JP5520455B2 - プラズマ処理装置 - Google Patents

プラズマ処理装置 Download PDF

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Publication number
JP5520455B2
JP5520455B2 JP2008153379A JP2008153379A JP5520455B2 JP 5520455 B2 JP5520455 B2 JP 5520455B2 JP 2008153379 A JP2008153379 A JP 2008153379A JP 2008153379 A JP2008153379 A JP 2008153379A JP 5520455 B2 JP5520455 B2 JP 5520455B2
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JP
Japan
Prior art keywords
gas
flow path
gas flow
plasma processing
processing apparatus
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JP2008153379A
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English (en)
Japanese (ja)
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JP2009302205A (ja
JP2009302205A5 (enExample
Inventor
昌樹 平山
忠弘 大見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tohoku University NUC
Tokyo Electron Ltd
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Tohoku University NUC
Tokyo Electron Ltd
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Priority to JP2008153379A priority Critical patent/JP5520455B2/ja
Application filed by Tohoku University NUC, Tokyo Electron Ltd filed Critical Tohoku University NUC
Priority to CN2009801214626A priority patent/CN102057465A/zh
Priority to KR1020107024030A priority patent/KR101202270B1/ko
Priority to US12/997,211 priority patent/US9196460B2/en
Priority to PCT/JP2009/060159 priority patent/WO2009150979A1/ja
Priority to CN201210243672.6A priority patent/CN102760633B/zh
Priority to TW098119217A priority patent/TW201015653A/zh
Publication of JP2009302205A publication Critical patent/JP2009302205A/ja
Publication of JP2009302205A5 publication Critical patent/JP2009302205A5/ja
Application granted granted Critical
Publication of JP5520455B2 publication Critical patent/JP5520455B2/ja
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32192Microwave generated discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • H01J37/32449Gas control, e.g. control of the gas flow

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
JP2008153379A 2008-06-11 2008-06-11 プラズマ処理装置 Active JP5520455B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2008153379A JP5520455B2 (ja) 2008-06-11 2008-06-11 プラズマ処理装置
KR1020107024030A KR101202270B1 (ko) 2008-06-11 2009-06-03 플라즈마 처리 장치 및 플라즈마 처리 방법
US12/997,211 US9196460B2 (en) 2008-06-11 2009-06-03 Plasma processing apparatus and plasma processing method
PCT/JP2009/060159 WO2009150979A1 (ja) 2008-06-11 2009-06-03 プラズマ処理装置及びプラズマ処理方法
CN2009801214626A CN102057465A (zh) 2008-06-11 2009-06-03 等离子体处理装置及等离子体处理方法
CN201210243672.6A CN102760633B (zh) 2008-06-11 2009-06-03 等离子体处理装置及等离子体处理方法
TW098119217A TW201015653A (en) 2008-06-11 2009-06-09 Plasma processing apparatus and plasma processing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008153379A JP5520455B2 (ja) 2008-06-11 2008-06-11 プラズマ処理装置

Publications (3)

Publication Number Publication Date
JP2009302205A JP2009302205A (ja) 2009-12-24
JP2009302205A5 JP2009302205A5 (enExample) 2011-08-11
JP5520455B2 true JP5520455B2 (ja) 2014-06-11

Family

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Family Applications (1)

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JP2008153379A Active JP5520455B2 (ja) 2008-06-11 2008-06-11 プラズマ処理装置

Country Status (6)

Country Link
US (1) US9196460B2 (enExample)
JP (1) JP5520455B2 (enExample)
KR (1) KR101202270B1 (enExample)
CN (2) CN102760633B (enExample)
TW (1) TW201015653A (enExample)
WO (1) WO2009150979A1 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5520455B2 (ja) * 2008-06-11 2014-06-11 東京エレクトロン株式会社 プラズマ処理装置
JP5478058B2 (ja) * 2008-12-09 2014-04-23 国立大学法人東北大学 プラズマ処理装置
KR101327458B1 (ko) * 2012-01-10 2013-11-08 주식회사 유진테크 냉각 방식의 샤워헤드 및 이를 구비하는 기판 처리 장치
KR101206836B1 (ko) * 2012-03-14 2012-11-30 한국델파이주식회사 스티어링 기어의 랙 바 지지 장치
US9267205B1 (en) * 2012-05-30 2016-02-23 Alta Devices, Inc. Fastener system for supporting a liner plate in a gas showerhead reactor
JP2014096553A (ja) * 2012-10-09 2014-05-22 Tokyo Electron Ltd プラズマ処理方法、及びプラズマ処理装置
JP2014082354A (ja) * 2012-10-17 2014-05-08 Hitachi High-Technologies Corp プラズマ処理装置
JP5700032B2 (ja) * 2012-12-26 2015-04-15 東京エレクトロン株式会社 プラズマドーピング装置、およびプラズマドーピング方法
JP6137986B2 (ja) * 2013-08-07 2017-05-31 株式会社荏原製作所 基板洗浄及び乾燥装置
US9336997B2 (en) * 2014-03-17 2016-05-10 Applied Materials, Inc. RF multi-feed structure to improve plasma uniformity
JP6378360B2 (ja) * 2014-11-26 2018-08-22 株式会社日立ハイテクノロジーズ イオンビーム装置
JP6404111B2 (ja) * 2014-12-18 2018-10-10 東京エレクトロン株式会社 プラズマ処理装置
DE102015101461A1 (de) 2015-02-02 2016-08-04 Aixtron Se Vorrichtung zum Beschichten eines großflächigen Substrats
WO2018042877A1 (ja) * 2016-09-05 2018-03-08 信越半導体株式会社 気相成長装置、エピタキシャルウェーハの製造方法及び気相成長装置用のアタッチメント
JP6624110B2 (ja) * 2017-02-10 2019-12-25 株式会社豊田中央研究所 化合物単結晶製造装置、及び化合物単結晶の製造方法
CN106604514A (zh) * 2017-02-21 2017-04-26 唐山铸锐科技有限公司 排管及低温等离子体发生设备
CN107118381A (zh) * 2017-06-16 2017-09-01 南京工业大学 聚四氟乙烯亲水性改性等离子体处理装置及方法
US11239057B2 (en) * 2017-07-28 2022-02-01 Sumitomo Electric Industries, Ltd. Showerhead and method for manufacturing the same
NL2022556A (en) 2018-02-13 2019-08-19 Asml Netherlands Bv Cleaning a structure surface in an euv chamber
JP6835019B2 (ja) 2018-03-14 2021-02-24 株式会社豊田中央研究所 半導体装置及びその製造方法
JP7346698B2 (ja) * 2019-07-15 2023-09-19 アプライド マテリアルズ インコーポレイテッド フラットパネルディスプレイ用の大面積高密度プラズマ処理チャンバ
CN112349572B (zh) * 2019-08-09 2024-03-08 中微半导体设备(上海)股份有限公司 一种气体喷淋头及等离子处理装置
JP7428521B2 (ja) * 2020-01-15 2024-02-06 株式会社テクノ菱和 電極
JP7540864B2 (ja) * 2020-06-15 2024-08-27 東京エレクトロン株式会社 シャワープレート及び成膜装置
US12394604B2 (en) 2020-09-11 2025-08-19 Applied Materials, Inc. Plasma source with floating electrodes
US11776793B2 (en) 2020-11-13 2023-10-03 Applied Materials, Inc. Plasma source with ceramic electrode plate
JP7648307B2 (ja) * 2021-06-22 2025-03-18 東京エレクトロン株式会社 シャワーヘッド及びプラズマ処理装置
KR102858462B1 (ko) * 2021-12-08 2025-09-12 가부시키가이샤 티마이크 활성 가스 생성 장치
TWI821950B (zh) * 2022-03-18 2023-11-11 韓商細美事有限公司 晶粒表面處理裝置以及其晶粒結合系統
US12327810B2 (en) 2022-04-21 2025-06-10 Semes Co., Ltd. Die surface treatment apparatus and die bonding system including the same

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02114530A (ja) 1988-10-25 1990-04-26 Mitsubishi Electric Corp 薄膜形成装置
US5091049A (en) * 1989-06-13 1992-02-25 Plasma & Materials Technologies, Inc. High density plasma deposition and etching apparatus
US5122251A (en) * 1989-06-13 1992-06-16 Plasma & Materials Technologies, Inc. High density plasma deposition and etching apparatus
TW293983B (enExample) * 1993-12-17 1996-12-21 Tokyo Electron Co Ltd
US5611864A (en) * 1994-03-24 1997-03-18 Matsushita Electric Industrial Co., Ltd. Microwave plasma processing apparatus and processing method using the same
US5620523A (en) * 1994-04-11 1997-04-15 Canon Sales Co., Inc. Apparatus for forming film
TW283250B (en) * 1995-07-10 1996-08-11 Watkins Johnson Co Plasma enhanced chemical processing reactor and method
JPH10158847A (ja) * 1996-12-06 1998-06-16 Toshiba Corp マイクロ波励起によるプラズマ処理装置
US6357385B1 (en) * 1997-01-29 2002-03-19 Tadahiro Ohmi Plasma device
US6042687A (en) * 1997-06-30 2000-03-28 Lam Research Corporation Method and apparatus for improving etch and deposition uniformity in plasma semiconductor processing
JP3317209B2 (ja) * 1997-08-12 2002-08-26 東京エレクトロンエイ・ティー株式会社 プラズマ処理装置及びプラズマ処理方法
US6132552A (en) * 1998-02-19 2000-10-17 Micron Technology, Inc. Method and apparatus for controlling the temperature of a gas distribution plate in a process reactor
JP4141021B2 (ja) * 1998-09-18 2008-08-27 東京エレクトロン株式会社 プラズマ成膜方法
JP3668079B2 (ja) * 1999-05-31 2005-07-06 忠弘 大見 プラズマプロセス装置
JP3645768B2 (ja) 1999-12-07 2005-05-11 シャープ株式会社 プラズマプロセス装置
JP3482949B2 (ja) * 2000-08-04 2004-01-06 松下電器産業株式会社 プラズマ処理方法及び装置
US7008484B2 (en) * 2002-05-06 2006-03-07 Applied Materials Inc. Method and apparatus for deposition of low dielectric constant materials
US6942753B2 (en) 2003-04-16 2005-09-13 Applied Materials, Inc. Gas distribution plate assembly for large area plasma enhanced chemical vapor deposition
JP4179041B2 (ja) * 2003-04-30 2008-11-12 株式会社島津製作所 有機el用保護膜の成膜装置、製造方法および有機el素子
WO2005086215A1 (ja) * 2004-03-03 2005-09-15 Tokyo Electron Limited プラズマ処理方法及びコンピュータ記憶媒体
CN100449708C (zh) * 2004-05-27 2009-01-07 东京毅力科创株式会社 基板处理装置
JP2006128000A (ja) * 2004-10-29 2006-05-18 Advanced Lcd Technologies Development Center Co Ltd プラズマ処理装置
JP4770167B2 (ja) 2004-12-16 2011-09-14 株式会社島津製作所 表面波励起プラズマcvd装置を用いた成膜方法
JP2006310736A (ja) * 2005-03-30 2006-11-09 Tokyo Electron Ltd ゲート絶縁膜の製造方法および半導体装置の製造方法
TWI423308B (zh) * 2005-09-01 2014-01-11 松下電器產業股份有限公司 A plasma processing apparatus, a plasma processing method, and a dielectric window for use therefor and a method of manufacturing the same
US20080254220A1 (en) * 2006-01-20 2008-10-16 Tokyo Electron Limited Plasma processing apparatus
CN101371341B (zh) 2006-01-20 2010-08-18 东京毅力科创株式会社 等离子处理装置
JP4683334B2 (ja) * 2006-03-31 2011-05-18 株式会社島津製作所 表面波励起プラズマ処理装置
US20080081114A1 (en) * 2006-10-03 2008-04-03 Novellus Systems, Inc. Apparatus and method for delivering uniform fluid flow in a chemical deposition system
JP5252613B2 (ja) * 2006-12-25 2013-07-31 国立大学法人東北大学 イオン注入装置およびイオン注入方法
KR101173268B1 (ko) * 2007-03-29 2012-08-10 도쿄엘렉트론가부시키가이샤 플라즈마 처리 장치
JPWO2008153053A1 (ja) * 2007-06-11 2010-08-26 東京エレクトロン株式会社 プラズマ処理装置、給電装置およびプラズマ処理装置の使用方法
DE112008001548B4 (de) * 2007-06-11 2013-07-11 Tokyo Electron Ltd. Plasmabearbeitungsvorrichtung und Plasmabearbeitungsverfahren
US8568556B2 (en) * 2007-06-11 2013-10-29 Tokyo Electron Limited Plasma processing apparatus and method for using plasma processing apparatus
JP2008305736A (ja) * 2007-06-11 2008-12-18 Tokyo Electron Ltd プラズマ処理装置、プラズマ処理装置の使用方法およびプラズマ処理装置のクリーニング方法
US20080303744A1 (en) * 2007-06-11 2008-12-11 Tokyo Electron Limited Plasma processing system, antenna, and use of plasma processing system
JP5058727B2 (ja) * 2007-09-06 2012-10-24 東京エレクトロン株式会社 天板構造及びこれを用いたプラズマ処理装置
CN102057762A (zh) * 2008-06-11 2011-05-11 东京毅力科创株式会社 等离子体处理装置及等离子体处理方法
JP5213530B2 (ja) * 2008-06-11 2013-06-19 東京エレクトロン株式会社 プラズマ処理装置
JP5520455B2 (ja) * 2008-06-11 2014-06-11 東京エレクトロン株式会社 プラズマ処理装置
JP5421551B2 (ja) * 2008-06-11 2014-02-19 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP5478058B2 (ja) * 2008-12-09 2014-04-23 国立大学法人東北大学 プラズマ処理装置
JP5222744B2 (ja) * 2009-01-21 2013-06-26 国立大学法人東北大学 プラズマ処理装置
KR101930230B1 (ko) * 2009-11-06 2018-12-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치를 제작하기 위한 방법
JP5483245B2 (ja) * 2012-02-17 2014-05-07 国立大学法人東北大学 プラズマ処理装置およびプラズマ処理方法
US9343291B2 (en) * 2013-05-15 2016-05-17 Tokyo Electron Limited Method for forming an interfacial layer on a semiconductor using hydrogen plasma

Also Published As

Publication number Publication date
CN102760633A (zh) 2012-10-31
WO2009150979A1 (ja) 2009-12-17
US20110180213A1 (en) 2011-07-28
CN102057465A (zh) 2011-05-11
TW201015653A (en) 2010-04-16
JP2009302205A (ja) 2009-12-24
US9196460B2 (en) 2015-11-24
KR20100126571A (ko) 2010-12-01
CN102760633B (zh) 2015-09-02
KR101202270B1 (ko) 2012-11-16

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