JP4036923B2 - 表示装置およびその駆動回路 - Google Patents

表示装置およびその駆動回路 Download PDF

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Publication number
JP4036923B2
JP4036923B2 JP20857097A JP20857097A JP4036923B2 JP 4036923 B2 JP4036923 B2 JP 4036923B2 JP 20857097 A JP20857097 A JP 20857097A JP 20857097 A JP20857097 A JP 20857097A JP 4036923 B2 JP4036923 B2 JP 4036923B2
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JP
Japan
Prior art keywords
channel
tft
type tft
drain
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP20857097A
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English (en)
Japanese (ja)
Other versions
JPH1138447A (ja
JPH1138447A5 (enExample
Inventor
舜平 山崎
潤 小山
豊 塩野入
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP20857097A priority Critical patent/JP4036923B2/ja
Priority to US09/115,841 priority patent/US6292183B1/en
Priority to KR1019980028526A priority patent/KR100635084B1/ko
Priority to TW087111683A priority patent/TW401583B/zh
Priority to DE19832297.6A priority patent/DE19832297B4/de
Publication of JPH1138447A publication Critical patent/JPH1138447A/ja
Priority to US09/946,364 priority patent/US6525719B2/en
Publication of JPH1138447A5 publication Critical patent/JPH1138447A5/ja
Application granted granted Critical
Publication of JP4036923B2 publication Critical patent/JP4036923B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2310/00Command of the display device
    • G09G2310/02Addressing, scanning or driving the display screen or processing steps related thereto
    • G09G2310/0264Details of driving circuits
    • G09G2310/0289Details of voltage level shifters arranged for use in a driving circuit
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611Control of matrices with row and column drivers
    • G09G3/3685Details of drivers for data electrodes
    • G09G3/3688Details of drivers for data electrodes suitable for active matrices only

Landscapes

  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
JP20857097A 1997-07-17 1997-07-17 表示装置およびその駆動回路 Expired - Fee Related JP4036923B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP20857097A JP4036923B2 (ja) 1997-07-17 1997-07-17 表示装置およびその駆動回路
KR1019980028526A KR100635084B1 (ko) 1997-07-17 1998-07-15 표시장치및그의구동회로
US09/115,841 US6292183B1 (en) 1997-07-17 1998-07-15 Display device and drive circuit therefor
DE19832297.6A DE19832297B4 (de) 1997-07-17 1998-07-17 Anzeigevorrichtung und Treiberschaltkreis dafür
TW087111683A TW401583B (en) 1997-07-17 1998-07-17 Display device and drive circuit therefor
US09/946,364 US6525719B2 (en) 1997-07-17 2001-09-06 Display device and drive circuit therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20857097A JP4036923B2 (ja) 1997-07-17 1997-07-17 表示装置およびその駆動回路

Publications (3)

Publication Number Publication Date
JPH1138447A JPH1138447A (ja) 1999-02-12
JPH1138447A5 JPH1138447A5 (enExample) 2005-06-09
JP4036923B2 true JP4036923B2 (ja) 2008-01-23

Family

ID=16558380

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20857097A Expired - Fee Related JP4036923B2 (ja) 1997-07-17 1997-07-17 表示装置およびその駆動回路

Country Status (5)

Country Link
US (2) US6292183B1 (enExample)
JP (1) JP4036923B2 (enExample)
KR (1) KR100635084B1 (enExample)
DE (1) DE19832297B4 (enExample)
TW (1) TW401583B (enExample)

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JP3866070B2 (ja) 2000-10-20 2007-01-10 株式会社 日立ディスプレイズ 表示装置
JP2002236472A (ja) * 2001-02-08 2002-08-23 Semiconductor Energy Lab Co Ltd 液晶表示装置およびその駆動方法
JP4785271B2 (ja) * 2001-04-27 2011-10-05 株式会社半導体エネルギー研究所 液晶表示装置、電子機器
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WO2003107314A2 (en) * 2002-06-01 2003-12-24 Samsung Electronics Co., Ltd. Method of driving a shift register, a shift register, a liquid crystal display device having the shift register
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US7274350B2 (en) * 2004-01-22 2007-09-25 Au Optronics Corp. Analog buffer for LTPS amLCD
US7355418B2 (en) 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US7319335B2 (en) 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
US6833717B1 (en) 2004-02-12 2004-12-21 Applied Materials, Inc. Electron beam test system with integrated substrate transfer module
US20050184407A1 (en) * 2004-02-20 2005-08-25 Takahiro Korenari Transistor circuit, thin film transistor circuit and display device
JP4869569B2 (ja) * 2004-06-23 2012-02-08 株式会社 日立ディスプレイズ 表示装置
KR100685814B1 (ko) * 2005-02-18 2007-02-22 삼성에스디아이 주식회사 스캔 드라이버 및 이를 구비한 평판 표시 장치
JP4821954B2 (ja) * 2005-03-25 2011-11-24 日本電気株式会社 アナログバッファ回路
US7323924B2 (en) * 2005-04-19 2008-01-29 Semiconductor Energy Laboratory Co., Ltd. Level shifter circuit
US7535238B2 (en) 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
JP4864408B2 (ja) * 2005-09-30 2012-02-01 シャープ株式会社 アクティブマトリクス基板
KR100714014B1 (ko) * 2005-12-13 2007-05-04 삼성에스디아이 주식회사 유기 발광 표시장치
TWI323788B (en) 2006-03-14 2010-04-21 Applied Materials Inc Method to reduce cross talk in a multi column e-beam test system
TW200746022A (en) * 2006-04-19 2007-12-16 Ignis Innovation Inc Stable driving scheme for active matrix displays
US7602199B2 (en) 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing
US7786742B2 (en) 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
US7443202B2 (en) * 2006-06-02 2008-10-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic apparatus having the same
CN101287329B (zh) * 2007-04-13 2011-04-20 群康科技(深圳)有限公司 显示装置
EP2477172A4 (en) * 2009-09-11 2016-03-23 Sharp Kk Active Matrix Substrate and Active Matrix Display Device
JP5101669B2 (ja) * 2010-08-02 2012-12-19 株式会社ジャパンディスプレイイースト 表示装置
TWI563488B (en) * 2016-02-01 2016-12-21 Sitronix Technology Corp Gate driving circuit
CN115295560B (zh) * 2022-08-05 2024-08-02 厦门天马显示科技有限公司 显示面板和显示装置

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Also Published As

Publication number Publication date
JPH1138447A (ja) 1999-02-12
DE19832297A1 (de) 1999-01-21
KR100635084B1 (ko) 2007-01-31
US6292183B1 (en) 2001-09-18
US6525719B2 (en) 2003-02-25
TW401583B (en) 2000-08-11
US20020008695A1 (en) 2002-01-24
KR19990013868A (ko) 1999-02-25
DE19832297B4 (de) 2016-10-20

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