JP2012042970A5 - - Google Patents
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- Publication number
- JP2012042970A5 JP2012042970A5 JP2011217896A JP2011217896A JP2012042970A5 JP 2012042970 A5 JP2012042970 A5 JP 2012042970A5 JP 2011217896 A JP2011217896 A JP 2011217896A JP 2011217896 A JP2011217896 A JP 2011217896A JP 2012042970 A5 JP2012042970 A5 JP 2012042970A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- imaging
- objective lens
- image pickup
- sample mounting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 claims 18
- 238000001000 micrograph Methods 0.000 claims 7
- 230000007246 mechanism Effects 0.000 claims 5
- 230000003287 optical effect Effects 0.000 claims 4
- 238000005259 measurement Methods 0.000 claims 3
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011217896A JP5209103B2 (ja) | 2005-03-17 | 2011-09-30 | 顕微鏡画像撮像装置 |
| US13/611,227 US20130084390A1 (en) | 2005-03-17 | 2012-09-12 | Film-forming apparatus and film-forming method |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005077990 | 2005-03-17 | ||
| JP2005077990 | 2005-03-17 | ||
| JP2011217896A JP5209103B2 (ja) | 2005-03-17 | 2011-09-30 | 顕微鏡画像撮像装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007508232A Division JP4871264B2 (ja) | 2005-03-17 | 2006-03-17 | 顕微鏡画像撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012042970A JP2012042970A (ja) | 2012-03-01 |
| JP2012042970A5 true JP2012042970A5 (enExample) | 2012-08-09 |
| JP5209103B2 JP5209103B2 (ja) | 2013-06-12 |
Family
ID=36991787
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007508232A Expired - Lifetime JP4871264B2 (ja) | 2005-03-17 | 2006-03-17 | 顕微鏡画像撮像装置 |
| JP2011217896A Expired - Lifetime JP5209103B2 (ja) | 2005-03-17 | 2011-09-30 | 顕微鏡画像撮像装置 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007508232A Expired - Lifetime JP4871264B2 (ja) | 2005-03-17 | 2006-03-17 | 顕微鏡画像撮像装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8422127B2 (enExample) |
| EP (1) | EP1865354B1 (enExample) |
| JP (2) | JP4871264B2 (enExample) |
| WO (1) | WO2006098443A1 (enExample) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| WO2010122547A1 (en) * | 2009-04-20 | 2010-10-28 | Bio-Rad Laboratories Inc. | Non-scanning surface plasmon resonance ( spr) system |
| JP5443096B2 (ja) * | 2009-08-12 | 2014-03-19 | 株式会社ニューフレアテクノロジー | 半導体製造装置および半導体製造方法 |
| JP5732284B2 (ja) * | 2010-08-27 | 2015-06-10 | 株式会社ニューフレアテクノロジー | 成膜装置および成膜方法 |
| GB2494734B (en) * | 2011-09-14 | 2016-04-06 | Malvern Instr Ltd | Apparatus and method for measuring particle size distribution by light scattering |
| JP6136085B2 (ja) * | 2011-10-05 | 2017-05-31 | ソニー株式会社 | 画像取得装置、画像取得方法、およびコンピュータプログラム |
| JP5981241B2 (ja) * | 2012-06-25 | 2016-08-31 | 浜松ホトニクス株式会社 | 顕微鏡撮像装置及び顕微鏡撮像方法 |
| JP6027875B2 (ja) * | 2012-12-07 | 2016-11-16 | オリンパス株式会社 | 撮像装置及び顕微鏡システム |
| JP6010450B2 (ja) | 2012-12-20 | 2016-10-19 | 浜松ホトニクス株式会社 | 光観察装置及び光観察方法 |
| JP6147006B2 (ja) * | 2013-01-09 | 2017-06-14 | オリンパス株式会社 | 撮像装置、顕微鏡システム及び撮像方法 |
| JP6086366B2 (ja) | 2013-04-05 | 2017-03-01 | 国立研究開発法人理化学研究所 | 顕微鏡、焦準器具、流体保持器具、及び光学ユニット |
| HUE052489T2 (hu) * | 2013-04-26 | 2021-04-28 | Hamamatsu Photonics Kk | Képfelvevõ berendezés és eljárás és rendszer fókusztérkép elõállítására minta számára |
| EP2990851B1 (en) | 2013-04-26 | 2020-09-09 | Hamamatsu Photonics K.K. | Image acquisition device and focusing method for image acquisition device |
| US10330910B2 (en) | 2013-04-26 | 2019-06-25 | Hamamatsu Photonics K.K. | Image acquisition device and method and system for acquiring focusing information for specimen |
| JP6134249B2 (ja) * | 2013-11-01 | 2017-05-24 | 浜松ホトニクス株式会社 | 画像取得装置及び画像取得装置の画像取得方法 |
| WO2015077819A1 (en) | 2013-11-26 | 2015-06-04 | Ansell Limited | Effervescent texturing |
| US10145013B2 (en) | 2014-01-27 | 2018-12-04 | Veeco Instruments Inc. | Wafer carrier having retention pockets with compound radii for chemical vapor desposition systems |
| CN110211859B (zh) * | 2014-03-12 | 2021-10-22 | 应用材料公司 | 处理基板的方法 |
| EP3239691B1 (en) * | 2014-12-26 | 2021-11-17 | Sysmex Corporation | Cell imaging device, cell imaging method, and sample cell |
| HU231246B1 (hu) | 2015-08-31 | 2022-05-28 | 3Dhistech Kft | Konfokális elvû tárgylemez szkenner |
| WO2017154895A1 (ja) * | 2016-03-09 | 2017-09-14 | 浜松ホトニクス株式会社 | 測定装置、観察装置および測定方法 |
| DE102016107336B4 (de) * | 2016-04-20 | 2017-11-02 | Carl Zeiss Industrielle Messtechnik Gmbh | Koordinatenmessgerät, Verfahren zur Herstellung eines Koordinatenmessgeräts und Verfahren zur Messung eines optischen Filters |
| CN106094194B (zh) * | 2016-08-17 | 2019-06-14 | 江浩 | 显微镜下样本图片的获取方法、成像装置及其获取样本图片的方法 |
| US10636628B2 (en) * | 2017-09-11 | 2020-04-28 | Applied Materials, Inc. | Method for cleaning a process chamber |
| US11368614B2 (en) | 2018-07-23 | 2022-06-21 | Genemind Biosciences Company Limited | Imaging method, device and system |
| WO2020046567A1 (en) | 2018-08-29 | 2020-03-05 | Applied Materials, Inc. | Chamber injector |
| JP7312020B2 (ja) * | 2019-05-30 | 2023-07-20 | 株式会社Screenホールディングス | 熱処理方法および熱処理装置 |
| US11523046B2 (en) * | 2019-06-03 | 2022-12-06 | Molecular Devices, Llc | System and method to correct for variation of in-focus plane across a field of view of a microscope objective |
| US11499817B2 (en) * | 2020-05-29 | 2022-11-15 | Mitutoyo Corporation | Coordinate measuring machine with vision probe for performing points-from-focus type measurement operations |
| TW202212620A (zh) * | 2020-06-02 | 2022-04-01 | 荷蘭商Asm Ip私人控股有限公司 | 處理基板之設備、形成膜之方法、及控制用於處理基板之設備之方法 |
| WO2022123944A1 (ja) * | 2020-12-08 | 2022-06-16 | ソニーグループ株式会社 | スライドガラス搬送装置及びスライドガラス撮影システム |
| CN113686857B (zh) * | 2021-08-31 | 2024-07-19 | 杭州智微信息科技有限公司 | 一种用于骨髓涂片扫描仪的玻片盒旋转升降结构 |
| IL298509B2 (en) * | 2022-11-23 | 2024-04-01 | Applied Materials Israel Ltd | Optical systems and a method for their calibration |
| JP2025185817A (ja) * | 2024-06-11 | 2025-12-23 | 矢崎総業株式会社 | 画像検査装置及び画像検査方法 |
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| US3826558A (en) * | 1972-07-21 | 1974-07-30 | Us Air Force | Mechanical rotary tilt stage |
| US4328553A (en) * | 1976-12-07 | 1982-05-04 | Computervision Corporation | Method and apparatus for targetless wafer alignment |
| JPS60134117U (ja) * | 1984-02-16 | 1985-09-06 | アルプス電気株式会社 | 光学式ロ−タリエンコ−ダ |
| US4819167A (en) * | 1987-04-20 | 1989-04-04 | Applied Materials, Inc. | System and method for detecting the center of an integrated circuit wafer |
| US4833790A (en) * | 1987-05-11 | 1989-05-30 | Lam Research | Method and system for locating and positioning circular workpieces |
| JPH0658795B2 (ja) | 1989-05-09 | 1994-08-03 | 日本電子株式会社 | ダイナミックフォーカス回路 |
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| JP2572767Y2 (ja) * | 1991-01-25 | 1998-05-25 | 日本分光株式会社 | 顕微赤外スペクトル測定装置 |
| US5337178A (en) * | 1992-12-23 | 1994-08-09 | International Business Machines Corporation | Titlable optical microscope stage |
| JPH06309035A (ja) | 1993-04-21 | 1994-11-04 | Hitachi Ltd | 試料ステージ |
| JPH0756093A (ja) | 1993-08-19 | 1995-03-03 | Fujitsu Ltd | 顕微鏡のステージ装置 |
| JPH07174980A (ja) | 1993-12-17 | 1995-07-14 | Olympus Optical Co Ltd | 顕微鏡ステージ |
| JPH0821961A (ja) * | 1994-07-08 | 1996-01-23 | Matsushita Electric Ind Co Ltd | 顕微鏡の自動焦点装置 |
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| JP2000241713A (ja) | 1999-02-16 | 2000-09-08 | Leica Microsystems Wetzler Gmbh | 試料担持体用ホールダ |
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| CN101911277B (zh) * | 2007-12-27 | 2012-04-04 | 朗姆研究公司 | 确定位置和偏移的装置和方法 |
| KR101749044B1 (ko) * | 2008-05-02 | 2017-06-20 | 어플라이드 머티어리얼스, 인코포레이티드 | 회전하는 기판들에 대한 비 방사상 온도 제어를 위한 시스템 |
| KR101182502B1 (ko) * | 2008-09-30 | 2012-09-12 | 도쿄엘렉트론가부시키가이샤 | 기판의 이상 배치 상태의 검지 방법, 기판 처리 방법, 컴퓨터 판독 가능한 기억 매체 및 기판 처리 장치 |
| US8150242B2 (en) * | 2008-10-31 | 2012-04-03 | Applied Materials, Inc. | Use of infrared camera for real-time temperature monitoring and control |
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| DE102009010555A1 (de) * | 2009-02-25 | 2010-09-02 | Siltronic Ag | Verfahren zum Erkennen einer Fehllage einer Halbleiterscheibe während einer thermischen Behandlung |
| JP5384220B2 (ja) * | 2009-06-22 | 2014-01-08 | 東京応化工業株式会社 | アライメント装置およびアライメント方法 |
| JP5038381B2 (ja) * | 2009-11-20 | 2012-10-03 | 株式会社東芝 | サセプタおよび成膜装置 |
-
2006
- 2006-03-17 WO PCT/JP2006/305434 patent/WO2006098443A1/ja not_active Ceased
- 2006-03-17 EP EP06729423.1A patent/EP1865354B1/en not_active Expired - Lifetime
- 2006-03-17 JP JP2007508232A patent/JP4871264B2/ja not_active Expired - Lifetime
- 2006-03-17 US US11/886,255 patent/US8422127B2/en active Active
-
2011
- 2011-09-30 JP JP2011217896A patent/JP5209103B2/ja not_active Expired - Lifetime
-
2012
- 2012-09-12 US US13/611,227 patent/US20130084390A1/en not_active Abandoned
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