JPS6444866A - Method and apparatus for inspecting continuity of precise circuit pattern - Google Patents
Method and apparatus for inspecting continuity of precise circuit patternInfo
- Publication number
- JPS6444866A JPS6444866A JP62202457A JP20245787A JPS6444866A JP S6444866 A JPS6444866 A JP S6444866A JP 62202457 A JP62202457 A JP 62202457A JP 20245787 A JP20245787 A JP 20245787A JP S6444866 A JPS6444866 A JP S6444866A
- Authority
- JP
- Japan
- Prior art keywords
- circuit pattern
- probe
- pairs
- pattern
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
PURPOSE:To simply and certainly inspect the continuity of a precise circuit pattern, by mounting at least two pairs of probes on the circuit pattern. CONSTITUTION:At first, at least two pairs of probes 8x1-x12, 8y1-y12 on an inspection plate 9 are respectively mounted on circuit patterns 3a-3l. Next, the inspection plate 9 is pressed to a printed wiring board 2 so that the adjacent circuit pattern pairs 3a, 3b to be inspected and two pairs of the probes 8x1, 8y1 and 8x2, 8y2 are respectively electrically connected. In the pressed state, a current is supplied to one probe 8x1 to be inputted to one pattern 3a and the presence of the output from the other probe 8y1 is detected to confirm the electrical connection of the pattern 3a and the probe 8x1 and, at the same time, the presence of the output from the probe 8y2 of the adjacent other pair is detected. Subsequently, the adjacent circuit pattern pair becoming an object to be inspected is successively changed over from 3a, 3b to 3b, 3c and this operation is repeated to inspect all of the circuit patterns 3a-3l of the wiring board 2 to inspect the continuity of the whole of the circuit patterns.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62202457A JPS6444866A (en) | 1987-08-13 | 1987-08-13 | Method and apparatus for inspecting continuity of precise circuit pattern |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62202457A JPS6444866A (en) | 1987-08-13 | 1987-08-13 | Method and apparatus for inspecting continuity of precise circuit pattern |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6444866A true JPS6444866A (en) | 1989-02-17 |
Family
ID=16457844
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62202457A Pending JPS6444866A (en) | 1987-08-13 | 1987-08-13 | Method and apparatus for inspecting continuity of precise circuit pattern |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6444866A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007147474A (en) * | 2005-11-29 | 2007-06-14 | Micronics Japan Co Ltd | Sensor board, and inspection method and apparatus using same |
-
1987
- 1987-08-13 JP JP62202457A patent/JPS6444866A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007147474A (en) * | 2005-11-29 | 2007-06-14 | Micronics Japan Co Ltd | Sensor board, and inspection method and apparatus using same |
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