KR100965095B1 - Liquid crystal display device - Google Patents

Abstract

The present invention discloses a liquid crystal display device capable of preventing disconnection of signal lines from static electricity generated from the outside by designing an auxiliary electrostatic circuit between a common bus line and a scribe line in an array substrate of the liquid crystal display device. The disclosed invention includes a plurality of gate bus lines and data bus lines vertically intersecting on a substrate to define unit pixels; A plurality of gate pads and data pads applying signals to the gate bus lines and the data bus lines; A plurality of electrostatic circuits connected to the data bus lines; A common bus line disposed around an edge of the substrate; And a plurality of auxiliary electrostatic circuits disposed between the substrate edge scribe line and the common bus line.

Here, the plurality of auxiliary electrostatic circuits protect a plurality of signal lines disposed on the substrate from static electricity applied through an scribe line of the substrate from the outside, and the plurality of auxiliary electrostatic circuits are connected in series along an edge of the substrate. The short bar is characterized in that the connection is arranged.

Static, Short, VCOM, Pad, COG

Description

[0001] LIQUID CRYSTAL DISPLAY DEVICE [0002]

1 is a diagram illustrating a signal line structure of a liquid crystal display according to the related art.

FIG. 2 is a view for explaining a problem in that short circuits occur between lines due to static electricity generated in region A of FIG.

3 is a view for explaining a drive IC of a liquid crystal display device having a chip on glass (COG) structure to which the electrostatic circuit of the present invention is applied.

4 is a diagram showing an antistatic structure of a liquid crystal display according to the present invention.

* Description of the symbols for the main parts of the drawings *

100: drive IC 150: data pad area

200: active area 300: electrostatic circuit

400: auxiliary electrostatic circuit

VCOM: Common Bus Lines

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, and more particularly, by designing an auxiliary electrostatic circuit between a common bus line (Vcom) and a scribe line (Scribe line) of an array substrate of a liquid crystal display device. It relates to a liquid crystal display device that can prevent the disconnection of these.

A liquid crystal display device, which is a type of flat panel display device, uses characteristics of liquid crystals in which light transmittance changes according to a voltage, and is widely used because it can be driven at a low voltage and power consumption is small.

The manufacture of such a TFT-LCD panel for a liquid crystal display device includes a TFT array process for forming switchings for applying a pixel-based signal, a color filter process for forming a color filter array for realizing color, and a completed When the driving circuits are provided on the TFT substrate and the color filter substrate, they are divided into a liquid crystal cell process of manufacturing a unit liquid crystal cell in which signal driving is possible.

In particular, during the manufacturing process of the liquid crystal display device, after each process is completed, a pattern defect inspection and a signal line disconnection inspection are performed to repair or remove products manufactured as defective in the process.

When the TFT array substrate of the liquid crystal display device is completed, an array test process is performed. In the above array test process, TFT ON / OFF and pixel defects are detected. Then, a test signal for inspection is applied through the data pad region, and when a defect is detected in the active region of the array substrate, the detected pixel is displayed as coordinates.

In this case, when there are many TFTs or defective pixels with a high degree of defects, the array substrates are discarded without being repaired. At this time, an inspection operation for analyzing the cause or form of the defects is performed on the array substrates inspected as defective products. .

As described above, the pattern of the pixel defects is closely examined and analyzed even with respect to the array substrate designated as the defective product, and the shape of the defects appears in what form, and the defect patterns are generated in which processes and conditions.

1 is a diagram illustrating a signal line structure of a liquid crystal display according to the related art.

As shown in FIG. 1, in the TFT array substrate 10 of the liquid crystal display device, a plurality of data bus lines 53a and gate bus lines 51a are vertically intersected to define a plurality of unit pixel regions. The data pads 53 and the gate pads 51 for applying a graphic signal and a driving signal to the data bus lines 53a and the gate bus lines 51a are formed at the edge pad region of the array substrate 10. 50) respectively.

TFT switching elements that are turned on or turned off by the driving signals applied from the gate bus line 51 are disposed on the unit pixel region, respectively.

A common bus line 11 for applying a reference voltage of a signal applied to the gate bus line 51a and the data bus line 53a is disposed around the edge of the array substrate 10.

In general, the TFT inspection separates the order of the gate bus line 51a and the data bus line 53a into even and odd numbers, and alternates even numbers based on a common voltage applied to the common bus line 11. Apply a test signal through the and odd-numbered signal lines.

By the test signal, it is checked whether the graphic signal is transmitted to the pixel electrode region through the TFT driving of the unit pixel region and the data bus line 53a.

Although shown in the figure, 30, which is not described, is a liquid crystal margin region, and 20 is an active region.

FIG. 2 is a diagram for describing a problem in which a short circuit occurs between lines due to static electricity generation in region A of FIG. 1.

As shown in FIG. 2, in order to inspect the TFT array substrate of the liquid crystal display device, the gate bus line and the data bus line are separated into odd and even numbers, respectively, and then an array test is performed by sequentially applying signals.

In this case, the common bus lines disposed along the edges of the array substrate are connected to the data bus lines, respectively, and the short circuit caused by static electricity is prevented in an area where the common bus lines and the data bus lines are electrically connected. An electrostatic circuit is installed for this purpose.

Therefore, the electrostatic circuit serves to prevent a problem of disconnection due to static electricity generated in the region inside the common bus line.

However, in the prior art as described above, the TFT array substrate test operation is performed by contacting the test line in the data pad area and then applying signals to the odd-numbered signal lines and even-numbered signal lines.

However, in the case of a liquid crystal display having a chip on glass structure, since a drive IC is directly mounted on a pad area, a signal line for a test cannot be applied in the data pad area.

Accordingly, in the array substrate having the chip on glass (COG) structure, the array inspection operation is performed by connecting the TFT inspection signal lines from the other region facing the data pad region.

However, in particular, the metal line is exposed to the outside while thermally bonding the color filter substrate and the array substrate to the other region of the data pad region and the gate pad region, and cutting the substrate bonded by a scribe.

The exposed metal lines are connected to signal lines to apply test signals to the data bus lines for array test, wherein the static electricity generated in the test process is applied to the exposed metal lines to disconnect the signal lines. Occurs.

That is, since the array test of the liquid crystal display device is performed in the structure of the chip-on glass, but not in the data pad area, the static electricity generated in the working process is exposed to the common bus line through the exposed metal line when the array test signal is applied. Defects in the existing gate insulating film and semiconductor layer cause short defects in the common bus line and the data bus line.

In particular, when externally generated static electricity is applied to the signal line during the array test process, the electrostatic circuit disposed between the data bus line and the common bus line does not provide protection.

The present invention provides a liquid crystal display device which can prevent disconnection of signal lines by generating static electricity from the outside such as a TFT inspection operation by designing an auxiliary electrostatic circuit between a common bus line and a scribe line in an array substrate of a liquid crystal display device. The purpose is to provide.

In order to achieve the above object, the liquid crystal display device according to the present invention,

A plurality of gate bus lines and data bus lines vertically intersecting on the substrate to define unit pixels;

A plurality of gate pads and data pads applying signals to the gate bus lines and the data bus lines;

A plurality of electrostatic circuits connected to the data bus lines;

A common bus line disposed around an edge of the substrate; And

And a plurality of auxiliary electrostatic circuits disposed between the substrate edge scribe line and the common bus line.

Here, the plurality of auxiliary electrostatic circuits protect a plurality of signal lines disposed on the substrate from static electricity applied through an scribe line of the substrate from the outside, and the plurality of auxiliary electrostatic circuits are connected in series along an edge of the substrate. The short bar is characterized in that the connection is arranged.

Each of the plurality of auxiliary electrostatic circuits is arranged in a number corresponding to each of the plurality of electrostatic circuits connected to the data bus line, and the auxiliary electrostatic circuits are electrically connected to the test signal line during the TFT array inspection operation. It is characterized in that the connected to prevent the disconnection of the device from the static electricity generated during the operation.

According to the present invention, by designing an auxiliary electrostatic circuit between the common bus line and the scribe line in the array substrate of the liquid crystal display device, it is possible to prevent the signal lines from being disconnected by static electricity generated from the outside such as the TFT inspection operation.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

In the case of the tapered carrier package (TCP) type of the array substrate structure of the liquid crystal display device, a shorting bar is formed as the pad region 150 to prevent disconnection due to static electricity.

However, the chip on glass type array substrate has a structure in which the drive IC is directly mounted on the pad area of the array substrate, so that the test signal line cannot be contacted during the TFT array inspection. Doing

3 is a view for explaining a drive IC of a liquid crystal display device having a chip on glass (COG) structure to which the electrostatic circuit of the present invention is applied.

As shown in FIG. 3, it can be seen that the drive IC 100 is mounted on the pad region 150 of the array substrate on the chip on glass type array substrate.

When the TFT array inspection operation is performed on the chip-on-glass type substrate as described above, a test signal is applied from an area on the opposite side of the data pad to turn on / off a state of the TFT disposed in the active area 200. Should be inspected.

Therefore, since the static electricity generated from the outside is more likely to flow into the array substrate than when the TFT array test signal is applied in the pad region 150 as in the related art, the problem of disconnecting the signal line despite the conventional static electricity protection circuit is avoided. Can be generated.

In order to solve such a problem, the present invention provides a signal line from static electricity that can be applied from the outside during TFT inspection between the common bus line and the scribe line in addition to the electrostatic circuit formed between the common bus line and the active region. Auxiliary blackout circuits were placed for protection.

4 is a diagram illustrating an antistatic structure of a liquid crystal display according to the present invention.

As shown in FIG. 4, in the chip on glass type liquid crystal display, when the array inspection process is performed, signal lines are divided into odd and even numbers in the data pad area without applying a test signal. The test signal is applied through a signal line exposed in a scribe line region facing the data pad.                     

In the scribe line region, signal lines are exposed to the outside by thermal bonding and cutting of the color filter substrate and the array substrate. Static electricity generated during the TFT inspection operation is applied to the exposed signal lines to cause line breakage.

By disposing an auxiliary electrostatic circuit 400 to protect internal signal lines from static electricity that may be applied from the outside between the scribe line and the common bus line, the static electricity between data bus lines arranged to overlap the common bus line. This prevents disconnection that may occur due to the application of.

The auxiliary electrostatic circuit 400 is disposed between the scribe line and the common bus line so as to correspond to the electrostatic circuit 300 connected in series with the data bus line.

Therefore, the test signal is divided into odd-numbered and even-numbered lines for TFT inspection, thereby connecting a test signal line and a data bus line, and electrically connecting the test signal line with a connection of the auxiliary electrostatic circuit 400. Even if static electricity generated during the TFT inspection was applied to the array substrate through the scribe line, the internal signal line was protected.

The static electricity generated during the TFT inspection operation is combined with the array substrate and the color filter substrate and flows into the substrate through the cut scribe line. The auxiliary electrostatic circuit 400 is disposed around the substrate along the scribe line and the common bus line. Since it is disposed in, the introduced static electricity is removed by the auxiliary electrostatic circuit 400.

 As described in detail above, the present invention designes an auxiliary electrostatic circuit between a common bus line and a scribe line in an array substrate of a liquid crystal display device, thereby preventing signal lines from being disconnected by static electricity generated from the outside, such as a TFT inspection operation. There is an effect that can be prevented.

The present invention is not limited to the above-described embodiments, and various changes can be made by those skilled in the art without departing from the gist of the present invention as claimed in the following claims.

Claims (5)

A plurality of gate bus lines and data bus lines vertically intersecting on the substrate to define unit pixels; A plurality of gate pads and data pads applying signals to the gate bus lines and the data bus lines; A plurality of electrostatic circuits connected to the data bus lines; A common bus line disposed around an edge of the substrate; And And a plurality of auxiliary electrostatic circuits disposed between the substrate edge scribe line and the common bus line and preventing static electricity flowing between the data bus lines disposed to overlap the common bus line. And the plurality of auxiliary electrostatic circuits are connected to each other in a series of short bar shapes along an edge of the substrate. The method of claim 1, And the plurality of auxiliary electrostatic circuits protect a plurality of signal lines disposed on the substrate from static electricity applied through the scribe lines of the substrate from the outside. delete The method of claim 1, And each of the plurality of auxiliary electrostatic circuits is arranged in a number corresponding to each of the plurality of electrostatic circuits connected to the data bus line. The method of claim 1, And the auxiliary electrostatic circuits are electrically connected to a test signal line during a TFT array inspection operation to prevent disconnection of the device from static electricity generated during the operation.

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