10-30 Delta Electronics Int’L Singapore Pte Ltd Packaging process
US10497648B2 (en) 2018-04-03 2019-12-03 General Electric Company Embedded electronics package with multi-thickness interconnect structure and method of making same
KR20200048971A (ko) * 2018-10-31 2020-05-08 삼성전자주식회사 반도체 패키지 및 이를 포함하는 안테나 모듈
RU196513U1 (ru) * 2019-12-19 2020-03-03 Федеральное государственное бюджетное образовательное учреждение высшего образования "МИРЭА - Российский технологический университет" Высокоплотный электронный модуль
CN111128977A (zh) * 2019-12-25 2020-05-08 华进半导体封装先导技术研发中心有限公司 一种多层芯片的封装结构和封装方法
KR20220027537A (ko) * 2020-08-27 2022-03-08 삼성전자주식회사 팬-아웃 타입 반도체 패키지
US11978699B2 (en) * 2021-08-19 2024-05-07 Texas Instruments Incorporated Electronic device multilevel package substrate for improved electromigration preformance

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4246595A (en) * 1977-03-08 1981-01-20 Matsushita Electric Industrial Co., Ltd. Electronics circuit device and method of making the same
US5306670A (en) * 1993-02-09 1994-04-26 Texas Instruments Incorporated Multi-chip integrated circuit module and method for fabrication thereof

Family Cites Families (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4783695A (en) 1986-09-26 1988-11-08 General Electric Company Multichip integrated circuit packaging configuration and method
US4894115A (en) 1989-02-14 1990-01-16 General Electric Company Laser beam scanning method for forming via holes in polymer materials
US5208188A (en) * 1989-10-02 1993-05-04 Advanced Micro Devices, Inc. Process for making a multilayer lead frame assembly for an integrated circuit structure and multilayer integrated circuit die package formed by such process
JPH0744320B2 (ja) 1989-10-20 1995-05-15 松下電器産業株式会社 樹脂回路基板及びその製造方法
US5227338A (en) * 1990-04-30 1993-07-13 International Business Machines Corporation Three-dimensional memory card structure with internal direct chip attachment
JP3094481B2 (ja) 1991-03-13 2000-10-03 松下電器産業株式会社 電子回路装置とその製造方法
US5250843A (en) 1991-03-27 1993-10-05 Integrated System Assemblies Corp. Multichip integrated circuit modules
US5162613A (en) * 1991-07-01 1992-11-10 At&T Bell Laboratories Integrated circuit interconnection technique
US5102829A (en) * 1991-07-22 1992-04-07 At&T Bell Laboratories Plastic pin grid array package
US5216806A (en) * 1992-09-01 1993-06-08 Atmel Corporation Method of forming a chip package and package interconnects
US5353498A (en) 1993-02-08 1994-10-11 General Electric Company Method for fabricating an integrated circuit module
US5353195A (en) 1993-07-09 1994-10-04 General Electric Company Integral power and ground structure for multi-chip modules
EP0637070B1 (en) * 1993-07-28 1997-09-24 The Whitaker Corporation Perimeter independent precision locating member for a semiconductor chip and method of making said member
JPH08167630A (ja) 1994-12-15 1996-06-25 Hitachi Ltd チップ接続構造
EP0774888B1 (en) 1995-11-16 2003-03-19 Matsushita Electric Industrial Co., Ltd Printed wiring board and assembly of the same
US5869869A (en) * 1996-01-31 1999-02-09 Lsi Logic Corporation Microelectronic device with thin film electrostatic discharge protection structure
US5729049A (en) * 1996-03-19 1998-03-17 Micron Technology, Inc. Tape under frame for conventional-type IC package assembly
JP3345878B2 (ja) * 1997-02-17 2002-11-18 株式会社デンソー 電子回路装置の製造方法
US5943216A (en) 1997-06-03 1999-08-24 Photo Opto Electronic Technologies Apparatus for providing a two-sided, cavity, inverted-mounted component circuit board
US5919329A (en) * 1997-10-14 1999-07-06 Gore Enterprise Holdings, Inc. Method for assembling an integrated circuit chip package having at least one semiconductor device
US6038133A (en) 1997-11-25 2000-03-14 Matsushita Electric Industrial Co., Ltd. Circuit component built-in module and method for producing the same
US6495394B1 (en) * 1999-02-16 2002-12-17 Sumitomo Metal (Smi) Electronics Devices Inc. Chip package and method for manufacturing the same
US6172419B1 (en) * 1998-02-24 2001-01-09 Micron Technology, Inc. Low profile ball grid array package
US6131269A (en) * 1998-05-18 2000-10-17 Trw Inc. Circuit isolation technique for RF and millimeter-wave modules
US6239485B1 (en) * 1998-11-13 2001-05-29 Fujitsu Limited Reduced cross-talk noise high density signal interposer with power and ground wrap
JP2000311229A (ja) 1999-04-27 2000-11-07 Hitachi Ltd Icカード及びその製造方法
JP3575001B2 (ja) * 1999-05-07 2004-10-06 アムコー テクノロジー コリア インコーポレーティド 半導体パッケージ及びその製造方法
JP2001053447A (ja) 1999-08-05 2001-02-23 Iwaki Denshi Kk 部品内蔵型多層配線基板およびその製造方法
US6312972B1 (en) * 1999-08-09 2001-11-06 International Business Machines Corporation Pre-bond encapsulation of area array terminated chip and wafer scale packages
US6284564B1 (en) 1999-09-20 2001-09-04 Lockheed Martin Corp. HDI chip attachment method for reduced processing
US6271469B1 (en) 1999-11-12 2001-08-07 Intel Corporation Direct build-up layer on an encapsulated die package
US6154366A (en) 1999-11-23 2000-11-28 Intel Corporation Structures and processes for fabricating moisture resistant chip-on-flex packages
US6538210B2 (en) 1999-12-20 2003-03-25 Matsushita Electric Industrial Co., Ltd. Circuit component built-in module, radio device having the same, and method for producing the same
US6475877B1 (en) 1999-12-22 2002-11-05 General Electric Company Method for aligning die to interconnect metal on flex substrate
JP3809053B2 (ja) 2000-01-20 2006-08-16 新光電気工業株式会社 電子部品パッケージ
JP4685251B2 (ja) 2000-02-09 2011-05-18 日本特殊陶業株式会社 配線基板の製造方法
US6396148B1 (en) 2000-02-10 2002-05-28 Epic Technologies, Inc. Electroless metal connection structures and methods
JP2002016327A (ja) 2000-04-24 2002-01-18 Ngk Spark Plug Co Ltd 配線基板およびその製造方法
US6404043B1 (en) * 2000-06-21 2002-06-11 Dense-Pac Microsystems, Inc. Panel stacking of BGA devices to form three-dimensional modules
US6292366B1 (en) 2000-06-26 2001-09-18 Intel Corporation Printed circuit board with embedded integrated circuit
US20020020898A1 (en) * 2000-08-16 2002-02-21 Vu Quat T. Microelectronic substrates with integrated devices
US6350633B1 (en) 2000-08-22 2002-02-26 Charles W. C. Lin Semiconductor chip assembly with simultaneously electroplated contact terminal and connection joint
US6562657B1 (en) 2000-08-22 2003-05-13 Charles W. C. Lin Semiconductor chip assembly with simultaneously electrolessly plated contact terminal and connection joint
US6489185B1 (en) 2000-09-13 2002-12-03 Intel Corporation Protective film for the fabrication of direct build-up layers on an encapsulated die package
JP3554533B2 (ja) * 2000-10-13 2004-08-18 シャープ株式会社 チップオンフィルム用テープおよび半導体装置
JP2002202025A (ja) * 2000-11-06 2002-07-19 Auto Network Gijutsu Kenkyusho:Kk インジェクタ一体型モジュール
JP2002158307A (ja) 2000-11-22 2002-05-31 Toshiba Corp 半導体装置及びその製造方法
JP2003152317A (ja) * 2000-12-25 2003-05-23 Ngk Spark Plug Co Ltd 配線基板
TW511405B (en) 2000-12-27 2002-11-21 Matsushita Electric Ind Co Ltd Device built-in module and manufacturing method thereof
TW511415B (en) 2001-01-19 2002-11-21 Matsushita Electric Ind Co Ltd Component built-in module and its manufacturing method
SG100635A1 (en) * 2001-03-09 2003-12-26 Micron Technology Inc Die support structure
US6512182B2 (en) 2001-03-12 2003-01-28 Ngk Spark Plug Co., Ltd. Wiring circuit board and method for producing same
TW579581B (en) * 2001-03-21 2004-03-11 Ultratera Corp Semiconductor device with chip separated from substrate and its manufacturing method
US6537848B2 (en) * 2001-05-30 2003-03-25 St. Assembly Test Services Ltd. Super thin/super thermal ball grid array package
JP2003037205A (ja) 2001-07-23 2003-02-07 Sony Corp Icチップ内蔵多層基板及びその製造方法
TW550997B (en) * 2001-10-18 2003-09-01 Matsushita Electric Ind Co Ltd Module with built-in components and the manufacturing method thereof
TW200302685A (en) 2002-01-23 2003-08-01 Matsushita Electric Ind Co Ltd Circuit component built-in module and method of manufacturing the same
TWI237883B (en) * 2004-05-11 2005-08-11 Via Tech Inc Chip embedded package structure and process thereof
TWI251910B (en) * 2004-06-29 2006-03-21 Phoenix Prec Technology Corp Semiconductor device buried in a carrier and a method for fabricating the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4246595A (en) * 1977-03-08 1981-01-20 Matsushita Electric Industrial Co., Ltd. Electronics circuit device and method of making the same
US5306670A (en) * 1993-02-09 1994-04-26 Texas Instruments Incorporated Multi-chip integrated circuit module and method for fabrication thereof

Also Published As

Publication number Publication date
RU2004126136A (ru) 2005-05-27
US20070206366A1 (en) 2007-09-06
US20110266041A1 (en) 2011-11-03
US8368201B2 (en) 2013-02-05
CN1625926A (zh) 2005-06-08
ATE513453T1 (de) 2011-07-15
FI20020191A0 (fi) 2002-01-31
FI119215B (fi) 2008-08-29
RU2327311C2 (ru) 2008-06-20
US20080036093A1 (en) 2008-02-14
US7732909B2 (en) 2010-06-08
FI20020191A (fi) 2003-08-01
US7989944B2 (en) 2011-08-02
EP1477048B1 (en) 2011-06-15
US7294529B2 (en) 2007-11-13
EP1477048A1 (en) 2004-11-17
US20050224988A1 (en) 2005-10-13
WO2003065779A1 (en) 2003-08-07

Similar Documents

Publication Publication Date Title
CN1625926B (zh) 用于将元件置入于基座中的方法
CN100566511C (zh) 用于将元件置入于基座中并且形成接触的方法
KR100687976B1 (ko) 전자 모듈 및 그의 제조 방법
CN101027948B (zh) 电子模块及其制造方法
CN101010994B (zh) 制造电子模块的方法
JP2007535156A (ja) 埋込み構成要素からの熱伝導
US8322596B2 (en) Wiring substrate manufacturing method
KR102628100B1 (ko) 내장된 칩을 구비하는 반도체 패키지 및 이의 제조 방법
CN102263076B (zh) 封装结构及形成封装结构的方法
US6506631B2 (en) Method for manufacturing integrated circuits and semiconductor wafer which has integrated circuits

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CP03 Change of name, title or address

Address after: Helsinki

Patentee after: GE Embedded Electronics OY

Address before: Espoo, Finland

Patentee before: IMBERA ELECTRONICS OY

CP03 Change of name, title or address
TR01 Transfer of patent right

Effective date of registration: 20200903

Address after: Virginia

Patentee after: Imberatec Co.,Ltd.

Address before: Helsinki

Patentee before: GE Embedded Electronics OY

TR01 Transfer of patent right
CX01 Expiry of patent term

Granted publication date: 20100526

CX01 Expiry of patent term