WO2005036628A1 - マウント装置及びマウント方法 - Google Patents
マウント装置及びマウント方法 Download PDFInfo
- Publication number
- WO2005036628A1 WO2005036628A1 PCT/JP2004/014198 JP2004014198W WO2005036628A1 WO 2005036628 A1 WO2005036628 A1 WO 2005036628A1 JP 2004014198 W JP2004014198 W JP 2004014198W WO 2005036628 A1 WO2005036628 A1 WO 2005036628A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ring frame
- dicing tape
- shaped material
- semiconductor wafer
- dancer roller
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
- Y10T156/1062—Prior to assembly
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
- Y10T156/1062—Prior to assembly
- Y10T156/1075—Prior to assembly of plural laminae from single stock and assembling to each other or to additional lamina
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1052—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing
- Y10T156/1084—Methods of surface bonding and/or assembly therefor with cutting, punching, tearing or severing of continuous or running length bonded web
- Y10T156/1085—One web only
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/12—Surface bonding means and/or assembly means with cutting, punching, piercing, severing or tearing
- Y10T156/1317—Means feeding plural workpieces to be joined
- Y10T156/1322—Severing before bonding or assembling of parts
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/12—Surface bonding means and/or assembly means with cutting, punching, piercing, severing or tearing
- Y10T156/1317—Means feeding plural workpieces to be joined
- Y10T156/1322—Severing before bonding or assembling of parts
- Y10T156/1339—Delivering cut part in sequence to serially conveyed articles
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/12—Surface bonding means and/or assembly means with cutting, punching, piercing, severing or tearing
- Y10T156/1348—Work traversing type
- Y10T156/1352—Work traversing type with liquid applying means
Definitions
- the present invention relates to a mounting apparatus and a mounting method, and more particularly, to a band-shaped material in which a film for forming a dicing tape is adhered to one surface of a base sheet when a semiconductor wafer is fixed to a ring frame.
- the present invention relates to a mounting device and a mounting method capable of forming a dicing tape one by one from a substrate and fixing a semiconductor wafer to a ring frame via the dicing tape.
- a roll-shaped raw material formed by forming a label-shaped dicing tape in which a cut is made in advance on the film surface in accordance with the shape of the ring frame.
- the dicing tape is peeled off one by one and is adhered to a ring frame.
- Patent Document 1 JP-A-6-216242
- a continuous dicing tape is adhered in a strip shape while applying force, and the outer peripheral side of the tape is cut off with a cutter according to the shape of the ring frame.
- the dicing tape is cut in the plane of the ring frame Therefore, there is an inconvenience that the ring frame is significantly damaged by the cutter blade.
- the degree of the damage is more pronounced.
- the amount of tape cutting waste generated by the above-described cutter increases, and that the material is wasted wastefully and the economic burden is increased.
- the method of attaching a dicing tape cut in the shape of a ring frame in advance requires a separate step of forming a labeling dicing tape within the surface of the film. It becomes.
- the tape base is a hard and thick material, there is a disadvantage that the tape base is peeled off from the base sheet during the feeding.
- the dicing tape cut into a label shape is wound in a roll shape in a state where the dicing tape is adhered to the base sheet via an adhesive, so that the dicing tape is cut in each layer along the radial direction of the roll.
- the singing tape will not always be wound so as to overlap exactly.
- a pressing mark (step) or a pressing scratch due to the winding pressure is formed on the surface of the dicing tape, and the planar accuracy is greatly reduced.
- a dicing tape having such a pressing mark or a pressing scratch is bonded to a ring frame, air mixing or the like due to a decrease in planar accuracy is caused to cause a problem such as poor bonding.
- the present invention has been devised in view of such inconvenience, and an object thereof is to form a dicing tape in a predetermined shape in a process of feeding a strip-shaped material, and to form a dicing tape immediately after the dicing tape is formed.
- An object of the present invention is to provide a mounting device and a mounting method that can be attached to a semiconductor wafer and a ring frame so that a cutting step using a cutter after the attachment is unnecessary.
- Another object of the present invention is to provide a mounting device and a mounting method capable of improving the sticking accuracy by avoiding the adverse effects of the conventional winding pressure.
- an apparatus of the present invention provides a semiconductor wafer by attaching a dicing tape to a ring frame in a state where the semiconductor wafer is arranged in an inner region of the ring frame arranged on a table.
- a precut means for forming a dicing tape by providing only a dicing tape, and a bonding means for peeling the dicing tape from a base sheet and bonding the dicing tape to a ring frame to fix the semiconductor wafer to the ring frame.
- tension adjusting means is disposed between the support means and the precut means
- the tension adjusting means includes a dancer roller which can be moved up and down so as to allow the band-shaped material to be fed out toward the bonding means while applying tension by its own weight to the band-shaped material, and a rising position of the dancer roller.
- a first sensor and a second sensor that respectively detect a descending position
- the support means draws out a predetermined amount of the band-shaped material and lowers the dancer roller when the ascending position of the dancer roller is detected by the first sensor, and the support means when the descending position of the dancer roller is detected by the second sensor.
- U, U is preferably provided to stop the feeding of the strip material.
- a ring frame is arranged on a table, a semiconductor wafer is arranged in an inner region of the ring frame, and a dicing tape is attached to the ring frame to attach the semiconductor wafer.
- a cut is formed in the film according to the size of the ring frame in a process of feeding out a band-shaped material having a film for forming a dicing tape adhered to one surface of a base sheet;
- the dicing tape formed inside the cut is peeled from the base sheet, the dicing tape and the table are relatively moved, and the dicing tape is attached to the semiconductor wafer and the ring frame, and the semiconductor wafer is fixed to the ring frame. To do that.
- a tension adjusting means is disposed between the support means and the pre-cutting means, and the tension adjusting means applies a tension by its own weight to the band-shaped material while attaching to the bonding means.
- a dancer roller that can move up and down so as to allow the belt-like material to be fed out with a direction force, and a first and a second that detect a rising position and a falling position of the dancer roller, respectively.
- the support means draws out a predetermined amount of the band-shaped material and lowers the dancer roller when the ascending position of the dancer roller is detected by the first sensor, and the support means when the descending position of the dancer roller is detected by the second sensor.
- Means Force It is preferable to adopt a method of repeating the operation of stopping the feeding of the band-shaped material.
- the band-shaped material is configured in a state where the film for forming the dicing tape is adhered to the base sheet, and the band-shaped material is wound in a roll and is fed out.
- a cut is formed by the pre-cutting means at the intermediate position of the fed strip-shaped material so as to have a planar shape corresponding to the shape of the ring frame, and a dicing tape is formed in an inner region surrounded by the cut line.
- This dicing tape is, for example, peeled off via a peel plate or the like, and then attached to the ring frame and the surface of the semiconductor wafer.
- the dicing tape is formed in the process of being unwound from the roll-shaped raw material, the above-described press marks and press flaws due to the winding pressure are not formed in the dicing tape. Can be adhered to the semiconductor wafer and the ring frame while maintaining high precision.
- the tension adjusting means By providing the tension adjusting means, the tension to the belt-shaped material can be always kept constant, and the bonding position of the die-cut dicing tape can be accurately maintained.
- FIG. 1 shows a schematic front view of a mounting apparatus according to the present embodiment
- FIG. 2 shows a schematic perspective view of a main part.
- a mounting device 10 is provided on an upper portion of a frame F, and a table 11 on which a ring frame RF and a semiconductor wafer W (see FIG. 3) can be mounted, and a mounting device 10 supported by the frame F.
- Brake-controllable support rollers 12 (supported) that are provided in the plane of plate Means), a precut device 13 for forming a dicing tape T (see FIG. 2) by providing a substantially circular cut in the strip-shaped material A fed from the support roller 12, and a ring frame RF and And a bonding means 34 for bonding to the semiconductor wafer W.
- the table 11 is provided so as to be able to move up and down, and is also provided so as to be movable in the left-right direction in FIG. 1, and moves from a right position to a left position indicated by a two-dot chain line in FIG. Sometimes, the dicing tape T can be attached. As shown in FIG. 3, the table 11 is provided in a planar shape in which the surface position of the center portion is slightly higher than the surface position of the outer peripheral portion, so that the upper surface positions of the ring frame RF and the semiconductor wafer W are approximately equal. Are matched.
- the table 11 is provided with a number of suction holes (not shown) opened on the upper surface side, and the ring frame RF, semiconductor wafer, and W arranged on the upper surface are kept at predetermined positions by the operation of a pressure reducing pump (not shown). It is provided as follows. The ring frame RF and the semiconductor wafers, W, are set on the table 11 in a state where their positions are adjusted via an alignment device, not shown. At this time, the circuit surface formed on the lower surface side of the semiconductor wafer W is covered with the protective sheet PS (see FIG. 3).
- the strip material A is formed by attaching a film FL to one surface of a base sheet S made of a release sheet or the like. It is configured to be sequentially fed out while being supported by the support roller 12.
- the support roller 12 is connected to an output shaft of a motor Ml, and the motor Ml rotates intermittently at a timing described later so as to feed out the band-shaped material A over a predetermined length. Further, along the downstream side of the belt material A in the feeding direction from the support roller 12, a guide roller 20, a dancer roller 21 as tension maintaining means for applying a constant tension to the belt material A by its own weight, and a rise of the dancer roller 21
- the first and second sensors SI and S2 for detecting the position and the descending position, respectively, the upstream tension roller 22 to which the biasing force is applied in the clockwise direction in FIG.
- the motor M2 stops the winding rotation of the winding roller 33 when the rising position of the dancer roller 31 is detected by the third sensor S3.
- the winding roller 33 is rotated to perform winding.
- the press roller 27 is rotatably supported on a motor output shaft (not shown) via a predetermined gear to apply repetitive power to the strip-shaped material A, and to apply the dicing tape T after peeling to the ring frame RF and the semiconductor wafer. It is configured to apply a bonding pressing force to the upper surface of W (see Patent No. 3174917).
- the peeling plate 26 and the press roller 27 constitute a bonding means 34.
- the pre-cutting device 13 also has a force with a die roller 35 located on the film FL side of the band material A, and a die receiving plate 36 arranged so as to sandwich the band material A between the die roller 35 and the die roller 35.
- the die roller 35 is provided with a cutter blade 35B on the outer peripheral side of the roller 35A.
- a half-cut cut L is formed on the surface of the film FL to form the cut L.
- a dicing tape is formed inside the area surrounded by L.
- Various types of die rollers 35 are prepared according to the size of the ring frame RF, and can be replaced according to the target ring frame RF.
- a web of the strip-shaped material A supported by the support roller 12 is drawn out by a predetermined length, and is wound around the above-described roller group to fix the lead end to the winding roller 33.
- the ring frame RF and the semiconductor wafers and W are mounted on the table 11 via an appropriate transfer robot in an aligned state, and are suction-held on the table 11.
- the press roller 27 rotates to apply repetitive power to the band-shaped material A sandwiched between the press roller 27 and the peel plate 26, and the dancer roller 21 rises.
- the belt material A is fed out.
- the motor Ml is driven to feed out the belt-shaped material A from the support roller 12 and lower the dancer roller 21.
- the motor Ml is driven until the lower position of the dancer roller 21 is detected by the second sensor S2. In this way, the dancer roller 21 continues to apply a constant tension to the belt-shaped material A by its own weight.
- the upstream tension roller 22 is urged clockwise, while the downstream tension roller 29 is urged counterclockwise.
- the dancer roller 31 located on the downstream side moves downward with the feeding of the belt-shaped material A, and the lowered position is detected by the fourth sensor S4, so that the motor M2 of the winding roller 33 is driven.
- the winding is started, and the winding is continued until the dancer roller 31 detects that the third sensor S3 has reached the ascending position.
- the precut device 13 makes a half cut-shaped cut L on the film FL surface by the rotation of the die roller 35 to form the dicing tape T.
- the table 11 moves to the left in FIG.
- the timing is adjusted via a sensor (not shown) so that the leading end side in the moving direction of the ring frame RF is located directly below.
- the diving tape T can be attached to the ring frame RF by the press roller 27 while synchronizing the movement speed to the middle left side substantially (see Fig. 5).
- the semiconductor wafer W is fixed to the ring frame RF in this manner, the semiconductor wafer W is sucked and held together with the S ring frame RF via a transfer device (not shown). Then, the protective sheet PS attached to the circuit surface side of the semiconductor wafer W is peeled off after the upper and lower surface positions are inverted and transferred to the subsequent process, and the dicing process is performed.
- the dicing tape T having a planar shape corresponding to the shape of the ring frame RF can be attached immediately after being formed from the strip material A. This eliminates the need for a step of cutting the film FL. Since a strip-shaped material on which a label-shaped dicing tape is formed in advance is not used by winding it into a roll, the bonding can be performed while maintaining the surface accuracy of the dicing tape at high accuracy. .
- the pre-cut device 13 can be replaced with various configurations.
- a die plate 51 having a substantially circular blade 50 is employed in place of the die roller 35, and a moving roller 52 is employed in place of the die receiving plate 36.
- the dicing tape T may be formed by rotating the moving roller 52 along the vertical direction.
- This type of pre-cutting device 13 includes a motor M2 fixed to a frame (not shown), a rotating member 60 rotatable by driving the motor M2, and a blade 62 held by the rotating member 60. By rotating the member 60, a substantially circular dicing tape T can be formed. At this time, the blade 62 Can be easily applied to ring frames of various sizes by adjusting the position with respect to the center of rotation.
- the dicing tape T is formed in a state where the strip-shaped material A is continuously fed, and the pre-cutting device 13 shown in FIGS. 5 and 6 is used.
- the device 13 can be adapted to the case where the strip material A is intermittently fed.
- the present invention can be used as a semiconductor wafer processing apparatus.
- FIG. 1 is a schematic front view of a mounting device according to the present embodiment.
- FIG. 2 is a schematic perspective view of a main part of FIG. 1.
- FIG. 3 is a schematic sectional view of a table.
- FIG. 4 is a schematic perspective view similar to FIG. 2, showing a state after a dicing tape has been attached.
- FIG. 5 is a schematic perspective view of a main part showing a modification.
- FIG. 6 is a schematic perspective view of a main part showing still another modified example.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020067006894A KR101059431B1 (ko) | 2003-10-10 | 2004-09-29 | 마운팅 장치 및 마운팅 방법 |
US10/574,847 US8196632B2 (en) | 2003-10-10 | 2004-09-29 | Mounting apparatus and mounting method |
EP04788265.9A EP1672684B1 (en) | 2003-10-10 | 2004-09-29 | Mounting device and method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003351900A JP4444619B2 (ja) | 2003-10-10 | 2003-10-10 | マウント装置及びマウント方法 |
JP2003-351900 | 2003-10-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005036628A1 true WO2005036628A1 (ja) | 2005-04-21 |
Family
ID=34431094
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2004/014198 WO2005036628A1 (ja) | 2003-10-10 | 2004-09-29 | マウント装置及びマウント方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US8196632B2 (ja) |
EP (1) | EP1672684B1 (ja) |
JP (1) | JP4444619B2 (ja) |
KR (1) | KR101059431B1 (ja) |
CN (1) | CN100437918C (ja) |
SG (1) | SG147427A1 (ja) |
TW (1) | TW200514188A (ja) |
WO (1) | WO2005036628A1 (ja) |
Cited By (1)
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US7850799B2 (en) | 2006-02-22 | 2010-12-14 | Nitto Denko Corporation | Method for affixing adhesive tape to semiconductor wafer, and apparatus using the same |
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JP4795743B2 (ja) * | 2005-05-19 | 2011-10-19 | リンテック株式会社 | 貼付装置 |
JP4541237B2 (ja) * | 2005-06-29 | 2010-09-08 | リンテック株式会社 | 半導体ウエハ処理テープ巻装体およびそれを用いた半導体ウエハ処理テープ貼着装置ならびに半導体ウエハ加工処理装置 |
JP4441451B2 (ja) * | 2005-07-07 | 2010-03-31 | リンテック株式会社 | シート貼付装置 |
JP4441450B2 (ja) * | 2005-07-07 | 2010-03-31 | リンテック株式会社 | シート貼付装置及び貼付方法 |
JP2007043057A (ja) * | 2005-07-07 | 2007-02-15 | Lintec Corp | シート貼付用テーブル |
JP4461176B2 (ja) * | 2005-08-11 | 2010-05-12 | リンテック株式会社 | シート貼付装置及び貼付方法 |
JP4468884B2 (ja) * | 2005-12-09 | 2010-05-26 | リンテック株式会社 | テープ貼付装置、マウント装置及びマウント方法 |
JP4884075B2 (ja) | 2006-05-22 | 2012-02-22 | 株式会社東京精密 | テープ貼付方法およびテープ貼付装置 |
JP5112984B2 (ja) * | 2008-08-06 | 2013-01-09 | リンテック株式会社 | シート貼付装置及び貼付方法 |
JP4995796B2 (ja) * | 2008-09-30 | 2012-08-08 | 日東電工株式会社 | 粘着テープ貼付け方法および粘着テープ貼付け装置 |
JP5006300B2 (ja) * | 2008-10-23 | 2012-08-22 | リンテック株式会社 | マウント装置及びマウント方法 |
JP5412226B2 (ja) * | 2009-10-01 | 2014-02-12 | 日東電工株式会社 | 粘着テープ貼付け装置 |
US8167017B2 (en) * | 2009-11-13 | 2012-05-01 | Pitney Bowes Inc. | Multi-mode system for dispensing adhesive-backed labels |
JP5529503B2 (ja) * | 2009-11-13 | 2014-06-25 | リンテック株式会社 | 帯状体の巻取装置及び巻取方法 |
US8047250B2 (en) * | 2009-11-23 | 2011-11-01 | Pitney Bowes Inc. | Postage label dispensing system and repositionable peeler guide therefor |
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Also Published As
Publication number | Publication date |
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SG147427A1 (en) | 2008-11-28 |
KR101059431B1 (ko) | 2011-08-25 |
EP1672684A4 (en) | 2010-05-26 |
JP4444619B2 (ja) | 2010-03-31 |
KR20060125720A (ko) | 2006-12-06 |
JP2005116928A (ja) | 2005-04-28 |
EP1672684A1 (en) | 2006-06-21 |
US20070131344A1 (en) | 2007-06-14 |
US8196632B2 (en) | 2012-06-12 |
EP1672684B1 (en) | 2015-12-09 |
TWI331786B (ja) | 2010-10-11 |
CN1868038A (zh) | 2006-11-22 |
TW200514188A (en) | 2005-04-16 |
CN100437918C (zh) | 2008-11-26 |
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