KR101099416B1 - 스퍼터링 타겟 및 그 제조 방법 - Google Patents

스퍼터링 타겟 및 그 제조 방법 Download PDF

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Publication number
KR101099416B1
KR101099416B1 KR1020117022659A KR20117022659A KR101099416B1 KR 101099416 B1 KR101099416 B1 KR 101099416B1 KR 1020117022659 A KR1020117022659 A KR 1020117022659A KR 20117022659 A KR20117022659 A KR 20117022659A KR 101099416 B1 KR101099416 B1 KR 101099416B1
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KR
South Korea
Prior art keywords
powder
naf
sputtering target
sputtering
target
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Expired - Fee Related
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KR1020117022659A
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English (en)
Korean (ko)
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KR20110113213A (ko
Inventor
쇼우빈 장
요시노리 시라이
Original Assignee
미쓰비시 마테리알 가부시키가이샤
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Application filed by 미쓰비시 마테리알 가부시키가이샤 filed Critical 미쓰비시 마테리알 가부시키가이샤
Publication of KR20110113213A publication Critical patent/KR20110113213A/ko
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Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F3/00—Manufacture of workpieces or articles from metallic powder characterised by the manner of compacting or sintering; Apparatus specially adapted therefor ; Presses and furnaces
    • B22F3/12—Both compacting and sintering
    • B22F3/14—Both compacting and sintering simultaneously
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22C—ALLOYS
    • C22C1/00—Making non-ferrous alloys
    • C22C1/04—Making non-ferrous alloys by powder metallurgy
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22C—ALLOYS
    • C22C9/00—Alloys based on copper
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/12—Active materials
    • H10F77/126—Active materials comprising only Group I-III-VI chalcopyrite materials, e.g. CuInSe2, CuGaSe2 or CuInGaSe2 [CIGS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/541—CuInSe2 material PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)
  • Photovoltaic Devices (AREA)
  • Powder Metallurgy (AREA)
KR1020117022659A 2009-11-06 2010-11-04 스퍼터링 타겟 및 그 제조 방법 Expired - Fee Related KR101099416B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2009255540 2009-11-06
JPJP-P-2009-255540 2009-11-06
JPJP-P-2010-241749 2010-10-28
JP2010241749A JP4793504B2 (ja) 2009-11-06 2010-10-28 スパッタリングターゲット及びその製造方法
PCT/JP2010/006481 WO2011055537A1 (ja) 2009-11-06 2010-11-04 スパッタリングターゲット及びその製造方法

Publications (2)

Publication Number Publication Date
KR20110113213A KR20110113213A (ko) 2011-10-14
KR101099416B1 true KR101099416B1 (ko) 2011-12-27

Family

ID=43969780

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117022659A Expired - Fee Related KR101099416B1 (ko) 2009-11-06 2010-11-04 스퍼터링 타겟 및 그 제조 방법

Country Status (8)

Country Link
US (1) US8795489B2 (enExample)
EP (1) EP2402482B1 (enExample)
JP (1) JP4793504B2 (enExample)
KR (1) KR101099416B1 (enExample)
CN (1) CN102395702B (enExample)
IN (1) IN2012DN03820A (enExample)
TW (1) TW201126002A (enExample)
WO (1) WO2011055537A1 (enExample)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5877510B2 (ja) * 2010-01-07 2016-03-08 Ｊｘ金属株式会社 Ｃｕ−Ｇａ系スパッタリングターゲット、同ターゲットの製造方法、光吸収層及び該光吸収層を用いた太陽電池
JP4831258B2 (ja) * 2010-03-18 2011-12-07 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
JP5418463B2 (ja) * 2010-10-14 2014-02-19 住友金属鉱山株式会社 Ｃｕ−Ｇａ合金スパッタリングターゲットの製造方法
JP5153911B2 (ja) * 2011-04-22 2013-02-27 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
JP5725610B2 (ja) * 2011-04-29 2015-05-27 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
WO2012165092A1 (ja) * 2011-06-03 2012-12-06 日東電工株式会社 太陽電池の製造方法
JP5795898B2 (ja) * 2011-07-28 2015-10-14 株式会社アルバック ＣｕＧａＮａ系スパッタリング用ターゲット
JP5795897B2 (ja) * 2011-07-28 2015-10-14 株式会社アルバック ＣｕＧａＮａ系スパッタリング用ターゲット
JP5165100B1 (ja) 2011-11-01 2013-03-21 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
JP5919738B2 (ja) * 2011-11-10 2016-05-18 三菱マテリアル株式会社 スパッタリングターゲットおよびその製造方法
JP5999357B2 (ja) 2012-02-24 2016-09-28 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
US8586457B1 (en) * 2012-05-17 2013-11-19 Intermolecular, Inc. Method of fabricating high efficiency CIGS solar cells
CN102751388B (zh) * 2012-07-18 2015-03-11 林刘毓 一种铜铟镓硒薄膜太阳能电池的制备方法
JP5907428B2 (ja) * 2012-07-23 2016-04-26 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
JP2014037556A (ja) * 2012-08-10 2014-02-27 Mitsubishi Materials Corp スパッタリングターゲット及びその製造方法
JP6311912B2 (ja) * 2012-10-17 2018-04-18 三菱マテリアル株式会社 Ｃｕ−Ｇａ二元系スパッタリングターゲット及びその製造方法
AT13564U1 (de) 2013-01-31 2014-03-15 Plansee Se CU-GA-IN-NA Target
JP6365922B2 (ja) 2013-04-15 2018-08-01 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
CN103255367B (zh) * 2013-04-28 2015-07-29 柳州百韧特先进材料有限公司 太阳能电池cigs吸收层靶材的制备方法
JP6120076B2 (ja) * 2013-08-01 2017-04-26 三菱マテリアル株式会社 Ｃｕ−Ｇａ合金スパッタリングターゲット及びその製造方法
JP5733357B2 (ja) * 2013-08-02 2015-06-10 住友金属鉱山株式会社 Ｃｕ−Ｇａ合金スパッタリングターゲット
WO2015042622A1 (de) * 2013-09-27 2015-04-02 Plansee Se Kupfer-gallium sputtering target
JP2015086434A (ja) * 2013-10-30 2015-05-07 住友金属鉱山株式会社 Ｃｕ−Ｇａ合金スパッタリングターゲットの製造方法
JP6665428B2 (ja) * 2014-07-08 2020-03-13 三菱マテリアル株式会社 Ｃｕ−Ｇａ合金スパッタリングターゲット及びその製造方法
JP5973041B2 (ja) * 2014-08-28 2016-08-17 三菱マテリアル株式会社 Ｃｕ−Ｇａスパッタリングターゲット及びＣｕ−Ｇａスパッタリングターゲットの製造方法
WO2016047556A1 (ja) * 2014-09-22 2016-03-31 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
JP6634750B2 (ja) * 2014-09-22 2020-01-22 三菱マテリアル株式会社 スパッタリングターゲット及びその製造方法
US9947531B2 (en) 2015-01-12 2018-04-17 NuvoSun, Inc. High rate sputter deposition of alkali metal-containing precursor films useful to fabricate chalcogenide semiconductors
TWI551704B (zh) * 2015-05-21 2016-10-01 China Steel Corp Copper gallium alloy composite sodium element target manufacturing method
JP6794850B2 (ja) * 2016-02-08 2020-12-02 三菱マテリアル株式会社 スパッタリングターゲット及びスパッタリングターゲットの製造方法
WO2017147037A1 (en) 2016-02-26 2017-08-31 Dow Global Technologies Llc Method for improving stability of photovoltaic articles incorporating chalcogenide semiconductors
JP2018024933A (ja) * 2016-07-29 2018-02-15 三菱マテリアル株式会社 Ｃｕ−Ｇａスパッタリングターゲット及びＣｕ−Ｇａスパッタリングターゲットの製造方法
WO2018021105A1 (ja) 2016-07-29 2018-02-01 三菱マテリアル株式会社 Ｃｕ－Ｇａスパッタリングターゲット及びＣｕ－Ｇａスパッタリングターゲットの製造方法
KR102026458B1 (ko) * 2017-05-12 2019-09-27 서울대학교산학협력단 금속 소결체의 제조방법
JP2019112671A (ja) * 2017-12-22 2019-07-11 三菱マテリアル株式会社 Ｃｕ−Ｇａ合金スパッタリングターゲット、及び、Ｃｕ−Ｇａ合金スパッタリングターゲットの製造方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE68916988T2 (de) * 1988-03-16 1995-03-16 Mitsui Toatsu Chemicals Verfahren zur Herstellung von gasförmigen Fluoriden.
JPH08253826A (ja) * 1994-10-19 1996-10-01 Sumitomo Electric Ind Ltd 焼結摩擦材およびそれに用いられる複合銅合金粉末とそれらの製造方法
JPH08195501A (ja) * 1995-01-18 1996-07-30 Shin Etsu Chem Co Ltd Ｉｂ−ＩＩＩｂ−ＶＩｂ族化合物半導体
JP3249408B2 (ja) 1996-10-25 2002-01-21 昭和シェル石油株式会社 薄膜太陽電池の薄膜光吸収層の製造方法及び製造装置
JP4766441B2 (ja) * 2003-09-17 2011-09-07 三菱マテリアル株式会社 半導体不揮発メモリー用相変化膜およびこの相変化膜を形成するためのスパッタリングターゲット
JP4907259B2 (ja) * 2006-08-16 2012-03-28 山陽特殊製鋼株式会社 Ｃｒを添加したＦｅＣｏＢ系ターゲット材
JP4811660B2 (ja) * 2006-11-30 2011-11-09 三菱マテリアル株式会社 高Ｇａ含有Ｃｕ−Ｇａ二元系合金スパッタリングターゲットおよびその製造方法
US9279178B2 (en) 2007-04-27 2016-03-08 Honeywell International Inc. Manufacturing design and processing methods and apparatus for sputtering targets
JP2009267336A (ja) 2007-09-28 2009-11-12 Fujifilm Corp 太陽電池用基板および太陽電池
CN101260513B (zh) 2008-04-23 2011-04-06 王东生 太阳能电池铜铟镓硒薄膜关键靶材的制备方法
CN101397647B (zh) * 2008-11-03 2011-08-17 清华大学 铜铟镓硒或铜铟铝硒太阳能电池吸收层靶材及其制备方法
US20100116341A1 (en) * 2008-11-12 2010-05-13 Solar Applied Materials Technology Corp. Copper-gallium allay sputtering target, method for fabricating the same and related applications
JP2010225883A (ja) * 2009-03-24 2010-10-07 Honda Motor Co Ltd 薄膜太陽電池の製造方法
US9284639B2 (en) * 2009-07-30 2016-03-15 Apollo Precision Kunming Yuanhong Limited Method for alkali doping of thin film photovoltaic materials

Also Published As

Publication number Publication date
EP2402482B1 (en) 2014-07-02
CN102395702B (zh) 2013-04-10
US20120217157A1 (en) 2012-08-30
JP4793504B2 (ja) 2011-10-12
WO2011055537A1 (ja) 2011-05-12
IN2012DN03820A (enExample) 2015-08-28
EP2402482A1 (en) 2012-01-04
KR20110113213A (ko) 2011-10-14
US8795489B2 (en) 2014-08-05
EP2402482A4 (en) 2012-03-28
CN102395702A (zh) 2012-03-28
JP2011117077A (ja) 2011-06-16
TW201126002A (en) 2011-08-01
TWI360583B (enExample) 2012-03-21

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