KR101202270B1 - 플라즈마 처리 장치 및 플라즈마 처리 방법 - Google Patents
플라즈마 처리 장치 및 플라즈마 처리 방법 Download PDFInfo
- Publication number
- KR101202270B1 KR101202270B1 KR1020107024030A KR20107024030A KR101202270B1 KR 101202270 B1 KR101202270 B1 KR 101202270B1 KR 1020107024030 A KR1020107024030 A KR 1020107024030A KR 20107024030 A KR20107024030 A KR 20107024030A KR 101202270 B1 KR101202270 B1 KR 101202270B1
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- flow path
- gas flow
- gas discharge
- processing container
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000003672 processing method Methods 0.000 title description 5
- 238000000034 method Methods 0.000 claims abstract description 74
- 238000007599 discharging Methods 0.000 claims abstract description 13
- 229910052751 metal Inorganic materials 0.000 claims description 194
- 239000002184 metal Substances 0.000 claims description 194
- 239000000758 substrate Substances 0.000 claims description 47
- 230000005284 excitation Effects 0.000 claims description 8
- 230000001902 propagating effect Effects 0.000 claims description 8
- 230000001939 inductive effect Effects 0.000 claims 6
- 239000007789 gas Substances 0.000 description 914
- 239000011295 pitch Substances 0.000 description 19
- 239000004020 conductor Substances 0.000 description 13
- 210000005239 tubule Anatomy 0.000 description 13
- 238000005530 etching Methods 0.000 description 9
- 229910000838 Al alloy Inorganic materials 0.000 description 7
- 239000007795 chemical reaction product Substances 0.000 description 7
- 230000002093 peripheral effect Effects 0.000 description 7
- 238000009832 plasma treatment Methods 0.000 description 7
- 239000002826 coolant Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 5
- 230000008021 deposition Effects 0.000 description 5
- 239000003989 dielectric material Substances 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000011109 contamination Methods 0.000 description 4
- 230000001629 suppression Effects 0.000 description 4
- 238000011144 upstream manufacturing Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000003507 refrigerant Substances 0.000 description 3
- 125000006850 spacer group Chemical group 0.000 description 3
- 238000003466 welding Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 238000005304 joining Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- -1 aluminum Chemical class 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005674 electromagnetic induction Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000007937 lozenge Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008153379A JP5520455B2 (ja) | 2008-06-11 | 2008-06-11 | プラズマ処理装置 |
| JPJP-P-2008-153379 | 2008-06-11 | ||
| PCT/JP2009/060159 WO2009150979A1 (ja) | 2008-06-11 | 2009-06-03 | プラズマ処理装置及びプラズマ処理方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20100126571A KR20100126571A (ko) | 2010-12-01 |
| KR101202270B1 true KR101202270B1 (ko) | 2012-11-16 |
Family
ID=41416688
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107024030A Active KR101202270B1 (ko) | 2008-06-11 | 2009-06-03 | 플라즈마 처리 장치 및 플라즈마 처리 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9196460B2 (enExample) |
| JP (1) | JP5520455B2 (enExample) |
| KR (1) | KR101202270B1 (enExample) |
| CN (2) | CN102760633B (enExample) |
| TW (1) | TW201015653A (enExample) |
| WO (1) | WO2009150979A1 (enExample) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5520455B2 (ja) * | 2008-06-11 | 2014-06-11 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP5478058B2 (ja) * | 2008-12-09 | 2014-04-23 | 国立大学法人東北大学 | プラズマ処理装置 |
| KR101327458B1 (ko) * | 2012-01-10 | 2013-11-08 | 주식회사 유진테크 | 냉각 방식의 샤워헤드 및 이를 구비하는 기판 처리 장치 |
| KR101206836B1 (ko) * | 2012-03-14 | 2012-11-30 | 한국델파이주식회사 | 스티어링 기어의 랙 바 지지 장치 |
| US9267205B1 (en) * | 2012-05-30 | 2016-02-23 | Alta Devices, Inc. | Fastener system for supporting a liner plate in a gas showerhead reactor |
| JP2014096553A (ja) * | 2012-10-09 | 2014-05-22 | Tokyo Electron Ltd | プラズマ処理方法、及びプラズマ処理装置 |
| JP2014082354A (ja) * | 2012-10-17 | 2014-05-08 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| JP5700032B2 (ja) * | 2012-12-26 | 2015-04-15 | 東京エレクトロン株式会社 | プラズマドーピング装置、およびプラズマドーピング方法 |
| JP6137986B2 (ja) * | 2013-08-07 | 2017-05-31 | 株式会社荏原製作所 | 基板洗浄及び乾燥装置 |
| US9336997B2 (en) * | 2014-03-17 | 2016-05-10 | Applied Materials, Inc. | RF multi-feed structure to improve plasma uniformity |
| JP6378360B2 (ja) * | 2014-11-26 | 2018-08-22 | 株式会社日立ハイテクノロジーズ | イオンビーム装置 |
| JP6404111B2 (ja) * | 2014-12-18 | 2018-10-10 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| DE102015101461A1 (de) | 2015-02-02 | 2016-08-04 | Aixtron Se | Vorrichtung zum Beschichten eines großflächigen Substrats |
| JP6628065B2 (ja) * | 2016-09-05 | 2020-01-08 | 信越半導体株式会社 | 気相成長装置、エピタキシャルウェーハの製造方法及び気相成長装置用のアタッチメント |
| JP6624110B2 (ja) | 2017-02-10 | 2019-12-25 | 株式会社豊田中央研究所 | 化合物単結晶製造装置、及び化合物単結晶の製造方法 |
| CN106604514A (zh) * | 2017-02-21 | 2017-04-26 | 唐山铸锐科技有限公司 | 排管及低温等离子体发生设备 |
| CN107118381A (zh) * | 2017-06-16 | 2017-09-01 | 南京工业大学 | 聚四氟乙烯亲水性改性等离子体处理装置及方法 |
| KR102578539B1 (ko) * | 2017-07-28 | 2023-09-13 | 스미토모덴키고교가부시키가이샤 | 샤워 헤드 및 그 제조 방법 |
| US11347154B2 (en) | 2018-02-13 | 2022-05-31 | Asml Netherlands B.V. | Cleaning a structure surface in an EUV chamber |
| JP6835019B2 (ja) | 2018-03-14 | 2021-02-24 | 株式会社豊田中央研究所 | 半導体装置及びその製造方法 |
| JP7346698B2 (ja) * | 2019-07-15 | 2023-09-19 | アプライド マテリアルズ インコーポレイテッド | フラットパネルディスプレイ用の大面積高密度プラズマ処理チャンバ |
| CN112349572B (zh) * | 2019-08-09 | 2024-03-08 | 中微半导体设备(上海)股份有限公司 | 一种气体喷淋头及等离子处理装置 |
| JP7428521B2 (ja) * | 2020-01-15 | 2024-02-06 | 株式会社テクノ菱和 | 電極 |
| JP7540864B2 (ja) * | 2020-06-15 | 2024-08-27 | 東京エレクトロン株式会社 | シャワープレート及び成膜装置 |
| US12394604B2 (en) | 2020-09-11 | 2025-08-19 | Applied Materials, Inc. | Plasma source with floating electrodes |
| US11776793B2 (en) | 2020-11-13 | 2023-10-03 | Applied Materials, Inc. | Plasma source with ceramic electrode plate |
| JP7648307B2 (ja) * | 2021-06-22 | 2025-03-18 | 東京エレクトロン株式会社 | シャワーヘッド及びプラズマ処理装置 |
| KR102858462B1 (ko) * | 2021-12-08 | 2025-09-12 | 가부시키가이샤 티마이크 | 활성 가스 생성 장치 |
| TWI821950B (zh) * | 2022-03-18 | 2023-11-11 | 韓商細美事有限公司 | 晶粒表面處理裝置以及其晶粒結合系統 |
| US12327810B2 (en) | 2022-04-21 | 2025-06-10 | Semes Co., Ltd. | Die surface treatment apparatus and die bonding system including the same |
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| JPH02114530A (ja) | 1988-10-25 | 1990-04-26 | Mitsubishi Electric Corp | 薄膜形成装置 |
| US5122251A (en) * | 1989-06-13 | 1992-06-16 | Plasma & Materials Technologies, Inc. | High density plasma deposition and etching apparatus |
| US5091049A (en) * | 1989-06-13 | 1992-02-25 | Plasma & Materials Technologies, Inc. | High density plasma deposition and etching apparatus |
| TW296534B (enExample) * | 1993-12-17 | 1997-01-21 | Tokyo Electron Co Ltd | |
| US5611864A (en) * | 1994-03-24 | 1997-03-18 | Matsushita Electric Industrial Co., Ltd. | Microwave plasma processing apparatus and processing method using the same |
| US5620523A (en) * | 1994-04-11 | 1997-04-15 | Canon Sales Co., Inc. | Apparatus for forming film |
| TW283250B (en) * | 1995-07-10 | 1996-08-11 | Watkins Johnson Co | Plasma enhanced chemical processing reactor and method |
| JPH10158847A (ja) * | 1996-12-06 | 1998-06-16 | Toshiba Corp | マイクロ波励起によるプラズマ処理装置 |
| WO1998033362A1 (en) * | 1997-01-29 | 1998-07-30 | Tadahiro Ohmi | Plasma device |
| US6042687A (en) * | 1997-06-30 | 2000-03-28 | Lam Research Corporation | Method and apparatus for improving etch and deposition uniformity in plasma semiconductor processing |
| JP3317209B2 (ja) * | 1997-08-12 | 2002-08-26 | 東京エレクトロンエイ・ティー株式会社 | プラズマ処理装置及びプラズマ処理方法 |
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| JP4141021B2 (ja) * | 1998-09-18 | 2008-08-27 | 東京エレクトロン株式会社 | プラズマ成膜方法 |
| JP3668079B2 (ja) * | 1999-05-31 | 2005-07-06 | 忠弘 大見 | プラズマプロセス装置 |
| JP3645768B2 (ja) | 1999-12-07 | 2005-05-11 | シャープ株式会社 | プラズマプロセス装置 |
| JP3482949B2 (ja) * | 2000-08-04 | 2004-01-06 | 松下電器産業株式会社 | プラズマ処理方法及び装置 |
| US7008484B2 (en) | 2002-05-06 | 2006-03-07 | Applied Materials Inc. | Method and apparatus for deposition of low dielectric constant materials |
| US6942753B2 (en) | 2003-04-16 | 2005-09-13 | Applied Materials, Inc. | Gas distribution plate assembly for large area plasma enhanced chemical vapor deposition |
| JP4179041B2 (ja) * | 2003-04-30 | 2008-11-12 | 株式会社島津製作所 | 有機el用保護膜の成膜装置、製造方法および有機el素子 |
| EP1722406A1 (en) * | 2004-03-03 | 2006-11-15 | Tokyo Electron Limited | Plasma processing method and computer storing medium |
| KR100856159B1 (ko) * | 2004-05-27 | 2008-09-03 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치 |
| JP2006128000A (ja) * | 2004-10-29 | 2006-05-18 | Advanced Lcd Technologies Development Center Co Ltd | プラズマ処理装置 |
| JP4770167B2 (ja) * | 2004-12-16 | 2011-09-14 | 株式会社島津製作所 | 表面波励起プラズマcvd装置を用いた成膜方法 |
| JP2006310736A (ja) * | 2005-03-30 | 2006-11-09 | Tokyo Electron Ltd | ゲート絶縁膜の製造方法および半導体装置の製造方法 |
| US20090130335A1 (en) * | 2005-09-01 | 2009-05-21 | Tomohiro Okumura | Plasma processing apparatus, plasma processing method, dielectric window used therein, and manufacturing method of such a dielectric window |
| KR100954128B1 (ko) | 2006-01-20 | 2010-04-20 | 도쿄엘렉트론가부시키가이샤 | 플라즈마 처리 장치, 플라즈마 처리 장치에 이용되는 천판 및, 천판의 제조 방법 |
| US20080254220A1 (en) | 2006-01-20 | 2008-10-16 | Tokyo Electron Limited | Plasma processing apparatus |
| JP4683334B2 (ja) * | 2006-03-31 | 2011-05-18 | 株式会社島津製作所 | 表面波励起プラズマ処理装置 |
| US20080081114A1 (en) | 2006-10-03 | 2008-04-03 | Novellus Systems, Inc. | Apparatus and method for delivering uniform fluid flow in a chemical deposition system |
| JP5252613B2 (ja) * | 2006-12-25 | 2013-07-31 | 国立大学法人東北大学 | イオン注入装置およびイオン注入方法 |
| KR101119627B1 (ko) * | 2007-03-29 | 2012-03-07 | 도쿄엘렉트론가부시키가이샤 | 플라즈마 처리 장치 |
| KR101183039B1 (ko) * | 2007-06-11 | 2012-09-20 | 고쿠리츠다이가쿠호진 도호쿠다이가쿠 | 플라즈마 처리 장치 및 플라즈마 처리 장치의 사용 방법 |
| JP2008305736A (ja) * | 2007-06-11 | 2008-12-18 | Tokyo Electron Ltd | プラズマ処理装置、プラズマ処理装置の使用方法およびプラズマ処理装置のクリーニング方法 |
| US20080303744A1 (en) * | 2007-06-11 | 2008-12-11 | Tokyo Electron Limited | Plasma processing system, antenna, and use of plasma processing system |
| JP4944198B2 (ja) * | 2007-06-11 | 2012-05-30 | 東京エレクトロン株式会社 | プラズマ処理装置および処理方法 |
| CN101632330B (zh) * | 2007-06-11 | 2012-11-21 | 东京毅力科创株式会社 | 等离子体处理装置、供电装置及等离子体处理装置的使用方法 |
| JP5058727B2 (ja) * | 2007-09-06 | 2012-10-24 | 東京エレクトロン株式会社 | 天板構造及びこれを用いたプラズマ処理装置 |
| JP5520455B2 (ja) * | 2008-06-11 | 2014-06-11 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP5213530B2 (ja) * | 2008-06-11 | 2013-06-19 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP5421551B2 (ja) * | 2008-06-11 | 2014-02-19 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| KR101229780B1 (ko) * | 2008-06-11 | 2013-02-05 | 고쿠리츠다이가쿠호진 도호쿠다이가쿠 | 플라즈마 처리 장치 및 플라즈마 처리 방법 |
| JP5478058B2 (ja) * | 2008-12-09 | 2014-04-23 | 国立大学法人東北大学 | プラズマ処理装置 |
| JP5222744B2 (ja) * | 2009-01-21 | 2013-06-26 | 国立大学法人東北大学 | プラズマ処理装置 |
| KR101747158B1 (ko) * | 2009-11-06 | 2017-06-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치를 제작하기 위한 방법 |
| WO2013121467A1 (ja) * | 2012-02-17 | 2013-08-22 | 国立大学法人東北大学 | プラズマ処理装置およびプラズマ処理方法 |
| US9343291B2 (en) * | 2013-05-15 | 2016-05-17 | Tokyo Electron Limited | Method for forming an interfacial layer on a semiconductor using hydrogen plasma |
-
2008
- 2008-06-11 JP JP2008153379A patent/JP5520455B2/ja active Active
-
2009
- 2009-06-03 WO PCT/JP2009/060159 patent/WO2009150979A1/ja not_active Ceased
- 2009-06-03 CN CN201210243672.6A patent/CN102760633B/zh active Active
- 2009-06-03 US US12/997,211 patent/US9196460B2/en active Active
- 2009-06-03 CN CN2009801214626A patent/CN102057465A/zh active Pending
- 2009-06-03 KR KR1020107024030A patent/KR101202270B1/ko active Active
- 2009-06-09 TW TW098119217A patent/TW201015653A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CN102760633A (zh) | 2012-10-31 |
| US20110180213A1 (en) | 2011-07-28 |
| JP2009302205A (ja) | 2009-12-24 |
| WO2009150979A1 (ja) | 2009-12-17 |
| TW201015653A (en) | 2010-04-16 |
| CN102760633B (zh) | 2015-09-02 |
| US9196460B2 (en) | 2015-11-24 |
| CN102057465A (zh) | 2011-05-11 |
| JP5520455B2 (ja) | 2014-06-11 |
| KR20100126571A (ko) | 2010-12-01 |
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