KR100260119B1 - 반도체 처리장치 - Google Patents
반도체 처리장치 Download PDFInfo
- Publication number
- KR100260119B1 KR100260119B1 KR1019940014586A KR19940014586A KR100260119B1 KR 100260119 B1 KR100260119 B1 KR 100260119B1 KR 1019940014586 A KR1019940014586 A KR 1019940014586A KR 19940014586 A KR19940014586 A KR 19940014586A KR 100260119 B1 KR100260119 B1 KR 100260119B1
- Authority
- KR
- South Korea
- Prior art keywords
- case
- chamber
- pressure
- processing
- cylindrical portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
-
- H10P72/0436—
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45559—Diffusion of reactive gas to substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP93-179845 | 1993-06-24 | ||
| JP17984593A JP3165938B2 (ja) | 1993-06-24 | 1993-06-24 | ガス処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR950001878A KR950001878A (ko) | 1995-01-04 |
| KR100260119B1 true KR100260119B1 (ko) | 2000-07-01 |
Family
ID=16072914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019940014586A Expired - Fee Related KR100260119B1 (ko) | 1993-06-24 | 1994-06-24 | 반도체 처리장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5462603A (enExample) |
| JP (1) | JP3165938B2 (enExample) |
| KR (1) | KR100260119B1 (enExample) |
| GB (1) | GB2279366B (enExample) |
| SG (1) | SG46325A1 (enExample) |
| TW (1) | TW280940B (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100638406B1 (ko) * | 1999-03-04 | 2006-10-24 | 어플라이드 머티어리얼스, 인코포레이티드 | 기판 지지대 내의 열구배를 감소시키기 위한 방법 및 장치 |
| WO2012015140A1 (ko) * | 2010-07-28 | 2012-02-02 | 국제엘렉트릭코리아 주식회사 | 기판 서셉터 및 그것을 갖는 증착 장치 |
| KR101165477B1 (ko) * | 2003-12-01 | 2012-07-13 | 가부시키가이샤 브리지스톤 | 세라믹 히터 유닛 |
| KR101315412B1 (ko) * | 2006-09-27 | 2013-10-07 | 엘아이지에이디피 주식회사 | 기판증착기 및 이를 이용한 증착방법 |
| WO2019093657A1 (ko) * | 2017-11-09 | 2019-05-16 | 주식회사 미코 | 마운트, 상기 마운트를 포함하는 히터 및 상기 히터를 포함하는 증착 장치 |
Families Citing this family (110)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07111244A (ja) * | 1993-10-13 | 1995-04-25 | Mitsubishi Electric Corp | 気相結晶成長装置 |
| TW254030B (en) * | 1994-03-18 | 1995-08-11 | Anelva Corp | Mechanic escape mechanism for substrate |
| US5753891A (en) * | 1994-08-31 | 1998-05-19 | Tokyo Electron Limited | Treatment apparatus |
| JPH08302474A (ja) * | 1995-04-28 | 1996-11-19 | Anelva Corp | Cvd装置の加熱装置 |
| JP3983831B2 (ja) * | 1995-05-30 | 2007-09-26 | シグマメルテック株式会社 | 基板ベーキング装置及び基板ベーキング方法 |
| US5700725A (en) * | 1995-06-26 | 1997-12-23 | Lucent Technologies Inc. | Apparatus and method for making integrated circuits |
| US6002109A (en) | 1995-07-10 | 1999-12-14 | Mattson Technology, Inc. | System and method for thermal processing of a semiconductor substrate |
| US6113702A (en) | 1995-09-01 | 2000-09-05 | Asm America, Inc. | Wafer support system |
| AU6962196A (en) * | 1995-09-01 | 1997-03-27 | Advanced Semiconductor Materials America, Inc. | Wafer support system |
| US5881208A (en) * | 1995-12-20 | 1999-03-09 | Sematech, Inc. | Heater and temperature sensor array for rapid thermal processing thermal core |
| JP3586031B2 (ja) * | 1996-03-27 | 2004-11-10 | 株式会社東芝 | サセプタおよび熱処理装置および熱処理方法 |
| US5709772A (en) * | 1996-03-29 | 1998-01-20 | Applied Materials, Inc. | Non-plasma halogenated gas flow to prevent metal residues |
| US5753566A (en) * | 1996-05-23 | 1998-05-19 | Taiwan Semiconductor Manufactured Company, Ltd. | Method of spin-on-glass etchback using hot backside helium |
| US6046439A (en) * | 1996-06-17 | 2000-04-04 | Mattson Technology, Inc. | System and method for thermal processing of a semiconductor substrate |
| US5885353A (en) * | 1996-06-21 | 1999-03-23 | Micron Technology, Inc. | Thermal conditioning apparatus |
| GB9622177D0 (en) * | 1996-10-24 | 1996-12-18 | Xaar Ltd | Passivation of ink jet print heads |
| KR100246963B1 (ko) * | 1996-11-22 | 2000-03-15 | 윤종용 | 반도체 제조장치의 웨이퍼 홀더용 스테이지 |
| US6035101A (en) * | 1997-02-12 | 2000-03-07 | Applied Materials, Inc. | High temperature multi-layered alloy heater assembly and related methods |
| US5911896A (en) * | 1997-06-25 | 1999-06-15 | Brooks Automation, Inc. | Substrate heating apparatus with glass-ceramic panels and thin film ribbon heater element |
| KR100418519B1 (ko) * | 1997-07-03 | 2004-04-21 | 삼성전자주식회사 | 확산설비 구조 및 가스 제어 방법 |
| JPH11176902A (ja) * | 1997-12-10 | 1999-07-02 | Oki Electric Ind Co Ltd | 半導体製造装置及びその製造方法 |
| US6086362A (en) * | 1998-05-20 | 2000-07-11 | Applied Komatsu Technology, Inc. | Multi-function chamber for a substrate processing system |
| JP3333135B2 (ja) * | 1998-06-25 | 2002-10-07 | 東京エレクトロン株式会社 | 熱処理装置及び熱処理方法 |
| US6224678B1 (en) | 1998-08-12 | 2001-05-01 | Advanced Micro Devices, Inc. | Modified thermocouple mounting bushing and system including the same |
| US6139640A (en) * | 1998-08-12 | 2000-10-31 | Advanced Micro Devices, Inc. | Chemical vapor deposition system and method employing a mass flow controller |
| US6206966B1 (en) | 1998-09-30 | 2001-03-27 | The Regents Of The University Of California | Pedestal substrate for coated optics |
| KR20000027189A (ko) * | 1998-10-27 | 2000-05-15 | 윤종용 | 반도체 장치 제조를 위한 증착설비의 가스공급장치 |
| EP1135659B1 (en) * | 1998-11-13 | 2006-05-10 | Mattson Technology Inc. | Apparatus and method for thermal processing of semiconductor substrates |
| US6087632A (en) * | 1999-01-11 | 2000-07-11 | Tokyo Electron Limited | Heat processing device with hot plate and associated reflector |
| JP4236329B2 (ja) * | 1999-04-15 | 2009-03-11 | 日本碍子株式会社 | プラズマ処理装置 |
| US6151794A (en) * | 1999-06-02 | 2000-11-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus for heat treating an object |
| US6307184B1 (en) * | 1999-07-12 | 2001-10-23 | Fsi International, Inc. | Thermal processing chamber for heating and cooling wafer-like objects |
| US6406545B2 (en) | 1999-07-27 | 2002-06-18 | Kabushiki Kaisha Toshiba | Semiconductor workpiece processing apparatus and method |
| TW476983B (en) * | 1999-09-30 | 2002-02-21 | Tokyo Electron Ltd | Heat treatment unit and heat treatment method |
| US6342691B1 (en) * | 1999-11-12 | 2002-01-29 | Mattson Technology, Inc. | Apparatus and method for thermal processing of semiconductor substrates |
| KR100629255B1 (ko) * | 1999-11-12 | 2006-09-29 | 삼성전자주식회사 | 반도체 포토 공정용 베이크 장치 |
| US6303906B1 (en) * | 1999-11-30 | 2001-10-16 | Wafermasters, Inc. | Resistively heated single wafer furnace |
| US6494955B1 (en) | 2000-02-15 | 2002-12-17 | Applied Materials, Inc. | Ceramic substrate support |
| US20010035403A1 (en) | 2000-05-18 | 2001-11-01 | Albert Wang | Method and structure for producing flat wafer chucks |
| EP1220303B1 (en) * | 2000-06-02 | 2004-09-08 | Ibiden Co., Ltd. | Hot plate unit |
| US6652655B1 (en) * | 2000-07-07 | 2003-11-25 | Applied Materials, Inc. | Method to isolate multi zone heater from atmosphere |
| US6838115B2 (en) * | 2000-07-12 | 2005-01-04 | Fsi International, Inc. | Thermal processing system and methods for forming low-k dielectric films suitable for incorporation into microelectronic devices |
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| US7192888B1 (en) * | 2000-08-21 | 2007-03-20 | Micron Technology, Inc. | Low selectivity deposition methods |
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| JP4009100B2 (ja) * | 2000-12-28 | 2007-11-14 | 東京エレクトロン株式会社 | 基板加熱装置および基板加熱方法 |
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| US20120085747A1 (en) * | 2010-10-07 | 2012-04-12 | Benson Chao | Heater assembly and wafer processing apparatus using the same |
| US9719169B2 (en) * | 2010-12-20 | 2017-08-01 | Novellus Systems, Inc. | System and apparatus for flowable deposition in semiconductor fabrication |
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|---|---|---|---|---|
| ES2054357T3 (es) * | 1989-05-08 | 1994-08-01 | Philips Nv | Aparato y metodo para tratar substratos planos bajo una presion reducida. |
| US5094885A (en) * | 1990-10-12 | 1992-03-10 | Genus, Inc. | Differential pressure cvd chuck |
| US5060354A (en) * | 1990-07-02 | 1991-10-29 | George Chizinsky | Heated plate rapid thermal processor |
| US5252807A (en) * | 1990-07-02 | 1993-10-12 | George Chizinsky | Heated plate rapid thermal processor |
| WO1993013241A1 (en) * | 1991-12-23 | 1993-07-08 | Genus, Inc. | Purge gas in wafer coating area selection |
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- 1993-06-24 JP JP17984593A patent/JP3165938B2/ja not_active Expired - Lifetime
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- 1994-06-24 KR KR1019940014586A patent/KR100260119B1/ko not_active Expired - Fee Related
- 1994-06-24 SG SG1996002937A patent/SG46325A1/en unknown
- 1994-06-24 US US08/265,139 patent/US5462603A/en not_active Expired - Lifetime
- 1994-06-24 GB GB9412704A patent/GB2279366B/en not_active Expired - Fee Related
- 1994-06-27 TW TW083105820A patent/TW280940B/zh not_active IP Right Cessation
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100638406B1 (ko) * | 1999-03-04 | 2006-10-24 | 어플라이드 머티어리얼스, 인코포레이티드 | 기판 지지대 내의 열구배를 감소시키기 위한 방법 및 장치 |
| KR101165477B1 (ko) * | 2003-12-01 | 2012-07-13 | 가부시키가이샤 브리지스톤 | 세라믹 히터 유닛 |
| KR101315412B1 (ko) * | 2006-09-27 | 2013-10-07 | 엘아이지에이디피 주식회사 | 기판증착기 및 이를 이용한 증착방법 |
| WO2012015140A1 (ko) * | 2010-07-28 | 2012-02-02 | 국제엘렉트릭코리아 주식회사 | 기판 서셉터 및 그것을 갖는 증착 장치 |
| KR101205433B1 (ko) * | 2010-07-28 | 2012-11-28 | 국제엘렉트릭코리아 주식회사 | 기판 서셉터 및 그것을 갖는 증착 장치 |
| CN103026465A (zh) * | 2010-07-28 | 2013-04-03 | 国际电气高丽株式会社 | 基板衬托器及具有其的沉积装置 |
| CN103026465B (zh) * | 2010-07-28 | 2015-08-19 | 国际电气高丽株式会社 | 基板衬托器及具有其的沉积装置 |
| US9567673B2 (en) | 2010-07-28 | 2017-02-14 | Kookje Electric Korea Co., Ltd. | Substrate susceptor and deposition apparatus having same |
| WO2019093657A1 (ko) * | 2017-11-09 | 2019-05-16 | 주식회사 미코 | 마운트, 상기 마운트를 포함하는 히터 및 상기 히터를 포함하는 증착 장치 |
| KR20190052804A (ko) * | 2017-11-09 | 2019-05-17 | 주식회사 미코 | 마운트, 상기 마운트를 포함하는 히터 및 상기 히터를 포함하는 증착 장치 |
| KR102441541B1 (ko) * | 2017-11-09 | 2022-09-08 | 주식회사 미코세라믹스 | 마운트, 상기 마운트를 포함하는 히터 및 상기 히터를 포함하는 증착 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB9412704D0 (en) | 1994-08-17 |
| SG46325A1 (en) | 1998-02-20 |
| JPH0778766A (ja) | 1995-03-20 |
| US5462603A (en) | 1995-10-31 |
| JP3165938B2 (ja) | 2001-05-14 |
| TW280940B (enExample) | 1996-07-11 |
| KR950001878A (ko) | 1995-01-04 |
| GB2279366B (en) | 1996-12-18 |
| GB2279366A (en) | 1995-01-04 |
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