CN103137200A - 源侧非对称预充电编程方案 - Google Patents
源侧非对称预充电编程方案 Download PDFInfo
- Publication number
- CN103137200A CN103137200A CN2012105707999A CN201210570799A CN103137200A CN 103137200 A CN103137200 A CN 103137200A CN 2012105707999 A CN2012105707999 A CN 2012105707999A CN 201210570799 A CN201210570799 A CN 201210570799A CN 103137200 A CN103137200 A CN 103137200A
- Authority
- CN
- China
- Prior art keywords
- memory cell
- programming
- voltage
- string
- transfer overvoltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US88863807P | 2007-02-07 | 2007-02-07 | |
| US60/888,638 | 2007-02-07 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200880004505.8A Division CN101617370B (zh) | 2007-02-07 | 2008-02-06 | 源侧非对称预充电编程方案 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103137200A true CN103137200A (zh) | 2013-06-05 |
Family
ID=39676017
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012105707999A Pending CN103137200A (zh) | 2007-02-07 | 2008-02-06 | 源侧非对称预充电编程方案 |
| CN200880004505.8A Expired - Fee Related CN101617370B (zh) | 2007-02-07 | 2008-02-06 | 源侧非对称预充电编程方案 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200880004505.8A Expired - Fee Related CN101617370B (zh) | 2007-02-07 | 2008-02-06 | 源侧非对称预充电编程方案 |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US7952929B2 (enExample) |
| EP (2) | EP2122628B1 (enExample) |
| JP (2) | JP5279729B2 (enExample) |
| KR (1) | KR101444491B1 (enExample) |
| CN (2) | CN103137200A (enExample) |
| CA (1) | CA2672245A1 (enExample) |
| TW (1) | TWI483253B (enExample) |
| WO (1) | WO2008095294A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11978515B2 (en) | 2020-03-02 | 2024-05-07 | Winbond Electronics Corp. | Semiconductor memory device and reading method |
Families Citing this family (65)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US8280431B2 (en) | 2006-12-29 | 2012-10-02 | Intel Corporation | Apparatus for end-user transparent utilization of computational, storage, and network capacity of mobile devices, and associated methods |
| JP5136328B2 (ja) * | 2008-09-26 | 2013-02-06 | 富士通セミコンダクター株式会社 | 半導体メモリ、半導体メモリの動作方法およびシステム |
| KR101036720B1 (ko) * | 2009-02-02 | 2011-05-24 | 주식회사 하이닉스반도체 | 불휘발성 메모리 소자의 동작 방법 |
| US8638609B2 (en) | 2010-05-19 | 2014-01-28 | Spansion Llc | Partial local self boosting for NAND |
| US8472271B2 (en) | 2011-02-18 | 2013-06-25 | International Business Machines Corporation | Systems and methods for memory device precharging |
| US8614918B2 (en) | 2011-05-02 | 2013-12-24 | Micron Technology, Inc. | Memory apparatus and methods |
| JP2013058276A (ja) * | 2011-09-07 | 2013-03-28 | Toshiba Corp | 半導体記憶装置 |
| JP5254413B2 (ja) * | 2011-09-22 | 2013-08-07 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| US8842479B2 (en) * | 2011-10-11 | 2014-09-23 | Macronix International Co., Ltd. | Low voltage programming in NAND flash with two stage source side bias |
| KR20130044693A (ko) * | 2011-10-24 | 2013-05-03 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 그 동작 방법 |
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| KR102179845B1 (ko) | 2014-02-03 | 2020-11-17 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 그것의 프로그램 방법 |
| KR102210328B1 (ko) | 2014-02-12 | 2021-02-01 | 삼성전자주식회사 | 불휘발성 메모리 장치, 메모리 시스템 및 불휘발성 메모리 장치의 동작 방법 |
| US9396791B2 (en) | 2014-07-18 | 2016-07-19 | Micron Technology, Inc. | Programming memories with multi-level pass signal |
| CN105427884B (zh) * | 2014-09-12 | 2019-06-28 | 上海华虹宏力半导体制造有限公司 | 一种新的x译码器电路 |
| US9368222B2 (en) | 2014-10-01 | 2016-06-14 | Sandisk Technologies Inc. | Bit line pre-charge with current reduction |
| US9472288B2 (en) * | 2014-10-29 | 2016-10-18 | Hewlett-Packard Development Company, L.P. | Mitigating parasitic current while programming a floating gate memory array |
| KR102222594B1 (ko) | 2014-11-13 | 2021-03-08 | 삼성전자주식회사 | 비휘발성 메모리 장치, 그것의 소거 방법, 및 그것을 포함하는 메모리 시스템 |
| JP5992983B2 (ja) * | 2014-12-03 | 2016-09-14 | ウィンボンド エレクトロニクス コーポレーション | 不揮発性半導体記憶装置 |
| WO2016186086A1 (ja) * | 2015-05-15 | 2016-11-24 | 国立大学法人東北大学 | 抵抗変化型素子を備えた記憶回路 |
| US9947418B2 (en) * | 2016-04-12 | 2018-04-17 | Micron Technology, Inc. | Boosted channel programming of memory |
| US9779819B1 (en) * | 2016-06-24 | 2017-10-03 | Micron Technology, Inc. | Connecting memory cells to a data line sequentially while applying a program voltage to the memory cells |
| KR102469684B1 (ko) * | 2016-06-30 | 2022-11-22 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치의 프로그램 방법 |
| US9640273B1 (en) | 2016-08-25 | 2017-05-02 | Sandisk Technologies Llc | Mitigating hot electron program disturb |
| KR102656828B1 (ko) | 2017-01-05 | 2024-04-18 | 에스케이하이닉스 주식회사 | 메모리 장치 및 이의 동작 방법 |
| KR102295521B1 (ko) | 2017-03-16 | 2021-08-30 | 삼성전자 주식회사 | 비휘발성 메모리 장치 및 비휘발성 메모리 장치의 프로그램 방법 |
| US10850509B2 (en) * | 2017-04-05 | 2020-12-01 | Hewlett-Packard Development Company, L.P. | On-die actuator evaluation with pre-charged thresholds |
| KR102289598B1 (ko) * | 2017-06-26 | 2021-08-18 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 그것을 포함하는 메모리 시스템 그리고 그것의 프로그램 방법 |
| KR102336659B1 (ko) * | 2017-09-05 | 2021-12-07 | 삼성전자 주식회사 | 데이터 신뢰성을 향상시키기 위한 메모리 동작을 수행하는 메모리 장치, 이를 포함하는 메모리 시스템 및 메모리 장치의 동작 방법 |
| US11232841B2 (en) | 2017-09-05 | 2022-01-25 | Samsung Electronics Co., Ltd. | Methods of operating memory devices based on sub-block positions and related memory system |
| US11217311B2 (en) | 2018-02-28 | 2022-01-04 | Samsung Electronics Co., Ltd. | Memory device with improved program performance and method of operating the same |
| US11152074B2 (en) * | 2018-02-28 | 2021-10-19 | Samsung Electronics Co., Ltd. | Memory device with improved program performance and method of operating the same |
| KR102441580B1 (ko) * | 2018-02-28 | 2022-09-07 | 삼성전자주식회사 | 프로그램 성능이 개선된 메모리 장치 및 이의 동작방법 |
| KR102532998B1 (ko) | 2018-04-16 | 2023-05-16 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 비휘발성 메모리 장치의 프로그램 방법 |
| US10580504B2 (en) | 2018-06-07 | 2020-03-03 | Sandisk Technologies Llc | Non-volatile memory with countermeasure for program disturb including spike during boosting |
| US10643718B2 (en) | 2018-06-07 | 2020-05-05 | Sandisk Technologies Llc | Non-volatile memory with countermeasure for program disturb including purge during precharge |
| US10541037B2 (en) | 2018-06-07 | 2020-01-21 | Sandisk Technologies Llc | Non-volatile memory with countermeasure for program disturb including delayed ramp down during program verify |
| US10553298B1 (en) | 2018-07-27 | 2020-02-04 | Sandisk Technologies Llc | Non-volatile memory with countermeasure for select gate disturb |
| US10559368B1 (en) | 2018-08-07 | 2020-02-11 | Sandisk Technologies Llc | Non-volatile memory with countermeasures for select gate disturb during program pre-charge |
| US10665300B1 (en) | 2018-11-12 | 2020-05-26 | Micron Technology, Inc. | Apparatus and methods for discharging control gates after performing an access operation on a memory cell |
| US10726920B2 (en) | 2018-11-26 | 2020-07-28 | Sandisk Technologies Llc | Pre-charge voltage for inhibiting unselected NAND memory cell programming |
| CN110289034A (zh) * | 2019-06-28 | 2019-09-27 | 长江存储科技有限责任公司 | 非易失性存储器及其操作方法 |
| KR102757291B1 (ko) * | 2019-08-01 | 2025-01-20 | 에스케이하이닉스 주식회사 | 메모리 장치 및 이의 동작 방법 |
| JP2021047939A (ja) * | 2019-09-17 | 2021-03-25 | キオクシア株式会社 | 半導体記憶装置 |
| KR20250070140A (ko) * | 2019-10-22 | 2025-05-20 | 양쯔 메모리 테크놀로지스 씨오., 엘티디. | 비휘발성 메모리 장치 및 제어 방법 |
| CN114467143A (zh) * | 2019-11-14 | 2022-05-10 | 长江存储科技有限责任公司 | 用于执行编程操作的方法及相关的存储器件 |
| CN111095419B (zh) * | 2019-11-28 | 2021-01-29 | 长江存储科技有限责任公司 | 提高从存储器件读取数据的速度的方法 |
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| KR102671178B1 (ko) | 2020-02-06 | 2024-06-03 | 양쯔 메모리 테크놀로지스 씨오., 엘티디. | 3d 메모리 디바이스를 프로그래밍하는 방법 및 관련된 3d 메모리 디바이스 |
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| KR102897358B1 (ko) * | 2020-07-30 | 2025-12-05 | 삼성전자 주식회사 | 프로그래밍 동안 양방향 채널 프리차지를 수행하는 비휘발성 메모리 장치 |
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| TWI736495B (zh) * | 2020-12-30 | 2021-08-11 | 旺宏電子股份有限公司 | 用於記憶裝置之編程方法 |
| CN114822615A (zh) * | 2021-01-20 | 2022-07-29 | 长江存储科技有限责任公司 | 存储器的编程操作方法及装置 |
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| TWI855786B (zh) * | 2023-07-21 | 2024-09-11 | 旺宏電子股份有限公司 | 記憶體裝置及其預充電方法 |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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-
2008
- 2008-02-06 CA CA002672245A patent/CA2672245A1/en not_active Abandoned
- 2008-02-06 CN CN2012105707999A patent/CN103137200A/zh active Pending
- 2008-02-06 JP JP2009548552A patent/JP5279729B2/ja not_active Expired - Fee Related
- 2008-02-06 EP EP08714555A patent/EP2122628B1/en not_active Not-in-force
- 2008-02-06 EP EP12168362A patent/EP2490225A1/en not_active Withdrawn
- 2008-02-06 CN CN200880004505.8A patent/CN101617370B/zh not_active Expired - Fee Related
- 2008-02-06 KR KR1020097018585A patent/KR101444491B1/ko active Active
- 2008-02-06 US US12/026,825 patent/US7952929B2/en not_active Expired - Fee Related
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| US5715194A (en) * | 1996-07-24 | 1998-02-03 | Advanced Micro Devices, Inc. | Bias scheme of program inhibit for random programming in a nand flash memory |
| US6011287A (en) * | 1997-02-27 | 2000-01-04 | Kabushiki Kaisha Toshiba | Non-volatile semiconductor memory device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US11978515B2 (en) | 2020-03-02 | 2024-05-07 | Winbond Electronics Corp. | Semiconductor memory device and reading method |
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| Publication number | Publication date |
|---|---|
| US8139414B2 (en) | 2012-03-20 |
| JP5279729B2 (ja) | 2013-09-04 |
| US20080186776A1 (en) | 2008-08-07 |
| US20120262986A1 (en) | 2012-10-18 |
| CN101617370A (zh) | 2009-12-30 |
| KR20090117794A (ko) | 2009-11-12 |
| JP2010518538A (ja) | 2010-05-27 |
| US20110194351A1 (en) | 2011-08-11 |
| CA2672245A1 (en) | 2008-08-14 |
| WO2008095294A1 (en) | 2008-08-14 |
| US8537617B2 (en) | 2013-09-17 |
| JP5476572B2 (ja) | 2014-04-23 |
| TW200901198A (en) | 2009-01-01 |
| TWI483253B (zh) | 2015-05-01 |
| EP2490225A1 (en) | 2012-08-22 |
| EP2122628A1 (en) | 2009-11-25 |
| EP2122628B1 (en) | 2012-05-30 |
| CN101617370B (zh) | 2014-07-16 |
| US7952929B2 (en) | 2011-05-31 |
| JP2011076715A (ja) | 2011-04-14 |
| KR101444491B1 (ko) | 2014-09-24 |
| EP2122628A4 (en) | 2010-02-24 |
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