TW498522B - Semiconductor device and its manufacture method - Google Patents
Semiconductor device and its manufacture method Download PDFInfo
- Publication number
- TW498522B TW498522B TW090105543A TW90105543A TW498522B TW 498522 B TW498522 B TW 498522B TW 090105543 A TW090105543 A TW 090105543A TW 90105543 A TW90105543 A TW 90105543A TW 498522 B TW498522 B TW 498522B
- Authority
- TW
- Taiwan
- Prior art keywords
- main plane
- substrate
- semiconductor wafer
- semiconductor device
- sealing resin
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W76/00—Containers; Fillings or auxiliary members therefor; Seals
- H10W76/10—Containers or parts thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/012—Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/121—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by multiple encapsulations, e.g. by a thin protective coating and a thick encapsulation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W76/00—Containers; Fillings or auxiliary members therefor; Seals
- H10W76/40—Fillings or auxiliary members in containers, e.g. centering rings
- H10W76/42—Fillings
- H10W76/47—Solid or gel fillings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/63—Vias, e.g. via plugs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/013—Manufacture or treatment of die-attach connectors
- H10W72/01308—Manufacture or treatment of die-attach connectors using permanent auxiliary members, e.g. using alignment marks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07311—Treating the bonding area before connecting, e.g. by applying flux or cleaning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/353—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
- H10W72/354—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/856—Bump connectors and die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/877—Bump connectors and die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/879—Bump connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Ceramic Capacitors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000076709A JP2001267473A (ja) | 2000-03-17 | 2000-03-17 | 半導体装置およびその製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW498522B true TW498522B (en) | 2002-08-11 |
Family
ID=18594407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW090105543A TW498522B (en) | 2000-03-17 | 2001-03-09 | Semiconductor device and its manufacture method |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6433412B2 (https=) |
| JP (1) | JP2001267473A (https=) |
| KR (1) | KR20010091916A (https=) |
| TW (1) | TW498522B (https=) |
Families Citing this family (72)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19960246A1 (de) * | 1999-12-14 | 2001-07-05 | Infineon Technologies Ag | Gehäuseanordnung eines Halbleiterbausteins |
| KR100779345B1 (ko) * | 2001-08-17 | 2007-11-23 | 앰코 테크놀로지 코리아 주식회사 | 반도체패키지 |
| US6573592B2 (en) * | 2001-08-21 | 2003-06-03 | Micron Technology, Inc. | Semiconductor die packages with standard ball grid array footprint and method for assembling the same |
| KR100708045B1 (ko) * | 2001-09-05 | 2007-04-16 | 앰코 테크놀로지 코리아 주식회사 | 반도체패키지 및 그 제조 방법 |
| KR100443399B1 (ko) * | 2001-10-25 | 2004-08-09 | 삼성전자주식회사 | 보이드가 형성된 열 매개 물질을 갖는 반도체 패키지 |
| US6882041B1 (en) * | 2002-02-05 | 2005-04-19 | Altera Corporation | Thermally enhanced metal capped BGA package |
| US6680530B1 (en) * | 2002-08-12 | 2004-01-20 | International Business Machines Corporation | Multi-step transmission line for multilayer packaging |
| DE10238523B4 (de) * | 2002-08-22 | 2014-10-02 | Epcos Ag | Verkapseltes elektronisches Bauelement und Verfahren zur Herstellung |
| US6998532B2 (en) | 2002-12-24 | 2006-02-14 | Matsushita Electric Industrial Co., Ltd. | Electronic component-built-in module |
| JP2004253738A (ja) * | 2003-02-21 | 2004-09-09 | Toshiba Corp | パッケージ基板及びフリップチップ型半導体装置 |
| WO2005004200A2 (en) * | 2003-06-25 | 2005-01-13 | Advanced Interconnect Technologies Limited | Lead frame routed chip pads for semiconductor packages |
| US6888238B1 (en) * | 2003-07-09 | 2005-05-03 | Altera Corporation | Low warpage flip chip package solution-channel heat spreader |
| TWI229928B (en) * | 2003-08-19 | 2005-03-21 | Advanced Semiconductor Eng | Semiconductor package structure |
| JP3819901B2 (ja) * | 2003-12-25 | 2006-09-13 | 松下電器産業株式会社 | 半導体装置及びそれを用いた電子機器 |
| JP3809168B2 (ja) * | 2004-02-03 | 2006-08-16 | 株式会社東芝 | 半導体モジュール |
| JP3999759B2 (ja) * | 2004-04-02 | 2007-10-31 | 富士通株式会社 | 基板及び電子機器 |
| DE102004020204A1 (de) * | 2004-04-22 | 2005-11-10 | Epcos Ag | Verkapseltes elektrisches Bauelement und Verfahren zur Herstellung |
| US7608789B2 (en) * | 2004-08-12 | 2009-10-27 | Epcos Ag | Component arrangement provided with a carrier substrate |
| DE102005008511B4 (de) | 2005-02-24 | 2019-09-12 | Tdk Corporation | MEMS-Mikrofon |
| DE102005008512B4 (de) | 2005-02-24 | 2016-06-23 | Epcos Ag | Elektrisches Modul mit einem MEMS-Mikrofon |
| US7518224B2 (en) * | 2005-05-16 | 2009-04-14 | Stats Chippac Ltd. | Offset integrated circuit package-on-package stacking system |
| US7746656B2 (en) * | 2005-05-16 | 2010-06-29 | Stats Chippac Ltd. | Offset integrated circuit package-on-package stacking system |
| US20060278170A1 (en) * | 2005-06-10 | 2006-12-14 | Wildlife Solutions, Inc. | Method for removing unwanted animals and their attractants |
| KR20070016383A (ko) * | 2005-08-03 | 2007-02-08 | 삼성전자주식회사 | 칩형 전기 소자 및 이를 포함하는 액정 표시 모듈 |
| JP5123664B2 (ja) * | 2005-09-28 | 2013-01-23 | スパンション エルエルシー | 半導体装置およびその製造方法 |
| CN100373599C (zh) * | 2005-09-29 | 2008-03-05 | 威盛电子股份有限公司 | 无凸块式芯片封装体 |
| DE102005050398A1 (de) * | 2005-10-20 | 2007-04-26 | Epcos Ag | Gehäuse mit Hohlraum für ein mechanisch empfindliches elektronisches Bauelement und Verfahren zur Herstellung |
| DE102005053765B4 (de) | 2005-11-10 | 2016-04-14 | Epcos Ag | MEMS-Package und Verfahren zur Herstellung |
| DE102005053767B4 (de) | 2005-11-10 | 2014-10-30 | Epcos Ag | MEMS-Mikrofon, Verfahren zur Herstellung und Verfahren zum Einbau |
| JP2007134540A (ja) * | 2005-11-11 | 2007-05-31 | Murata Mfg Co Ltd | 半導体装置およびその製造方法 |
| KR100718169B1 (ko) * | 2006-01-12 | 2007-05-15 | 한국과학기술원 | 니켈 표면 처리된 전자부품과 무전해 니켈 표면 처리된전자부품의 접합방법 |
| WO2007096975A1 (ja) | 2006-02-24 | 2007-08-30 | Fujitsu Limited | 半導体装置 |
| JP4691455B2 (ja) * | 2006-02-28 | 2011-06-01 | 富士通株式会社 | 半導体装置 |
| US20080001282A1 (en) * | 2006-06-30 | 2008-01-03 | Mitul Modi | Microelectronic assembly having a periphery seal around a thermal interface material |
| JP4963890B2 (ja) * | 2006-06-30 | 2012-06-27 | 太陽誘電株式会社 | 樹脂封止回路装置 |
| EP1914798A3 (en) * | 2006-10-18 | 2009-07-29 | Panasonic Corporation | Semiconductor Mounting Substrate and Method for Manufacturing the Same |
| US8163600B2 (en) * | 2006-12-28 | 2012-04-24 | Stats Chippac Ltd. | Bridge stack integrated circuit package-on-package system |
| KR100850897B1 (ko) * | 2007-01-22 | 2008-08-07 | 주식회사 네패스 | 수동소자가 매립된 반도체 장치 및 그 제조 방법 |
| KR101011199B1 (ko) * | 2007-11-01 | 2011-01-26 | 파나소닉 주식회사 | 실장 구조체 |
| JP2009117767A (ja) * | 2007-11-09 | 2009-05-28 | Shinko Electric Ind Co Ltd | 半導体装置の製造方法及びそれにより製造した半導体装置 |
| JP4492695B2 (ja) * | 2007-12-24 | 2010-06-30 | 株式会社デンソー | 半導体モジュールの実装構造 |
| US7906376B2 (en) * | 2008-06-30 | 2011-03-15 | Intel Corporation | Magnetic particle-based composite materials for semiconductor packages |
| US8415809B2 (en) * | 2008-07-02 | 2013-04-09 | Altera Corporation | Flip chip overmold package |
| JP4555369B2 (ja) * | 2008-08-13 | 2010-09-29 | 富士通メディアデバイス株式会社 | 電子部品モジュール及びその製造方法 |
| JP4560113B2 (ja) * | 2008-09-30 | 2010-10-13 | 株式会社東芝 | プリント回路板及びプリント回路板を備えた電子機器 |
| JP4900432B2 (ja) * | 2009-07-21 | 2012-03-21 | 株式会社村田製作所 | 樹脂封止型電子部品の製造方法及び樹脂封止型電子部品の集合体 |
| JP5625340B2 (ja) | 2009-12-07 | 2014-11-19 | 富士通セミコンダクター株式会社 | 半導体装置とその製造方法 |
| GB2477492B (en) * | 2010-01-27 | 2014-04-09 | Thales Holdings Uk Plc | Integrated circuit package |
| JP2011176112A (ja) * | 2010-02-24 | 2011-09-08 | Renesas Electronics Corp | 半導体集積回路及びその製造方法 |
| US8217500B1 (en) * | 2010-05-07 | 2012-07-10 | Altera Corporation | Semiconductor device package |
| TWI401773B (zh) * | 2010-05-14 | 2013-07-11 | 南茂科技股份有限公司 | 晶片封裝裝置及其製造方法 |
| TW201225238A (en) * | 2010-07-26 | 2012-06-16 | Unisem Mauritius Holdings Ltd | Lead frame routed chip pads for semiconductor packages |
| JP5573645B2 (ja) * | 2010-12-15 | 2014-08-20 | 富士通セミコンダクター株式会社 | 半導体装置及び半導体装置の製造方法 |
| US8624359B2 (en) * | 2011-10-05 | 2014-01-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wafer level chip scale package and method of manufacturing the same |
| JP5861580B2 (ja) * | 2012-07-09 | 2016-02-16 | 株式会社ソシオネクスト | 半導体装置及び半導体装置製造方法 |
| US9287194B2 (en) * | 2013-03-06 | 2016-03-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packaging devices and methods for semiconductor devices |
| DE102013106353B4 (de) * | 2013-06-18 | 2018-06-28 | Tdk Corporation | Verfahren zum Aufbringen einer strukturierten Beschichtung auf ein Bauelement |
| US9355966B2 (en) * | 2013-07-08 | 2016-05-31 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Substrate warpage control using external frame stiffener |
| CN104575584B (zh) | 2013-10-23 | 2018-11-30 | 钰创科技股份有限公司 | 具有嵌入式内存的系统级封装内存模块 |
| US20150262902A1 (en) * | 2014-03-12 | 2015-09-17 | Invensas Corporation | Integrated circuits protected by substrates with cavities, and methods of manufacture |
| CN204993854U (zh) * | 2015-06-24 | 2016-01-20 | 瑞声声学科技(深圳)有限公司 | Mems麦克风 |
| JP6569375B2 (ja) * | 2015-08-11 | 2019-09-04 | 株式会社ソシオネクスト | 半導体装置、半導体装置の製造方法及び電子装置 |
| FR3055943B1 (fr) * | 2016-09-15 | 2020-10-02 | Valeo Vision | Cablage d'une source lumineuse de haute resolution |
| WO2018164160A1 (ja) * | 2017-03-10 | 2018-09-13 | 株式会社村田製作所 | モジュール |
| US10217649B2 (en) * | 2017-06-09 | 2019-02-26 | Advanced Semiconductor Engineering, Inc. | Semiconductor device package having an underfill barrier |
| US10541153B2 (en) * | 2017-08-03 | 2020-01-21 | General Electric Company | Electronics package with integrated interconnect structure and method of manufacturing thereof |
| US10804115B2 (en) | 2017-08-03 | 2020-10-13 | General Electric Company | Electronics package with integrated interconnect structure and method of manufacturing thereof |
| US10541209B2 (en) | 2017-08-03 | 2020-01-21 | General Electric Company | Electronics package including integrated electromagnetic interference shield and method of manufacturing thereof |
| JP6645487B2 (ja) * | 2017-10-30 | 2020-02-14 | セイコーエプソン株式会社 | プリント回路板 |
| US20220262759A1 (en) * | 2019-02-04 | 2022-08-18 | Sony Interactive Entertainment Inc. | Electronic apparatus, semiconductor device, insulating sheet, and semiconductor device manufacturing method |
| KR102837779B1 (ko) * | 2021-09-17 | 2025-07-22 | 삼성전자주식회사 | 반도체 패키지 |
| CN216749870U (zh) * | 2021-12-10 | 2022-06-14 | 云南中宣液态金属科技有限公司 | 一种用于芯片散热的液态金属封装结构 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0846098A (ja) | 1994-07-22 | 1996-02-16 | Internatl Business Mach Corp <Ibm> | 直接的熱伝導路を形成する装置および方法 |
| US5872051A (en) * | 1995-08-02 | 1999-02-16 | International Business Machines Corporation | Process for transferring material to semiconductor chip conductive pads using a transfer substrate |
| JP3724979B2 (ja) * | 1999-04-27 | 2005-12-07 | 富士通株式会社 | 半導体装置 |
-
2000
- 2000-03-17 JP JP2000076709A patent/JP2001267473A/ja active Pending
-
2001
- 2001-02-28 KR KR1020010010284A patent/KR20010091916A/ko not_active Withdrawn
- 2001-03-08 US US09/800,589 patent/US6433412B2/en not_active Expired - Fee Related
- 2001-03-09 TW TW090105543A patent/TW498522B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR20010091916A (ko) | 2001-10-23 |
| JP2001267473A (ja) | 2001-09-28 |
| US6433412B2 (en) | 2002-08-13 |
| US20010050428A1 (en) | 2001-12-13 |
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