CN100538379C - 传感器基板和使用它的检查方法及装置 - Google Patents

传感器基板和使用它的检查方法及装置 Download PDF

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Publication number
CN100538379C
CN100538379C CNB2006101607252A CN200610160725A CN100538379C CN 100538379 C CN100538379 C CN 100538379C CN B2006101607252 A CNB2006101607252 A CN B2006101607252A CN 200610160725 A CN200610160725 A CN 200610160725A CN 100538379 C CN100538379 C CN 100538379C
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CN
China
Prior art keywords
mentioned
electrode
inspection
signal
base plate
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Expired - Fee Related
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CNB2006101607252A
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English (en)
Chinese (zh)
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CN1975447A (zh
Inventor
池田真人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Publication of CN1975447A publication Critical patent/CN1975447A/zh
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Publication of CN100538379C publication Critical patent/CN100538379C/zh
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
CNB2006101607252A 2005-11-29 2006-11-29 传感器基板和使用它的检查方法及装置 Expired - Fee Related CN100538379C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005343170 2005-11-29
JP2005343170A JP5276774B2 (ja) 2005-11-29 2005-11-29 検査方法及び装置

Publications (2)

Publication Number Publication Date
CN1975447A CN1975447A (zh) 2007-06-06
CN100538379C true CN100538379C (zh) 2009-09-09

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ID=38125657

Family Applications (1)

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CNB2006101607252A Expired - Fee Related CN100538379C (zh) 2005-11-29 2006-11-29 传感器基板和使用它的检查方法及装置

Country Status (4)

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JP (1) JP5276774B2 (ja)
KR (1) KR100863986B1 (ja)
CN (1) CN100538379C (ja)
TW (1) TW200732677A (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009080042A (ja) * 2007-09-26 2009-04-16 Oht Inc 回路パターン検査装置
JP5269482B2 (ja) * 2008-05-28 2013-08-21 株式会社日本マイクロニクス センサ基板及び検査装置
WO2010041403A1 (ja) * 2008-10-10 2010-04-15 株式会社ニコン 可撓性基板、表示素子の製造方法及び表示素子の製造装置
CN103105186A (zh) * 2011-11-14 2013-05-15 鸿富锦精密工业（深圳）有限公司 自动更换测针系统及方法
JP5433876B1 (ja) * 2013-03-26 2014-03-05 オー・エイチ・ティー株式会社 回路パターン検査装置
KR102387464B1 (ko) * 2017-10-12 2022-04-15 삼성전자주식회사 배선 회로 테스트 장치 및 방법과, 그 방법을 포함한 반도체 소자 제조방법
CN108039405B (zh) * 2018-01-11 2023-10-20 中国工程物理研究院总体工程研究所 一种压电元件、压电传感器和速度及位移检测装置
CN112485724A (zh) * 2019-08-21 2021-03-12 泰科电子(上海)有限公司 柔性扁平电缆测试系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1511262A (zh) * 2001-05-24 2004-07-07 Oht��ʽ���� 电路布图检查装置和电路布图检查方法及记录媒体
JP2004191381A (ja) * 2002-11-30 2004-07-08 Oht Inc 回路パターン検査装置及び回路パターン検査方法
CN1514939A (zh) * 2001-06-11 2004-07-21 Oht��ʽ���� 电路布图检查装置和电路布图检查方法及记录媒体
CN1576870A (zh) * 2003-07-04 2005-02-09 株式会社东京阴极研究所 导电图案检查装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58103671A (ja) * 1981-12-15 1983-06-20 Fujitsu Ltd パタ−ンチエツカ−の制御方法
JPS6444866A (en) * 1987-08-13 1989-02-17 Mitsui Mining & Smelting Co Method and apparatus for inspecting continuity of precise circuit pattern
JPH01119093A (ja) * 1987-10-31 1989-05-11 Toshiba Corp 配線パターンの検査装置
JPH05196679A (ja) * 1992-01-22 1993-08-06 Fujitsu Ltd 液晶表示板の検査方法と検査装置
JPH0763809A (ja) * 1993-08-27 1995-03-10 Ntn Corp 短絡欠陥検査修正装置
US5517110A (en) * 1995-04-06 1996-05-14 Yentec Inc. Contactless test method and system for testing printed circuit boards
JP2001084905A (ja) * 1999-09-14 2001-03-30 Dainippon Printing Co Ltd 電極検査装置及び電極検査方法
JP2001194405A (ja) * 2000-01-07 2001-07-19 Oht Kk 基板検査用プローブおよび基板検査方法
JP2002156417A (ja) * 2000-11-17 2002-05-31 Oht Inc 回路基板の検査装置及び検査方法
JP4244807B2 (ja) * 2001-12-27 2009-03-25 パナソニック株式会社 方位センサ
KR100528696B1 (ko) * 2003-05-06 2005-11-16 엘지.필립스 엘시디 주식회사 평판표시장치의 검사방법 및 장치
JP3781056B2 (ja) * 2003-07-18 2006-05-31 愛知製鋼株式会社 ３次元磁気方位センサおよびマグネト・インピーダンス・センサ素子

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1511262A (zh) * 2001-05-24 2004-07-07 Oht��ʽ���� 电路布图检查装置和电路布图检查方法及记录媒体
CN1514939A (zh) * 2001-06-11 2004-07-21 Oht��ʽ���� 电路布图检查装置和电路布图检查方法及记录媒体
JP2004191381A (ja) * 2002-11-30 2004-07-08 Oht Inc 回路パターン検査装置及び回路パターン検査方法
CN1576870A (zh) * 2003-07-04 2005-02-09 株式会社东京阴极研究所 导电图案检查装置

Also Published As

Publication number Publication date
TW200732677A (en) 2007-09-01
TWI306157B (ja) 2009-02-11
JP5276774B2 (ja) 2013-08-28
CN1975447A (zh) 2007-06-06
KR20070056950A (ko) 2007-06-04
JP2007147474A (ja) 2007-06-14
KR100863986B1 (ko) 2008-10-16

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