US5521036A
(en)
*
|
1992-07-27 |
1996-05-28 |
Nikon Corporation |
Positioning method and apparatus
|
US5345870A
(en)
*
|
1993-02-10 |
1994-09-13 |
Miles Inc. |
"Direct-to-press" positive lithographic printing plate and method for making same
|
US5576854A
(en)
*
|
1993-11-12 |
1996-11-19 |
Hughes-Jvc Technology Corporation |
Liquid crystal light valve projector with improved contrast ratio and with 0.27 wavelength compensation for birefringence in the liquid crystal light valve
|
US5442467A
(en)
*
|
1994-03-21 |
1995-08-15 |
Xerox Corporation |
Enhanced off-axis viewing performance and luminous efficiency of a liquid crystal display employing fiberoptic faceplate elements
|
US5700076A
(en)
*
|
1994-07-25 |
1997-12-23 |
Proxima Corporation |
Laser illuminated image producing system and method of using same
|
US5704700A
(en)
*
|
1994-07-25 |
1998-01-06 |
Proxima Corporation |
Laser illuminated image projection system and method of using same
|
US5663832A
(en)
*
|
1995-03-03 |
1997-09-02 |
Miller; Walter B. |
Device for and method of real-time simulation of atmospheric effects on an image
|
US5598053A
(en)
*
|
1995-03-20 |
1997-01-28 |
The United States Of America As Represented By The Secretary Of The Army |
LCD-CRT hybrid image tube
|
JPH095745A
(ja)
*
|
1995-06-07 |
1997-01-10 |
Xerox Corp |
カラー液晶ディスプレイ装置の光ファイバフェースプレート
|
US6268893B1
(en)
*
|
1996-03-11 |
2001-07-31 |
American Bank Note Holographics |
Method and apparatus for a fringe direct writing system
|
US20080248046A1
(en)
*
|
1997-03-17 |
2008-10-09 |
Human Genome Sciences, Inc. |
Death domain containing receptor 5
|
US6005692A
(en)
*
|
1997-05-29 |
1999-12-21 |
Stahl; Thomas D. |
Light-emitting diode constructions
|
KR100245414B1
(ko)
*
|
1997-06-26 |
2000-03-02 |
윤종용 |
노광 시스템과 노광 시스템의 노광 방법
|
US6291110B1
(en)
|
1997-06-27 |
2001-09-18 |
Pixelligent Technologies Llc |
Methods for transferring a two-dimensional programmable exposure pattern for photolithography
|
US5959773A
(en)
*
|
1997-08-20 |
1999-09-28 |
Hughes-Jvc Technology Corporation |
Parallel plate beam splitter configuration in high index glass
|
US6106979A
(en)
*
|
1997-12-30 |
2000-08-22 |
Micron Technology, Inc. |
Use of attenuating phase-shifting mask for improved printability of clear-field patterns
|
US6077630A
(en)
*
|
1998-01-08 |
2000-06-20 |
Micron Technology, Inc. |
Subresolution grating for attenuated phase shifting mask fabrication
|
US6096457A
(en)
*
|
1998-02-27 |
2000-08-01 |
Micron Technology, Inc. |
Method for optimizing printing of a phase shift mask having a phase shift error
|
US5998069A
(en)
|
1998-02-27 |
1999-12-07 |
Micron Technology, Inc. |
Electrically programmable photolithography mask
|
US6136509A
(en)
*
|
1998-06-05 |
2000-10-24 |
Creo Srl |
Method of exposing thermoresist
|
US6387597B1
(en)
|
1998-06-05 |
2002-05-14 |
Creo Srl |
Method for exposing features on non-planar resists
|
US6251550B1
(en)
|
1998-07-10 |
2001-06-26 |
Ball Semiconductor, Inc. |
Maskless photolithography system that digitally shifts mask data responsive to alignment data
|
WO2000026702A1
(fr)
*
|
1998-11-04 |
2000-05-11 |
Xiaojing Shao |
Dispositif d'enregistrement pour reseau de diffraction et procede d'enregistrement d'image tridimensionnelle ou bidimensionnelle
|
US6529262B1
(en)
|
1999-04-14 |
2003-03-04 |
Ball Semiconductor, Inc. |
System and method for performing lithography on a substrate
|
FI19992157A
(fi)
*
|
1999-10-06 |
2001-04-07 |
Vtg Worldwide Oy |
Kolmiulotteisen kappaleen pinnan yksilöllinen kuviointi
|
US6461797B1
(en)
|
1999-11-19 |
2002-10-08 |
International Business Machines Corporation |
Method and apparatus for selectively programming a semiconductor device
|
TW546551B
(en)
*
|
1999-12-21 |
2003-08-11 |
Asml Netherlands Bv |
Balanced positioning system for use in lithographic apparatus
|
US6379867B1
(en)
|
2000-01-10 |
2002-04-30 |
Ball Semiconductor, Inc. |
Moving exposure system and method for maskless lithography system
|
TW588222B
(en)
*
|
2000-02-10 |
2004-05-21 |
Asml Netherlands Bv |
Cooling of voice coil motors in lithographic projection apparatus
|
TW509823B
(en)
|
2000-04-17 |
2002-11-11 |
Asml Netherlands Bv |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
US6425669B1
(en)
|
2000-05-24 |
2002-07-30 |
Ball Semiconductor, Inc. |
Maskless exposure system
|
US6509955B2
(en)
*
|
2000-05-25 |
2003-01-21 |
Ball Semiconductor, Inc. |
Lens system for maskless photolithography
|
US6552779B2
(en)
|
2000-05-25 |
2003-04-22 |
Ball Semiconductor, Inc. |
Flying image of a maskless exposure system
|
US7508487B2
(en)
*
|
2000-06-01 |
2009-03-24 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
US6630984B2
(en)
*
|
2000-08-03 |
2003-10-07 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
US6537738B1
(en)
|
2000-08-08 |
2003-03-25 |
Ball Semiconductor, Inc. |
System and method for making smooth diagonal components with a digital photolithography system
|
US6493867B1
(en)
*
|
2000-08-08 |
2002-12-10 |
Ball Semiconductor, Inc. |
Digital photolithography system for making smooth diagonal components
|
US7561270B2
(en)
|
2000-08-24 |
2009-07-14 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby
|
TW527526B
(en)
*
|
2000-08-24 |
2003-04-11 |
Asml Netherlands Bv |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
TW548524B
(en)
*
|
2000-09-04 |
2003-08-21 |
Asm Lithography Bv |
Lithographic projection apparatus, device manufacturing method and device manufactured thereby
|
TWI232356B
(en)
|
2000-09-04 |
2005-05-11 |
Asml Netherlands Bv |
Lithographic projection apparatus, device manufacturing method and device manufactured thereby
|
EP1197803B1
(en)
|
2000-10-10 |
2012-02-01 |
ASML Netherlands B.V. |
Lithographic apparatus
|
EP1679550A1
(en)
|
2000-11-07 |
2006-07-12 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US6512625B2
(en)
|
2000-11-22 |
2003-01-28 |
Ball Semiconductor, Inc. |
Light modulation device and system
|
US6473237B2
(en)
|
2000-11-14 |
2002-10-29 |
Ball Semiconductor, Inc. |
Point array maskless lithography
|
US6433917B1
(en)
|
2000-11-22 |
2002-08-13 |
Ball Semiconductor, Inc. |
Light modulation device and system
|
TW591342B
(en)
*
|
2000-11-30 |
2004-06-11 |
Asml Netherlands Bv |
Lithographic projection apparatus and integrated circuit manufacturing method using a lithographic projection apparatus
|
US7113258B2
(en)
*
|
2001-01-15 |
2006-09-26 |
Asml Netherlands B.V. |
Lithographic apparatus
|
US20020115021A1
(en)
*
|
2001-02-01 |
2002-08-22 |
Advanced Micro Devices, Inc. |
Configurable patterning device and a method of making integrated circuits using such a device
|
JP4761261B2
(ja)
*
|
2001-02-02 |
2011-08-31 |
学校法人東京電機大学 |
液晶マトリックス投影露光装置
|
US6792591B2
(en)
*
|
2001-02-28 |
2004-09-14 |
Asml Masktools B.V. |
Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs
|
JP4267245B2
(ja)
|
2001-03-14 |
2009-05-27 |
エーエスエムエル マスクツールズ ビー.ブイ. |
解像度以下の補助フィーチャとして罫線ラダー・バーを利用した光近接補正方法
|
US7062094B2
(en)
*
|
2001-03-22 |
2006-06-13 |
Disco Corporation |
System and method for lossless data transmission
|
US7735052B2
(en)
*
|
2001-04-24 |
2010-06-08 |
Asml Masktools Netherlands B.V. |
Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs
|
JP4342155B2
(ja)
|
2001-05-23 |
2009-10-14 |
エーエスエムエル ネザーランズ ビー.ブイ. |
位置決めマークを備えた基板、マスクを設計する方法、コンピュータ・プログラム、位置決めマークを露光するマスク、およびデバイス製造方法
|
TWI266959B
(en)
*
|
2001-06-20 |
2006-11-21 |
Asml Netherlands Bv |
Device manufacturing method, device manufactured thereby and a mask for use in the method
|
TW529172B
(en)
*
|
2001-07-24 |
2003-04-21 |
Asml Netherlands Bv |
Imaging apparatus
|
US6965387B2
(en)
|
2001-08-03 |
2005-11-15 |
Ball Semiconductor, Inc. |
Real time data conversion for a digital display
|
US7026081B2
(en)
|
2001-09-28 |
2006-04-11 |
Asml Masktools B.V. |
Optical proximity correction method utilizing phase-edges as sub-resolution assist features
|
KR100592822B1
(ko)
*
|
2001-10-19 |
2006-06-23 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피장치, 디바이스제조방법
|
TWI291729B
(en)
*
|
2001-11-22 |
2007-12-21 |
Semiconductor Energy Lab |
A semiconductor fabricating apparatus
|
DE60230663D1
(de)
|
2001-11-27 |
2009-02-12 |
Asml Netherlands Bv |
Bilderzeugungsapparat
|
US7333178B2
(en)
*
|
2002-03-18 |
2008-02-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7170587B2
(en)
*
|
2002-03-18 |
2007-01-30 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
EP1349010B1
(en)
|
2002-03-28 |
2014-12-10 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US6870604B2
(en)
|
2002-04-23 |
2005-03-22 |
Ball Semiconductor, Inc. |
High resolution point array
|
EP1367446A1
(en)
|
2002-05-31 |
2003-12-03 |
ASML Netherlands B.V. |
Lithographic apparatus
|
CN1492284A
(zh)
*
|
2002-06-14 |
2004-04-28 |
Asml |
有光学元件的光刻投射装置、器件的生产方法及其器件
|
US7164961B2
(en)
|
2002-06-14 |
2007-01-16 |
Disco Corporation |
Modified photolithography movement system
|
SG128443A1
(en)
*
|
2002-07-11 |
2007-01-30 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
EP1383007A1
(en)
*
|
2002-07-16 |
2004-01-21 |
ASML Netherlands B.V. |
Lithographic apparatus, and device manufacturing method
|
SG109523A1
(en)
*
|
2002-08-15 |
2005-03-30 |
Asml Netherlands Bv |
Lithographic projection apparatus and reflector assembly for use in said apparatus
|
TWI227814B
(en)
*
|
2002-09-20 |
2005-02-11 |
Asml Netherlands Bv |
Alignment system and methods for lithographic systems using at least two wavelengths
|
EP2204697A3
(en)
|
2002-09-20 |
2012-04-18 |
ASML Netherlands B.V. |
Marker structure, lithographic projection apparatus, method for substrate alignment using such a structure, and substrate comprising such marker structure
|
US20040105084A1
(en)
*
|
2002-09-30 |
2004-06-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
CN100421024C
(zh)
*
|
2002-09-30 |
2008-09-24 |
Asml荷兰有限公司 |
光刻装置及器件制造方法
|
US9482966B2
(en)
|
2002-11-12 |
2016-11-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US10503084B2
(en)
|
2002-11-12 |
2019-12-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
EP2495613B1
(en)
|
2002-11-12 |
2013-07-31 |
ASML Netherlands B.V. |
Lithographic apparatus
|
SG137657A1
(en)
*
|
2002-11-12 |
2007-12-28 |
Asml Masktools Bv |
Method and apparatus for performing model-based layout conversion for use with dipole illumination
|
US7110081B2
(en)
|
2002-11-12 |
2006-09-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
SG121822A1
(en)
|
2002-11-12 |
2006-05-26 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
EP1429188B1
(en)
|
2002-11-12 |
2013-06-19 |
ASML Netherlands B.V. |
Lithographic projection apparatus
|
CN100568101C
(zh)
*
|
2002-11-12 |
2009-12-09 |
Asml荷兰有限公司 |
光刻装置和器件制造方法
|
SG111171A1
(en)
*
|
2002-11-27 |
2005-05-30 |
Asml Netherlands Bv |
Lithographic projection apparatus and device manufacturing method
|
SG115590A1
(en)
*
|
2002-11-27 |
2005-10-28 |
Asml Netherlands Bv |
Lithographic projection apparatus and device manufacturing method
|
DE60323927D1
(de)
*
|
2002-12-13 |
2008-11-20 |
Asml Netherlands Bv |
Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
|
DE60322331D1
(de)
*
|
2002-12-19 |
2008-09-04 |
Asml Netherlands Bv |
Verfahren zur Herstellung eines Artikels unter Verwendung einer lithographischen Projektionsmaske
|
TWI230847B
(en)
*
|
2002-12-23 |
2005-04-11 |
Asml Netherlands Bv |
Contamination barrier with expandable lamellas
|
EP1434092A1
(en)
*
|
2002-12-23 |
2004-06-30 |
ASML Netherlands B.V. |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
JP3910180B2
(ja)
*
|
2003-01-14 |
2007-04-25 |
エーエスエムエル ネザーランズ ビー.ブイ. |
リソグラフィ装置のレベルセンサ
|
TWI304158B
(en)
*
|
2003-01-15 |
2008-12-11 |
Asml Netherlands Bv |
Detection assembly and lithographic projection apparatus provided with such a detection assembly
|
US6943941B2
(en)
*
|
2003-02-27 |
2005-09-13 |
Asml Netherlands B.V. |
Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems
|
US7206059B2
(en)
*
|
2003-02-27 |
2007-04-17 |
Asml Netherlands B.V. |
Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems
|
SG115641A1
(en)
*
|
2003-03-06 |
2005-10-28 |
Asml Netherlands Bv |
Device and method for manipulation and routing of a metrology beam
|
TWI264620B
(en)
*
|
2003-03-07 |
2006-10-21 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
SG115630A1
(en)
*
|
2003-03-11 |
2005-10-28 |
Asml Netherlands Bv |
Temperature conditioned load lock, lithographic apparatus comprising such a load lock and method of manufacturing a substrate with such a load lock
|
TWI234692B
(en)
*
|
2003-03-11 |
2005-06-21 |
Asml Netherlands Bv |
Lithographic projection assembly, handling apparatus for handling substrates and method of handling a substrate
|
SG125108A1
(en)
*
|
2003-03-11 |
2006-09-29 |
Asml Netherlands Bv |
Assembly comprising a sensor for determining at least one of tilt and height of a substrate, a method therefor and a lithographic projection apparatus
|
EP1457827A1
(en)
*
|
2003-03-11 |
2004-09-15 |
ASML Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby
|
EP1457833B1
(en)
|
2003-03-11 |
2012-05-30 |
ASML Netherlands B.V. |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
SG115631A1
(en)
*
|
2003-03-11 |
2005-10-28 |
Asml Netherlands Bv |
Lithographic projection assembly, load lock and method for transferring objects
|
SG115629A1
(en)
*
|
2003-03-11 |
2005-10-28 |
Asml Netherlands Bv |
Method and apparatus for maintaining a machine part
|
EP1457826A1
(en)
*
|
2003-03-11 |
2004-09-15 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
EP1457825A1
(en)
*
|
2003-03-11 |
2004-09-15 |
ASML Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby
|
US6775037B1
(en)
|
2003-03-20 |
2004-08-10 |
K Laser Technology, Inc. |
Grating matrix recording system
|
SG125948A1
(en)
*
|
2003-03-31 |
2006-10-30 |
Asml Netherlands Bv |
Supporting structure for use in a lithographic apparatus
|
US7397539B2
(en)
*
|
2003-03-31 |
2008-07-08 |
Asml Netherlands, B.V. |
Transfer apparatus for transferring an object, lithographic apparatus employing such a transfer apparatus, and method of use thereof
|
US7126671B2
(en)
*
|
2003-04-04 |
2006-10-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
JP4394500B2
(ja)
*
|
2003-04-09 |
2010-01-06 |
エーエスエムエル ネザーランズ ビー.ブイ. |
リソグラフィ装置、デバイス製造方法、及びコンピュータ・プログラム
|
SG115678A1
(en)
|
2003-04-22 |
2005-10-28 |
Asml Netherlands Bv |
Substrate carrier and method for making a substrate carrier
|
SG118242A1
(en)
*
|
2003-04-30 |
2006-01-27 |
Asml Netherlands Bv |
Lithographic apparatus device manufacturing methods mask and method of characterising a mask and/or pellicle
|
EP1475666A1
(en)
|
2003-05-06 |
2004-11-10 |
ASML Netherlands B.V. |
Substrate holder for lithographic apparatus
|
EP1475667A1
(en)
*
|
2003-05-09 |
2004-11-10 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US20040263816A1
(en)
*
|
2003-05-12 |
2004-12-30 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
EP1477861A1
(en)
*
|
2003-05-16 |
2004-11-17 |
ASML Netherlands B.V. |
A method of calibrating a lithographic apparatus, an alignment method, a computer program, a lithographic apparatus and a device manufacturing method
|
US7063920B2
(en)
*
|
2003-05-16 |
2006-06-20 |
Asml Holding, N.V. |
Method for the generation of variable pitch nested lines and/or contact holes using fixed size pixels for direct-write lithographic systems
|
SG141228A1
(en)
*
|
2003-05-19 |
2008-04-28 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
US7057779B2
(en)
|
2003-05-21 |
2006-06-06 |
K Laser Technology, Inc. |
Holographic stereogram device
|
TWI304522B
(en)
*
|
2003-05-28 |
2008-12-21 |
Asml Netherlands Bv |
Lithographic apparatus, method of calibrating and device manufacturing method
|
US7061591B2
(en)
*
|
2003-05-30 |
2006-06-13 |
Asml Holding N.V. |
Maskless lithography systems and methods utilizing spatial light modulator arrays
|
US6989920B2
(en)
*
|
2003-05-29 |
2006-01-24 |
Asml Holding N.V. |
System and method for dose control in a lithographic system
|
EP1482373A1
(en)
*
|
2003-05-30 |
2004-12-01 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
TWI442694B
(zh)
*
|
2003-05-30 |
2014-06-21 |
Asml Netherlands Bv |
微影裝置及元件製造方法
|
EP1486828B1
(en)
|
2003-06-09 |
2013-10-09 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7213963B2
(en)
|
2003-06-09 |
2007-05-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
EP1486824A1
(en)
*
|
2003-06-11 |
2004-12-15 |
ASML Netherlands B.V. |
A movable stage system for in a lithographic projection apparatus, lithographic projection apparatus and device manufacturing method
|
EP2261741A3
(en)
|
2003-06-11 |
2011-05-25 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7317504B2
(en)
*
|
2004-04-08 |
2008-01-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
SG118283A1
(en)
*
|
2003-06-20 |
2006-01-27 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
EP1489449A1
(en)
*
|
2003-06-20 |
2004-12-22 |
ASML Netherlands B.V. |
Spatial light modulator
|
US7110082B2
(en)
*
|
2003-06-24 |
2006-09-19 |
Asml Holding N.V. |
Optical system for maskless lithography
|
SG119224A1
(en)
*
|
2003-06-26 |
2006-02-28 |
Asml Netherlands Bv |
Calibration method for a lithographic apparatus and device manufacturing method
|
EP1491966A1
(en)
*
|
2003-06-26 |
2004-12-29 |
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|
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(en)
*
|
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2006-03-11 |
Asml Netherlands Bv |
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|
EP1491967A1
(en)
*
|
2003-06-27 |
2004-12-29 |
ASML Netherlands B.V. |
Method and apparatus for positioning a substrate on a substrate table
|
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(en)
|
2003-06-30 |
2008-06-25 |
ASML Netherlands B.V. |
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|
US7154587B2
(en)
*
|
2003-06-30 |
2006-12-26 |
Asml Netherlands B.V |
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|
US7355673B2
(en)
*
|
2003-06-30 |
2008-04-08 |
Asml Masktools B.V. |
Method, program product and apparatus of simultaneous optimization for NA-Sigma exposure settings and scattering bars OPC using a device layout
|
US7158215B2
(en)
*
|
2003-06-30 |
2007-01-02 |
Asml Holding N.V. |
Large field of view protection optical system with aberration correctability for flat panel displays
|
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(en)
*
|
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2007-07-21 |
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|
US7248339B2
(en)
*
|
2003-07-04 |
2007-07-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
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(en)
*
|
2003-07-11 |
2005-01-12 |
ASML Netherlands B.V. |
Method and system for feedforward overlay correction of pattern induced distortion and displacement, and lithographic projection apparatus using such a method and system
|
US7384149B2
(en)
|
2003-07-21 |
2008-06-10 |
Asml Netherlands B.V. |
Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system
|
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(en)
*
|
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2005-01-26 |
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|
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(en)
*
|
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|
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(en)
*
|
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|
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(en)
|
2003-07-22 |
2005-12-11 |
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|
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(en)
*
|
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2006-09-19 |
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Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
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(en)
|
2003-07-30 |
2007-05-29 |
Asml Holding N. V. |
Deformable mirror using piezoelectric actuators formed as an integrated circuit and method of use
|
US6831768B1
(en)
*
|
2003-07-31 |
2004-12-14 |
Asml Holding N.V. |
Using time and/or power modulation to achieve dose gray-scaling in optical maskless lithography
|
JP2005057294A
(ja)
*
|
2003-08-07 |
2005-03-03 |
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インタフェースユニット、該インタフェースユニットを含むリソグラフィ投影装置、及びデバイス製造方法
|
JP4146825B2
(ja)
*
|
2003-08-27 |
2008-09-10 |
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リソグラフィック装置、デバイス製造方法及びスライド・アセンブリ
|
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(en)
|
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2005-12-11 |
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Lithographic apparatus and device manufacturing method
|
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(en)
|
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2005-03-29 |
Asml Netherlands B.V. |
Adaptive lithographic critical dimension enhancement
|
SG110196A1
(en)
*
|
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2005-04-28 |
Asml Netherlands Bv |
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|
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(en)
*
|
2003-09-22 |
2011-11-22 |
Asml Netherlands B.V. |
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|
US7414701B2
(en)
*
|
2003-10-03 |
2008-08-19 |
Asml Holding N.V. |
Method and systems for total focus deviation adjustments on maskless lithography systems
|
JP4387359B2
(ja)
*
|
2003-09-26 |
2009-12-16 |
カール・ツァイス・エスエムティー・アーゲー |
光学特性の測定方法、及び波面検出系を備えた投影露光システム
|
US6876440B1
(en)
*
|
2003-09-30 |
2005-04-05 |
Asml Holding N.V. |
Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap of exposure zones with attenuation of the aerial image in the overlap region
|
US7410736B2
(en)
*
|
2003-09-30 |
2008-08-12 |
Asml Holding N.V. |
Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system not utilizing overlap of the exposure zones
|
US7023526B2
(en)
*
|
2003-09-30 |
2006-04-04 |
Asml Holding N.V. |
Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap without an explicit attenuation
|
US7109498B2
(en)
*
|
2003-10-09 |
2006-09-19 |
Asml Netherlands B.V. |
Radiation source, lithographic apparatus, and device manufacturing method
|
US7116398B2
(en)
*
|
2003-11-07 |
2006-10-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7196772B2
(en)
*
|
2003-11-07 |
2007-03-27 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7253077B2
(en)
*
|
2003-12-01 |
2007-08-07 |
Asml Netherlands B.V. |
Substrate, method of preparing a substrate, method of measurement, lithographic apparatus, device manufacturing method and device manufactured thereby, and machine-readable storage medium
|
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(en)
|
2003-12-09 |
2009-07-21 |
Asml Netherlands B.V. |
Lithographic apparatus, method of determining a model parameter, device manufacturing method, and device manufactured thereby
|
US7001232B2
(en)
*
|
2003-12-11 |
2006-02-21 |
Montgomery Robert E |
Personal watercraft air intake assembly
|
US20050134865A1
(en)
*
|
2003-12-17 |
2005-06-23 |
Asml Netherlands B.V. |
Method for determining a map, device manufacturing method, and lithographic apparatus
|
US7288779B2
(en)
*
|
2003-12-17 |
2007-10-30 |
Asml Netherlands B.V. |
Method for position determination, method for overlay optimization, and lithographic projection apparatus
|
US6992753B2
(en)
*
|
2003-12-24 |
2006-01-31 |
Carl Zeiss Smt Ag |
Projection optical system
|
US6955074B2
(en)
*
|
2003-12-29 |
2005-10-18 |
Asml Netherlands, B.V. |
Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby
|
US7349101B2
(en)
*
|
2003-12-30 |
2008-03-25 |
Asml Netherlands B.V. |
Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby
|
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(en)
*
|
2003-12-31 |
2006-12-05 |
Asml Netherlands, B.V. |
Lithographic apparatus, device manufacturing method, and device manufactured thereby
|
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(en)
*
|
2004-01-13 |
2006-03-14 |
Asml Holding N.V. |
Maskless optical writer
|
US7256873B2
(en)
*
|
2004-01-28 |
2007-08-14 |
Asml Netherlands B.V. |
Enhanced lithographic resolution through double exposure
|
JP4083751B2
(ja)
*
|
2004-01-29 |
2008-04-30 |
エーエスエムエル ホールディング エヌ.ブイ. |
空間光変調器アレイを較正するシステムおよび空間光変調器アレイを較正する方法
|
US6847461B1
(en)
*
|
2004-01-29 |
2005-01-25 |
Asml Holding N.V. |
System and method for calibrating a spatial light modulator array using shearing interferometry
|
US7580559B2
(en)
*
|
2004-01-29 |
2009-08-25 |
Asml Holding N.V. |
System and method for calibrating a spatial light modulator
|
US7190434B2
(en)
*
|
2004-02-18 |
2007-03-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7352472B2
(en)
*
|
2004-02-18 |
2008-04-01 |
Asml Netherlands B.V. |
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|
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(en)
*
|
2004-02-18 |
2006-11-07 |
Asml Netherlands, B.V. |
Lithographic apparatus and device manufacturing method
|
US7113256B2
(en)
*
|
2004-02-18 |
2006-09-26 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method with feed-forward focus control
|
JP2005243928A
(ja)
*
|
2004-02-26 |
2005-09-08 |
Fujitsu Ltd |
トレンチアイソレーションで分離されたトランジスタ対を有する半導体装置
|
US7081947B2
(en)
*
|
2004-02-27 |
2006-07-25 |
Asml Netherlands B.V. |
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|
US7094506B2
(en)
*
|
2004-03-09 |
2006-08-22 |
Asml Netherlands B.V |
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|
US6967711B2
(en)
*
|
2004-03-09 |
2005-11-22 |
Asml Netherlands B.V. |
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|
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(en)
|
2004-03-09 |
2012-07-17 |
Asml Netherlands B.V. |
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|
US7184123B2
(en)
*
|
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2007-02-27 |
Asml Netherlands B.V. |
Lithographic optical system
|
US7561251B2
(en)
*
|
2004-03-29 |
2009-07-14 |
Asml Netherlands B.V. |
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|
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(en)
*
|
2004-03-31 |
2006-05-30 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2006-12-26 |
Asml Holding N.V. |
System and method for verifying and controlling the performance of a maskless lithography tool
|
DE102004035595B4
(de)
*
|
2004-04-09 |
2008-02-07 |
Carl Zeiss Smt Ag |
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|
US7002666B2
(en)
*
|
2004-04-16 |
2006-02-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US6963434B1
(en)
*
|
2004-04-30 |
2005-11-08 |
Asml Holding N.V. |
System and method for calculating aerial image of a spatial light modulator
|
US20050243295A1
(en)
*
|
2004-04-30 |
2005-11-03 |
Asml Netherlands B.V. |
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|
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(en)
|
2004-05-19 |
2005-11-24 |
Asml Holding N.V. |
Shearing interferometer with dynamic pupil fill
|
US7289858B2
(en)
*
|
2004-05-25 |
2007-10-30 |
Asml Netherlands B.V. |
Lithographic motion control system and method
|
US7242456B2
(en)
*
|
2004-05-26 |
2007-07-10 |
Asml Holdings N.V. |
System and method utilizing a lithography tool having modular illumination, pattern generator, and projection optics portions
|
US7477403B2
(en)
*
|
2004-05-27 |
2009-01-13 |
Asml Netherlands B.V. |
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|
KR100643422B1
(ko)
*
|
2004-06-01 |
2006-11-10 |
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|
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(en)
*
|
2004-06-08 |
2006-10-17 |
Asml Netherlands B.V |
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|
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(en)
*
|
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2006-03-21 |
Asml Netherlands Bv |
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|
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(en)
*
|
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2006-10-03 |
Asml Netherlands B.V |
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|
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(en)
*
|
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2006-10-03 |
Asml Netherlands B.V |
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|
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(en)
*
|
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2007-01-02 |
Asml Netherlands B.V. |
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|
US20060001890A1
(en)
*
|
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2006-01-05 |
Asml Holding N.V. |
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|
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(en)
|
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2008-07-22 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2009-08-11 |
Asml Netherlands Bv |
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|
US20060012779A1
(en)
*
|
2004-07-13 |
2006-01-19 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2007-06-05 |
Asml Holding N.V. |
Lithographic apparatus having double telecentric illumination
|
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(en)
*
|
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2007-08-21 |
Asml Netherlands B.V. |
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|
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(en)
*
|
2004-07-26 |
2008-02-26 |
Asml Holding N.V. |
Method to modify the spatial response of a pattern generator
|
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(en)
*
|
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2006-11-28 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2009-03-31 |
Asml Holding N.V. |
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|
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(en)
*
|
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2007-07-31 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2009-05-26 |
Asml Netherlands B.V. |
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|
US7102733B2
(en)
*
|
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2006-09-05 |
Asml Holding N.V. |
System and method to compensate for static and dynamic misalignments and deformations in a maskless lithography tool
|
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(en)
*
|
2004-08-17 |
2009-03-03 |
Asml Netherlands B.V. |
Lithographic apparatus, method, and computer program product for generating a mask pattern and device manufacturing method using same
|
US7304718B2
(en)
*
|
2004-08-17 |
2007-12-04 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2007-11-27 |
Carl Zeiss Smt Ag |
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|
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(en)
*
|
2004-09-14 |
2006-07-18 |
Asml Netherlands B.V |
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|
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(en)
|
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2007-02-13 |
Asml Netherlands B.V. |
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|
US7388663B2
(en)
*
|
2004-10-28 |
2008-06-17 |
Asml Netherlands B.V. |
Optical position assessment apparatus and method
|
US7423732B2
(en)
*
|
2004-11-04 |
2008-09-09 |
Asml Holding N.V. |
Lithographic apparatus and device manufacturing method utilizing placement of a patterning device at a pupil plane
|
US7609362B2
(en)
*
|
2004-11-08 |
2009-10-27 |
Asml Netherlands B.V. |
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|
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(ko)
|
2004-11-10 |
2007-08-24 |
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|
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(en)
*
|
2004-11-17 |
2007-01-30 |
Asml Netherlands B.V. |
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|
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(en)
*
|
2004-11-22 |
2006-06-13 |
Asml Netherlands B.V. |
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|
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(en)
|
2004-11-22 |
2009-01-06 |
Asml Holding N.V. |
Lithographic apparatus, device manufacturing method, and a projection element for use in the lithographic apparatus
|
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(en)
*
|
2004-11-24 |
2010-01-05 |
Asml Holding N.V. |
Pattern generator using a dual phase step element and method of using same
|
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(en)
*
|
2004-11-30 |
2008-02-19 |
Asml Netherlands B.V. |
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|
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(en)
*
|
2004-11-30 |
2010-05-11 |
Asml Holding N.V. |
System and method for generating pattern data used to control a pattern generator
|
US7365848B2
(en)
*
|
2004-12-01 |
2008-04-29 |
Asml Holding N.V. |
System and method using visible and infrared light to align and measure alignment patterns on multiple layers
|
US7262831B2
(en)
*
|
2004-12-01 |
2007-08-28 |
Asml Netherlands B.V. |
Lithographic projection apparatus and device manufacturing method using such lithographic projection apparatus
|
US7391499B2
(en)
*
|
2004-12-02 |
2008-06-24 |
Asml Netherlands B.V. |
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|
US20060119811A1
(en)
|
2004-12-07 |
2006-06-08 |
Asml Netherlands B.V. |
Radiation exposure apparatus comprising a gas flushing system
|
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(en)
*
|
2004-12-07 |
2008-04-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
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(en)
*
|
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2008-04-08 |
Asml Netherlands B.V. |
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|
KR101143005B1
(ko)
*
|
2004-12-14 |
2012-05-08 |
삼성전자주식회사 |
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|
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(en)
*
|
2004-12-17 |
2007-02-20 |
Asml Netherlands B.V. |
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|
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(en)
|
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2008-03-25 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2008-05-20 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2008-06-24 |
Asml Netherlands B.V. |
Ultrasonic distance sensors
|
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(en)
*
|
2004-12-22 |
2007-04-10 |
Asml Netherlands B.V. |
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|
US7274502B2
(en)
*
|
2004-12-22 |
2007-09-25 |
Asml Holding N.V. |
System, apparatus and method for maskless lithography that emulates binary, attenuating phase-shift and alternating phase-shift masks
|
US7256867B2
(en)
*
|
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2007-08-14 |
Asml Netherlands B.V. |
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|
US7230677B2
(en)
*
|
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2007-06-12 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2010-02-02 |
Asml Netherlands B.V. |
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|
US7242458B2
(en)
*
|
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2007-07-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a multiple substrate carrier for flat panel display substrates
|
US7426076B2
(en)
*
|
2004-12-23 |
2008-09-16 |
Asml Holding N.V. |
Projection system for a lithographic apparatus
|
US7538857B2
(en)
*
|
2004-12-23 |
2009-05-26 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a substrate handler
|
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(en)
*
|
2004-12-27 |
2008-12-02 |
Asml Netherlands B.V. |
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|
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(en)
*
|
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2006-10-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
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(en)
*
|
2004-12-27 |
2008-01-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7279110B2
(en)
*
|
2004-12-27 |
2007-10-09 |
Asml Holding N.V. |
Method and apparatus for creating a phase step in mirrors used in spatial light modulator arrays
|
US20060138349A1
(en)
*
|
2004-12-27 |
2006-06-29 |
Asml Netherlands B.V. |
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|
US7274029B2
(en)
*
|
2004-12-28 |
2007-09-25 |
Asml Netherlands B.V. |
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|
US7145636B2
(en)
*
|
2004-12-28 |
2006-12-05 |
Asml Netherlands Bv |
System and method for determining maximum operational parameters used in maskless applications
|
US7403865B2
(en)
*
|
2004-12-28 |
2008-07-22 |
Asml Netherlands B.V. |
System and method for fault indication on a substrate in maskless applications
|
US7756660B2
(en)
*
|
2004-12-28 |
2010-07-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7342644B2
(en)
*
|
2004-12-29 |
2008-03-11 |
Asml Netherlands B.V. |
Methods and systems for lithographic beam generation
|
US7253881B2
(en)
*
|
2004-12-29 |
2007-08-07 |
Asml Netherlands Bv |
Methods and systems for lithographic gray scaling
|
JP2008527403A
(ja)
*
|
2004-12-30 |
2008-07-24 |
カール・ツァイス・エスエムティー・アーゲー |
投影光学系
|
US7567368B2
(en)
*
|
2005-01-06 |
2009-07-28 |
Asml Holding N.V. |
Systems and methods for minimizing scattered light in multi-SLM maskless lithography
|
US7542013B2
(en)
*
|
2005-01-31 |
2009-06-02 |
Asml Holding N.V. |
System and method for imaging enhancement via calculation of a customized optimal pupil field and illumination mode
|
US7460208B2
(en)
*
|
2005-02-18 |
2008-12-02 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7286137B2
(en)
*
|
2005-02-28 |
2007-10-23 |
Asml Holding N.V. |
Method and system for constrained pixel graytones interpolation for pattern rasterization
|
US7499146B2
(en)
*
|
2005-03-14 |
2009-03-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method, an integrated circuit, a flat panel display, and a method of compensating for cupping
|
US7812930B2
(en)
*
|
2005-03-21 |
2010-10-12 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using repeated patterns in an LCD to reduce datapath volume
|
JP5080009B2
(ja)
*
|
2005-03-22 |
2012-11-21 |
日立ビアメカニクス株式会社 |
露光方法
|
JP4410134B2
(ja)
*
|
2005-03-24 |
2010-02-03 |
日立ビアメカニクス株式会社 |
パターン露光方法及び装置
|
US7209216B2
(en)
*
|
2005-03-25 |
2007-04-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing dynamic correction for magnification and position in maskless lithography
|
US7548302B2
(en)
*
|
2005-03-29 |
2009-06-16 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7317506B2
(en)
*
|
2005-03-29 |
2008-01-08 |
Asml Netherlands B.V. |
Variable illumination source
|
US7403265B2
(en)
*
|
2005-03-30 |
2008-07-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing data filtering
|
US7728956B2
(en)
*
|
2005-04-05 |
2010-06-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing multiple die designs on a substrate using a data buffer that stores pattern variation data
|
US7456935B2
(en)
*
|
2005-04-05 |
2008-11-25 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a positioning device for positioning an object table
|
US7330239B2
(en)
*
|
2005-04-08 |
2008-02-12 |
Asml Netherlands B.V. |
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|
US7209217B2
(en)
|
2005-04-08 |
2007-04-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing plural patterning devices
|
US7221514B2
(en)
|
2005-04-15 |
2007-05-22 |
Asml Netherlands B.V. |
Variable lens and exposure system
|
US20060244805A1
(en)
*
|
2005-04-27 |
2006-11-02 |
Ming-Hsiang Yeh |
Multicolor pen
|
US7400382B2
(en)
*
|
2005-04-28 |
2008-07-15 |
Asml Holding N.V. |
Light patterning device using tilting mirrors in a superpixel form
|
US7738081B2
(en)
*
|
2005-05-06 |
2010-06-15 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a flat panel display handler with conveyor device and substrate handler
|
US7738075B2
(en)
*
|
2005-05-23 |
2010-06-15 |
Asml Netherlands B.V. |
Lithographic attribute enhancement
|
US7477772B2
(en)
*
|
2005-05-31 |
2009-01-13 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing 2D run length encoding for image data compression
|
US7197828B2
(en)
*
|
2005-05-31 |
2007-04-03 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing FPD chuck Z position measurement
|
US7292317B2
(en)
*
|
2005-06-08 |
2007-11-06 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing substrate stage compensating
|
US7742148B2
(en)
*
|
2005-06-08 |
2010-06-22 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method for writing a digital image
|
US7233384B2
(en)
*
|
2005-06-13 |
2007-06-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method, and device manufactured thereby for calibrating an imaging system with a sensor
|
US7321416B2
(en)
*
|
2005-06-15 |
2008-01-22 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method, device manufactured thereby, and controllable patterning device utilizing a spatial light modulator with distributed digital to analog conversion
|
US7408617B2
(en)
*
|
2005-06-24 |
2008-08-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a large area FPD chuck equipped with encoders an encoder scale calibration method
|
US7965373B2
(en)
*
|
2005-06-28 |
2011-06-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a datapath having a balanced calculation load
|
US7522258B2
(en)
*
|
2005-06-29 |
2009-04-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing movement of clean air to reduce contamination
|
US7307694B2
(en)
*
|
2005-06-29 |
2007-12-11 |
Asml Netherlands B.V. |
Lithographic apparatus, radiation beam inspection device, method of inspecting a beam of radiation and device manufacturing method
|
US7576835B2
(en)
*
|
2005-07-06 |
2009-08-18 |
Asml Netherlands B.V. |
Substrate handler, lithographic apparatus and device manufacturing method
|
US8139218B2
(en)
|
2005-07-06 |
2012-03-20 |
Asml Netherlands B.V. |
Substrate distortion measurement
|
US20070013889A1
(en)
*
|
2005-07-12 |
2007-01-18 |
Asml Netherlands B.V. |
Lithographic apparatus, device manufacturing method and device manufactured thereby having an increase in depth of focus
|
US7251019B2
(en)
*
|
2005-07-20 |
2007-07-31 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a continuous light beam in combination with pixel grid imaging
|
JP5069232B2
(ja)
*
|
2005-07-25 |
2012-11-07 |
カール・ツァイス・エスエムティー・ゲーエムベーハー |
マイクロリソグラフィ投影露光装置の投影対物レンズ
|
JP2007033882A
(ja)
*
|
2005-07-27 |
2007-02-08 |
Hitachi Via Mechanics Ltd |
露光装置及び露光方法並びに配線基板の製造方法
|
US8194242B2
(en)
*
|
2005-07-29 |
2012-06-05 |
Asml Netherlands B.V. |
Substrate distortion measurement
|
US7606430B2
(en)
*
|
2005-08-30 |
2009-10-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a multiple dictionary compression method for FPD
|
US20070046917A1
(en)
*
|
2005-08-31 |
2007-03-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method that compensates for reticle induced CDU
|
JP2007114750A
(ja)
*
|
2005-09-09 |
2007-05-10 |
Asml Netherlands Bv |
投影システム設計方法、リソグラフィー装置およびデバイス製造方法
|
US7830493B2
(en)
*
|
2005-10-04 |
2010-11-09 |
Asml Netherlands B.V. |
System and method for compensating for radiation induced thermal distortions in a substrate or projection system
|
US7391503B2
(en)
*
|
2005-10-04 |
2008-06-24 |
Asml Netherlands B.V. |
System and method for compensating for thermal expansion of lithography apparatus or substrate
|
US7332733B2
(en)
*
|
2005-10-05 |
2008-02-19 |
Asml Netherlands B.V. |
System and method to correct for field curvature of multi lens array
|
US20070127005A1
(en)
*
|
2005-12-02 |
2007-06-07 |
Asml Holding N.V. |
Illumination system
|
US7626181B2
(en)
*
|
2005-12-09 |
2009-12-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US20070133007A1
(en)
*
|
2005-12-14 |
2007-06-14 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using laser trimming of a multiple mirror contrast device
|
US7440078B2
(en)
*
|
2005-12-20 |
2008-10-21 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using interferometric and maskless exposure units
|
US20070153249A1
(en)
*
|
2005-12-20 |
2007-07-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using multiple exposures and multiple exposure types
|
US7466394B2
(en)
*
|
2005-12-21 |
2008-12-16 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using a compensation scheme for a patterning array
|
US7751130B2
(en)
*
|
2005-12-30 |
2010-07-06 |
Asml Holding N.V. |
Optical element damping systems
|
US7649611B2
(en)
|
2005-12-30 |
2010-01-19 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7532403B2
(en)
*
|
2006-02-06 |
2009-05-12 |
Asml Holding N.V. |
Optical system for transforming numerical aperture
|
CN102314096B
(zh)
*
|
2006-02-17 |
2014-05-21 |
卡尔蔡司Smt有限责任公司 |
制造长的微透镜阵列的方法
|
US7368744B2
(en)
*
|
2006-02-17 |
2008-05-06 |
Asml Netherlands B.V. |
Photon sieve for optical systems in micro-lithography
|
TWI456267B
(zh)
|
2006-02-17 |
2014-10-11 |
Zeiss Carl Smt Gmbh |
用於微影投射曝光設備之照明系統
|
US20070212649A1
(en)
*
|
2006-03-07 |
2007-09-13 |
Asml Netherlands B.V. |
Method and system for enhanced lithographic patterning
|
US7598024B2
(en)
|
2006-03-08 |
2009-10-06 |
Asml Netherlands B.V. |
Method and system for enhanced lithographic alignment
|
US7728955B2
(en)
*
|
2006-03-21 |
2010-06-01 |
Asml Netherlands B.V. |
Lithographic apparatus, radiation supply and device manufacturing method
|
EP2267530A1
(en)
*
|
2006-04-06 |
2010-12-29 |
ASML MaskTools B.V. |
Method and apparatus for performing dark field double dipole lithography
|
US7528933B2
(en)
*
|
2006-04-06 |
2009-05-05 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilizing a MEMS mirror with large deflection using a non-linear spring arrangement
|
US7508491B2
(en)
*
|
2006-04-12 |
2009-03-24 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method utilized to reduce quantization influence of datapath SLM interface to dose uniformity
|
US7948606B2
(en)
*
|
2006-04-13 |
2011-05-24 |
Asml Netherlands B.V. |
Moving beam with respect to diffractive optics in order to reduce interference patterns
|
US7839487B2
(en)
*
|
2006-04-13 |
2010-11-23 |
Asml Holding N.V. |
Optical system for increasing illumination efficiency of a patterning device
|
US8264667B2
(en)
*
|
2006-05-04 |
2012-09-11 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using interferometric and other exposure
|
US7583359B2
(en)
*
|
2006-05-05 |
2009-09-01 |
Asml Netherlands B.V. |
Reduction of fit error due to non-uniform sample distribution
|
GB0610606D0
(en)
|
2006-05-30 |
2006-07-05 |
Photocentric Ltd |
Process and apparatus
|
US8934084B2
(en)
*
|
2006-05-31 |
2015-01-13 |
Asml Holding N.V. |
System and method for printing interference patterns having a pitch in a lithography system
|
US7728954B2
(en)
*
|
2006-06-06 |
2010-06-01 |
Asml Netherlands B.V. |
Reflective loop system producing incoherent radiation
|
US7649676B2
(en)
*
|
2006-06-14 |
2010-01-19 |
Asml Netherlands B.V. |
System and method to form unpolarized light
|
US7936445B2
(en)
*
|
2006-06-19 |
2011-05-03 |
Asml Netherlands B.V. |
Altering pattern data based on measured optical element characteristics
|
US8896808B2
(en)
*
|
2006-06-21 |
2014-11-25 |
Asml Netherlands B.V. |
Lithographic apparatus and method
|
US7697115B2
(en)
*
|
2006-06-23 |
2010-04-13 |
Asml Holding N.V. |
Resonant scanning mirror
|
US7593094B2
(en)
*
|
2006-06-26 |
2009-09-22 |
Asml Netherlands B.V. |
Patterning device
|
US20080002174A1
(en)
*
|
2006-06-30 |
2008-01-03 |
Asml Netherlands B.V. |
Control system for pattern generator in maskless lithography
|
US7630136B2
(en)
|
2006-07-18 |
2009-12-08 |
Asml Holding N.V. |
Optical integrators for lithography systems and methods
|
US7548315B2
(en)
*
|
2006-07-27 |
2009-06-16 |
Asml Netherlands B.V. |
System and method to compensate for critical dimension non-uniformity in a lithography system
|
US7738077B2
(en)
*
|
2006-07-31 |
2010-06-15 |
Asml Netherlands B.V. |
Patterning device utilizing sets of stepped mirrors and method of using same
|
US7567338B2
(en)
*
|
2006-08-30 |
2009-07-28 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
US7626182B2
(en)
*
|
2006-09-05 |
2009-12-01 |
Asml Netherlands B.V. |
Radiation pulse energy control system, lithographic apparatus and device manufacturing method
|
US7628875B2
(en)
*
|
2006-09-12 |
2009-12-08 |
Asml Netherlands B.V. |
MEMS device and assembly method
|
US8049865B2
(en)
*
|
2006-09-18 |
2011-11-01 |
Asml Netherlands B.V. |
Lithographic system, device manufacturing method, and mask optimization method
|
US7804603B2
(en)
*
|
2006-10-03 |
2010-09-28 |
Asml Netherlands B.V. |
Measurement apparatus and method
|
KR100816494B1
(ko)
*
|
2006-10-09 |
2008-03-24 |
엘지전자 주식회사 |
마스크리스 노광기 및 이를 이용한 표시장치용 기판의 제조방법
|
US7683300B2
(en)
*
|
2006-10-17 |
2010-03-23 |
Asml Netherlands B.V. |
Using an interferometer as a high speed variable attenuator
|
US20080100816A1
(en)
*
|
2006-10-31 |
2008-05-01 |
Asml Netherlands B.V. |
Lithographic apparatus and method
|
JP4707701B2
(ja)
*
|
2006-11-08 |
2011-06-22 |
エーエスエムエル マスクツールズ ビー.ブイ. |
瞳を有する光学結像システムの結像性能をシミュレーションするモデルを生成する方法およびコンピュータプログラム
|
JP4700672B2
(ja)
|
2006-11-08 |
2011-06-15 |
エーエスエムエル マスクツールズ ビー.ブイ. |
ライン幅粗さおよびレジストパターン不良を予測する方法、プログラム、および装置、ならびにそのリソグラフィシミュレーションプロセスでの使用
|
US20080111977A1
(en)
*
|
2006-11-14 |
2008-05-15 |
Asml Holding N.V. |
Compensation techniques for fluid and magnetic bearings
|
US7738079B2
(en)
*
|
2006-11-14 |
2010-06-15 |
Asml Netherlands B.V. |
Radiation beam pulse trimming
|
US7453551B2
(en)
*
|
2006-11-14 |
2008-11-18 |
Asml Netherlands B.V. |
Increasing pulse-to-pulse radiation beam uniformity
|
US8054449B2
(en)
|
2006-11-22 |
2011-11-08 |
Asml Holding N.V. |
Enhancing the image contrast of a high resolution exposure tool
|
US8259285B2
(en)
*
|
2006-12-14 |
2012-09-04 |
Asml Holding N.V. |
Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data
|
US7965378B2
(en)
*
|
2007-02-20 |
2011-06-21 |
Asml Holding N.V |
Optical system and method for illumination of reflective spatial light modulators in maskless lithography
|
US8009269B2
(en)
|
2007-03-14 |
2011-08-30 |
Asml Holding N.V. |
Optimal rasterization for maskless lithography
|
US8009270B2
(en)
*
|
2007-03-22 |
2011-08-30 |
Asml Netherlands B.V. |
Uniform background radiation in maskless lithography
|
WO2008131928A1
(en)
*
|
2007-04-25 |
2008-11-06 |
Carl Zeiss Smt Ag |
Illumination system for illuminating a mask in a microlithographic exposure apparatus
|
US7714986B2
(en)
*
|
2007-05-24 |
2010-05-11 |
Asml Netherlands B.V. |
Laser beam conditioning system comprising multiple optical paths allowing for dose control
|
WO2008151185A1
(en)
|
2007-06-04 |
2008-12-11 |
Brion Technologies, Inc. |
Methods for performing model-based lithography guided layout design
|
US20080304034A1
(en)
*
|
2007-06-07 |
2008-12-11 |
Asml Netherlands B.V. |
Dose control for optical maskless lithography
|
US7816658B2
(en)
*
|
2007-06-07 |
2010-10-19 |
Asml Netherlands B.V. |
Extreme ultra-violet lithographic apparatus and device manufacturing method
|
US8692974B2
(en)
*
|
2007-06-14 |
2014-04-08 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method using pupil filling by telecentricity control
|
US7768627B2
(en)
*
|
2007-06-14 |
2010-08-03 |
Asml Netherlands B.V. |
Illumination of a patterning device based on interference for use in a maskless lithography system
|
US8189172B2
(en)
*
|
2007-06-14 |
2012-05-29 |
Asml Netherlands B.V. |
Lithographic apparatus and method
|
US20090025750A1
(en)
*
|
2007-07-24 |
2009-01-29 |
Asml Netherlands B.V. |
Method for removal of a deposition from an optical element, lithographic apparatus, and method for manufacturing a device
|
US7999920B2
(en)
|
2007-08-22 |
2011-08-16 |
Asml Netherlands B.V. |
Method of performing model-based scanner tuning
|
US9779186B2
(en)
|
2007-08-28 |
2017-10-03 |
Asml Netherlands B.V. |
Methods for performing model-based lithography guided layout design
|
JP2010537414A
(ja)
|
2007-08-30 |
2010-12-02 |
カール・ツァイス・エスエムティー・アーゲー |
マイクロリソグラフィ投影露光装置においてマスクを照明するための照明システム
|
US8451427B2
(en)
|
2007-09-14 |
2013-05-28 |
Nikon Corporation |
Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method
|
EP2048540A1
(en)
*
|
2007-10-09 |
2009-04-15 |
Carl Zeiss SMT AG |
Microlithographic projection exposure apparatus
|
KR101546987B1
(ko)
*
|
2007-10-16 |
2015-08-24 |
가부시키가이샤 니콘 |
조명 광학 시스템, 노광 장치 및 디바이스 제조 방법
|
US8379187B2
(en)
|
2007-10-24 |
2013-02-19 |
Nikon Corporation |
Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
|
JP5326259B2
(ja)
|
2007-11-08 |
2013-10-30 |
株式会社ニコン |
照明光学装置、露光装置、およびデバイス製造方法
|
JP5024001B2
(ja)
*
|
2007-12-03 |
2012-09-12 |
ソニー株式会社 |
光造形装置および光造形方法
|
NL1036189A1
(nl)
|
2007-12-05 |
2009-06-08 |
Brion Tech Inc |
Methods and System for Lithography Process Window Simulation.
|
TW200929333A
(en)
|
2007-12-17 |
2009-07-01 |
Nikon Corp |
Illumination optical system, exposure apparatus, and device manufacturing method
|
WO2009078223A1
(ja)
|
2007-12-17 |
2009-06-25 |
Nikon Corporation |
空間光変調ユニット、照明光学系、露光装置、およびデバイス製造方法
|
NL1036321A1
(nl)
*
|
2007-12-20 |
2009-06-29 |
Asml Netherlands Bv |
Device control method and apparatus.
|
WO2009080231A1
(en)
|
2007-12-21 |
2009-07-02 |
Carl Zeiss Smt Ag |
Illumination system for illuminating a mask in a microlithographic exposure apparatus
|
JPWO2009125511A1
(ja)
*
|
2008-04-11 |
2011-07-28 |
株式会社ニコン |
空間光変調ユニット、照明光学系、露光装置、およびデバイス製造方法
|
NL1036750A1
(nl)
*
|
2008-04-14 |
2009-10-15 |
Brion Tech Inc |
A Method Of Performing Mask-Writer Tuning and Optimization.
|
JP5360057B2
(ja)
|
2008-05-28 |
2013-12-04 |
株式会社ニコン |
空間光変調器の検査装置および検査方法、照明光学系、照明光学系の調整方法、露光装置、およびデバイス製造方法
|
US8542340B2
(en)
*
|
2008-07-07 |
2013-09-24 |
Asml Netherlands B.V. |
Illumination optimization
|
JPWO2010024106A1
(ja)
*
|
2008-08-28 |
2012-01-26 |
株式会社ニコン |
照明光学系、露光装置、およびデバイス製造方法
|
EP2161704A1
(en)
*
|
2008-09-05 |
2010-03-10 |
Dmitrijs Volohovs |
Image projection apparatus
|
NL2003364A
(en)
*
|
2008-09-26 |
2010-03-29 |
Asml Netherlands Bv |
Lithographic apparatus and method.
|
NL2003654A
(en)
*
|
2008-11-06 |
2010-05-10 |
Brion Tech Inc |
Methods and system for lithography calibration.
|
US8092122B2
(en)
|
2008-11-10 |
2012-01-10 |
Reynolds Consumer Products, Inc. |
Connection device for fastening expanded cell confinement structures and methods for doing the same
|
NL2003696A
(en)
*
|
2008-11-10 |
2010-05-11 |
Brion Tech Inc |
Scanner model representation with transmission cross coefficients.
|
NL2003718A
(en)
|
2008-11-10 |
2010-05-11 |
Brion Tech Inc |
Methods and system for model-based generic matching and tuning.
|
NL2003702A
(en)
|
2008-11-10 |
2010-05-11 |
Brion Tech Inc |
Pattern selection for lithographic model calibration.
|
CN102224459B
(zh)
|
2008-11-21 |
2013-06-19 |
Asml荷兰有限公司 |
用于优化光刻过程的方法及设备
|
NL2003699A
(en)
|
2008-12-18 |
2010-06-21 |
Brion Tech Inc |
Method and system for lithography process-window-maximixing optical proximity correction.
|
US20100237895A1
(en)
*
|
2009-03-19 |
2010-09-23 |
Kyo Young Chung |
System and method for characterizing solar cell conversion performance and detecting defects in a solar cell
|
NL2005523A
(en)
|
2009-10-28 |
2011-05-02 |
Asml Netherlands Bv |
Selection of optimum patterns in a design layout based on diffraction signature analysis.
|
TWI448830B
(zh)
|
2010-02-09 |
2014-08-11 |
Asml Netherlands Bv |
微影裝置及元件製造方法
|
CN102770810B
(zh)
|
2010-02-23 |
2016-01-06 |
Asml荷兰有限公司 |
光刻设备和器件制造方法
|
NL2006257A
(en)
|
2010-02-23 |
2011-08-24 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method.
|
WO2011104180A1
(en)
|
2010-02-23 |
2011-09-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
WO2011104171A1
(en)
|
2010-02-23 |
2011-09-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
KR101420197B1
(ko)
|
2010-02-23 |
2014-07-17 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치 및 디바이스 제조 방법
|
US20120320359A1
(en)
|
2010-02-23 |
2012-12-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
KR101469588B1
(ko)
*
|
2010-02-23 |
2014-12-05 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치 및 디바이스 제조 방법
|
NL2006254A
(en)
|
2010-02-23 |
2011-08-24 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method.
|
KR101496877B1
(ko)
|
2010-02-23 |
2015-03-02 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치 및 디바이스 제조 방법
|
NL2006261A
(en)
|
2010-02-25 |
2011-08-29 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method.
|
US9696633B2
(en)
|
2010-04-12 |
2017-07-04 |
Asml Netherlands B.V. |
Substrate handling apparatus and lithographic apparatus
|
KR101475305B1
(ko)
|
2010-05-18 |
2014-12-22 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치 및 디바이스 제조 방법
|
NL2007577A
(en)
|
2010-11-10 |
2012-05-14 |
Asml Netherlands Bv |
Optimization of source, mask and projection optics.
|
NL2007642A
(en)
|
2010-11-10 |
2012-05-14 |
Asml Netherlands Bv |
Optimization flows of source, mask and projection optics.
|
NL2007579A
(en)
|
2010-11-10 |
2012-05-14 |
Asml Netherlands Bv |
Pattern-dependent proximity matching/tuning including light manipulation by projection optics.
|
NL2007578A
(en)
|
2010-11-17 |
2012-05-22 |
Asml Netherlands Bv |
Pattern-independent and hybrid matching/tuning including light manipulation by projection optics.
|
CN103238113B
(zh)
|
2010-12-08 |
2015-09-09 |
Asml荷兰有限公司 |
光刻设备和器件制造方法
|
JP5793236B2
(ja)
|
2011-03-29 |
2015-10-14 |
エーエスエムエル ネザーランズ ビー.ブイ. |
リソグラフィにおける放射ビームスポットの位置の測定
|
DE102011001785B4
(de)
*
|
2011-04-04 |
2015-03-05 |
Jenoptik Optical Systems Gmbh |
Belichtungseinrichtung zur strukturierten Belichtung einer Fläche
|
NL2008426A
(en)
|
2011-04-08 |
2012-10-09 |
Asml Netherlands Bv |
Lithographic apparatus, programmable patterning device and lithographic method.
|
KR101579916B1
(ko)
|
2011-04-21 |
2015-12-23 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치, 리소그래피 장치를 유지하는 방법, 및 디바이스 제조 방법
|
KR101616761B1
(ko)
|
2011-08-16 |
2016-04-29 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치, 프로그램가능한 패터닝 디바이스 및 리소그래피 방법
|
US9690210B2
(en)
|
2011-08-18 |
2017-06-27 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
CN103048885B
(zh)
*
|
2011-10-11 |
2015-02-25 |
中山新诺科技股份有限公司 |
无掩膜曝光系统及方法
|
NL2009342A
(en)
|
2011-10-31 |
2013-05-07 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method.
|
KR101616764B1
(ko)
|
2011-11-29 |
2016-04-29 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치, 디바이스 제조 방법, 및 컴퓨터 프로그램
|
US10346729B2
(en)
|
2011-11-29 |
2019-07-09 |
Asml Netherlands B.V. |
Apparatus and method for converting a vector-based representation of a desired device pattern for a lithography apparatus, apparatus and method for providing data to a programmable patterning device, a lithography apparatus and a device manufacturing method
|
NL2009806A
(en)
|
2011-12-05 |
2013-06-10 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method.
|
WO2013083383A1
(en)
|
2011-12-06 |
2013-06-13 |
Asml Netherlands B.V. |
A lithography apparatus, an apparatus for providing setpoint data, a device manufacturing method, a method of calculating setpoint data and a computer program
|
NL2009902A
(en)
|
2011-12-27 |
2013-07-01 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method.
|
NL2009982A
(en)
|
2012-01-10 |
2013-07-15 |
Asml Netherlands Bv |
Source mask optimization to reduce stochastic effects.
|
KR101633759B1
(ko)
|
2012-01-12 |
2016-06-27 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 장치, 세트포인트 데이터를 제공하는 장치, 디바이스 제조 방법, 세트포인트 데이터를 제공하는 방법, 및 컴퓨터 프로그램
|
CN104054024B
(zh)
|
2012-01-17 |
2017-06-13 |
Asml荷兰有限公司 |
光刻设备和装置制造方法
|
NL2010196A
(en)
|
2012-02-09 |
2013-08-13 |
Asml Netherlands Bv |
Lens heating aware source mask optimization for advanced lithography.
|
US9715183B2
(en)
|
2012-02-23 |
2017-07-25 |
Asml Netherlands B.V. |
Device, lithographic apparatus, method for guiding radiation and device manufacturing method
|
WO2013178459A1
(en)
|
2012-05-31 |
2013-12-05 |
Asml Netherlands B.V. |
Gradient-based pattern and evaluation point selection
|
NL2011592A
(en)
|
2012-10-31 |
2014-05-06 |
Asml Netherlands Bv |
Compensation for patterning device deformation.
|
NL2012052A
(en)
|
2013-01-29 |
2014-08-04 |
Asml Netherlands Bv |
A radiation modulator for a lithography apparatus, a lithography apparatus, a method of modulating radiation for use in lithography, and a device manufacturing method.
|
KR101757777B1
(ko)
|
2013-02-22 |
2017-07-14 |
에이에스엠엘 네델란즈 비.브이. |
3차원 패터닝 디바이스에 대한 리소그래피 모델
|
CN105008997B
(zh)
|
2013-02-25 |
2017-03-08 |
Asml荷兰有限公司 |
离散源掩模优化
|
US11054750B2
(en)
|
2013-10-01 |
2021-07-06 |
Asml Netherlands B.V. |
Profile aware source-mask optimization
|
WO2015090774A1
(en)
|
2013-12-17 |
2015-06-25 |
Asml Netherlands B.V. |
Yield estimation and control
|
SG11201606179QA
(en)
|
2014-02-11 |
2016-08-30 |
Asml Netherlands Bv |
Model for calculating a stochastic variation in an arbitrary pattern
|
KR20160131110A
(ko)
|
2014-03-18 |
2016-11-15 |
에이에스엠엘 네델란즈 비.브이. |
패턴 배치 에러 인식의 최적화
|
WO2015158444A1
(en)
|
2014-04-14 |
2015-10-22 |
Asml Netherlands B.V. |
Flows of optimization for lithographic processes
|
CN106462086B
(zh)
|
2014-06-25 |
2019-10-15 |
Asml荷兰有限公司 |
蚀刻变化容差优化
|
US10310386B2
(en)
|
2014-07-14 |
2019-06-04 |
Asml Netherlands B.V. |
Optimization of assist features and source
|
NL2015160A
(en)
|
2014-07-28 |
2016-07-07 |
Asml Netherlands Bv |
Illumination system, inspection apparatus including such an illumination system, inspection method and manufacturing method.
|
WO2016050584A1
(en)
|
2014-10-02 |
2016-04-07 |
Asml Netherlands B.V. |
Rule-based deployment of assist features
|
WO2016096309A1
(en)
|
2014-12-15 |
2016-06-23 |
Asml Netherlands B.V. |
Optimization based on machine learning
|
US10372043B2
(en)
|
2014-12-17 |
2019-08-06 |
Asml Netherlands B.V. |
Hotspot aware dose correction
|
US10685158B2
(en)
|
2014-12-18 |
2020-06-16 |
Asml Netherlands B.V. |
Lithography model for 3D features
|
TWI620980B
(zh)
|
2015-02-13 |
2018-04-11 |
Asml荷蘭公司 |
影像對數斜率(ils)最佳化
|
WO2016128189A1
(en)
|
2015-02-13 |
2016-08-18 |
Asml Netherlands B.V. |
Process variability aware adaptive inspection and metrology
|
US10459345B2
(en)
|
2015-03-06 |
2019-10-29 |
Asml Netherlands B.V. |
Focus-dose co-optimization based on overlapping process window
|
KR102182005B1
(ko)
|
2015-03-16 |
2020-11-24 |
에이에스엠엘 네델란즈 비.브이. |
레지스트 변형을 결정하는 방법들
|
WO2016184664A1
(en)
|
2015-05-20 |
2016-11-24 |
Asml Netherlands B.V. |
Coloring aware optimization
|
KR102063229B1
(ko)
|
2015-05-29 |
2020-01-07 |
에이에스엠엘 네델란즈 비.브이. |
소스 방사선의 각도 분포의 다중-샘플링을 사용하는 리소그래피의 시뮬레이션
|
CN107924137B
(zh)
|
2015-06-17 |
2021-03-05 |
Asml荷兰有限公司 |
基于配置方案间的一致性的配置方案选择
|
KR102047429B1
(ko)
|
2015-12-07 |
2019-11-21 |
에이에스엠엘 홀딩 엔.브이. |
대물렌즈 시스템
|
DE102015224522B4
(de)
*
|
2015-12-08 |
2018-06-21 |
Carl Zeiss Smt Gmbh |
Beleuchtungssystem einer mikrolithographischen Projektionsanlage und Verfahren zum Betreiben eines solchen Systems
|
US10416566B2
(en)
|
2015-12-14 |
2019-09-17 |
Asml Netherlands B.V. |
Optimization of source and bandwidth for new and existing patterning devices
|
WO2017102264A1
(en)
|
2015-12-17 |
2017-06-22 |
Asml Netherlands B.V. |
Source separation from metrology data
|
IL259633B
(en)
|
2015-12-22 |
2022-07-01 |
Asml Netherlands Bv |
A device and method for characterizing a window process
|
WO2017114653A1
(en)
|
2015-12-30 |
2017-07-06 |
Asml Netherlands B.V. |
Method and apparatus for direct write maskless lithography
|
US10712669B2
(en)
|
2015-12-30 |
2020-07-14 |
Asml Netherlands B.V. |
Method and apparatus for direct write maskless lithography
|
WO2017114659A1
(en)
|
2015-12-30 |
2017-07-06 |
Asml Netherlands B.V. |
Method and apparatus for direct write maskless lithography
|
US10437158B2
(en)
|
2015-12-31 |
2019-10-08 |
Asml Netherlands B.V. |
Metrology by reconstruction
|
KR102148875B1
(ko)
|
2015-12-31 |
2020-08-28 |
에이에스엠엘 네델란즈 비.브이. |
에칭-어시스트 피처
|
WO2017114662A1
(en)
|
2015-12-31 |
2017-07-06 |
Asml Netherlands B.V. |
Selection of measurement locations for patterning processes
|
WO2017162471A1
(en)
|
2016-03-24 |
2017-09-28 |
Asml Netherlands B.V. |
Optimization of a lithographic projection apparatus accounting for an interlayer characteristic
|
WO2017178276A1
(en)
|
2016-04-14 |
2017-10-19 |
Asml Netherlands B.V. |
Mapping of patterns between design layout and patterning device
|
WO2017202602A1
(en)
|
2016-05-23 |
2017-11-30 |
Asml Netherlands B.V. |
Selection of substrate measurement recipes
|
WO2018010940A1
(en)
|
2016-07-12 |
2018-01-18 |
Asml Netherlands B.V. |
Visualizing performance metrics of computational analyses of design layouts
|
KR20190032444A
(ko)
|
2016-07-19 |
2019-03-27 |
에이에스엠엘 네델란즈 비.브이. |
리소그래피 단계에서 기판에 적용될 패턴의 조합의 결정
|
CN109478024B
(zh)
|
2016-07-19 |
2021-03-26 |
Asml荷兰有限公司 |
用于直接写入无掩模光刻的设备
|
KR20190039579A
(ko)
|
2016-08-19 |
2019-04-12 |
에이에스엠엘 네델란즈 비.브이. |
노광후 공정들의 모델링
|
CN110114726B
(zh)
|
2016-12-28 |
2021-11-30 |
Asml荷兰有限公司 |
确定由图案形成装置上的有限厚度的结构引起的辐射的散射的方法
|
WO2018121988A1
(en)
|
2016-12-28 |
2018-07-05 |
Asml Netherlands B.V. |
Methods of guiding process models and inspection in a manufacturing process
|
CN110325921B
(zh)
|
2017-01-26 |
2022-02-18 |
Asml荷兰有限公司 |
微调过程模型的方法
|
CN110431485B
(zh)
|
2017-03-15 |
2021-06-15 |
Asml荷兰有限公司 |
传感器标记和制造传感器标记的方法
|
WO2018192710A1
(en)
|
2017-04-20 |
2018-10-25 |
Asml Netherlands B.V. |
Method of performance testing a fluid handling structure
|
WO2018202361A1
(en)
|
2017-05-05 |
2018-11-08 |
Asml Netherlands B.V. |
Method to predict yield of a device manufacturing process
|
WO2018233947A1
(en)
|
2017-06-20 |
2018-12-27 |
Asml Netherlands B.V. |
DETERMINATION OF EDGE ROUGHNESS PARAMETERS
|
EP3467589A1
(en)
|
2017-10-06 |
2019-04-10 |
ASML Netherlands B.V. |
Determining edge roughness parameters
|
WO2019011604A1
(en)
|
2017-07-12 |
2019-01-17 |
Asml Netherlands B.V. |
PREDICTION OF DEFECTS
|
WO2019015899A1
(en)
|
2017-07-17 |
2019-01-24 |
Asml Netherlands B.V. |
APPARATUS AND METHOD FOR DETERMINING INFORMATION
|
EP3432071A1
(en)
|
2017-07-17 |
2019-01-23 |
ASML Netherlands B.V. |
Information determining apparatus and method
|
WO2019020484A1
(en)
|
2017-07-25 |
2019-01-31 |
Asml Netherlands B.V. |
METHOD FOR DETERMINING PARAMETERS AND ASSOCIATED APPARATUS
|
EP3444675A1
(en)
|
2017-08-14 |
2019-02-20 |
ASML Netherlands B.V. |
Optical detector
|
CN111095112B
(zh)
|
2017-09-11 |
2022-05-13 |
Asml荷兰有限公司 |
光刻过程中的量测
|
EP3462239A1
(en)
|
2017-09-27 |
2019-04-03 |
ASML Netherlands B.V. |
Metrology in lithographic processes
|
EP3457211A1
(en)
|
2017-09-13 |
2019-03-20 |
ASML Netherlands B.V. |
A method of aligning a pair of complementary diffraction patterns and associated metrology method and apparatus
|
EP3462240A1
(en)
|
2017-09-27 |
2019-04-03 |
ASML Netherlands B.V. |
Method of determining control parameters of a device manufacturing process
|
CN111149063B
(zh)
|
2017-09-27 |
2022-04-22 |
Asml荷兰有限公司 |
确定器件制造工艺的控制参数的方法
|
EP3467588A1
(en)
|
2017-10-03 |
2019-04-10 |
ASML Netherlands B.V. |
Method and apparatus for determining alignment properties of a beam of radiation
|
EP3480659A1
(en)
|
2017-11-01 |
2019-05-08 |
ASML Netherlands B.V. |
Estimation of data in metrology
|
CN111727406B
(zh)
|
2018-02-18 |
2023-09-08 |
Asml荷兰有限公司 |
二元化方法和自由形式的掩模优化流程
|
WO2019162346A1
(en)
|
2018-02-23 |
2019-08-29 |
Asml Netherlands B.V. |
Methods for training machine learning model for computation lithography
|
KR102481727B1
(ko)
|
2018-03-19 |
2022-12-29 |
에이에스엠엘 네델란즈 비.브이. |
패터닝 디바이스에 대한 곡선적 패턴들을 결정하는 방법
|
CN116841129A
(zh)
|
2018-05-07 |
2023-10-03 |
Asml荷兰有限公司 |
用于确定与计算光刻掩模模型相关联的电磁场的方法
|
WO2019233711A1
(en)
|
2018-06-04 |
2019-12-12 |
Asml Netherlands B.V. |
Method for improving a process model for a patterning process
|
KR20210010897A
(ko)
|
2018-06-15 |
2021-01-28 |
에이에스엠엘 네델란즈 비.브이. |
기계 학습 기반 역 광 근접 보정 및 공정 모델 캘리브레이션
|
EP3594750A1
(en)
|
2018-07-10 |
2020-01-15 |
ASML Netherlands B.V. |
Hidden defect detection and epe estimation based on the extracted 3d information from e-beam images
|
US11422473B2
(en)
|
2018-07-12 |
2022-08-23 |
Asml Netherlands B.V. |
Utilize pattern recognition to improve SEM contour measurement accuracy and stability automatically
|
WO2020035285A1
(en)
|
2018-08-15 |
2020-02-20 |
Asml Netherlands B.V. |
Utilize machine learning in selecting high quality averaged sem images from raw images automatically
|
TWI794544B
(zh)
|
2018-10-09 |
2023-03-01 |
荷蘭商Asml荷蘭公司 |
用於高數值孔徑穿縫源光罩最佳化之方法
|
WO2020078762A1
(en)
|
2018-10-17 |
2020-04-23 |
Asml Netherlands B.V. |
Methods for generating characteristic pattern and training machine learning model
|
KR102655261B1
(ko)
|
2018-10-19 |
2024-04-08 |
에이에스엠엘 네델란즈 비.브이. |
소스 및 마스크 최적화로 이상적인 소스 스펙트럼들을 생성하는 방법
|
WO2020094387A1
(en)
|
2018-11-05 |
2020-05-14 |
Asml Holding N.V. |
A method to manufacture nano ridges in hard ceramic coatings
|
US11354484B2
(en)
|
2018-11-08 |
2022-06-07 |
Asml Netherlands B.V. |
Failure model for predicting failure due to resist layer
|
EP3650940A1
(en)
|
2018-11-09 |
2020-05-13 |
ASML Netherlands B.V. |
A method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method
|
US11796978B2
(en)
|
2018-11-26 |
2023-10-24 |
Asml Netherlands B.V. |
Method for determining root causes of events of a semiconductor manufacturing process and for monitoring a semiconductor manufacturing process
|
EP3705959A1
(en)
|
2019-03-04 |
2020-09-09 |
ASML Netherlands B.V. |
Method for determining root causes of events of a semiconductor manufacturing process and for monitoring a semiconductor manufacturing process
|
JP7209835B2
(ja)
|
2018-11-30 |
2023-01-20 |
エーエスエムエル ネザーランズ ビー.ブイ. |
機械学習モデル予測における不確実性を減少させる方法
|
EP3660744A1
(en)
|
2018-11-30 |
2020-06-03 |
ASML Netherlands B.V. |
Method for decreasing uncertainty in machine learning model predictions
|
KR102610060B1
(ko)
|
2018-11-30 |
2023-12-06 |
에이에스엠엘 네델란즈 비.브이. |
제조성에 기초한 패터닝 디바이스 패턴을 결정하기 위한 방법
|
CN113168111B
(zh)
|
2018-12-03 |
2024-05-03 |
Asml荷兰有限公司 |
用于预测半导体制造过程的产率的方法
|
EP3663855A1
(en)
|
2018-12-04 |
2020-06-10 |
ASML Netherlands B.V. |
Sem fov fingerprint in stochastic epe and placement measurements in large fov sem devices
|
WO2020114692A1
(en)
|
2018-12-07 |
2020-06-11 |
Asml Netherlands B.V. |
Method for determining root cause affecting yield in a semiconductor manufacturing process
|
KR20240052072A
(ko)
|
2018-12-28 |
2024-04-22 |
에이에스엠엘 네델란즈 비.브이. |
패치 경계에서 패터닝 디바이스 패턴을 생성하는 방법
|
TWI738169B
(zh)
|
2019-01-29 |
2021-09-01 |
荷蘭商Asml荷蘭公司 |
用於為佈局圖案化程序判定訓練圖案之方法及相關的電腦程式產品
|
CN113366390B
(zh)
|
2019-01-29 |
2024-02-20 |
Asml荷兰有限公司 |
半导体制造过程中的决定方法
|
EP3693795A1
(en)
|
2019-02-06 |
2020-08-12 |
ASML Netherlands B.V. |
Method for decision making in a semiconductor manufacturing process
|
US11086230B2
(en)
|
2019-02-01 |
2021-08-10 |
Asml Netherlands B.V. |
Method and apparatus for source mask optimization configured to increase scanner throughput for a patterning process
|
US20220134480A1
(en)
|
2019-02-19 |
2022-05-05 |
Asml Holding N.V. |
Laser roughening: engineering the roughness of the burl top
|
KR102641682B1
(ko)
|
2019-02-20 |
2024-02-27 |
에이에스엠엘 네델란즈 비.브이. |
반도체 디바이스의 제조 프로세스를 특성화하기 위한 방법
|
KR20210116613A
(ko)
|
2019-02-21 |
2021-09-27 |
에이에스엠엘 네델란즈 비.브이. |
마스크에 대한 광학 근접 보정을 결정하기 위한 머신 러닝 모델의 트레이닝 방법
|
US11567413B2
(en)
|
2019-02-25 |
2023-01-31 |
Asml Netherlands B.V. |
Method for determining stochastic variation of printed patterns
|
US20220113632A1
(en)
|
2019-02-27 |
2022-04-14 |
Asml Netherlands B.V. |
Gauge selection for model calibration
|
KR102649174B1
(ko)
|
2019-03-03 |
2024-03-20 |
에이에스엠엘 네델란즈 비.브이. |
협소화 대역폭을 이용한 이미징 방법 및 장치
|
CN113544592A
(zh)
|
2019-03-08 |
2021-10-22 |
Asml荷兰有限公司 |
用于衍射图案引导的源掩模优化的方法和设备
|
US20220179321A1
(en)
|
2019-03-25 |
2022-06-09 |
Asml Netherlands B.V. |
Method for determining pattern in a patterning process
|
US20220187713A1
(en)
|
2019-04-04 |
2022-06-16 |
Asml Netherlands B.V. |
Method and apparatus for predicting substrate image
|
EP3742229A1
(en)
|
2019-05-21 |
2020-11-25 |
ASML Netherlands B.V. |
Systems and methods for adjusting prediction models between facility locations
|
WO2020207696A1
(en)
|
2019-04-09 |
2020-10-15 |
Asml Netherlands B.V. |
Systems and methods for adjusting prediction models between facility locations
|
CN113924525A
(zh)
|
2019-04-15 |
2022-01-11 |
Asml荷兰有限公司 |
用于确定对掩模的特征的校正的方法
|
KR20210141673A
(ko)
|
2019-04-25 |
2021-11-23 |
에이에스엠엘 네델란즈 비.브이. |
핫스팟 감소를 위한 결함 기반 패터닝 공정 특성 결정 방법
|
EP3734365A1
(en)
|
2019-04-30 |
2020-11-04 |
ASML Netherlands B.V. |
Method and apparatus for photolithographic imaging
|
JP7305792B2
(ja)
|
2019-04-30 |
2023-07-10 |
エーエスエムエル ネザーランズ ビー.ブイ. |
フォトリソグラフィ結像の方法及び装置
|
CN113874787B
(zh)
|
2019-05-21 |
2024-04-16 |
Asml荷兰有限公司 |
用于确定与期望图案相关联的随机变化的方法
|
US20220276563A1
(en)
|
2019-07-10 |
2022-09-01 |
Asml Netherlands B.V. |
Prediction data selection for model calibration to reduce model prediction uncertainty
|
CN114503035A
(zh)
|
2019-08-08 |
2022-05-13 |
Asml荷兰有限公司 |
用于光刻成像的方法和设备
|
CN114341739A
(zh)
|
2019-08-30 |
2022-04-12 |
Asml控股股份有限公司 |
计量系统和方法
|
CN114402262A
(zh)
|
2019-08-30 |
2022-04-26 |
Asml荷兰有限公司 |
半导体器件几何方法和系统
|
EP3789923A1
(en)
|
2019-09-06 |
2021-03-10 |
ASML Netherlands B.V. |
Method for increasing certainty in parameterized model predictions
|
US20220335290A1
(en)
|
2019-09-06 |
2022-10-20 |
Asml Netherlands B.V. |
Method for increasing certainty in parameterized model predictions
|
CN114402342A
(zh)
|
2019-09-16 |
2022-04-26 |
Asml荷兰有限公司 |
用于生成特性图案以及训练机器学习模型的方法
|
IL291367B1
(en)
|
2019-10-08 |
2024-06-01 |
Asml Netherlands Bv |
A method for determining the definition of a field of view
|
EP3822703A1
(en)
|
2019-11-18 |
2021-05-19 |
ASML Netherlands B.V. |
Method for determining a field-of-view setting
|
CN114556223A
(zh)
|
2019-10-14 |
2022-05-27 |
Asml控股股份有限公司 |
量测标记结构和确定量测标记结构的方法
|
US20240126183A1
(en)
|
2019-10-24 |
2024-04-18 |
Asml Netherlands B.V. |
Method for rule-based retargeting of target pattern
|
US20220404712A1
(en)
|
2019-11-01 |
2022-12-22 |
Asml Netherlands B.V |
Machine learning based image generation for model base alignments
|
CN114585973A
(zh)
|
2019-11-07 |
2022-06-03 |
Asml控股股份有限公司 |
在光刻设备中使用的光学部件和夹具
|
WO2021099047A1
(en)
|
2019-11-19 |
2021-05-27 |
Asml Netherlands B.V. |
A method of obtaining performance information about a lithography process
|
US20220390832A1
(en)
|
2019-11-19 |
2022-12-08 |
Asml Holding N.V. |
Optimization using a non-uniform illumination intensity profile
|
WO2021110343A1
(en)
|
2019-12-02 |
2021-06-10 |
Cymer Inc. |
Method and system for enhancing target features of a pattern imaged onto a substrate
|
WO2021140020A2
(en)
|
2020-01-07 |
2021-07-15 |
Asml Netherlands B.V. |
High brightness low energy spread pulsed electron source
|
EP3848953A1
(en)
|
2020-01-07 |
2021-07-14 |
ASML Netherlands B.V. |
High brightness electron source
|
EP3862813A1
(en)
|
2020-02-07 |
2021-08-11 |
ASML Netherlands B.V. |
Methods and systems for maskless lithography
|
WO2021160522A1
(en)
|
2020-02-12 |
2021-08-19 |
Asml Netherlands B.V. |
Method for determining a mask pattern comprising optical proximity corrections using a trained machine learning model
|
EP3872567A1
(en)
|
2020-02-25 |
2021-09-01 |
ASML Netherlands B.V. |
Systems and methods for process metric aware process control
|
WO2021175570A1
(en)
|
2020-03-03 |
2021-09-10 |
Asml Netherlands B.V. |
Machine learning based subresolution assist feature placement
|
CN115335774A
(zh)
|
2020-03-27 |
2022-11-11 |
Asml控股股份有限公司 |
光学设备和使用所述光学设备的光刻设备
|
EP3910417A1
(en)
|
2020-05-13 |
2021-11-17 |
ASML Netherlands B.V. |
Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process
|
US11740560B2
(en)
|
2020-04-02 |
2023-08-29 |
Asml Netherlands B.V. |
Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process
|
WO2021228725A1
(en)
|
2020-05-09 |
2021-11-18 |
Asml Netherlands B.V. |
Determining metrics for a portion of a pattern on a substrate
|
EP3910418A1
(en)
|
2020-05-14 |
2021-11-17 |
ASML Netherlands B.V. |
Method for direct decomposition of stochastic contributors
|
WO2021229030A1
(en)
|
2020-05-14 |
2021-11-18 |
Asml Netherlands B.V. |
Method for predicting stochastic contributors
|
US20230185187A1
(en)
|
2020-06-02 |
2023-06-15 |
Asml Netherlands B.V. |
Verifying freeform curvilinear features of a mask design
|
JP2023528208A
(ja)
|
2020-06-03 |
2023-07-04 |
エーエスエムエル ネザーランズ ビー.ブイ. |
パターニングデバイス及びそのパターンを生成するためのシステム、製品、及び方法
|
CN115698864A
(zh)
|
2020-06-08 |
2023-02-03 |
Asml荷兰有限公司 |
用于光刻设备中的衬底保持器和制造衬底保持器的方法
|
CN115715381A
(zh)
|
2020-06-10 |
2023-02-24 |
Asml荷兰有限公司 |
像差影响系统、模型和制造过程
|
WO2021259738A1
(en)
|
2020-06-24 |
2021-12-30 |
Asml Netherlands B.V. |
Systems, methods, and products for determining printing probability of assist feature and its application
|
WO2022012888A1
(en)
|
2020-07-14 |
2022-01-20 |
Asml Netherlands B.V. |
Apparatus and methods for generating denoising model
|
EP3951496A1
(en)
|
2020-08-07 |
2022-02-09 |
ASML Netherlands B.V. |
Apparatus and method for selecting informative patterns for training machine learning models
|
US20230273528A1
(en)
|
2020-08-19 |
2023-08-31 |
Asml Netherlands B.V. |
Systems, products, and methods for image-based pattern selection
|
US20230298158A1
(en)
|
2020-08-19 |
2023-09-21 |
Asml Netherlands B.V. |
Apparatus and method for selecting high quality images from raw images automatically
|
US20230333483A1
(en)
|
2020-09-25 |
2023-10-19 |
Asml Netherlands B.V. |
Optimization of scanner throughput and imaging quality for a patterning process
|
TWI834063B
(zh)
|
2020-09-30 |
2024-03-01 |
荷蘭商Asml荷蘭公司 |
減輕幫浦故障造成之損害之真空系統
|
US20240005457A1
(en)
|
2020-10-13 |
2024-01-04 |
Asml Netherlands B.V. |
Apparatus and methods to generate deblurring model and deblur image
|
KR20230107823A
(ko)
|
2020-11-24 |
2023-07-18 |
에이에스엠엘 네델란즈 비.브이. |
오버레이 핑거프린트들에 대한 마크 구조체를 결정하는 방법
|
WO2022112037A1
(en)
|
2020-11-30 |
2022-06-02 |
Asml Netherlands B.V. |
Mems array interconnection design
|
US20240004184A1
(en)
|
2020-11-30 |
2024-01-04 |
Asml Netherlands B.V. |
High accuracy temperature-compensated piezoresistive position sensing system
|
WO2022112027A1
(en)
|
2020-11-30 |
2022-06-02 |
Asml Netherlands B.V. |
High force low voltage piezoelectric micromirror actuator
|
WO2022128284A1
(en)
|
2020-12-14 |
2022-06-23 |
Asml Netherlands B.V. |
Micromirror arrays
|
US20240054669A1
(en)
|
2020-12-15 |
2024-02-15 |
Asml Netherlands B.V. |
Apparatus and method for determining three dimensional data based on an image of a patterned substrate
|
WO2022128500A1
(en)
|
2020-12-18 |
2022-06-23 |
Asml Netherlands B.V. |
Method for determining mask pattern and training machine learning model
|
US20240104284A1
(en)
|
2020-12-21 |
2024-03-28 |
Asml Netherlands B.V. |
Feature based cell extraction for pattern regions
|
US20240045341A1
(en)
|
2020-12-23 |
2024-02-08 |
Asml Netherlands B.V. |
Optimization of lithographic process based on bandwidth and speckle
|
EP4298478A1
(en)
|
2021-02-23 |
2024-01-03 |
ASML Netherlands B.V. |
A machine learning model using target pattern and reference layer pattern to determine optical proximity correction for mask
|
EP4050328A1
(en)
|
2021-02-25 |
2022-08-31 |
ASML Netherlands B.V. |
Method to predict metrology offset of a semiconductor manufacturing process
|
US20240119212A1
(en)
|
2021-03-03 |
2024-04-11 |
Asml Netherlands B.V. |
Configuration of patterning process
|
KR20230154852A
(ko)
|
2021-03-08 |
2023-11-09 |
에이에스엠엘 네델란즈 비.브이. |
반도체 제조 관련 프로세스의 패턴 선택 방법
|
WO2022248217A1
(en)
|
2021-05-25 |
2022-12-01 |
Asml Netherlands B.V. |
Determining mask rule check violations and mask design
|
WO2022258398A1
(en)
|
2021-06-07 |
2022-12-15 |
Asml Netherlands B.V. |
Determining rounded contours for lithography related patterns
|
IL309218A
(en)
|
2021-06-18 |
2024-02-01 |
Asml Netherlands Bv |
Test data filtering systems and methods
|
WO2022268434A1
(en)
|
2021-06-23 |
2022-12-29 |
Asml Netherlands B.V. |
Etch simulation model including a correlation between etch biases and curvatures of contours
|
WO2023280511A1
(en)
|
2021-07-06 |
2023-01-12 |
Asml Netherlands B.V. |
Determining localized image prediction errors to improve a machine learning model in predicting an image
|
EP4120019A1
(en)
|
2021-07-12 |
2023-01-18 |
ASML Netherlands B.V. |
Method of determining a correction for at least one control parameter in a semiconductor manufacturing process
|
WO2023285071A1
(en)
|
2021-07-13 |
2023-01-19 |
Asml Netherlands B.V. |
Pattern selection for source mask optimization and target optimization
|
CN117651914A
(zh)
|
2021-07-21 |
2024-03-05 |
Asml荷兰有限公司 |
用于光学器件列的热稳定安装的系统和方法
|
CN117616319A
(zh)
|
2021-08-02 |
2024-02-27 |
Asml荷兰有限公司 |
用于在量测系统中使用的光学元件
|
WO2023016752A1
(en)
|
2021-08-10 |
2023-02-16 |
Asml Netherlands B.V. |
Match the aberration sensitivity of the metrology mark and the device pattern
|
WO2023030807A1
(en)
|
2021-09-02 |
2023-03-09 |
Asml Netherlands B.V. |
Method of evaluating selected set of patterns
|
WO2023036539A1
(en)
|
2021-09-08 |
2023-03-16 |
Asml Netherlands B.V. |
Patterning parameter determination using a charged particle inspection system
|
KR20240063929A
(ko)
|
2021-09-09 |
2024-05-10 |
에이에스엠엘 네델란즈 비.브이. |
계측 데이터 변환 방법
|
EP4148499A1
(en)
|
2021-09-09 |
2023-03-15 |
ASML Netherlands B.V. |
Patterning device defect detection systems and methods
|
WO2023041488A1
(en)
|
2021-09-15 |
2023-03-23 |
Asml Netherlands B.V. |
Source separation from metrology data
|
WO2023046385A1
(en)
|
2021-09-22 |
2023-03-30 |
Asml Netherlands B.V. |
Pattern selection systems and methods
|
WO2023066657A1
(en)
|
2021-10-19 |
2023-04-27 |
Asml Netherlands B.V. |
Pattern matching method
|
WO2023084063A1
(en)
|
2021-11-15 |
2023-05-19 |
Asml Netherlands B.V. |
Generating augmented data to train machine learning models to preserve physical trends
|
WO2023088649A1
(en)
|
2021-11-17 |
2023-05-25 |
Asml Netherlands B.V. |
Determining an etch effect based on an etch bias direction
|
WO2023088641A1
(en)
|
2021-11-19 |
2023-05-25 |
Asml Netherlands B.V. |
Simulation model stability determination method
|
EP4194950A1
(en)
|
2021-12-08 |
2023-06-14 |
ASML Netherlands B.V. |
Systems and methods for reducing pattern shift in a lithographic apparatus
|
WO2023110346A1
(en)
|
2021-12-14 |
2023-06-22 |
Asml Netherlands B.V. |
Methods, software, and systems for determination of constant-width sub-resolution assist features
|
WO2023110401A1
(en)
|
2021-12-14 |
2023-06-22 |
Asml Netherlands B.V. |
Thermal control systems, models, and manufacturing processes in lithography
|
WO2023110347A1
(en)
|
2021-12-16 |
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