JP4568089B2 - 温度制御システムを備えた熱処理装置 - Google Patents
温度制御システムを備えた熱処理装置 Download PDFInfo
- Publication number
- JP4568089B2 JP4568089B2 JP2004330576A JP2004330576A JP4568089B2 JP 4568089 B2 JP4568089 B2 JP 4568089B2 JP 2004330576 A JP2004330576 A JP 2004330576A JP 2004330576 A JP2004330576 A JP 2004330576A JP 4568089 B2 JP4568089 B2 JP 4568089B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- processing
- substrate
- heat treatment
- heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B17/00—Furnaces of a kind not covered by any of groups F27B1/00 - F27B15/00
- F27B17/0016—Chamber type furnaces
- F27B17/0025—Chamber type furnaces specially adapted for treating semiconductor wafers
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D19/00—Arrangements of controlling devices
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D21/00—Arrangement of monitoring devices; Arrangement of safety devices
- F27D21/0014—Devices for monitoring temperature
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/1927—Control of temperature characterised by the use of electric means using a plurality of sensors
- G05D23/193—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces
- G05D23/1931—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces to control the temperature of one space
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/36—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations using air tracks
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Remote Sensing (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/713,543 US6940047B2 (en) | 2003-11-14 | 2003-11-14 | Heat treatment apparatus with temperature control system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005203743A JP2005203743A (ja) | 2005-07-28 |
| JP2005203743A5 JP2005203743A5 (https=) | 2007-03-01 |
| JP4568089B2 true JP4568089B2 (ja) | 2010-10-27 |
Family
ID=34619869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004330576A Expired - Lifetime JP4568089B2 (ja) | 2003-11-14 | 2004-11-15 | 温度制御システムを備えた熱処理装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6940047B2 (https=) |
| JP (1) | JP4568089B2 (https=) |
Families Citing this family (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10227953B4 (de) * | 2002-06-22 | 2005-04-07 | Schott Glas | Druckeinrichtung |
| EP1803328B1 (en) * | 2004-09-30 | 2012-04-11 | Watlow Electric Manufacturing Company | Modular layered heater system |
| US7217670B2 (en) * | 2004-11-22 | 2007-05-15 | Asm International N.V. | Dummy substrate for thermal reactor |
| US7980481B2 (en) * | 2004-12-08 | 2011-07-19 | Rosemount Inc. | Thermally controlled process interface |
| US7482555B2 (en) * | 2004-12-23 | 2009-01-27 | Au Optronics Corporation | Substrate transportation device (air) |
| EP2021279A2 (en) * | 2006-04-13 | 2009-02-11 | Cabot Corporation | Production of silicon through a closed-loop process |
| US8043087B2 (en) * | 2006-10-11 | 2011-10-25 | Raytheon Company | Methods and apparatus for thermal development of large area solids |
| JP5226206B2 (ja) * | 2006-12-22 | 2013-07-03 | 三井造船株式会社 | 誘導加熱を用いた熱処理方法および熱処理装置 |
| KR100820650B1 (ko) * | 2007-03-15 | 2008-04-08 | 주식회사 경동네트웍 | 난방장치 제어방법 |
| JP5021347B2 (ja) * | 2007-03-26 | 2012-09-05 | 三井造船株式会社 | 熱処理装置 |
| US11738130B2 (en) | 2008-01-23 | 2023-08-29 | Deka Products Limited Partnership | Fluid line autoconnect apparatus and methods for medical treatment system |
| US11833281B2 (en) | 2008-01-23 | 2023-12-05 | Deka Products Limited Partnership | Pump cassette and methods for use in medical treatment system using a plurality of fluid lines |
| MX340210B (es) | 2008-01-23 | 2016-06-29 | Deka Products Ltd Partnership * | Componentes desechables para sistemas y métodos de autoconexión de una linea de fluido. |
| US10195330B2 (en) | 2008-01-23 | 2019-02-05 | Deka Products Limited Partnership | Medical treatment system and methods using a plurality of fluid lines |
| US8315746B2 (en) | 2008-05-30 | 2012-11-20 | Apple Inc. | Thermal management techniques in an electronic device |
| US8002463B2 (en) * | 2008-06-13 | 2011-08-23 | Asm International N.V. | Method and device for determining the temperature of a substrate |
| US12171922B2 (en) | 2008-08-27 | 2024-12-24 | Deka Products Limited Partnership | Blood treatment systems and methods |
| WO2010038674A1 (ja) * | 2008-09-30 | 2010-04-08 | 東京エレクトロン株式会社 | 基板の異常載置状態の検知方法、基板処理方法、コンピュータ読み取り可能な記憶媒体および基板処理装置 |
| US8306772B2 (en) | 2008-10-13 | 2012-11-06 | Apple Inc. | Method for estimating temperature at a critical point |
| US20100130352A1 (en) * | 2008-11-25 | 2010-05-27 | Dabich Ii Leonard Charles | Methods For Processing Shaped Bodies |
| US20100127418A1 (en) * | 2008-11-25 | 2010-05-27 | Ronald Alan Davidson | Methods For Continuous Firing Of Shaped Bodies And Roller Hearth Furnaces Therefor |
| US20100127421A1 (en) * | 2008-11-25 | 2010-05-27 | Dabich Ii Leonard Charles | Bi-directional flow for processing shaped bodies |
| JP2011091386A (ja) * | 2009-09-24 | 2011-05-06 | Semiconductor Energy Lab Co Ltd | 熱処理装置、熱処理方法及び半導体装置の作製方法 |
| DE112012001031T5 (de) * | 2011-02-28 | 2013-11-28 | Ihi Corporation | Vorrichtung und Verfahren zum Messen der Temperatur eines wärmebehandelten Werkstücks |
| EP3498316B1 (en) | 2011-11-04 | 2020-07-22 | DEKA Products Limited Partnership | Medical treatment system and methods using a plurality of fluid lines |
| JP6304660B2 (ja) * | 2012-08-07 | 2018-04-04 | パナソニックIpマネジメント株式会社 | バッテリーヒータ装置 |
| US8691598B1 (en) * | 2012-12-06 | 2014-04-08 | Ultratech, Inc. | Dual-loop control for laser annealing of semiconductor wafers |
| US8772055B1 (en) * | 2013-01-16 | 2014-07-08 | Applied Materials, Inc. | Multizone control of lamps in a conical lamphead using pyrometers |
| JP6324739B2 (ja) * | 2014-01-27 | 2018-05-16 | 株式会社Kelk | 半導体ウェーハの温度制御装置、及び半導体ウェーハの温度制御方法 |
| US10006717B2 (en) | 2014-03-07 | 2018-06-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Adaptive baking system and method of using the same |
| KR101448546B1 (ko) * | 2014-04-16 | 2014-10-14 | 주식회사 이엔씨 테크놀로지 | 공기 순환 유닛을 갖는 평면 디스플레이 패널의 열처리 장치 및 그 열처리 방법 |
| US10453714B2 (en) | 2016-08-05 | 2019-10-22 | Sandvik Thermal Process, Inc. | Thermal process device |
| JP6798017B6 (ja) * | 2016-10-17 | 2021-01-13 | エーエスエムエル ネザーランズ ビー.ブイ. | 基板にわたってパラメータ変動を修正する処理装置及び方法 |
| US10851457B2 (en) | 2017-08-31 | 2020-12-01 | Lam Research Corporation | PECVD deposition system for deposition on selective side of the substrate |
| CN108088246A (zh) * | 2017-12-22 | 2018-05-29 | 合肥费舍罗热工装备有限公司 | 一种立式梯度炉 |
| KR102403198B1 (ko) | 2019-07-19 | 2022-05-27 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| JP2022544221A (ja) * | 2019-08-16 | 2022-10-17 | ラム リサーチ コーポレーション | ウエハ内の様々な反りを補償するために空間を調整する堆積 |
| EP4200900A1 (en) * | 2020-08-18 | 2023-06-28 | Mattson Technology, Inc. | Rapid thermal processing system with cooling system |
| CN112852469A (zh) * | 2021-03-26 | 2021-05-28 | 杰瑞环保科技有限公司 | 含油固体物料处理系统和含油固体物料处理方法 |
| CN113340125A (zh) * | 2021-06-08 | 2021-09-03 | 吉林麦吉柯半导体有限公司 | 推拉控制设备和扩散炉系统 |
| KR20230004095A (ko) * | 2021-06-30 | 2023-01-06 | 주성엔지니어링(주) | 캐니스터 온도 제어 방법 및 원료 공급 장치 |
| CN115674550B (zh) * | 2022-10-26 | 2024-02-23 | 安徽尚诺捷顺智能科技有限公司 | 用于冰箱门体生产的固化烘炉 |
| CN118522686B (zh) * | 2024-07-22 | 2024-11-19 | 无锡邑文微电子科技股份有限公司 | 一种晶圆夹持及热处理设备 |
| CN120816690B (zh) * | 2025-09-16 | 2025-12-02 | 湖南科太科技有限公司 | 用于注胶模具智能温控的软启动控制方法 |
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-
2003
- 2003-11-14 US US10/713,543 patent/US6940047B2/en not_active Expired - Lifetime
-
2004
- 2004-11-15 JP JP2004330576A patent/JP4568089B2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US6940047B2 (en) | 2005-09-06 |
| US20050115945A1 (en) | 2005-06-02 |
| JP2005203743A (ja) | 2005-07-28 |
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