TW200732677A - Sensor board, and inspection method and apparatus using the same - Google Patents
Sensor board, and inspection method and apparatus using the sameInfo
- Publication number
- TW200732677A TW200732677A TW095138363A TW95138363A TW200732677A TW 200732677 A TW200732677 A TW 200732677A TW 095138363 A TW095138363 A TW 095138363A TW 95138363 A TW95138363 A TW 95138363A TW 200732677 A TW200732677 A TW 200732677A
- Authority
- TW
- Taiwan
- Prior art keywords
- board
- sensor board
- spaced apart
- sensor
- inspection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The invention is to specify the presence of disconnection and a disconnected part by relatively moving a sensor board and a board to be inspected once. The sensor board is used for the inspection of the board to be inspected, such as a glass board of a display panel, comprising a plurality of circuits extending in a second direction spaced apart in a first direction. The sensor board includes at least one power supplying electrode for supplying the circuit with an AC inspection signal in a noncontact manner, a plurality of power receiving electrodes which are spaced apart at least in the first direction and are spaced apart in the second direction so that each of which receives the inspection signal supplied to the circuit in a noncontact manner, and a plurality of sensor circuits which output an electric signal indicating the presence of a reception signal by the power receiving electrode.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005343170A JP5276774B2 (en) | 2005-11-29 | 2005-11-29 | Inspection method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200732677A true TW200732677A (en) | 2007-09-01 |
TWI306157B TWI306157B (en) | 2009-02-11 |
Family
ID=38125657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095138363A TW200732677A (en) | 2005-11-29 | 2006-10-18 | Sensor board, and inspection method and apparatus using the same |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5276774B2 (en) |
KR (1) | KR100863986B1 (en) |
CN (1) | CN100538379C (en) |
TW (1) | TW200732677A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI500006B (en) * | 2008-10-10 | 2015-09-11 | 尼康股份有限公司 | A flexible substrate, a manufacturing method of a display element, and a manufacturing apparatus for a display device |
TWI550373B (en) * | 2011-11-14 | 2016-09-21 | 鴻海精密工業股份有限公司 | System and method for automatically replacing measuring probes |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009080042A (en) * | 2007-09-26 | 2009-04-16 | Oht Inc | Circuit pattern inspection device |
JP5269482B2 (en) * | 2008-05-28 | 2013-08-21 | 株式会社日本マイクロニクス | Sensor substrate and inspection device |
JP5433876B1 (en) * | 2013-03-26 | 2014-03-05 | オー・エイチ・ティー株式会社 | Circuit pattern inspection device |
KR102387464B1 (en) * | 2017-10-12 | 2022-04-15 | 삼성전자주식회사 | Apparatus and method for testing interconnect circuit, and method for manufacturing semiconductor device comprising the method |
CN108039405B (en) * | 2018-01-11 | 2023-10-20 | 中国工程物理研究院总体工程研究所 | Piezoelectric element, piezoelectric sensor, speed and displacement detection device |
CN112485724A (en) * | 2019-08-21 | 2021-03-12 | 泰科电子(上海)有限公司 | Flexible flat cable test system |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58103671A (en) * | 1981-12-15 | 1983-06-20 | Fujitsu Ltd | Controlling method of pattern checker |
JPS6444866A (en) * | 1987-08-13 | 1989-02-17 | Mitsui Mining & Smelting Co | Method and apparatus for inspecting continuity of precise circuit pattern |
JPH01119093A (en) * | 1987-10-31 | 1989-05-11 | Toshiba Corp | Device for inspecting wiring pattern |
JPH05196679A (en) * | 1992-01-22 | 1993-08-06 | Fujitsu Ltd | Inspection method and inspection device for liquid crystal display board |
JPH0763809A (en) * | 1993-08-27 | 1995-03-10 | Ntn Corp | Short circuit defect inspection corrector |
US5517110A (en) * | 1995-04-06 | 1996-05-14 | Yentec Inc. | Contactless test method and system for testing printed circuit boards |
JP2001084905A (en) * | 1999-09-14 | 2001-03-30 | Dainippon Printing Co Ltd | Inspection device for electrode and method therefor |
JP2001194405A (en) * | 2000-01-07 | 2001-07-19 | Oht Kk | Probe for inspecting substrate and inspection/method for substrate |
JP2002156417A (en) * | 2000-11-17 | 2002-05-31 | Oht Inc | Apparatus and method for inspecting circuit board |
JP4450143B2 (en) * | 2001-05-24 | 2010-04-14 | オー・エイチ・ティー株式会社 | Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium |
JP2002365325A (en) * | 2001-06-11 | 2002-12-18 | Oht Inc | Circuit pattern inspection device, circuit pattern inspection method and storage medium |
JP4244807B2 (en) * | 2001-12-27 | 2009-03-25 | パナソニック株式会社 | Direction sensor |
WO2004051290A1 (en) * | 2002-11-30 | 2004-06-17 | Oht Inc. | Circuit pattern inspection device and circuit pattern inspection method |
KR100528696B1 (en) * | 2003-05-06 | 2005-11-16 | 엘지.필립스 엘시디 주식회사 | Method and Apparatus for Testing Flat Panel Display |
JP4562358B2 (en) * | 2003-07-04 | 2010-10-13 | 株式会社ユニオンアロー・テクノロジー | Conductive pattern inspection device |
JP3781056B2 (en) * | 2003-07-18 | 2006-05-31 | 愛知製鋼株式会社 | 3D magnetic orientation sensor and magneto-impedance sensor element |
-
2005
- 2005-11-29 JP JP2005343170A patent/JP5276774B2/en not_active Expired - Fee Related
-
2006
- 2006-10-18 TW TW095138363A patent/TW200732677A/en not_active IP Right Cessation
- 2006-11-21 KR KR1020060114999A patent/KR100863986B1/en not_active IP Right Cessation
- 2006-11-29 CN CNB2006101607252A patent/CN100538379C/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI500006B (en) * | 2008-10-10 | 2015-09-11 | 尼康股份有限公司 | A flexible substrate, a manufacturing method of a display element, and a manufacturing apparatus for a display device |
US9178155B2 (en) | 2008-10-10 | 2015-11-03 | Nikon Corporation | Flexible substrate, manufacturing method of display element, and manufacturing apparatus of display element |
TWI550373B (en) * | 2011-11-14 | 2016-09-21 | 鴻海精密工業股份有限公司 | System and method for automatically replacing measuring probes |
Also Published As
Publication number | Publication date |
---|---|
CN100538379C (en) | 2009-09-09 |
TWI306157B (en) | 2009-02-11 |
JP5276774B2 (en) | 2013-08-28 |
CN1975447A (en) | 2007-06-06 |
KR20070056950A (en) | 2007-06-04 |
JP2007147474A (en) | 2007-06-14 |
KR100863986B1 (en) | 2008-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |