JPH05196679A - Inspection method and inspection device for liquid crystal display board - Google Patents
Inspection method and inspection device for liquid crystal display boardInfo
- Publication number
- JPH05196679A JPH05196679A JP881092A JP881092A JPH05196679A JP H05196679 A JPH05196679 A JP H05196679A JP 881092 A JP881092 A JP 881092A JP 881092 A JP881092 A JP 881092A JP H05196679 A JPH05196679 A JP H05196679A
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- crystal display
- inspection
- display panel
- inspecting
- Prior art date
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- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は X-Yクロスオーバを持つ
マトリックス型液晶表示板の欠陥検査方法に係り、特に
検査工数の削減と検査装置の低価格化を実現して生産性
の向上を図った液晶表示板の検査方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a defect inspection method for a matrix type liquid crystal display panel having an XY crossover, and in particular, it aims to improve the productivity by reducing the inspection man-hours and the inspection device cost. The present invention relates to a method for inspecting a liquid crystal display board.
【０００２】パーソナルコンピュータやワードプロセッ
サ等の分野では情報表示手段に従来のブラウン管（ＣＲ
Ｔ）表示に代わるものとして薄型化，軽量化，低消費電
力化が実現し得る液晶表示装置が多用されるようになっ
てきている。In the field of personal computers, word processors, etc., a conventional cathode ray tube (CR) is used as an information display means.
T) As an alternative to the display, a liquid crystal display device which can realize thinning, lightening, and low power consumption has been widely used.
【０００３】そしてかかる液晶表示装置を構成する液晶
表示板には、二枚の透明基板で単純な電極線マトリック
スを形成した後液晶体を封入して構成する液晶パネル
と、例えば一枚の透明基板上に各交点が短絡しない電極
線マトリックスとそれぞれの各交点近傍にX,Y 電極線に
繋がる薄膜トランジスタとをパターン形成した後他の透
明基板との間に液晶体を封入して構成するＴＦＴ(Thin
Film Transistor)液晶表示板の如き X-Yクロスオーバを
持つ液晶表示板とが実用化されているが、表示画像のコ
ントラストが良いことと多色化が容易なこと等の理由か
ら後者の液晶表示板が増加しつつある現状にある。The liquid crystal display plate constituting such a liquid crystal display device includes a liquid crystal panel formed by forming a simple electrode line matrix with two transparent substrates and then enclosing a liquid crystal body, and one transparent substrate, for example. A TFT (Thin that is constructed by encapsulating a liquid crystal between another electrode and an electrode line matrix where each intersection is not short-circuited and a thin film transistor connected to the X and Y electrode lines near each intersection is patterned.
Film Transistor) A liquid crystal display panel with an XY crossover such as a liquid crystal display panel has been put into practical use, but the latter liquid crystal display panel is used because of the good contrast of the displayed image and the ease of multicoloring. The situation is increasing.
【０００４】[0004]
【従来の技術】以下図によって、ＴＦＴ液晶表示板の場
合を例として説明する。図３はＴＦＴ液晶表示板を概略
的に説明する図であり、図４は従来の液晶表示板の検査
方法を説明する図である。2. Description of the Related Art A case of a TFT liquid crystal display panel will be described below with reference to the drawings. FIG. 3 is a diagram schematically illustrating a TFT liquid crystal display panel, and FIG. 4 is a diagram illustrating a conventional liquid crystal display panel inspection method.
【０００５】図３でＴＦＴ液晶表示板（以下単に液晶表
示板とする）１は第１の透明基板11と該基板11に液晶体
を挟んで添着される第２の透明基板12とで構成されてお
り、全面に透明電極が形成されている該第２の透明基板
12は上記第１の透明基板11より小さく形成されている。In FIG. 3, a TFT liquid crystal display panel (hereinafter simply referred to as a liquid crystal display panel) 1 is composed of a first transparent substrate 11 and a second transparent substrate 12 attached to the substrate 11 with a liquid crystal body interposed therebetween. And the second transparent substrate having a transparent electrode formed on the entire surface.
12 is formed smaller than the first transparent substrate 11.
【０００６】そして、第１の透明基板11の片面（図では
上面）には例えば 300μm ピッチ程度の間隔に縦横の電
極線11a,11b がパターン形成されているが、これら各電
極線11a,11b のマトリックス配置となる交点は拡大した
円内図(a) に示すように相互に短絡しないようになって
おり、更に該交点の近傍には各電極線11a,11b に繋がる
薄膜トランジスタ11c がパターン形成されている。On one surface (upper surface in the figure) of the first transparent substrate 11, vertical and horizontal electrode lines 11a and 11b are pattern-formed at intervals of about 300 μm pitch, and these electrode lines 11a and 11b are formed. The matrix-shaped intersections are designed so as not to be short-circuited to each other, as shown in the enlarged circle (a), and the thin film transistors 11c connected to the electrode lines 11a and 11b are patterned near the intersections. There is.
【０００７】そこで該第１の透明基板11の電極形成面に
図示されない液晶体を介して上記第２の透明基板12を添
着することで周囲に駆動用電極 11a′,11b′が露出した
所要の液晶表示板１が構成されている。Therefore, the second transparent substrate 12 is attached to the electrode formation surface of the first transparent substrate 11 via a liquid crystal body (not shown) to expose the driving electrodes 11a 'and 11b' to the surroundings. The liquid crystal display panel 1 is configured.
【０００８】かかる液晶表示板１では、第１の透明基板
11の周囲に露出する駆動用電極 11a′,11b′を図示され
ない制御回路で適宜選択し更に選択された電極に所定の
電位を印加することで所要の文字, 記号等の画像を表示
することができる。In such a liquid crystal display panel 1, the first transparent substrate
By appropriately selecting the drive electrodes 11a ', 11b' exposed around 11 by a control circuit (not shown) and applying a predetermined potential to the selected electrodes, it is possible to display an image of a desired character, symbol, or the like. it can.
【０００９】しかしこの場合の液晶表示板１は各電極線
11a,11b の交点が確実に絶縁されていることが前提であ
り、該交点部分が短絡していると回路的に干渉して線欠
陥の表示不良となってしまう。However, in this case, the liquid crystal display panel 1 has each electrode line.
It is premised that the intersections of 11a and 11b are surely insulated, and if the intersections are short-circuited, they interfere with each other in a circuit to cause a line defect display failure.
【００１０】従って各交点における短絡の有無を検査
し、短絡不良箇所については例えば第１の透明基板11の
裏面（図では下面）側からレーザを照射する等の手段で
該不良箇所を修正するようにしている。Therefore, the presence or absence of a short circuit at each intersection is inspected, and if there is a short circuit defect, it is corrected by, for example, irradiating a laser from the back surface (lower surface in the figure) of the first transparent substrate 11. I have to.
【００１１】かかる交点における短絡有無を検査する方
法の一例を原理的に示す図４で、１は図３で説明した液
晶表示板であり、２は制御部21と２個の検査ヘッド22a,
22bからなる検査装置である。In principle, one example of a method for inspecting the presence or absence of a short circuit at such an intersection is shown. In FIG. 4, 1 is the liquid crystal display panel explained in FIG. 3, 2 is a control unit 21 and two inspection heads 22a,
It is an inspection device consisting of 22b.
【００１２】そしてこの場合の２個の検査ヘッド22a,22
b は例えば各数10本のプローブピン22a′,22b′が液晶
表示板１の駆動用電極 11a′,11b′の隣接間ピッチと等
しい隔たりを保って一列に植設して構成されているもの
であり、プローブピン 22a′とプローブピン 22b′との
間の導通の有無が上記制御部21で検知し得るようになっ
ている。In this case, the two inspection heads 22a, 22a
For example, b is formed by arranging several dozen probe pins 22a ', 22b' in a row at a distance equal to the pitch between adjacent driving electrodes 11a ', 11b' of the liquid crystal display panel 1. The presence or absence of conduction between the probe pin 22a 'and the probe pin 22b' can be detected by the control unit 21.
【００１３】そこで、例えば検査ヘッド22a を矢印Ａの
ように降下させてプローブピン 22a′を液晶表示板１の
対応する駆動用電極 11a′に接触させたまま検査ヘッド
22bを実線で示す矢印Ｂのように順次液晶表示板１の駆
動用電極 11b′上をずらしながら接触させ、更に検査ヘ
ッド22a を破線で示す矢印Ｃの如く移動した状態で上記
検査ヘッド22b を上記同様にずらし、以下同様の工程を
繰り返すことですべての交点での短絡有無を検査するよ
うにしている。Therefore, for example, the inspection head 22a is lowered as shown by an arrow A and the inspection head 22a 'is kept in contact with the corresponding drive electrode 11a' of the liquid crystal display panel 1 while the inspection head 22a is in contact with the corresponding drive electrode 11a '.
22b is brought into contact with the driving electrode 11b 'of the liquid crystal display panel 1 sequentially while being shifted as shown by an arrow B shown by a solid line, and the inspection head 22a is moved as shown by an arrow C shown by a broken line. Similarly, by shifting and repeating the same process thereafter, the presence or absence of a short circuit at all intersections is inspected.
【００１４】[0014]
【発明が解決しようとする課題】しかし従来の検査方法
では、各検査ヘッド22a,22b を液晶表示板１の駆動用電
極 11a′,11b′の対応する位置に順次ずらしながら正確
に接触させなければならず、ブロック毎に動かす装置と
そのための制御ソフトウェアが必要となるばかりでなく
数10本のプローブピンの内から短絡不良対象となる一本
を選択する切り換えスイッチ機構等が必要となる。However, in the conventional inspection method, the inspection heads 22a and 22b must be accurately brought into contact with the liquid crystal display panel 1 by sequentially shifting them to the corresponding positions of the drive electrodes 11a 'and 11b'. Of course, not only a device for moving each block and control software therefor are required, but also a changeover switch mechanism or the like for selecting one of several tens of probe pins to be a short circuit failure target.
【００１５】従って検査装置自体が大型且つ高価になる
と言う問題があり、また検査工数がかかるために生産性
の向上を期待することができないと言う問題があった。Therefore, there is a problem that the inspection apparatus itself becomes large and expensive, and there is a problem that it is not possible to expect improvement in productivity because of the number of inspection steps.
【００１６】[0016]
【課題を解決するための手段】上記課題は、 X-Yクロス
オーバを持つマトリックス型液晶表示板の各クロスポイ
ントにおける短絡を検査する液晶表示板の検査方法であ
って、マトリックス型液晶表示板周片近傍のＸ方向とＹ
方向に整列して露出する駆動用電極の少なくとも各片側
の配置領域のそれぞれに、該配置領域をカバーする長さ
の柔軟な有機物を基材とする導電性物質からなる検査ヘ
ッドを押圧して各駆動用電極に一括して接触させた後、
Ｘ方向の駆動用電極に対応する上記検査ヘッドとＹ方向
の駆動用電極に対応する上記検査ヘッドとの間に、上記
クロスポイント近傍に位置するスイッチング素子の耐圧
電圧未満の電圧を印加し、しかる後に上記検査ヘッドを
除去する液晶表示板の検査方法によって達成される。[Means for Solving the Problems] The above problem is a method of inspecting a liquid crystal display panel for inspecting a short circuit at each cross point of a matrix type liquid crystal display panel having an XY crossover, the method comprising: X direction and Y
The inspection head made of a conductive substance having a flexible organic material as a base material and having a length to cover the disposition region is pressed against each of the disposition regions on at least one side of the drive electrodes that are aligned and exposed in each direction. After making contact with the drive electrodes all at once,
A voltage lower than the withstand voltage of the switching element located near the cross point is applied between the inspection head corresponding to the driving electrode in the X direction and the inspection head corresponding to the driving electrode in the Y direction. This is achieved by a method of inspecting a liquid crystal display panel, in which the inspection head is removed later.
【００１７】また、 X-Yクロスオーバを持つマトリック
ス型液晶表示板の各クロスポイントにおける短絡を検査
する液晶表示板の検査装置であって、マトリックス型液
晶表示板周片近傍のＸ方向とＹ方向に整列して露出する
駆動用電極の少なくとも各片側の配置領域をカバーする
長さの柔軟な有機物を基材とする導電性物質からなる２
個の検査ヘッドと、Ｘ方向に位置せしめる上記検査ヘッ
ドとＹ方向に位置せしめる上記検査ヘッドとの間に上記
クロスポイント近傍に位置するスイッチング素子の耐圧
電圧未満の電圧を印加する電源部、とを少なくとも具え
て構成されている液晶表示板の検査装置によって達成さ
れる。Further, there is provided a liquid crystal display panel inspection device for inspecting a short circuit at each cross point of a matrix type liquid crystal display panel having an XY crossover, which is aligned in the X direction and the Y direction near the periphery of the matrix type liquid crystal display panel. And a conductive material having a flexible organic material as a base material and having a length that covers at least one disposition area of each driving electrode exposed
An individual inspection head, and a power supply unit for applying a voltage lower than the withstand voltage of the switching element located near the cross point between the inspection head located in the X direction and the inspection head located in the Y direction. This is achieved by an inspection device for a liquid crystal display panel that is configured at least.
【００１８】[0018]
【作用】駆動用電極面を押圧している柔軟な有機物を基
材とする導電性物質例えば導電ゴムがその接触面で部分
的に熱せられると該導電ゴムの加熱領域で発生する熱反
応生成物が駆動用電極面に付着し易くなる。Operation: A thermal reaction product generated in the heating region of the conductive rubber when the conductive material having the flexible organic material pressing the driving electrode surface as a base material, for example, the conductive rubber, is partially heated at the contact surface. Tend to adhere to the driving electrode surface.
【００１９】このことは、該導電ゴムを基板から剥離除
去した後でも該基板面上に残留する導電ゴムの熱反応生
成物またはその痕跡が目視し得ることを意味する。一
方、図３で説明した液晶表示板１の駆動用電極 11a′と
11b′との間に薄膜トランジスタ11c が破壊しない範囲
の電位を印加すると、短絡していない交点に繋がる駆動
用電極 11a′〜 11b′間には電流が流れることはないが
短絡している交点に繋がる駆動用電極 11a′〜 11b′間
には高電流が流れることとなる。This means that even after the conductive rubber is peeled off from the substrate, the thermal reaction product of the conductive rubber or its traces remaining on the surface of the substrate can be visually observed. On the other hand, the driving electrodes 11a 'of the liquid crystal display panel 1 described with reference to FIG.
If a potential within the range where the thin film transistor 11c is not destroyed is applied to 11b ', it will be connected to the intersection which is not short-circuited.No current will flow between the drive electrodes 11a'-11b', but it will be connected to the intersection which is short-circuited A high current will flow between the drive electrodes 11a'-11b '.
【００２０】このことは、駆動用電極 11a′と 11b′の
それぞれの上に上記導電ゴムを接触させておくと、該導
電ゴムの短絡交点と繋がる駆動用電極 11a′, 11b′に
対応する領域のみが加熱されることを意味する。This means that when the above-mentioned conductive rubber is brought into contact with each of the driving electrodes 11a 'and 11b', the regions corresponding to the driving electrodes 11a 'and 11b' connected to the short-circuiting intersections of the conductive rubbers. Means that only is heated.
【００２１】そこで本発明では、駆動用電極 11a′と 1
1b′のそれぞれを一括して押圧し得る大きさを持つ２個
の導電ゴムからなる検査ヘッドをそれぞれの駆動用電極
上に押圧接触させた状態で、該２個の検査ヘッド間に薄
膜トランジスタ11c が破壊しない範囲の電位を印加して
液晶表示板を検査するようにしている。Therefore, in the present invention, the drive electrodes 11a 'and 1
In the state where two inspection heads made of conductive rubber having a size capable of pressing each of the 1b's together are pressed against the respective driving electrodes, a thin film transistor 11c is formed between the two inspection heads. The liquid crystal display panel is inspected by applying a potential in a range that does not destroy it.
【００２２】従って、該２個の検査ヘッドを除去した後
の透明基板面を目視観察するのみで短絡する交点を検知
することができて大型で高価な試験装置を使用すること
なく効率的で生産性のよい検査方法を実現することがで
きる。Therefore, it is possible to detect the intersecting point of the short circuit only by visually observing the transparent substrate surface after removing the two inspection heads, and efficiently and efficiently without using a large and expensive test apparatus. A good inspection method can be realized.
【００２３】[0023]
【実施例】図１は本発明になる液晶表示板の検査方法を
説明する図であり、図２は検査後の状態を示す図であ
る。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a diagram for explaining a method of inspecting a liquid crystal display panel according to the present invention, and FIG. 2 is a diagram showing a state after the inspection.
【００２４】図１で液晶表示板１は図３で説明したもの
であり、３は電源部31と２個の検査ヘッド32a,32b とで
構成される検査装置である。そして一方の検査ヘッド32
a は、液晶表示板１の複数の駆動用電極 11a′の配置領
域を少なくともカバーする長さを持つ短冊形の導電ゴム
からなるものであり、また他方の検査ヘッド32b は駆動
用電極 11b′の配置領域を少なくともカバーする長さを
持つ短冊形の導電ゴムからなるものである。The liquid crystal display panel 1 shown in FIG. 1 is the same as that described with reference to FIG. 3, and the reference numeral 3 designates an inspection apparatus comprising a power supply section 31 and two inspection heads 32a and 32b. And one inspection head 32
a is made of a strip-shaped conductive rubber having a length that covers at least the area where the plurality of drive electrodes 11a 'of the liquid crystal display panel 1 are arranged, and the other inspection head 32b is provided with the drive electrodes 11b'. It is made of a strip-shaped conductive rubber having a length that covers at least the arrangement region.
【００２５】なお上記の各検査ヘッド32a,32b は、例え
ばスイッチ31a を具えた上記電源部31に直列に接続され
ている。そこで、各検査ヘッド32a,32b を矢印Ｄのよう
に各駆動用電極 11a′,11b′に対応させて載置押圧する
と複数の駆動用電極 11a′と複数の駆動用電極 11b′と
に一括して接触させることができるので、上記スイッチ
31a を閉じることで各駆動用電極 11a′と 11b′との間
に所定の電圧を負荷することができる。The inspection heads 32a and 32b are connected in series to the power supply section 31 having a switch 31a, for example. Therefore, when the inspection heads 32a and 32b are placed and pressed corresponding to the drive electrodes 11a 'and 11b' as shown by the arrow D, the inspection heads 32a and 32b are combined into a plurality of drive electrodes 11a 'and a plurality of drive electrodes 11b'. The above switch
By closing 31a, a predetermined voltage can be applied between the driving electrodes 11a 'and 11b'.
【００２６】なお検査ヘッド32a ，32b 間に印加する電
位差は図３で説明した薄膜トランジスタ11c が破壊しな
い範囲の電位差であることが絶対必要であり、例えば上
記薄膜トランジスタ11c が40Ｖの電位差で破壊するもの
である場合には30Ｖ程度の電位差を印加するようにす
る。It is absolutely necessary that the potential difference applied between the inspection heads 32a and 32b is within the range in which the thin film transistor 11c described with reference to FIG. 3 does not break. For example, the thin film transistor 11c breaks with a potential difference of 40V. In some cases, a potential difference of about 30V is applied.
【００２７】この場合、上記の各駆動用電極 11a′,11
b′で形成される各交点に短絡が生じていないときには
該検査ヘッド32a ，32b 間に電圧が印加されても電流が
流れることがないが、各交点の一箇所にでも短絡がある
と該短絡交点を経由して検査ヘッド32a ，32b 間に電流
が流れることとなり、結果的に検査ヘッド32a ，32b の
該短絡交点に繋がる駆動用電極 11a′,11b′に接触して
いる導電ゴム領域が熱せられて変質しその生成物が該電
極面に付着することとなる。In this case, each of the driving electrodes 11a ', 11 described above is
When no short circuit occurs at each intersection formed by b ', no current flows even if a voltage is applied between the inspection heads 32a and 32b. A current flows between the inspection heads 32a and 32b via the intersection, and as a result, the conductive rubber regions in contact with the driving electrodes 11a 'and 11b' connected to the short-circuit intersection of the inspection heads 32a and 32b are heated. As a result, the quality is changed and the product adheres to the electrode surface.
【００２８】従って、電圧負荷後に上記各検査ヘッド32
a ，32b を液晶表示板１から剥離除去し、駆動用電極上
の熱生成物の付着またはその痕跡を目視観察することで
短絡交点の有無をその位置と共に知ることができる。Therefore, after the voltage load, each of the inspection heads 32 is
By exfoliating and removing a and 32b from the liquid crystal display plate 1 and visually observing the adherence of the heat product on the driving electrode or the trace thereof, the presence or absence of the short-circuit intersection can be known together with its position.
【００２９】図２は電圧印加後に上述した検査ヘッド32
a ，32b を剥離除去したときの液晶表示板１の表面状態
を一部拡大した平面視で表わしたものである。図では駆
動用電極 11a′ではその一部すなわち 11a′-3に検査ヘ
ッド32a の熱生成物が付着し、駆動用電極 11b′ではそ
の一部すなわち 11b′-1に検査ヘッド32ｂの熱生成物が
付着した状態を示している。FIG. 2 shows the above-described inspection head 32 after voltage application.
3 is a partially enlarged plan view showing the surface condition of the liquid crystal display panel 1 when a and 32b are removed by peeling. In the figure, the heat product of the inspection head 32a adheres to a part of the drive electrode 11a ', that is, 11a' -3, and the heat product of the inspection head 32b adheres to a part of the drive electrode 11b ', that is, 11b' -1 . Shows a state in which is attached.
【００３０】この場合には、駆動用電極 11a′-3〜 11
b′-1の交点p1が短絡障害を起こしていることを意味し
ている。従って、該液晶表示板１の交点p1を図３で説明
したようにその裏面側からレーザ照射等の手段で修正す
ることで容易に該液晶表示板１を良品化することができ
る。In this case, the driving electrodes 11a'- 3 to 11
This means that the intersection p 1 of b ′ −1 is causing a short circuit fault. Therefore, by correcting the intersection point p 1 of the liquid crystal display plate 1 from the back side thereof by means such as laser irradiation as described with reference to FIG. 3, the liquid crystal display plate 1 can be easily made into a good product.
【００３１】なお駆動用電極 11a′,11b′上に付着した
検査ヘッド32a,32b の熱生成物は、例えばイソプロピル
アルコール(IPA) 等で拭うことで容易に除去清掃するこ
とができる。The heat products of the inspection heads 32a and 32b attached on the drive electrodes 11a 'and 11b' can be easily removed and cleaned by wiping with, for example, isopropyl alcohol (IPA).
【００３２】また短絡交点の有無とその位置を確認した
後、例えば一点鎖線E1,E2 で該液晶表示板１を切断して
も良品化された所要の液晶表示板１を得ることができ
る。Further, after confirming the presence or absence of the short-circuit intersection and its position, the liquid crystal display panel 1 can be obtained as a non-defective product even if the liquid crystal display panel 1 is cut along the alternate long and short dash lines E 1 and E 2 , for example. ..
【００３３】[0033]
【発明の効果】上述の如く本発明により、検査工数の削
減と検査装置の低価格化を実現して生産性の向上を図っ
た液晶表示板の検査方法を提供することができる。As described above, according to the present invention, it is possible to provide a method for inspecting a liquid crystal display panel, which realizes a reduction in the number of inspection steps and a reduction in the cost of the inspection apparatus, thereby improving the productivity.
【００３４】なお本発明の説明では検査ヘッドが導電ゴ
ムで形成されている場合を例としているが、該検査ヘッ
ドを例えばシリコン等の柔軟な有機材を基材とした導電
物体で形成しても同等の効果を得ることができる。In the description of the present invention, the case where the inspection head is formed of conductive rubber is taken as an example, but the inspection head may be formed of a conductive object having a flexible organic material such as silicon as a base material. The same effect can be obtained.
【図１】 本発明になる液晶表示板の検査方法を説明す
る図。FIG. 1 is a diagram illustrating a method for inspecting a liquid crystal display panel according to the present invention.
【図２】 検査後の状態を示す図。FIG. 2 is a diagram showing a state after the inspection.
【図３】 ＴＦＴ液晶表示板を概略的に説明する図。FIG. 3 is a diagram schematically illustrating a TFT liquid crystal display panel.
【図４】 従来の液晶表示板の検査方法を説明する図。FIG. 4 is a diagram illustrating a conventional method for inspecting a liquid crystal display panel.
１ ＴＦＴ液晶表示板 ３ 検査装置 11a′,11a′-3,11b′,11b′-1 駆動用電極 31 電源部 31a スイッチ 32a,32b 検査ヘッド1 TFT liquid crystal display board 3 Inspection device 11a ', 11a' -3 , 11b ', 11b' -1 Driving electrode 31 Power supply section 31a Switch 32a, 32b Inspection head
Claims (4)
液晶表示板の各クロスポイントにおける短絡を検査する
液晶表示板の検査方法であって、 マトリックス型液晶表示板周片近傍のＸ方向とＹ方向に
整列して露出する駆動用電極(11a′,11b′) の少なくと
も各片側の配置領域のそれぞれに、該配置領域をカバー
する長さの柔軟な有機物を基材とする導電性物質からな
る検査ヘッド(32a,32b) を押圧して各駆動用電極(11
a′,11b′) に一括して接触させた後、 Ｘ方向の駆動用電極(11a′) に対応する上記検査ヘッド
(32a) とＹ方向の駆動用電極(11b′) に対応する上記検
査ヘッド(32b) との間に、上記クロスポイント近傍に位
置するスイッチング素子の耐圧電圧未満の電圧を印加
し、 しかる後に上記検査ヘッド(32a,32b) を除去することを
特徴とした液晶表示板の検査方法。1. A method of inspecting a liquid crystal display panel for inspecting a short-circuit at each cross point of a matrix type liquid crystal display panel having an XY crossover, wherein the matrix type liquid crystal display panel is aligned in the X and Y directions in the vicinity of a peripheral portion of the liquid crystal display panel. The driving heads (11a ', 11b') that are exposed as a result are provided with an inspection head (1) made of a conductive substance having a flexible organic material as a base material and having a length that covers the placement areas. 32a, 32b) and press each electrode (11
a ', 11b'), and then the inspection head corresponding to the X-direction driving electrode (11a ')
A voltage lower than the withstand voltage of the switching element located near the cross point is applied between (32a) and the inspection head (32b) corresponding to the Y-direction driving electrode (11b '), and then the above A method for inspecting a liquid crystal display panel, characterized by removing the inspection heads (32a, 32b).
る導電性物質が、導電ゴムであることを特徴とした液晶
表示板の検査方法。2. A method of inspecting a liquid crystal display panel, wherein the conductive substance having a flexible organic material as a base material according to claim 1 is a conductive rubber.
液晶表示板の各クロスポイントにおける短絡を検査する
液晶表示板の検査装置であって、 マトリックス型液晶表示板周片近傍のＸ方向とＹ方向に
整列して露出する駆動用電極(11a′,11b′) の少なくと
も各片側の配置領域をカバーする長さの柔軟な有機物を
基材とする導電性物質からなる２個の検査ヘッド(32a,3
2b) と、 Ｘ方向に位置せしめる上記検査ヘッド(32a) とＹ方向に
位置せしめる上記検査ヘッド(32a) との間に上記クロス
ポイント近傍に位置するスイッチング素子の耐圧電圧未
満の電圧を印加する電源部(31)、とを少なくとも具えて
構成されていることを特徴とした液晶表示板の検査装
置。3. A liquid crystal display panel inspection device for inspecting a short circuit at each cross point of a matrix type liquid crystal display panel having an XY crossover, which is aligned in the X direction and the Y direction near the periphery of the matrix type liquid crystal display panel. Two test heads (32a, 3a) made of a conductive material having a length of a flexible organic material that covers at least one arrangement area on each side of the driving electrodes (11a ', 11b') exposed as a result.
2b) and the inspection head (32a) located in the X direction and the inspection head (32a) located in the Y direction, and a power supply for applying a voltage lower than the withstand voltage of the switching element located near the cross point. An inspection apparatus for a liquid crystal display panel, characterized by comprising at least a part (31).
る導電性物質が、導電ゴムであることを特徴とした液晶
表示板の検査装置。4. An inspection device for a liquid crystal display panel, wherein the conductive substance having a flexible organic material as a base material according to claim 3 is conductive rubber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP881092A JPH05196679A (en) | 1992-01-22 | 1992-01-22 | Inspection method and inspection device for liquid crystal display board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP881092A JPH05196679A (en) | 1992-01-22 | 1992-01-22 | Inspection method and inspection device for liquid crystal display board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH05196679A true JPH05196679A (en) | 1993-08-06 |
Family
ID=11703193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP881092A Withdrawn JPH05196679A (en) | 1992-01-22 | 1992-01-22 | Inspection method and inspection device for liquid crystal display board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH05196679A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007147474A (en) * | 2005-11-29 | 2007-06-14 | Micronics Japan Co Ltd | Sensor board, and inspection method and apparatus using same |
| JP2010127706A (en) * | 2008-11-26 | 2010-06-10 | Micronics Japan Co Ltd | Probe unit and inspection apparatus |
-
1992
- 1992-01-22 JP JP881092A patent/JPH05196679A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007147474A (en) * | 2005-11-29 | 2007-06-14 | Micronics Japan Co Ltd | Sensor board, and inspection method and apparatus using same |
| JP2010127706A (en) * | 2008-11-26 | 2010-06-10 | Micronics Japan Co Ltd | Probe unit and inspection apparatus |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19990408 |