JPH03107127A - Liquid crystal display device - Google Patents
Liquid crystal display deviceInfo
- Publication number
- JPH03107127A JPH03107127A JP1244306A JP24430689A JPH03107127A JP H03107127 A JPH03107127 A JP H03107127A JP 1244306 A JP1244306 A JP 1244306A JP 24430689 A JP24430689 A JP 24430689A JP H03107127 A JPH03107127 A JP H03107127A
- Authority
- JP
- Japan
- Prior art keywords
- display
- liquid crystal
- driving
- electrode substrate
- scanning signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 40
- 239000000758 substrate Substances 0.000 claims abstract description 35
- 239000011159 matrix material Substances 0.000 claims abstract description 9
- 230000002093 peripheral effect Effects 0.000 claims abstract description 9
- 230000007547 defect Effects 0.000 abstract description 11
- 210000002858 crystal cell Anatomy 0.000 abstract description 10
- 230000002950 deficient Effects 0.000 abstract description 2
- 238000007689 inspection Methods 0.000 abstract description 2
- 238000004806 packaging method and process Methods 0.000 abstract 3
- 239000011521 glass Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 238000005530 etching Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000003973 paint Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 101100514842 Xenopus laevis mtus1 gene Proteins 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Landscapes
- Liquid Crystal (AREA)
Abstract
Description
【発明の詳細な説明】
（イ）産業上の利用分野
本発明は液晶表示のための駆動用ＩＣを直接液晶表示パ
ネルに実装する液晶表示装置に関する。DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a liquid crystal display device in which a driving IC for liquid crystal display is directly mounted on a liquid crystal display panel.
（ロ）従来の技術
近年、液晶表示装置に於ては、大面積化及び画素の微細
化が進められている。例えば、１９８４年１月２日発行
の雑誌「日経エレクトロニクス」の記事「文書と画像表
示をねらうフラットパネルデイスプレィ」に開示されて
いる様に、大面積化及び画素の微細化が可能なアクテブ
マトリクス型の液晶表示装置が実用化されている。(B) Prior Art In recent years, liquid crystal display devices have been made larger in area and smaller in size. For example, as disclosed in the article ``Flat panel display aimed at displaying documents and images'' in the magazine ``Nikkei Electronics'' published on January 2, 1984, an active matrix that can increase the area and miniaturize the pixels. type liquid crystal display devices have been put into practical use.
このようなアクテブマトリクス型の液晶表示素子の大面
積化及び画素の微細化に伴って、液晶パネルとこれを駆
動するための駆動ＩＣとの接続端子が多数必要になり、
端子接続構造が繁雑になる不都合があった。As active matrix type liquid crystal display elements become larger in area and pixels become smaller, a large number of connection terminals between the liquid crystal panel and the drive IC to drive it are required.
There was an inconvenience that the terminal connection structure became complicated.
この為、液晶セルをなすガラス製の一方の基板に液晶表
示の為の複数の駆動用ＩＣ・・・を直接実装することに
よって、これらの端子接続構造を省略したチップオンガ
ラス方式の液晶表示装置が開発されている（特開昭５０
−１５９９９３号公報）。For this reason, a chip-on-glass type liquid crystal display device eliminates the terminal connection structure by directly mounting multiple driving ICs for liquid crystal display on one glass substrate that forms the liquid crystal cell. has been developed (Japanese Unexamined Patent Application Publication No. 1973)
-159993).
第６図にチップオンガラス方式を採用するための液晶セ
ルの平面図を示す。FIG. 6 shows a plan view of a liquid crystal cell employing the chip-on-glass method.
同図に於て、１０はマトリクス配置された各電極毎に薄
膜トランジスタを結合した構成の大面積のＴＦＴアレイ
電極基板、９は対向電極を備え′た小面積（表示領域よ
りやや広い）の対向電極基板であり、これら両基板９．
１０間に液晶が充填されている。In the figure, 10 is a large-area TFT array electrode substrate with a configuration in which a thin film transistor is connected to each electrode arranged in a matrix, and 9 is a small-area counter electrode (slightly wider than the display area) equipped with a counter electrode. Both substrates 9.
The space between 10 and 10 is filled with liquid crystal.
上記ＴＦＴアレイ電極基板１０の右下領域に対向電極基
板９が位置し、このＴＦＴアレイ電極基板１０の上領域
、及び左領域には夫々表示信号給電用の駆動ＩＣ１及び
走査信号給電用の駆動ＩＣが実装される区域が確保され
ている。即ち、この場合、ＴＦＴアレイ電極基板１０の
上領域の３区画夫々には上記駆動ＩＣの出力端子に結合
されるべき表示信号給電端子パッド１．１．１・・・が
備えられ、さらにＴＦＴアレイ電極基板１０の左領域に
は上記駆動ＩＣの出力端子に結合されるべき表示信号給
電端子パッド５．５．５・・・が備えられている。尚、
上記ＴＦＴアレイ電極基板１０の対向電極基板９のさら
に下端領域には、上記表示信号給電端子パッド１．１．
１・・・につながって液晶セル中を縦断してきた表示信
号線の端子２．２．２・・・が配列されて、上記ＴＦＴ
アレイ電極基板１０の対向電極基板９のさらに右端領域
には、上記表示信号給電端子パッド５．５．５・・・に
つながって液晶セル中を縦断してきた表示信号線の端子
６．６．６・・・が配列されている。A counter electrode substrate 9 is located in the lower right region of the TFT array electrode substrate 10, and a drive IC 1 for display signal power supply and a drive IC for scan signal power supply are located in the upper and left regions of the TFT array electrode substrate 10, respectively. The area where this will be implemented has been secured. That is, in this case, each of the three sections in the upper region of the TFT array electrode substrate 10 is provided with display signal power supply terminal pads 1.1.1, . The left region of the electrode substrate 10 is provided with display signal power supply terminal pads 5, 5, 5, . . . to be coupled to the output terminals of the drive IC. still,
In the further lower end region of the counter electrode substrate 9 of the TFT array electrode substrate 10, the display signal power supply terminal pads 1.1.
Terminals 2, 2, 2... of the display signal lines connected to 1... and running vertically through the liquid crystal cell are arranged,
Further on the right end region of the counter electrode substrate 9 of the array electrode substrate 10, there are terminals 6.6.6 of display signal lines that are connected to the display signal power supply terminal pads 5.5.5 and run vertically through the liquid crystal cell. ... are arranged.
しかしながらこの様なチップオンガラス方式を採用した
液晶表示装置に於ては、駆動用ＩＣに不良がなくても液
晶パネルの表示機構に不良がある場合は、パネルばかり
か、このパネルのガラス基板に実装されている複数の良
品の駆動用ＩＣまでも破棄しなければならない。このた
め、この種液晶表示装置の製造コスト高を来し、更には
製造歩留りの低下を招く慣れがあった。However, in a liquid crystal display device that uses such a chip-on-glass method, even if there is no defect in the drive IC, if there is a defect in the display mechanism of the liquid crystal panel, not only the panel but also the glass substrate of this panel may be damaged. Even the multiple good drive ICs installed must be discarded. For this reason, this type of liquid crystal display device has a habit of increasing manufacturing costs and further decreasing the manufacturing yield.
（ハ）発明が解決しようとする課題
本発明は上述の点に鑑みてなされたものであって、駆動
用ＩＣ実装前の液晶パネルの表示不良検査を可能とした
液晶表示装置を提供するものである。(c) Problems to be Solved by the Invention The present invention has been made in view of the above-mentioned points, and provides a liquid crystal display device that makes it possible to inspect display defects of a liquid crystal panel before mounting a driving IC. be.
（ニ）課題を解決するための手段
本発明の液晶表示装置は、アクテブマトリクス画素電極
基板の表示部周辺領域の端子群を短絡するダミー配線手
段を該表示部周辺領域に備えたものである。(d) Means for Solving the Problems The liquid crystal display device of the present invention is provided with dummy wiring means in the peripheral area of the display portion for short-circuiting a group of terminals in the peripheral area of the display portion of the active matrix pixel electrode substrate.
（ホ）作用
本発明の液晶表示装置によれば、駆動用ＩＣを実装する
前にダミー配線に駆動信号を供給して表示試験を行い、
該試験後にダミー配線を排除することにより、駆動用Ｉ
Ｃ実装前の液晶パネルの表示不良検査が可能となる。(E) Function According to the liquid crystal display device of the present invention, before mounting the driving IC, a display test is performed by supplying a driving signal to the dummy wiring.
By eliminating the dummy wiring after the test, the driving I
It becomes possible to inspect the display defects of the liquid crystal panel before C mounting.
（へ）実施例 本発明の一実施例を図面に基づいて説明する。(f) Example An embodiment of the present invention will be described based on the drawings.
第１図及び第２図は本発明の一実施例の液晶表示装置に
用いるパネル基板の平面図であり、駆動用ＩＣ実装前の
状態を示している。同図の実施例では、第６図の従来装
置同様に、図示の簡素化のために液晶セルを縦断する９
本の表示信号線とこれを横断する９本の走査信号線とを
備えて８１画素を構成するアクティブマトリクス型液晶
表示装置を示している。1 and 2 are plan views of a panel substrate used in a liquid crystal display device according to an embodiment of the present invention, and show a state before a driving IC is mounted. In the embodiment shown in the same figure, like the conventional device shown in FIG.
This figure shows an active matrix liquid crystal display device that includes a book display signal line and nine scanning signal lines that cross the line to form 81 pixels.
第１図に於て、第６図の従来装置と同様の部分には第６
図と同じ符号を付している。即ち、１０はＴＦＴアレイ
電極基板、９は対向電極基板であって、該ＴＦＴアレイ
電極基板１０には、第６図同様に表示信号給電端子パッ
ド１．１．１・・・とこれにつながる表示信号線の端子
２．２．２・・・と走査信号給電端子バッド５．５．５
・・・とこれにつながる走査信号線の端子６．６．６・
・・が備えられている。In Fig. 1, the same parts as the conventional device in Fig.
The same symbols as in the figure are given. That is, 10 is a TFT array electrode substrate, 9 is a counter electrode substrate, and the TFT array electrode substrate 10 has display signal power supply terminal pads 1.1.1... and displays connected thereto, as in FIG. Signal line terminals 2.2.2... and scanning signal power supply terminal pads 5.5.5
...and the terminal 6.6.6 of the scanning signal line connected to this.
...is provided.
第１図の本発明の液晶表示装置が第６図の従来装置を異
なるところは、上記ＴＦＴアレイ電極基板１０を縦断す
る表示信号線の下端子２．２．２・・・上に全ての端子
２．２．２・・・と結合してこれらを短絡させる為の表
示信号ダミー配線３を設けると共に、上記ＴＦＴアレイ
電極基板１０を縦断する走査信号線の右端子６．６．６
上に全ての端子６．６．６・・・と結合してこれらを短
絡させ−る為の走査信号ダミー配線７を設けた点にある
。The difference between the liquid crystal display device of the present invention shown in FIG. 1 and the conventional device shown in FIG. A display signal dummy wiring 3 is provided to connect with 2.2.2 and short-circuit these, and a right terminal 6.6.6 of the scanning signal line that traverses the TFT array electrode substrate 10 is provided.
The main point is that a scanning signal dummy wiring 7 is provided above to connect all the terminals 6, 6, 6, . . . to short-circuit them.
即ち、表示信号ダミー配線３はその右端に端子試験パッ
ド４を備え、このパッド４に試験的に供給される表示信
号が全ての表示信号線に印加されることになり、同じく
走査信号ダミー配線７はその下端に試験バッド８を備え
、このパッド８に試験的に供給される走査信号が全ての
走査信号線に印加され、全画素をＯＮ状態とする構成と
なっている。That is, the display signal dummy wiring 3 is provided with the terminal test pad 4 at its right end, and the display signal that is experimentally supplied to this pad 4 is applied to all the display signal lines. is provided with a test pad 8 at its lower end, and the scanning signal supplied to this pad 8 on a trial basis is applied to all the scanning signal lines to turn on all pixels.
尚、これらダミー配線３．７は、例えば液晶セル組立て
前で、ＴＦＴアレイ電極基板１０完成後に、該基板１０
上の端子２・・・、６・・・上に、例えばスクリーン印
刷を用いて導電塗料をパターン塗布することで形成でき
、排除はこの導電塗料の溶剤でパターンを洗い流すこと
で行われる。Note that these dummy wirings 3.7 are connected to the TFT array electrode substrate 10 after the TFT array electrode substrate 10 is completed, for example, before the liquid crystal cell is assembled.
The terminals 2, 6, . . . can be formed by applying a pattern of conductive paint using, for example, screen printing, and removal is performed by washing away the pattern with a solvent for the conductive paint.
以上のパネル構成によって、上記ＴＦＴアレイ電極基板
１０の表示領域外に駆動用ＩＣを実装する前に、上記表
示信号ダミー配線３の試験パッド４に表示信号を印加す
ると共に走査信号ダミー配線７の試験パッド８に走査信
号を印加することによって、全画素に対しての表示試験
を行い、表示不良があるかどうかを検査する。With the above panel configuration, before mounting a driving IC outside the display area of the TFT array electrode substrate 10, a display signal is applied to the test pad 4 of the display signal dummy wiring 3, and the scanning signal dummy wiring 7 is tested. By applying a scanning signal to the pad 8, a display test is performed on all pixels to check whether there is a display defect.
この検査に基づき、表示不良と判定された液晶セルは駆
動用ＩＣ実装前に破棄あるいは修復工程に回される。Based on this inspection, liquid crystal cells determined to have display defects are discarded or sent to a repair process before mounting a driving IC.
この結果、良品の液晶セルに対してのみ上記表示信号ダ
ミー配線３、走査信号ダミー配線７を排除し、第２図に
示すように駆動用ＩＣＩ １．１２を実装する。即ち、
第１図の上記表示信号給電端子パッド１．１．１・・・
に表示信号駆動用ＩＣＩ １の端子が結合され、さらに
走査信号給電端子パッド５．５．５・・・に走査信号駆
動用ＩＣＩ ２が結合される。As a result, the display signal dummy wiring 3 and the scanning signal dummy wiring 7 are removed only for non-defective liquid crystal cells, and the driving ICI 1.12 is mounted as shown in FIG. That is,
The above display signal power supply terminal pad 1.1.1... in Fig. 1
The terminals of the display signal driving ICI 1 are coupled to the scanning signal driving ICI 1, and the scanning signal driving ICI 2 is coupled to the scanning signal feeding terminal pads 5, 5, 5, . . . .
本発明の他の実施例装置の駆動用ＩＣ実装前の平面図を
第３図に示し、そのＡ−Ａ’線の断面図を第４図に示す
。さらに同装置の駆動用ＩＣ実装後の平面図を第５図に
示す。FIG. 3 shows a plan view of a device according to another embodiment of the present invention before mounting a driving IC, and FIG. 4 shows a cross-sectional view taken along line AA'. Further, FIG. 5 shows a plan view of the same device after the driving IC is mounted.
これらの図の本発明装置が第１図及び第２図の本発明実
施例装置と異なるところは、表示信号ダミー配線３を表
示信号線の端子２．２．２・・・と−体にパターン形成
し、一方走査信号ダミー配線７を走査信号線の端子６．
６．６・・・と一体にパターン形成した点にある。The difference between the device of the present invention shown in these figures and the device of the present invention shown in FIGS. On the other hand, the scanning signal dummy wiring 7 is connected to the scanning signal line terminal 6.
6. The point is that the pattern is formed integrally with 6...
この場合の走査信号ダミー配線７は、第４図に示す如く
、各走査信号線の端子６．６．６・・・間の渡り部分の
みが外気に露出する様に、ＴＦＴアレイ電極基板１０の
表面絶縁保護膜１５に開口１４が形成されており、エツ
チング液中に走査信号線の端子６．６．６・・・を浸漬
することによって、上記開口１４部の走査信号ダミー配
線７部分が溶解される。このことは表示信号ダミー配線
３についても同様である。In this case, the scanning signal dummy wiring 7 is arranged on the TFT array electrode substrate 10 so that only the transition portion between the terminals 6, 6, 6, . . . of each scanning signal line is exposed to the outside air, as shown in FIG. An opening 14 is formed in the surface insulating protective film 15, and by immersing the terminals 6, 6, 6, etc. of the scanning signal line in an etching solution, the portion of the scanning signal dummy wiring 7 in the opening 14 is dissolved. be done. This also applies to the display signal dummy wiring 3.
従って、表示試験の後に、液晶セルの走査信号ダミー配
線７が存在する右辺部と表示信号ダミー配線３が存在す
る下辺部とをエツチング処理するだけで簡単にしかも確
実に両ダミー配線３．７を排除できる。従って、第５図
に示す如く表示信号線の端子２．２．２・・・及び走査
信号線の端子６．６．６・・・が夫々独立されたＴＦＴ
アレイ電極基板１０に必要な数の表示信号駆動用ＩＣＩ
１と走査信号駆動用ＩＣＩ ２とができる。Therefore, after the display test, by simply etching the right side where the scanning signal dummy wiring 7 of the liquid crystal cell exists and the bottom side where the display signal dummy wiring 3 exists, both dummy wirings 3 and 7 can be easily and reliably removed. Can be eliminated. Therefore, as shown in FIG. 5, the display signal line terminals 2,2,2... and the scanning signal line terminals 6,6,6...
The number of display signal driving ICIs required for the array electrode substrate 10
1 and an ICI 2 for driving a scanning signal.
以上の各実施例に於ては、ダミー配線３．７の排除方法
として、導電性塗料の洗い流し処理、あるいは選択エツ
チング処理を例示したが、本発明はこれらの排除処理に
限定されるものでない。例えば、ダミー配線３．７をレ
ーザービームで切断できる。又、ダミー配線３．７はそ
のままでこれに結合されている全端子２．２．２・・・
そのものをレーザービームで切除することでも実質的に
ダミー配線３．７を排除できる。又、レーザービームの
代わりにＴＦＴアレイ電極基板１０のガラススクライブ
によって、ダミー配線３．７が存在する基板端部を基板
ごと切り取ることも可能である。In each of the above embodiments, the conductive paint washing process or the selective etching process was exemplified as a method for removing the dummy wiring 3.7, but the present invention is not limited to these removal processes. For example, the dummy wiring 3.7 can be cut with a laser beam. Also, leave the dummy wiring 3.7 as it is and connect all the terminals 2.2.2...
The dummy wiring 3.7 can also be substantially eliminated by cutting it with a laser beam. Furthermore, instead of using a laser beam, it is also possible to use a glass scribe on the TFT array electrode substrate 10 to cut out the end of the substrate where the dummy wiring 3.7 is present, along with the entire substrate.
（ト）発明の効果
本発明の液晶表示装置は、アクテブマトリクス画素電極
基板の表示部周辺領域の端子群を短絡するダミー配線手
段を該表示部周辺領域に備え、駆動用ＩＣを実装する前
にダミー配線に駆動信号を供給して表示試験を行い、該
試験後にダミー配線を排除することができるので、駆動
用ＩＣ実装前の液晶パネルの表示不良検査が可能となる
。(G) Effects of the Invention The liquid crystal display device of the present invention includes a dummy wiring means for short-circuiting a group of terminals in the peripheral area of the display part of the active matrix pixel electrode substrate in the peripheral area of the display part, and before mounting the driving IC. Since a display test is performed by supplying a drive signal to the dummy wiring, and the dummy wiring can be removed after the test, it is possible to inspect the display defect of the liquid crystal panel before mounting the driving IC.
従って、本発明によれば、チップオンガラス方式を採用
した液晶表示装置であっても、液晶パネルに表示不良が
ある場合でも、駆動用ＩＣまでも破棄してしまう無駄を
解消でき、製造コストの低減歩留まりの向上が望める。Therefore, according to the present invention, even if the liquid crystal display device employs the chip-on-glass method, there is a display defect in the liquid crystal panel, it is possible to eliminate the waste of discarding even the driving IC, and to reduce manufacturing costs. It is expected that the reduction yield will be improved.
第１図は本発明の液晶表示装置の駆動用ＩＣ実装前の一
実施例の平面図、第２図は第１図の本発明装置の駆動用
ＩＣ実装状態での平面図、第３図及び第４図は本発明装
置の駆動用ＩＣ実装前の他の実施例の平面図及びそのＡ
−Ａ″線の断面図、第５図は第３図の本発明装置の駆動
用ＩＣ実装状態の平面図、第６図は従来装置の平面図で
ある。FIG. 1 is a plan view of an embodiment of the liquid crystal display device of the present invention before the driving IC is mounted, FIG. 2 is a plan view of the device of the present invention shown in FIG. 1 with the driving IC mounted, and FIG. FIG. 4 is a plan view of another embodiment of the device of the present invention before the driving IC is mounted, and its A
5 is a plan view of the device of the present invention shown in FIG. 3 in which a driving IC is mounted, and FIG. 6 is a plan view of the conventional device.
Claims (1)
周辺領域に備えると共に該各端子郡につながる信号線に
結合した画素電極用スイッチング手段を表示部領域に備
えたアクテブマトリクス画素電極基板と、該画素電極基
板の表示部領域に対向した対向電極基板と、これら両基
板間に封入した液晶表示装置に於て、 上記アクテブマトリクス画素電極基板の表示部周辺領域
の端子群を短絡するダミー配線手段を該表示部周辺領域
に備え、上記駆動用ＩＣを実装する前にダミー配線に駆
動信号を供給して表示試験を行い、該試験後にダミー配
線を排除してなる液晶表示装置。(1) An active matrix pixel electrode substrate that is equipped with a group of terminals for directly mounting a driving IC in the peripheral area of the display area, and a switching means for pixel electrodes that is connected to a signal line connected to each group of terminals in the area of the display area. , a counter electrode substrate facing the display area of the pixel electrode substrate, and a dummy for short-circuiting a group of terminals in the display area peripheral area of the active matrix pixel electrode substrate in the liquid crystal display device sealed between these two substrates. A liquid crystal display device comprising wiring means in a peripheral area of the display section, a display test performed by supplying a drive signal to dummy wirings before mounting the driving IC, and removing the dummy wirings after the test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1244306A JP2865323B2 (en) | 1989-09-20 | 1989-09-20 | Liquid crystal display |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1244306A JP2865323B2 (en) | 1989-09-20 | 1989-09-20 | Liquid crystal display |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03107127A true JPH03107127A (en) | 1991-05-07 |
| JP2865323B2 JP2865323B2 (en) | 1999-03-08 |
Family
ID=17116778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1244306A Expired - Fee Related JP2865323B2 (en) | 1989-09-20 | 1989-09-20 | Liquid crystal display |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2865323B2 (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5467210A (en) * | 1993-02-16 | 1995-11-14 | Casio Computer Co., Ltd. | Arrangement of bonding IC chip to liquid crystal display device |
| US5517344A (en) * | 1994-05-20 | 1996-05-14 | Prime View Hk Limited | System for protection of drive circuits formed on a substrate of a liquid crystal display |
| KR100264236B1 (en) * | 1992-11-23 | 2000-08-16 | 윤종용 | Liquid crystal display panel |
| JP2002263950A (en) * | 2001-03-13 | 2002-09-17 | Daido Steel Co Ltd | Method and device for cutting long workpiece |
| US6498634B1 (en) * | 1995-12-20 | 2002-12-24 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
| WO2007034599A1 (en) * | 2005-09-26 | 2007-03-29 | Sharp Kabushiki Kaisha | Display device |
| JP2007292750A (en) * | 2006-04-21 | 2007-11-08 | Samsung Electronics Co Ltd | Inspection apparatus and inspection method of display panel |
| CN104991358A (en) * | 2015-07-21 | 2015-10-21 | 合肥鑫晟光电科技有限公司 | Array substrate, manufacturing method thereof, control method thereof and display apparatus |
-
1989
- 1989-09-20 JP JP1244306A patent/JP2865323B2/en not_active Expired - Fee Related
Cited By (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100264236B1 (en) * | 1992-11-23 | 2000-08-16 | 윤종용 | Liquid crystal display panel |
| US5467210A (en) * | 1993-02-16 | 1995-11-14 | Casio Computer Co., Ltd. | Arrangement of bonding IC chip to liquid crystal display device |
| US5517344A (en) * | 1994-05-20 | 1996-05-14 | Prime View Hk Limited | System for protection of drive circuits formed on a substrate of a liquid crystal display |
| US8040450B2 (en) | 1995-12-20 | 2011-10-18 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| US6914655B2 (en) * | 1995-12-20 | 2005-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| US6498634B1 (en) * | 1995-12-20 | 2002-12-24 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| US9182642B2 (en) | 1995-12-20 | 2015-11-10 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| US7327412B2 (en) | 1995-12-20 | 2008-02-05 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| US7692749B2 (en) | 1995-12-20 | 2010-04-06 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| US8339558B2 (en) | 1995-12-20 | 2012-12-25 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal electro-optic device |
| KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
| JP2002263950A (en) * | 2001-03-13 | 2002-09-17 | Daido Steel Co Ltd | Method and device for cutting long workpiece |
| WO2007034599A1 (en) * | 2005-09-26 | 2007-03-29 | Sharp Kabushiki Kaisha | Display device |
| US8102497B2 (en) | 2005-09-26 | 2012-01-24 | Sharp Kabushiki Kaisha | Display device |
| US7812914B2 (en) | 2005-09-26 | 2010-10-12 | Sharp Kabushiki Kaisha | Display device |
| US8456602B2 (en) | 2005-09-26 | 2013-06-04 | Sharp Kabushiki Kaisha | Display device |
| JP2007292750A (en) * | 2006-04-21 | 2007-11-08 | Samsung Electronics Co Ltd | Inspection apparatus and inspection method of display panel |
| CN104991358A (en) * | 2015-07-21 | 2015-10-21 | 合肥鑫晟光电科技有限公司 | Array substrate, manufacturing method thereof, control method thereof and display apparatus |
| CN104991358B (en) * | 2015-07-21 | 2018-07-13 | 合肥鑫晟光电科技有限公司 | Array substrate and preparation method thereof, control method, display device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2865323B2 (en) | 1999-03-08 |
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