JP2006261666A - 高効率無機ナノロッド強化光起電素子 - Google Patents
高効率無機ナノロッド強化光起電素子 Download PDFInfo
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- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035209—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures
- H01L31/035227—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures the quantum structure being quantum wires, or nanorods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/108—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type
- H01L31/1085—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the Schottky type the devices being of the Metal-Semiconductor-Metal [MSM] Schottky barrier type
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Abstract
【解決手段】 光起電素子は、基板と、その基板上にほぼ垂直な配向で配置された1次元ナノ構造のアレイを含む第1の領域と、第1の領域との接触が少なくとも1つの電荷分離接合を形成するように該第1の領域の上に存在する第2の領域と、第2の領域の上に層として存在する導電性透明材料を含む第3の領域と、該素子を外部回路に接続する働きをする上部及び下部接点とを含み、下部接点が第1の領域と電気接触しかつ上部接点が第2の領域と電気接触している。
【選択図】 図1
Description
実施例1
この実施例は、ウェットエッチングを使用して、本発明のPV素子で使用するナノワイヤアレイを作る実施形態を説明する。
実施例2
この実施例は、本発明のPV素子で使用する整列ナノワイヤアレイのCVD成長を示している。
実施例3
この実施例は、本発明の実施形態による太陽電池素子の製作を示している。
実施例4
この実施例は、本発明の代表的実施形態であるような太陽電池素子の作動特性を示す。
101a 上部セグメント(第1の領域)
101b 下部セグメント(第2の領域)
103 基板
104 誘電体材料
105 上部接点(第3の領域)
Claims (10)
- 光起電素子であって、
a)基板(103)と、
b)前記基板上にほぼ垂直な配向で配置された1次元ナノ構造のアレイを含む第1の領域(101a)と、
c)前記第1の領域との接触が少なくとも1つの電荷分離接合を形成するように該第1の領域の上に存在する第2の領域(101b)と、
d)前記第2の領域の上に層として存在する導電性透明材料を含む第3の領域(105)と、
e)該素子を外部回路に接続する働きをする上部及び下部接点と、を含み、
前記下部接点が前記第1の領域と電気接触しかつ前記上部接点が前記第2の領域と電気接触しており、
前記第1(101a)、第2(101b)及び第3(105)の領域が、無機構成要素だけで構成される、
光起電素子。 - 前記第2の領域(101b)が、前記第1の領域(101a)の1次元ナノ構造の延長部として存在し、前記第1及び第2の領域が、その内部に前記電荷分離接合が存在するように全体として1次元ナノ構造のアレイを形成する、
請求項1記載の光起電素子。 - 前記1次元ナノ構造の少なくとも幾つかが、多数の電荷分離接合を含む、請求項2記載の光起電素子。
- 前記第1及び第2の領域の少なくとも1つが、不均質サブ領域を含み、前記サブ領域が、不均質ドーピング、不均質組成及びそれらの組合せからなる群から選択される特性によって不均質になっている、
請求項2記載の光起電素子。 - 光起電素子を製作する方法であって、
a)基板上に、該基板に対してほぼ垂直な配向で該基板上に配置された1次元ナノ構造のアレイを含む第1の領域を形成するステップと、
b)前記第1の領域との接触が少なくとも1つの電荷分離接合を形成するように該第1の領域の上に第2の領域の材料を設置するステップと、
c)光学的に透明な導電性材料を含む第3の領域を前記第2の領域の上に層として設けるステップと、
d)該素子を外部回路に接続する働きをする上部及び下部接点を、該下部接点が前記第1の領域と電気接触しかつ該上部接点が前記第2の領域と電気接触するように設けるステップと、
を含む方法。 - 前記第1の領域を形成するステップが、半導体材料をウェットエッチングするステップを含む、請求項5記載の方法。
- 前記第1の領域を形成するステップ及び前記第2の領域を設置するステップが、硝酸銀を含むフッ化水素酸水溶液でプレーナ・シリコンp−n接合をウェットエッチングして、通常ドープシリコン基板上にアレイ配置されたドープシリコンナノワイヤの第1の領域と前記第1の領域のドープシリコンナノワイヤの延長部でありかつ全体としてヘテロ接合1次元シリコンナノ構造ワイヤのアレイを形成する異極性ドープシリコンコンナノワイヤの第2の領域とを設けるステップを含む、
請求項6記載の方法。 - 前記基板上に第1の領域を形成するステップが、
a)前記基板上に金属触媒ナノ粒子を設置するステップと、
b)化学気相蒸着、レーザアブレーション、分子線エピタキシ、原子層蒸着、超臨界点化学気相蒸着、プラズマ化学気相蒸着、低圧化学気相蒸着、スパッタリング、蒸発蒸着及びそれらの組合せからなる群から選択される堆積方法を使用して前記金属触媒ナノ粒子から1次元ナノ構造を成長させるステップと、
をさらに含む、請求項5記載の方法。 - 前記基板上に金属触媒ナノ粒子を設置するステップが、
a)前記基板上に金属触媒薄膜を堆積させるステップと、
b)前記金属触媒薄膜をアニールして金属触媒ナノ粒子を形成するステップと、
をさらに含む、請求項8記載の方法。 - 光起電素子であって、
a)基板(2301)と、
b)前記基板上に配置されかつその内部に電荷分離接合が存在する半導体材料の分岐ナノ構造のアレイを含む第1の領域(2302)と、
c)前記第1の領域の上に層として存在する導電性透明材料を含む第2の領域(2304)と、
d)該素子を外部回路に接続する働きをする上部及び下部接点(2305)と、を含み、
前記第1及び第2の領域が、無機構成要素だけで構成される、
光起電素子。
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