TWI306157B - - Google Patents

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Publication number
TWI306157B
TWI306157B TW095138363A TW95138363A TWI306157B TW I306157 B TWI306157 B TW I306157B TW 095138363 A TW095138363 A TW 095138363A TW 95138363 A TW95138363 A TW 95138363A TW I306157 B TWI306157 B TW I306157B
Authority
TW
Taiwan
Prior art keywords
circuit
substrate
power supply
electrode
signal
Prior art date
Application number
TW095138363A
Other languages
English (en)
Chinese (zh)
Other versions
TW200732677A (en
Inventor
Masato Ikeda
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200732677A publication Critical patent/TW200732677A/zh
Application granted granted Critical
Publication of TWI306157B publication Critical patent/TWI306157B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
TW095138363A 2005-11-29 2006-10-18 Sensor board, and inspection method and apparatus using the same TW200732677A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005343170A JP5276774B2 (ja) 2005-11-29 2005-11-29 検査方法及び装置

Publications (2)

Publication Number Publication Date
TW200732677A TW200732677A (en) 2007-09-01
TWI306157B true TWI306157B (ja) 2009-02-11

Family

ID=38125657

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095138363A TW200732677A (en) 2005-11-29 2006-10-18 Sensor board, and inspection method and apparatus using the same

Country Status (4)

Country Link
JP (1) JP5276774B2 (ja)
KR (1) KR100863986B1 (ja)
CN (1) CN100538379C (ja)
TW (1) TW200732677A (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009080042A (ja) * 2007-09-26 2009-04-16 Oht Inc 回路パターン検査装置
JP5269482B2 (ja) * 2008-05-28 2013-08-21 株式会社日本マイクロニクス センサ基板及び検査装置
WO2010041403A1 (ja) * 2008-10-10 2010-04-15 株式会社ニコン 可撓性基板、表示素子の製造方法及び表示素子の製造装置
CN103105186A (zh) * 2011-11-14 2013-05-15 鸿富锦精密工业（深圳）有限公司 自动更换测针系统及方法
JP5433876B1 (ja) * 2013-03-26 2014-03-05 オー・エイチ・ティー株式会社 回路パターン検査装置
KR102387464B1 (ko) * 2017-10-12 2022-04-15 삼성전자주식회사 배선 회로 테스트 장치 및 방법과, 그 방법을 포함한 반도체 소자 제조방법
CN108039405B (zh) * 2018-01-11 2023-10-20 中国工程物理研究院总体工程研究所 一种压电元件、压电传感器和速度及位移检测装置
CN112485724A (zh) * 2019-08-21 2021-03-12 泰科电子(上海)有限公司 柔性扁平电缆测试系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58103671A (ja) * 1981-12-15 1983-06-20 Fujitsu Ltd パタ−ンチエツカ−の制御方法
JPS6444866A (en) * 1987-08-13 1989-02-17 Mitsui Mining & Smelting Co Method and apparatus for inspecting continuity of precise circuit pattern
JPH01119093A (ja) * 1987-10-31 1989-05-11 Toshiba Corp 配線パターンの検査装置
JPH05196679A (ja) * 1992-01-22 1993-08-06 Fujitsu Ltd 液晶表示板の検査方法と検査装置
JPH0763809A (ja) * 1993-08-27 1995-03-10 Ntn Corp 短絡欠陥検査修正装置
US5517110A (en) * 1995-04-06 1996-05-14 Yentec Inc. Contactless test method and system for testing printed circuit boards
JP2001084905A (ja) * 1999-09-14 2001-03-30 Dainippon Printing Co Ltd 電極検査装置及び電極検査方法
JP2001194405A (ja) * 2000-01-07 2001-07-19 Oht Kk 基板検査用プローブおよび基板検査方法
JP2002156417A (ja) * 2000-11-17 2002-05-31 Oht Inc 回路基板の検査装置及び検査方法
JP4450143B2 (ja) * 2001-05-24 2010-04-14 オー・エイチ・ティー株式会社 回路パターン検査装置並びに回路パターン検査方法及び記録媒体
JP2002365325A (ja) * 2001-06-11 2002-12-18 Oht Inc 回路パターン検査装置並びに回路パターン検査方法及び記録媒体
JP4244807B2 (ja) * 2001-12-27 2009-03-25 パナソニック株式会社 方位センサ
WO2004051290A1 (ja) * 2002-11-30 2004-06-17 Oht Inc. 回路パターン検査装置及び回路パターン検査方法
KR100528696B1 (ko) * 2003-05-06 2005-11-16 엘지.필립스 엘시디 주식회사 평판표시장치의 검사방법 및 장치
JP4562358B2 (ja) * 2003-07-04 2010-10-13 株式会社ユニオンアロー・テクノロジー 導電パターン検査装置
JP3781056B2 (ja) * 2003-07-18 2006-05-31 愛知製鋼株式会社 ３次元磁気方位センサおよびマグネト・インピーダンス・センサ素子

Also Published As

Publication number Publication date
TW200732677A (en) 2007-09-01
CN100538379C (zh) 2009-09-09
JP5276774B2 (ja) 2013-08-28
CN1975447A (zh) 2007-06-06
KR20070056950A (ko) 2007-06-04
JP2007147474A (ja) 2007-06-14
KR100863986B1 (ko) 2008-10-16

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MM4A Annulment or lapse of patent due to non-payment of fees