ATE551609T1 - Anordnungen für einen integrierten sensor - Google Patents

Anordnungen für einen integrierten sensor

Info

Publication number
ATE551609T1
ATE551609T1 AT10195145T AT10195145T ATE551609T1 AT E551609 T1 ATE551609 T1 AT E551609T1 AT 10195145 T AT10195145 T AT 10195145T AT 10195145 T AT10195145 T AT 10195145T AT E551609 T1 ATE551609 T1 AT E551609T1
Authority
AT
Austria
Prior art keywords
arrangements
substrate
integrated sensor
substrates
base substrate
Prior art date
Application number
AT10195145T
Other languages
English (en)
Inventor
Michael C Doogue
William P Taylor
Vijay Mangtani
Original Assignee
Allegro Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=38194995&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE551609(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Allegro Microsystems Inc filed Critical Allegro Microsystems Inc
Application granted granted Critical
Publication of ATE551609T1 publication Critical patent/ATE551609T1/de

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/80—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/207—Constructional details independent of the type of device used
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49541—Geometry of the lead-frame
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
    • H01L25/162—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits the devices being mounted on two or more different substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/82—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by variation of the magnetic field applied to the device
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00—Hall-effect devices
    • H10N52/101—Semiconductor Hall-effect devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00—Hall-effect devices
    • H10N52/80—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08—Circuits for altering the measuring range
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3025—Electromagnetic shielding

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Computer Hardware Design (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Ceramic Engineering (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)
AT10195145T 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor ATE551609T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/335,944 US7768083B2 (en) 2006-01-20 2006-01-20 Arrangements for an integrated sensor

Publications (1)

Publication Number Publication Date
ATE551609T1 true ATE551609T1 (de) 2012-04-15

Family

ID=38194995

Family Applications (4)

Application Number Title Priority Date Filing Date
AT10195145T ATE551609T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor
AT10195143T ATE550672T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor
AT10195147T ATE550673T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor
AT07716253T ATE550671T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor

Family Applications After (3)

Application Number Title Priority Date Filing Date
AT10195143T ATE550672T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor
AT10195147T ATE550673T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor
AT07716253T ATE550671T1 (de) 2006-01-20 2007-01-04 Anordnungen für einen integrierten sensor

Country Status (6)

Country Link
US (6) US7768083B2 (de)
EP (4) EP1974223B1 (de)
JP (8) JP5748393B2 (de)
KR (1) KR101366007B1 (de)
AT (4) ATE551609T1 (de)
WO (1) WO2007087121A2 (de)

Families Citing this family (147)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7259545B2 (en) * 2003-02-11 2007-08-21 Allegro Microsystems, Inc. Integrated sensor
US7768083B2 (en) * 2006-01-20 2010-08-03 Allegro Microsystems, Inc. Arrangements for an integrated sensor
US7573112B2 (en) * 2006-04-14 2009-08-11 Allegro Microsystems, Inc. Methods and apparatus for sensor having capacitor on chip
US7687882B2 (en) * 2006-04-14 2010-03-30 Allegro Microsystems, Inc. Methods and apparatus for integrated circuit having multiple dies with at least one on chip capacitor
US20070279053A1 (en) * 2006-05-12 2007-12-06 Taylor William P Integrated current sensor
US20080013298A1 (en) 2006-07-14 2008-01-17 Nirmal Sharma Methods and apparatus for passive attachment of components for integrated circuits
US7816772B2 (en) * 2007-03-29 2010-10-19 Allegro Microsystems, Inc. Methods and apparatus for multi-stage molding of integrated circuit package
US7564237B2 (en) * 2007-10-23 2009-07-21 Honeywell International Inc. Integrated 3-axis field sensor and fabrication methods
US8009442B2 (en) * 2007-12-28 2011-08-30 Intel Corporation Directing the flow of underfill materials using magnetic particles
US9823090B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor for sensing a movement of a target object
US7816905B2 (en) * 2008-06-02 2010-10-19 Allegro Microsystems, Inc. Arrangements for a current sensing circuit and integrated current sensor
US8093670B2 (en) 2008-07-24 2012-01-10 Allegro Microsystems, Inc. Methods and apparatus for integrated circuit having on chip capacitor with eddy current reductions
US20100052424A1 (en) * 2008-08-26 2010-03-04 Taylor William P Methods and apparatus for integrated circuit having integrated energy storage device
US8486755B2 (en) * 2008-12-05 2013-07-16 Allegro Microsystems, Llc Magnetic field sensors and methods for fabricating the magnetic field sensors
US9222992B2 (en) 2008-12-18 2015-12-29 Infineon Technologies Ag Magnetic field current sensors
US20100188078A1 (en) * 2009-01-28 2010-07-29 Andrea Foletto Magnetic sensor with concentrator for increased sensing range
US20100193906A1 (en) * 2009-02-05 2010-08-05 Northern Lights Semiconductor Corp. Integrated Circuit Package for Magnetic Capacitor
US20110133732A1 (en) * 2009-12-03 2011-06-09 Allegro Microsystems, Inc. Methods and apparatus for enhanced frequency response of magnetic sensors
US20110210956A1 (en) * 2010-02-26 2011-09-01 Dev Alok Girdhar Current sensor for a semiconductor device and system
US8384183B2 (en) * 2010-02-19 2013-02-26 Allegro Microsystems, Inc. Integrated hall effect element having a germanium hall plate
US20110210411A1 (en) * 2010-02-26 2011-09-01 Sound Design Technologies, Ltd. Ultra thin flip-chip backside device sensor package
JP5067676B2 (ja) * 2010-03-12 2012-11-07 株式会社デンソー センサユニット及び、集磁モジュール
US8760149B2 (en) 2010-04-08 2014-06-24 Infineon Technologies Ag Magnetic field current sensors
US20120007597A1 (en) * 2010-07-09 2012-01-12 Invensense, Inc. Micromachined offset reduction structures for magnetic field sensing
EP2598896B1 (de) * 2010-07-30 2014-10-29 Commissariat à l'Énergie Atomique et aux Énergies Alternatives Magnetoresistor-integrierter sensor zur spannungs- oder strommessung und diagnosesystem
DE102010047128A1 (de) * 2010-09-30 2012-04-05 Infineon Technologies Ag Hallsensoranordnung zum redundanten Messen eines Magnetfeldes
US8339134B2 (en) * 2010-10-08 2012-12-25 Allegro Microsystems, Inc. Apparatus and method for reducing a transient signal in a magnetic field sensor
JP5794777B2 (ja) 2010-12-22 2015-10-14 三菱電機株式会社 半導体装置
US8975889B2 (en) 2011-01-24 2015-03-10 Infineon Technologies Ag Current difference sensors, systems and methods
US8963536B2 (en) 2011-04-14 2015-02-24 Infineon Technologies Ag Current sensors, systems and methods for sensing current in a conductor
US8907437B2 (en) 2011-07-22 2014-12-09 Allegro Microsystems, Llc Reinforced isolation for current sensor with magnetic field transducer
US8952686B2 (en) 2011-10-25 2015-02-10 Honeywell International Inc. High current range magnetoresistive-based current sensor
US8629539B2 (en) 2012-01-16 2014-01-14 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having non-conductive die paddle
US8791533B2 (en) * 2012-01-30 2014-07-29 Broadcom Corporation Semiconductor package having an interposer configured for magnetic signaling
US9494660B2 (en) 2012-03-20 2016-11-15 Allegro Microsystems, Llc Integrated circuit package having a split lead frame
US10234513B2 (en) 2012-03-20 2019-03-19 Allegro Microsystems, Llc Magnetic field sensor integrated circuit with integral ferromagnetic material
US9666788B2 (en) 2012-03-20 2017-05-30 Allegro Microsystems, Llc Integrated circuit package having a split lead frame
US9812588B2 (en) * 2012-03-20 2017-11-07 Allegro Microsystems, Llc Magnetic field sensor integrated circuit with integral ferromagnetic material
JP6243602B2 (ja) * 2012-03-22 2017-12-06 旭化成エレクトロニクス株式会社 磁場方向計測装置及び回転角度計測装置
US10215550B2 (en) 2012-05-01 2019-02-26 Allegro Microsystems, Llc Methods and apparatus for magnetic sensors having highly uniform magnetic fields
US9817078B2 (en) 2012-05-10 2017-11-14 Allegro Microsystems Llc Methods and apparatus for magnetic sensor having integrated coil
US9588134B2 (en) * 2012-05-10 2017-03-07 Infineon Technologies Ag Increased dynamic range sensor
US9372242B2 (en) * 2012-05-11 2016-06-21 Memsic, Inc. Magnetometer with angled set/reset coil
CN102809665B (zh) * 2012-06-04 2016-08-03 江苏多维科技有限公司 一种磁电阻齿轮传感器
JP5911065B2 (ja) * 2012-06-12 2016-04-27 公立大学法人大阪市立大学 漏電検出装置
US20140005527A1 (en) * 2012-06-29 2014-01-02 General Electric Company Method and system for dynamic referencing and registration used with surgical and interventional procedures
US9482700B2 (en) * 2013-01-20 2016-11-01 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Current detector to sense current without being in series with conductor
US9164155B2 (en) 2013-01-29 2015-10-20 Infineon Technologies Ag Systems and methods for offset reduction in sensor devices and systems
CH707687B1 (de) * 2013-03-08 2016-09-15 Melexis Technologies Nv Stromsensor.
US10345343B2 (en) 2013-03-15 2019-07-09 Allegro Microsystems, Llc Current sensor isolation
US10725100B2 (en) 2013-03-15 2020-07-28 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an externally accessible coil
US9190606B2 (en) 2013-03-15 2015-11-17 Allegro Micosystems, LLC Packaging for an electronic device
US9411025B2 (en) 2013-04-26 2016-08-09 Allegro Microsystems, Llc Integrated circuit package having a split lead frame and a magnet
US9733106B2 (en) 2013-05-24 2017-08-15 Allegro Microsystems, Llc Magnetic field sensor to detect a magnitude of a magnetic field in any direction
US9664752B2 (en) 2013-05-24 2017-05-30 Allegro Microsystems, Llc Magnetic field sensor for detecting a magnetic field in any direction above thresholds
JP6116061B2 (ja) * 2013-07-16 2017-04-19 横河電機株式会社 電流センサ
US10495699B2 (en) 2013-07-19 2019-12-03 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target
US10145908B2 (en) 2013-07-19 2018-12-04 Allegro Microsystems, Llc Method and apparatus for magnetic sensor producing a changing magnetic field
US9810519B2 (en) 2013-07-19 2017-11-07 Allegro Microsystems, Llc Arrangements for magnetic field sensors that act as tooth detectors
JP5945976B2 (ja) * 2013-12-06 2016-07-05 トヨタ自動車株式会社 バスバモジュール
JP6123687B2 (ja) * 2014-01-29 2017-05-10 株式会社デンソー 磁気センサ
US9605983B2 (en) * 2014-06-09 2017-03-28 Infineon Technologies Ag Sensor device and sensor arrangement
US9823168B2 (en) 2014-06-27 2017-11-21 Infineon Technologies Ag Auto tire localization systems and methods utilizing a TPMS angular position index
US10091594B2 (en) 2014-07-29 2018-10-02 Cochlear Limited Bone conduction magnetic retention system
US9719806B2 (en) 2014-10-31 2017-08-01 Allegro Microsystems, Llc Magnetic field sensor for sensing a movement of a ferromagnetic target object
US10712403B2 (en) 2014-10-31 2020-07-14 Allegro Microsystems, Llc Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element
US9720054B2 (en) 2014-10-31 2017-08-01 Allegro Microsystems, Llc Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element
US9823092B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor providing a movement detector
US9857398B2 (en) 2015-01-30 2018-01-02 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Inter-circuit board connector with current sensor
WO2016164265A1 (en) 2015-04-10 2016-10-13 Allegro Microsystems, Llc Hall effect sensing element
DE102015007190B4 (de) * 2015-06-09 2017-03-02 Micronas Gmbh Magnetfeldmessvorrichtung
US10130807B2 (en) 2015-06-12 2018-11-20 Cochlear Limited Magnet management MRI compatibility
US20160381473A1 (en) 2015-06-26 2016-12-29 Johan Gustafsson Magnetic retention device
US10917730B2 (en) * 2015-09-14 2021-02-09 Cochlear Limited Retention magnet system for medical device
US10411498B2 (en) 2015-10-21 2019-09-10 Allegro Microsystems, Llc Apparatus and methods for extending sensor integrated circuit operation through a power disturbance
US9976876B2 (en) 2015-11-24 2018-05-22 Allegro Microsystems, Llc Methods and apparatus for phase selection in ring magnet sensing
US10145906B2 (en) 2015-12-17 2018-12-04 Analog Devices Global Devices, systems and methods including magnetic structures
US10283699B2 (en) 2016-01-29 2019-05-07 Avago Technologies International Sales Pte. Limited Hall-effect sensor isolator
US10114085B2 (en) 2016-03-04 2018-10-30 Allegro Microsystems, Llc Magnetic field sensor with improved response immunity
US9910087B2 (en) * 2016-03-14 2018-03-06 Allegro Microsystems, Llc Integrated circuit and method for detecting a stress condition in the integrated circuit
US10012518B2 (en) 2016-06-08 2018-07-03 Allegro Microsystems, Llc Magnetic field sensor for sensing a proximity of an object
US10041810B2 (en) 2016-06-08 2018-08-07 Allegro Microsystems, Llc Arrangements for magnetic field sensors that act as movement detectors
US10260905B2 (en) 2016-06-08 2019-04-16 Allegro Microsystems, Llc Arrangements for magnetic field sensors to cancel offset variations
US10036785B2 (en) * 2016-07-18 2018-07-31 Allegro Microsystems, Llc Temperature-compensated magneto-resistive sensor
US10114044B2 (en) 2016-08-08 2018-10-30 Allegro Microsystems, Llc Current sensor
US10290608B2 (en) 2016-09-13 2019-05-14 Allegro Microsystems, Llc Signal isolator having bidirectional diagnostic signal exchange
KR200483900Y1 (ko) 2016-11-10 2017-07-07 한윤식 자연대류와 난방이 되는 조립식 돔 하우스
US10760981B2 (en) * 2016-11-18 2020-09-01 Asahi Kasei Microdevices Corporation Hall sensor
US10352969B2 (en) * 2016-11-29 2019-07-16 Allegro Microsystems, Llc Systems and methods for integrated shielding in a current sensor
US11595768B2 (en) 2016-12-02 2023-02-28 Cochlear Limited Retention force increasing components
US10324144B2 (en) 2016-12-20 2019-06-18 Infineon Technologies Austria Ag Lateral transmission of signals across a galvanic isolation barrier
US9958482B1 (en) * 2016-12-20 2018-05-01 Allegro Microsystems, Llc Systems and methods for a high isolation current sensor
US9941999B1 (en) * 2017-03-08 2018-04-10 Allegro Microsystems, Llc Methods and apparatus for communication over an isolation barrier with monitoring
US10481181B2 (en) * 2017-04-25 2019-11-19 Allegro Microsystems, Llc Systems and methods for current sensing
US10641842B2 (en) 2017-05-26 2020-05-05 Allegro Microsystems, Llc Targets for coil actuated position sensors
US10310028B2 (en) 2017-05-26 2019-06-04 Allegro Microsystems, Llc Coil actuated pressure sensor
US10324141B2 (en) 2017-05-26 2019-06-18 Allegro Microsystems, Llc Packages for coil actuated position sensors
US11428755B2 (en) 2017-05-26 2022-08-30 Allegro Microsystems, Llc Coil actuated sensor with sensitivity detection
US10996289B2 (en) 2017-05-26 2021-05-04 Allegro Microsystems, Llc Coil actuated position sensor with reflected magnetic field
US10837943B2 (en) 2017-05-26 2020-11-17 Allegro Microsystems, Llc Magnetic field sensor with error calculation
US10636285B2 (en) 2017-06-14 2020-04-28 Allegro Microsystems, Llc Sensor integrated circuits and methods for safety critical applications
US10692362B2 (en) 2017-06-14 2020-06-23 Allegro Microsystems, Llc Systems and methods for comparing signal channels having different common mode transient immunity
US10380879B2 (en) 2017-06-14 2019-08-13 Allegro Microsystems, Llc Sensor integrated circuits and methods for safety critical applications
US10622549B2 (en) 2017-08-29 2020-04-14 Allegro Microsystems, Llc Signal isolator having interposer
US10718825B2 (en) * 2017-09-13 2020-07-21 Nxp B.V. Stray magnetic field robust magnetic field sensor and system
US10257974B1 (en) 2017-09-22 2019-04-16 Cnh Industrial America Llc Seed meter with multiple sensors for seed cell status monitoring
DE102017124542B4 (de) 2017-10-20 2023-12-21 Infineon Technologies Ag Magnetfeldsensoranordnung und verfahren zum messen eines externen magnetfelds
US10236932B1 (en) 2017-11-02 2019-03-19 Allegro Microsystems, Llc Signal isolator having magnetic signal latching
US10509058B2 (en) * 2018-01-12 2019-12-17 Allegro Microsystems, Llc Current sensor using modulation of or change of sensitivity of magnetoresistance elements
EP3531076B1 (de) * 2018-02-23 2021-07-14 Allegro MicroSystems, LLC Winkelsensor mit verwendung von wirbelströmen
US10753968B2 (en) 2018-02-27 2020-08-25 Allegro Microsystems, Llc Integrated circuit having insulation breakdown detection
US10866117B2 (en) 2018-03-01 2020-12-15 Allegro Microsystems, Llc Magnetic field influence during rotation movement of magnetic target
US10978897B2 (en) 2018-04-02 2021-04-13 Allegro Microsystems, Llc Systems and methods for suppressing undesirable voltage supply artifacts
US10921391B2 (en) 2018-08-06 2021-02-16 Allegro Microsystems, Llc Magnetic field sensor with spacer
US10605874B2 (en) 2018-08-06 2020-03-31 Allegro Microsystems, Llc Magnetic field sensor with magnetoresistance elements having varying sensitivity
US11255700B2 (en) 2018-08-06 2022-02-22 Allegro Microsystems, Llc Magnetic field sensor
US10935612B2 (en) 2018-08-20 2021-03-02 Allegro Microsystems, Llc Current sensor having multiple sensitivity ranges
US10823586B2 (en) 2018-12-26 2020-11-03 Allegro Microsystems, Llc Magnetic field sensor having unequally spaced magnetic field sensing elements
US10866122B2 (en) * 2019-01-23 2020-12-15 Allegro Microsystems, Llc Magnetic field sensor for detecting an absolute position of a target object
US10816366B2 (en) 2019-01-23 2020-10-27 Allegro Microsystems, Llc Magnetic field sensor for detecting an absolute position of a target object
US11112465B2 (en) 2019-02-05 2021-09-07 Allegro Microsystems, Llc Integrated circuit having insulation monitoring with frequency discrimination
US11061084B2 (en) 2019-03-07 2021-07-13 Allegro Microsystems, Llc Coil actuated pressure sensor and deflectable substrate
US10955306B2 (en) 2019-04-22 2021-03-23 Allegro Microsystems, Llc Coil actuated pressure sensor and deformable substrate
US11029373B2 (en) 2019-07-16 2021-06-08 Allegro Microsystems, Llc Magnetic field sensors having a magnetic anti-aliasing filter
US10914765B1 (en) 2019-07-31 2021-02-09 Allegro Microsystems, Llc Multi-die integrated current sensor
US10991644B2 (en) 2019-08-22 2021-04-27 Allegro Microsystems, Llc Integrated circuit package having a low profile
US11115244B2 (en) 2019-09-17 2021-09-07 Allegro Microsystems, Llc Signal isolator with three state data transmission
US11237020B2 (en) 2019-11-14 2022-02-01 Allegro Microsystems, Llc Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet
US11280637B2 (en) 2019-11-14 2022-03-22 Allegro Microsystems, Llc High performance magnetic angle sensor
WO2021120060A1 (zh) * 2019-12-18 2021-06-24 上海麦歌恩微电子股份有限公司 一种基于垂直霍尔和各向异性磁阻的传感器及其使用方法
US11600498B2 (en) * 2019-12-31 2023-03-07 Texas Instruments Incorporated Semiconductor package with flip chip solder joint capsules
US11183436B2 (en) 2020-01-17 2021-11-23 Allegro Microsystems, Llc Power module package and packaging techniques
US11150273B2 (en) 2020-01-17 2021-10-19 Allegro Microsystems, Llc Current sensor integrated circuits
US11604058B2 (en) 2020-02-25 2023-03-14 Allegro Microsystems, Llc Reducing stray magnetic field effect on an angle sensor
US11262422B2 (en) 2020-05-08 2022-03-01 Allegro Microsystems, Llc Stray-field-immune coil-activated position sensor
US11346688B2 (en) 2020-07-06 2022-05-31 Allegro Microsystems, Llc Magnetic field sensors for detecting absolute position of multi-track targets
US11422167B2 (en) * 2020-07-17 2022-08-23 Texas Instruments Incorporated Integrated current sensor with magnetic flux concentrators
US11408945B2 (en) 2020-11-18 2022-08-09 Allegro Microsystems, Llc Magnetic field sensor with stacked transducers and capacitive summing amplifier
US11366141B1 (en) 2021-01-28 2022-06-21 Allegro Microsystems, Llc Multipath wide bandwidth current sensor
US11493361B2 (en) 2021-02-26 2022-11-08 Allegro Microsystems, Llc Stray field immune coil-activated sensor
US11567108B2 (en) 2021-03-31 2023-01-31 Allegro Microsystems, Llc Multi-gain channels for multi-range sensor
US11578997B1 (en) 2021-08-24 2023-02-14 Allegro Microsystems, Llc Angle sensor using eddy currents
US11644485B2 (en) 2021-10-07 2023-05-09 Allegro Microsystems, Llc Current sensor integrated circuits
US11768230B1 (en) 2022-03-30 2023-09-26 Allegro Microsystems, Llc Current sensor integrated circuit with a dual gauge lead frame
US11994541B2 (en) 2022-04-15 2024-05-28 Allegro Microsystems, Llc Current sensor assemblies for low currents
US11719769B1 (en) 2022-06-14 2023-08-08 Allegro Microsystems, Llc Method and apparatus for sensor signal path diagnostics
DE102022120256A1 (de) 2022-08-11 2024-02-22 Dr. Ing. H.C. F. Porsche Aktiengesellschaft Verfahren und Vorrichtung zu einer In-situ-AC-Strommessung an Stromschienen zwischen Pulswechselrichter und Verbraucher

Family Cites Families (230)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4283643A (en) 1979-05-25 1981-08-11 Electric Power Research Institute, Inc. Hall sensing apparatus
CH651151A5 (de) 1979-11-27 1985-08-30 Landis & Gyr Ag Messwandler zum messen eines insbesondere von einem messstrom erzeugten magnetfeldes.
JPS5687273A (en) 1979-12-17 1981-07-15 Sanyo Electric Co Ltd Automatic head leading device
US4343026A (en) 1980-07-09 1982-08-03 Spin Physics, Inc. Magnetoresistive head employing field feedback
JPS6311672Y2 (de) * 1980-12-22 1988-04-05
JPS57105977A (en) 1980-12-23 1982-07-01 Toshiba Corp Air cell
CH651671A5 (de) 1980-12-24 1985-09-30 Landis & Gyr Ag Anordnung zur messung elektrischer leistung oder energie.
CH651701A5 (de) 1980-12-24 1985-09-30 Landis & Gyr Ag Kompensierter messwandler.
JPS57187671A (en) 1981-05-15 1982-11-18 Nec Corp Magnetism sensor
JPS629970Y2 (de) 1981-05-25 1987-03-09
JPS5879430A (ja) 1981-11-06 1983-05-13 株式会社東芝 変圧器の内部部分放電自動監視装置
JPS58155761A (ja) * 1982-03-10 1983-09-16 Sharp Corp ホ−ル効果半導体集積回路
JPS58155761U (ja) 1982-04-13 1983-10-18 三洋電機株式会社 筒型電池
JPS58187004U (ja) 1982-06-04 1983-12-12 松下電器産業株式会社 スロツトイン式磁気記録再生装置
JPS59132091U (ja) 1983-02-22 1984-09-04 京都機械株式会社 布帛の連続染色用乾燥装置
DE3426784A1 (de) 1984-07-20 1986-01-30 Bosch Gmbh Robert Magnetoresistiver sensor zur abgabe von elektrischen signalen
CA1248222A (en) 1984-08-27 1989-01-03 Yutaka Souda Magnetic transducer head utilizing magnetoresistance effect
JPH0627150B2 (ja) 1985-07-08 1994-04-13 三菱油化株式会社 電気絶縁用エチレン共重合物架橋体
JPS6243260A (ja) 1985-08-20 1987-02-25 Canon Inc フアクシミリ装置
DE3632624C1 (de) * 1986-09-25 1988-03-10 Balluff Gebhard Feinmech Stoerfeldunempfindlicher Naeherungsschalter
CH669852A5 (de) 1986-12-12 1989-04-14 Lem Liaisons Electron Mec
JPS63150384A (ja) 1986-12-15 1988-06-23 Hitachi Ltd 潤滑剤
US4772929A (en) 1987-01-09 1988-09-20 Sprague Electric Company Hall sensor with integrated pole pieces
JPS63150384U (de) * 1987-03-24 1988-10-04
KR910004261B1 (ko) 1987-04-09 1991-06-25 후지쓰 가부시끼가이샤 자전 변환 소자를 이용한 검지기
JPS63263782A (ja) 1987-04-22 1988-10-31 Hitachi Ltd 磁電変換素子
DE3854457T2 (de) 1987-07-07 1996-02-29 Nippon Denso Co Stromdetektoranordnung mit ferromagnetischem Magnetwiderstandselement.
JPS6475969A (en) 1987-09-17 1989-03-22 Mitsubishi Electric Corp Measuring device of current
US4823075A (en) 1987-10-13 1989-04-18 General Electric Company Current sensor using hall-effect device with feedback
CH674089A5 (de) 1987-10-16 1990-04-30 Lem Liaisons Electron Mec
GB8725467D0 (en) 1987-10-30 1987-12-02 Honeywell Control Syst Making current sensor
US4939459A (en) 1987-12-21 1990-07-03 Tdk Corporation High sensitivity magnetic sensor
US5227721A (en) 1987-12-25 1993-07-13 Sharp Kabushiki Kaisha Superconductive magnetic sensor having self induced magnetic biasing
JPH01251763A (ja) 1988-03-31 1989-10-06 Res Dev Corp Of Japan 縦型ホール素子と集積化磁気センサ
JPH0216475A (ja) 1988-07-04 1990-01-19 Sharp Corp 超電導磁気測定装置
US5041780A (en) 1988-09-13 1991-08-20 California Institute Of Technology Integrable current sensors
US4847584A (en) 1988-10-14 1989-07-11 Honeywell Inc. Magnetoresistive magnetic sensor
US4926116A (en) 1988-10-31 1990-05-15 Westinghouse Electric Corp. Wide band large dynamic range current sensor and method of current detection using same
JPH02170061A (ja) 1988-12-23 1990-06-29 Fujitsu Ltd 電力検知装置
JPH02212789A (ja) * 1989-02-13 1990-08-23 Nec Corp 磁気センサ
JPH02238372A (ja) 1989-03-13 1990-09-20 Fujitsu Ltd 電流検出器
JP2796391B2 (ja) 1990-01-08 1998-09-10 株式会社日立製作所 物理量検出方法および物理量検出装置あるいはこれらの方法あるいは装置を利用したサーボモータおよびこのサーボモータを使用したパワーステアリング装置
JPH03214783A (ja) * 1990-01-19 1991-09-19 Aichi Tokei Denki Co Ltd 積層型センサ
JPH03263383A (ja) * 1990-03-13 1991-11-22 Fujitsu Ltd 磁気抵抗素子
JPH0627150Y2 (ja) 1990-12-28 1994-07-27 陽 小川 足踏み健康器
JPH04290979A (ja) 1991-03-20 1992-10-15 Hitachi Ltd 磁気センサ、磁気センサを持つ位置検出装置および磁気センサを利用したトルク検出装置、モータ制御装置、あるいはこのトルク検出装置を有する電動パワーステアリング装置
JP3093813B2 (ja) * 1991-03-29 2000-10-03 科学技術振興事業団 磁気センサ
JP3206027B2 (ja) 1991-07-05 2001-09-04 株式会社村田製作所 微小電流センサ
EP0537419A1 (de) 1991-10-09 1993-04-21 Landis & Gyr Business Support AG Anordnung mit einem integrierten Magnetfeldsensor sowie einem ferromagnetischen ersten und zweiten Magnetfluss-Konzentrator und Verfahren zum Einbau einer Vielzahl von Anordnungen in je einem Kunststoffgehäuse
JPH05126865A (ja) 1991-10-22 1993-05-21 Hitachi Ltd 電流検出装置あるいは電流検出方法
JPH05264701A (ja) * 1992-01-23 1993-10-12 Fujitsu Ltd 磁気センサ
DE4212737C1 (en) 1992-04-16 1993-07-08 Leica Mikroskopie Und Systeme Gmbh Compact bridge-connected sensor - has thin-film resistors on substrate
CH683469A5 (de) 1992-07-03 1994-03-15 Landis & Gyr Business Support Anordnung mit einem einen Magnetfeldsensor enthaltenden Halbleiterplättchen zwischen einem ersten und einem zweiten Polschuh und Verfahren zur Herstellung einer Vielzahl der Anordnungen.
JPH0627150A (ja) * 1992-07-07 1994-02-04 Honda Motor Co Ltd ホール素子型電流センサ
US5402064A (en) 1992-09-02 1995-03-28 Santa Barbara Research Center Magnetoresistive sensor circuit with high output voltage swing and temperature compensation
JPH06177454A (ja) * 1992-12-04 1994-06-24 Fujitsu Ltd 強磁性薄膜磁気抵抗素子とそれを用いた磁気センサ
DE4243358A1 (de) 1992-12-21 1994-06-23 Siemens Ag Magnetowiderstands-Sensor mit künstlichem Antiferromagneten und Verfahren zu seiner Herstellung
DE4300605C2 (de) 1993-01-13 1994-12-15 Lust Electronic Systeme Gmbh Sensorchip
US5442283A (en) 1993-09-03 1995-08-15 Allegro Microsystems, Inc. Hall-voltage slope-activated sensor
JP3234394B2 (ja) * 1994-02-04 2001-12-04 株式会社日本自動車部品総合研究所 電流測定装置
US6002553A (en) 1994-02-28 1999-12-14 The United States Of America As Represented By The United States Department Of Energy Giant magnetoresistive sensor
US5583725A (en) 1994-06-15 1996-12-10 International Business Machines Corporation Spin valve magnetoresistive sensor with self-pinned laminated layer and magnetic recording system using the sensor
US5500590A (en) 1994-07-20 1996-03-19 Honeywell Inc. Apparatus for sensing magnetic fields using a coupled film magnetoresistive transducer
JP3214783B2 (ja) 1994-07-25 2001-10-02 本田技研工業株式会社 燃料タンクの支持構造
DE4436876A1 (de) 1994-10-15 1996-04-18 Lust Antriebstechnik Gmbh Sensorchip
JPH08130338A (ja) * 1994-10-31 1996-05-21 Nec Corp 薄膜磁気センサ
US5561368A (en) 1994-11-04 1996-10-01 International Business Machines Corporation Bridge circuit magnetic field sensor having spin valve magnetoresistive elements formed on common substrate
US5570034A (en) 1994-12-29 1996-10-29 Intel Corporation Using hall effect to monitor current during IDDQ testing of CMOS integrated circuits
US5488294A (en) 1995-01-18 1996-01-30 Honeywell Inc. Magnetic sensor with means for retaining a magnet at a precise calibrated position
FR2734058B1 (fr) 1995-05-12 1997-06-20 Thomson Csf Amperemetre
US5717327A (en) * 1995-09-22 1998-02-10 Bradford; Melvin J. Current sensor
EP0772046B1 (de) 1995-10-30 2002-04-17 Sentron Ag Magnetfeldsensor und Strom- oder Energiesensor
JPH09166612A (ja) 1995-12-18 1997-06-24 Nissan Motor Co Ltd 磁気センサ
JPH09257835A (ja) 1996-03-22 1997-10-03 Toshiba Corp 電流検出装置
US5929636A (en) 1996-05-02 1999-07-27 Integrated Magnetoelectronics All-metal giant magnetoresistive solid-state component
DE19619806A1 (de) 1996-05-15 1997-11-20 Siemens Ag Magnetfeldempfindliche Sensoreinrichtung mit mehreren GMR-Sensorelementen
FR2749664B1 (fr) 1996-06-05 1998-07-24 Chauvin Arnoux Dispositif de mesure de courants faibles par pince amperemetrique
FR2750769B1 (fr) 1996-07-05 1998-11-13 Thomson Csf Capteur de champ magnetique en couche mince
US5831426A (en) 1996-08-16 1998-11-03 Nonvolatile Electronics, Incorporated Magnetic current sensor
US5896030A (en) * 1996-10-09 1999-04-20 Honeywell Inc. Magnetic sensor with components attached to transparent plate for laser trimming during calibration
DE19650078A1 (de) 1996-12-03 1998-06-04 Inst Mikrostrukturtechnologie Sensorelement zur Bestimmung eines Magnetfeldes oder eines Stromes
JPH10293141A (ja) 1997-04-18 1998-11-04 Yasusuke Yamamoto 電流センサー
EP0874244B1 (de) 1997-04-19 2002-01-30 LUST ANTRIEBSTECHNIK GmbH Verfahren zum Messen von elektrischen Strömen in n Leitern sowie Vorrichtung zur Durchführung des Verfahrens
US5877705A (en) 1997-04-22 1999-03-02 Nu-Metrics, Inc. Method and apparatus for analyzing traffic and a sensor therefor
WO1998057188A1 (en) 1997-06-13 1998-12-17 Koninklijke Philips Electronics N.V. Sensor comprising a wheatstone bridge
US5952825A (en) 1997-08-14 1999-09-14 Honeywell Inc. Magnetic field sensing device having integral coils for producing magnetic fields
DE69834043T2 (de) 1997-09-15 2006-11-16 Ams International Ag Eine stromüberwachungseinrichtung und ein verfahren zu ihrer herstellung
US5883567A (en) 1997-10-10 1999-03-16 Analog Devices, Inc. Packaged integrated circuit with magnetic flux concentrator
US6094330A (en) 1998-01-14 2000-07-25 General Electric Company Circuit interrupter having improved current sensing apparatus
US6300617B1 (en) 1998-03-04 2001-10-09 Nonvolatile Electronics, Incorporated Magnetic digital signal coupler having selected/reversal directions of magnetization
JP3544141B2 (ja) 1998-05-13 2004-07-21 三菱電機株式会社 磁気検出素子および磁気検出装置
JP3623366B2 (ja) 1998-07-17 2005-02-23 アルプス電気株式会社 巨大磁気抵抗効果素子を備えた磁界センサおよびその製造方法と製造装置
JP3623367B2 (ja) 1998-07-17 2005-02-23 アルプス電気株式会社 巨大磁気抵抗効果素子を備えたポテンショメータ
US6809515B1 (en) 1998-07-31 2004-10-26 Spinix Corporation Passive solid-state magnetic field sensors and applications therefor
WO2004075311A1 (ja) 1998-10-02 2004-09-02 Sanken Electric Co., Ltd. ホール効果素子を有する半導体装置
TW434411B (en) 1998-10-14 2001-05-16 Tdk Corp Magnetic sensor apparatus, current sensor apparatus and magnetic sensing element
TW534999B (en) 1998-12-15 2003-06-01 Tdk Corp Magnetic sensor apparatus and current sensor apparatus
JP3414292B2 (ja) 1998-12-25 2003-06-09 株式会社豊田中央研究所 磁界検出装置及び磁界検出素子
EP1067391B1 (de) 1999-01-21 2004-10-06 TDK Corporation Stromsensor
EP1031844A3 (de) 1999-02-25 2009-03-11 Liaisons Electroniques-Mecaniques Lem S.A. Verfahren zur Herstellung eines elektrischen Stromsensors
US6331773B1 (en) 1999-04-16 2001-12-18 Storage Technology Corporation Pinned synthetic anti-ferromagnet with oxidation protection layer
JP3583649B2 (ja) 1999-04-27 2004-11-04 Ｔｄｋ株式会社 薄膜磁気ヘッドおよびその製造方法ならびに磁気抵抗効果装置
DE10017374B4 (de) 1999-05-25 2007-05-10 Siemens Ag Magnetische Koppeleinrichtung und deren Verwendung
GB2352522B (en) 1999-05-28 2003-08-06 Caithness Dev Ltd A sensor
JP2003502876A (ja) 1999-06-18 2003-01-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 不可逆特性を持つ磁気システムおよびこの種システムを作成し修理し操作する方法
JP3696448B2 (ja) 1999-09-02 2005-09-21 矢崎総業株式会社 電流検出器
JP2001084535A (ja) 1999-09-16 2001-03-30 Tdk Corp 薄膜磁気ヘッドの製造方法および磁気抵抗効果装置の製造方法
US6583629B1 (en) 1999-10-01 2003-06-24 Nve Corporation Magnetic digital signal coupler monitor
US6445171B2 (en) 1999-10-29 2002-09-03 Honeywell Inc. Closed-loop magnetoresistive current sensor system having active offset nulling
US6462541B1 (en) 1999-11-12 2002-10-08 Nve Corporation Uniform sense condition magnetic field sensor using differential magnetoresistance
JP2001165963A (ja) 1999-12-09 2001-06-22 Sanken Electric Co Ltd ホール素子を備えた電流検出装置
JP3852554B2 (ja) 1999-12-09 2006-11-29 サンケン電気株式会社 ホール素子を備えた電流検出装置
JP4164615B2 (ja) 1999-12-20 2008-10-15 サンケン電気株式会社 ホ−ル素子を備えた電流検出装置
US6433981B1 (en) 1999-12-30 2002-08-13 General Electric Company Modular current sensor and power source
JP4216984B2 (ja) 2000-02-14 2009-01-28 パナソニック株式会社 部品振り分け制御装置、部品振り分け方法、および部品振り分けシステム。
JP2001227902A (ja) * 2000-02-16 2001-08-24 Mitsubishi Electric Corp 半導体装置
WO2001071713A1 (en) 2000-03-22 2001-09-27 Nve Corporation Read heads in planar monolithic integrated circuit chips
DE10028640B4 (de) 2000-06-09 2005-11-03 Institut für Physikalische Hochtechnologie e.V. Wheatstonebrücke, beinhaltend Brückenelemente, bestehend aus einem Spin-Valve-System, sowie ein Verfahren zu deren Herstellung
JP2002082136A (ja) 2000-06-23 2002-03-22 Yazaki Corp 電流センサ
JP2002026419A (ja) 2000-07-07 2002-01-25 Sanken Electric Co Ltd 磁電変換装置
US6429640B1 (en) 2000-08-21 2002-08-06 The United States Of America As Represented By The Secretary Of The Air Force GMR high current, wide dynamic range sensor
JP2002107382A (ja) 2000-09-27 2002-04-10 Asahi Kasei Corp 半導体装置およびその製造方法、並びに電流センサ
JP2002131342A (ja) 2000-10-19 2002-05-09 Canon Electronics Inc 電流センサ
DE20018538U1 (de) 2000-10-27 2002-03-07 Mannesmann Vdo Ag Sensormodul
JP2002163808A (ja) 2000-11-22 2002-06-07 Tdk Corp 磁気抵抗効果装置およびその製造方法ならびに薄膜磁気ヘッドおよびその製造方法
GB0029815D0 (en) 2000-12-06 2001-01-17 Pace Micro Tech Plc Voltage measuring apparatus
US6833615B2 (en) * 2000-12-29 2004-12-21 Intel Corporation Via-in-pad with off-center geometry
US20020093332A1 (en) 2001-01-18 2002-07-18 Thaddeus Schroeder Magnetic field sensor with tailored magnetic response
DE10108640A1 (de) 2001-02-22 2002-09-19 Infineon Technologies Ag Sensoranordnung zur kontaktlosen Strommessung
US6661083B2 (en) 2001-02-27 2003-12-09 Chippac, Inc Plastic semiconductor package
DE10159607B4 (de) 2001-03-09 2010-11-18 Siemens Ag Analog/Digital-Signalwandlereinrichtung mit galvanischer Trennung in ihrem Singalübertragungsweg
JP3260740B1 (ja) 2001-04-25 2002-02-25 ティーディーケイ株式会社 磁気抵抗効果装置の製造方法および薄膜磁気ヘッドの製造方法
JP3284130B1 (ja) 2001-04-25 2002-05-20 ティーディーケイ株式会社 磁気抵抗効果装置およびその製造方法、薄膜磁気ヘッドおよびその製造方法、ヘッドジンバルアセンブリならびにハードディスク装置
DE10120408B4 (de) 2001-04-25 2006-02-02 Infineon Technologies Ag Elektronisches Bauteil mit einem Halbleiterchip, elektronische Baugruppe aus gestapelten Halbleiterchips und Verfahren zu deren Herstellung
US6563629B2 (en) 2001-05-18 2003-05-13 Redc Optical Networks Ltd. Method and apparatus for full C-band amplifier with high dynamic gain range
US6946834B2 (en) 2001-06-01 2005-09-20 Koninklijke Philips Electronics N.V. Method of orienting an axis of magnetization of a first magnetic element with respect to a second magnetic element, semimanufacture for obtaining a sensor, sensor for measuring a magnetic field
DE10128150C1 (de) 2001-06-11 2003-01-23 Siemens Ag Magnetoresistives Sensorsystem
US6542375B1 (en) 2001-06-14 2003-04-01 National Semiconductor Corporation Hybrid PCB-IC directional coupler
JP4164626B2 (ja) 2001-06-15 2008-10-15 サンケン電気株式会社 ホ−ル素子を備えた電流検出装置
EP1267173A3 (de) 2001-06-15 2005-03-23 Sanken Electric Co., Ltd. Hall-Effektstromdetektor
EP1273921A1 (de) 2001-07-06 2003-01-08 Sanken Electric Co., Ltd. Hall-Effekt-Stromdetektor
JP2003043074A (ja) * 2001-07-26 2003-02-13 Asahi Kasei Corp 電流検出装置及びその製造方法
DE10140043B4 (de) 2001-08-16 2006-03-23 Siemens Ag Schichtensystem mit erhöhtem magnetoresistiven Effekt sowie Verwendung desselben
US6949927B2 (en) 2001-08-27 2005-09-27 International Rectifier Corporation Magnetoresistive magnetic field sensors and motor control devices using same
DE10142120A1 (de) 2001-08-30 2003-03-27 Infineon Technologies Ag Elektronisches Bauteil mit wenigstens zwei gestapelten Halbleiterchips sowie Verfahren zu seiner Herstellung
DE10142114C1 (de) 2001-08-30 2003-02-13 Infineon Technologies Ag Elektronisches Bauteil mit wenigstens zwei Halbleiterchips sowie Verfahren zu seiner Herstellung
DE10142118B4 (de) 2001-08-30 2007-07-12 Infineon Technologies Ag Elektronisches Bauteil mit wenigstens zwei gestapelten Halbleiterchips sowie Verfahren zu seiner Herstellung
DE10143437A1 (de) 2001-09-05 2003-03-27 Hella Kg Hueck & Co Vorrichtung zur Ermittlung der Position eines Schaltstocks oder eines Wählhebels eines Fahrzeuggetriebes
TWI273266B (en) 2001-11-01 2007-02-11 Asahi Kasei Emd Corp Current sensor and current sensor manufacturing method
DE10155423B4 (de) 2001-11-12 2006-03-02 Siemens Ag Verfahren zur homogenen Magnetisierung eines austauschgekoppelten Schichtsystems eines magneto-resistiven Bauelements, insbesondere eines Sensor-oder Logikelements
US6667682B2 (en) 2001-12-26 2003-12-23 Honeywell International Inc. System and method for using magneto-resistive sensors as dual purpose sensors
DE10202287C1 (de) 2002-01-22 2003-08-07 Siemens Ag Verfahren zur Herstellung einer monolithischen Brückenschaltung bestehend aus mehreren, als magneto-resistive Elemente ausgebildeten Brückengliedern und eine hiernach hergestellte monolithische Brückenschaltung
US6815944B2 (en) 2002-01-31 2004-11-09 Allegro Microsystems, Inc. Method and apparatus for providing information from a speed and direction sensor
US6984978B2 (en) 2002-02-11 2006-01-10 Honeywell International Inc. Magnetic field sensor
DE10222395B4 (de) 2002-05-21 2010-08-05 Siemens Ag Schaltungseinrichtung mit mehreren TMR-Sensorelementen
US7106046B2 (en) 2002-06-18 2006-09-12 Asahi Kasei Emd Corporation Current measuring method and current measuring device
DE10228764B4 (de) 2002-06-27 2006-07-13 Infineon Technologies Ag Anordnung zum Testen von Halbleitereinrichtungen
JP4180321B2 (ja) * 2002-07-30 2008-11-12 旭化成エレクトロニクス株式会社 磁気センサおよび磁気センサの製造方法
US6781359B2 (en) 2002-09-20 2004-08-24 Allegro Microsystems, Inc. Integrated current sensor
JP3896590B2 (ja) 2002-10-28 2007-03-22 サンケン電気株式会社 電流検出装置
JP2004158668A (ja) * 2002-11-07 2004-06-03 Asahi Kasei Corp ハイブリッド磁気センサ及びその製造方法
JP4200358B2 (ja) * 2002-12-13 2008-12-24 サンケン電気株式会社 ホール素子を備えた電流検出装置
US7259545B2 (en) 2003-02-11 2007-08-21 Allegro Microsystems, Inc. Integrated sensor
FI114854B (fi) 2003-02-11 2005-01-14 Liekki Oy Menetelmä nesteen syöttämiseksi liekkiruiskutuslaitteistoon
US6995957B2 (en) 2003-03-18 2006-02-07 Hitachi Global Storage Technologies Netherland B.V. Magnetoresistive sensor having a high resistance soft magnetic layer between sensor stack and shield
DE10314602B4 (de) 2003-03-31 2007-03-01 Infineon Technologies Ag Integrierter differentieller Magnetfeldsensor
JP2004356338A (ja) 2003-05-28 2004-12-16 Res Inst Electric Magnetic Alloys 薄膜磁気センサ及びその製造方法
WO2004109725A1 (en) 2003-06-11 2004-12-16 Koninklijke Philips Electronics N.V. Method of manufacturing a device with a magnetic layer-structure
US7075287B1 (en) 2003-08-26 2006-07-11 Allegro Microsystems, Inc. Current sensor
US7166807B2 (en) 2003-08-26 2007-01-23 Allegro Microsystems, Inc. Current sensor
US7709754B2 (en) 2003-08-26 2010-05-04 Allegro Microsystems, Inc. Current sensor
US20060219436A1 (en) 2003-08-26 2006-10-05 Taylor William P Current sensor
FR2860592B1 (fr) 2003-10-06 2006-01-21 Michel Remy Jean Combier Dispositif de mesure de courant sans contact, a grande dynamique, robuste et a bas cout.
WO2005059967A2 (en) 2003-12-17 2005-06-30 Chippac, Inc. Multiple chip package module having inverted package stacked over die
JP2005195427A (ja) 2004-01-06 2005-07-21 Asahi Kasei Electronics Co Ltd 電流測定装置、電流測定方法および電流測定プログラム
DE102004003369A1 (de) 2004-01-22 2005-08-18 Siemens Ag Magnetisches Bauelement mit hoher Grenzfrequenz
WO2005081007A1 (ja) 2004-02-19 2005-09-01 Mitsubishi Denki Kabushiki Kaisha 磁界検出器、これを用いた電流検出装置、位置検出装置および回転検出装置
JP4433820B2 (ja) 2004-02-20 2010-03-17 Ｔｄｋ株式会社 磁気検出素子およびその形成方法ならびに磁気センサ、電流計
DE102004009267B3 (de) 2004-02-26 2005-09-22 Siemens Ag Ausleseeinrichtung wenigstens eines magnetoresistiven Elementes
US7422930B2 (en) 2004-03-02 2008-09-09 Infineon Technologies Ag Integrated circuit with re-route layer and stacked die assembly
JP4511219B2 (ja) 2004-03-04 2010-07-28 三洋電機株式会社 モータ駆動回路
DE102004062474A1 (de) 2004-03-23 2005-10-13 Siemens Ag Vorrichtung zur potenzialfreien Strommessung
DE102004017191B4 (de) 2004-04-07 2007-07-12 Infineon Technologies Ag Vorrichtung und Verfahren zur Ermittlung einer Richtung eines Objekts
US20050246114A1 (en) 2004-04-29 2005-11-03 Rannow Randy K In-line field sensor
US7961431B2 (en) 2004-05-04 2011-06-14 Illinois Tool Works Inc. Additive-free fiber for metal texture of hard disk drives
DE102004021862B4 (de) 2004-05-04 2014-08-07 Infineon Technologies Ag Stromsenor
JP2005331437A (ja) * 2004-05-21 2005-12-02 Nsk Ltd 多極磁石エンコーダの出力検査方法
DE102004027273A1 (de) 2004-06-04 2005-12-29 Infineon Technologies Ag Halbleiterbaustein mit einer ersten und mindestens einer weiteren Halbleiterschaltung und Verfahren
US20080249165A1 (en) 2004-08-05 2008-10-09 Ivax Drug Research Institute Ltd. Glycosides and Salts Thereof
DE102004038847B3 (de) 2004-08-10 2005-09-01 Siemens Ag Einrichtung zur potenzialfreien Messung eines in einer elektrischen Leiterbahn fließenden Stromes
DE102005037905A1 (de) 2004-08-18 2006-03-09 Siemens Ag Magnetfeldsensor zum Messen eines Gradienten eines magnetischen Feldes
DE102004040079B3 (de) 2004-08-18 2005-12-22 Siemens Ag Magnetfeldsensor
DE102004043737A1 (de) 2004-09-09 2006-03-30 Siemens Ag Vorrichtung zum Erfassen des Gradienten eines Magnetfeldes und Verfahren zur Herstellung der Vorrichtung
JP4360998B2 (ja) 2004-10-01 2009-11-11 Ｔｄｋ株式会社 電流センサ
US7777607B2 (en) 2004-10-12 2010-08-17 Allegro Microsystems, Inc. Resistor having a predetermined temperature coefficient
JP4105142B2 (ja) 2004-10-28 2008-06-25 Ｔｄｋ株式会社 電流センサ
DE102004053551A1 (de) 2004-11-05 2006-05-18 Siemens Ag Vorrichtung zum Erfassen eines beweglichen oder bewegbaren elektrisch und/oder magnetisch leitenden Teiles
JP4105145B2 (ja) 2004-11-30 2008-06-25 Ｔｄｋ株式会社 電流センサ
JP4105147B2 (ja) 2004-12-06 2008-06-25 Ｔｄｋ株式会社 電流センサ
JP4131869B2 (ja) 2005-01-31 2008-08-13 Ｔｄｋ株式会社 電流センサ
US7476953B2 (en) 2005-02-04 2009-01-13 Allegro Microsystems, Inc. Integrated sensor having a magnetic flux concentrator
DE602005003777T2 (de) 2005-02-15 2008-12-04 C.R.F. Società Consortile per Azioni, Orbassano Oberflächenmontierter integrierter Stromsensor
DE102006008257B4 (de) 2005-03-22 2010-01-14 Siemens Ag Magnetoresistives Mehrschichtensystem vom Spin Valve-Typ mit einer magnetisch weicheren Elektrode aus mehreren Schichten und dessen Verwendung
JP2008541039A (ja) 2005-05-04 2008-11-20 エヌエックスピー ビー ヴィ センサモジュールを具える装置
US7358724B2 (en) 2005-05-16 2008-04-15 Allegro Microsystems, Inc. Integrated magnetic flux concentrator
JP2007003237A (ja) 2005-06-21 2007-01-11 Denso Corp 電流センサ
DE102006021774B4 (de) 2005-06-23 2014-04-03 Siemens Aktiengesellschaft Stromsensor zur galvanisch getrennten Strommessung
JP4466487B2 (ja) 2005-06-27 2010-05-26 Ｔｄｋ株式会社 磁気センサおよび電流センサ
US7541804B2 (en) 2005-07-29 2009-06-02 Everspin Technologies, Inc. Magnetic tunnel junction sensor
DE102005038655B3 (de) 2005-08-16 2007-03-22 Siemens Ag Magnetfeldsensitive Sensoreinrichtung
DE102005040539B4 (de) 2005-08-26 2007-07-05 Siemens Ag Magnetfeldsensitive Sensoreinrichtung
JP2007064851A (ja) 2005-08-31 2007-03-15 Tdk Corp コイル、コイルモジュールおよびその製造方法、ならびに電流センサおよびその製造方法
JP4298691B2 (ja) 2005-09-30 2009-07-22 Ｔｄｋ株式会社 電流センサおよびその製造方法
JP4415923B2 (ja) 2005-09-30 2010-02-17 Ｔｄｋ株式会社 電流センサ
JP4224483B2 (ja) 2005-10-14 2009-02-12 Ｔｄｋ株式会社 電流センサ
DE102005052688A1 (de) 2005-11-04 2007-05-24 Siemens Ag Magnetfeldsensor mit einer Messbrücke mit MR-Sensor
US7768083B2 (en) * 2006-01-20 2010-08-03 Allegro Microsystems, Inc. Arrangements for an integrated sensor
JP2007218700A (ja) 2006-02-15 2007-08-30 Tdk Corp 磁気センサおよび電流センサ
DE102006007770A1 (de) 2006-02-20 2007-08-30 Siemens Ag Sensoreinrichtung zur Erfassung einer Magnetfeldgröße
US20070279053A1 (en) 2006-05-12 2007-12-06 Taylor William P Integrated current sensor
DE202006020504U1 (de) 2006-06-06 2008-09-25 Insta Elektro Gmbh Elektrisches/elektronisches Gerät
DE102006028250A1 (de) 2006-06-20 2007-12-27 Carl Zeiss Microimaging Gmbh Verfahren zur Überwachung von Laserbearbeitungsprozessen
DE102006028698B3 (de) 2006-06-22 2007-12-13 Siemens Ag OMR-Sensor und Anordnung aus solchen Sensoren
KR101279116B1 (ko) 2006-06-30 2013-06-26 엘지디스플레이 주식회사 듀얼 뷰 디스플레이 장치 및 듀얼 뷰 액정 디스플레이 장치
DE102006046739B4 (de) 2006-09-29 2008-08-14 Siemens Ag Verfahren zum Betreiben eines Magnetfeldsensors und zugehöriger Magnetfeldsensor
DE102006046736B4 (de) 2006-09-29 2008-08-14 Siemens Ag Verfahren zum Betreiben eines Magnetfeldsensors und zugehöriger Magnetfeldsensor
US7816905B2 (en) 2008-06-02 2010-10-19 Allegro Microsystems, Inc. Arrangements for a current sensing circuit and integrated current sensor
US8203332B2 (en) 2008-06-24 2012-06-19 Magic Technologies, Inc. Gear tooth sensor (GTS) with magnetoresistive bridge
AT508554B1 (de) 2009-08-26 2011-02-15 Univ Wien Tech Chalkon-hydroxylase
DE102012012759A1 (de) 2012-06-27 2014-01-02 Sensitec Gmbh Anordnung zur Strommessung

Also Published As

Publication number Publication date
EP2290381A1 (de) 2011-03-02
EP2290379A1 (de) 2011-03-02
JP2014132269A (ja) 2014-07-17
EP2290379B1 (de) 2012-03-21
US8629520B2 (en) 2014-01-14
US20100237450A1 (en) 2010-09-23
US7768083B2 (en) 2010-08-03
JP6376995B2 (ja) 2018-08-22
JP2013178259A (ja) 2013-09-09
KR20080086919A (ko) 2008-09-26
US20070170533A1 (en) 2007-07-26
JP6150855B2 (ja) 2017-06-21
JP2014029340A (ja) 2014-02-13
WO2007087121A3 (en) 2008-04-03
JP2015108640A (ja) 2015-06-11
JP2009524053A (ja) 2009-06-25
EP2290380B1 (de) 2012-03-28
ATE550671T1 (de) 2012-04-15
US20150243882A1 (en) 2015-08-27
JP5748393B2 (ja) 2015-07-15
JP5635966B2 (ja) 2014-12-03
US9082957B2 (en) 2015-07-14
EP1974223B1 (de) 2012-03-21
US20130277782A1 (en) 2013-10-24
ATE550672T1 (de) 2012-04-15
US10069063B2 (en) 2018-09-04
ATE550673T1 (de) 2012-04-15
US20170110652A1 (en) 2017-04-20
EP2290380A1 (de) 2011-03-02
JP5902657B2 (ja) 2016-04-13
JP2012088325A (ja) 2012-05-10
US9859489B2 (en) 2018-01-02
US8952471B2 (en) 2015-02-10
US20130277783A1 (en) 2013-10-24
KR101366007B1 (ko) 2014-02-21
WO2007087121A2 (en) 2007-08-02
JP2016001186A (ja) 2016-01-07
JP2018036267A (ja) 2018-03-08
EP1974223A2 (de) 2008-10-01
EP2290381B1 (de) 2012-03-21
JP5848382B2 (ja) 2016-01-27

Similar Documents

Publication Publication Date Title
ATE550671T1 (de) Anordnungen für einen integrierten sensor
ATE443266T1 (de) Stromsensor
WO2008008581A3 (en) An electronics package with an integrated circuit device having post wafer fabrication integrated passive components
TWI264133B (en) Optical semiconductor device, optical connector and electronic equipment
ATE473489T1 (de) Duales chipkartensystem
TW200715708A (en) Electronic substrate, manufacturing method for electronic substrate, and electronic device
TW200801565A (en) Magnetic sensor, production method thereof, rotation detection device, and position detection device
WO2008005614A3 (en) Chip module for complete power train
TW200708175A (en) Mask holding structure, film forming method, electro-optic device manufacturing method, and electronic apparatus
WO2007120697A3 (en) Methods and apparatus for integrated circuit having multiple dies with at least one on chip capacitor
EP1619725A3 (de) Dünnschicht-Halbleiterbauelement und diesbezügliches Herstellungsverfahren, elektro-optische Vorrichtung und elektronisches Gerät
WO2010048102A3 (en) Integrated sensor including sensing and processing die mounted on opposite sides of package substrate
TW200631150A (en) Semiconductor device, display module, and manufacturing method of semiconductor device
TW200802537A (en) Semiconductor device having symbol pattern utilized as identification sign and its manufacture method
ATE502399T1 (de) Schaltungsvorrichtung mit gebondetem smd-bauteil
EP2026082A3 (de) Doppelseitiger integrierter Verarbeitungs- und Erfassungschip
TW200703472A (en) Semiconductor test device
TW201129994A (en) Anisotropic conducting film and method for manufacturing the same
WO2008105228A1 (ja) 磁気センサモジュール及び、ピストン位置検出装置
TW200702851A (en) Module for manufacturing a display device, method of manufacturing the same, and method of manufacturing a display device using the same
TW200723462A (en) Package module with alignment structure and electronic device with the same
TW200722460A (en) Semiconductor device and display module using same
TW200733030A (en) Light source driving device with light sensor module and electronic device using the same
TW200715424A (en) Semiconductor device and method of manufacturing the same
TW200707864A (en) Connecting element and circuit connecting device using the connecting element