JP2005183934A - オフセット接合型マルチチップ半導体装置 - Google Patents
オフセット接合型マルチチップ半導体装置 Download PDFInfo
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Abstract
【解決手段】 基板2の一面にボールバンプ1が配設され、基板2の他面に第1のチップ3が搭載されている。第2のチップ4を第1のチップ3に対して平行にずらして第1のチップ3と第2のチップ4がバンプ5,6によって接合されている。第1のチップ3と第2のチップ4の接合状態において、第1のチップ3の一部と第2のチップ4の一部とがそれぞれのチップの中心が一致しないで重なっている。さらに、第2のチップ4の重心が、第1のチップ3と第2のチップ4の間の最外周のバンプで囲まれた領域の内側にある。
【選択図】 図1
Description
図1は本発明の第1の実施の形態によるCOC型半導体装置の構造を示す側面図、図2は図1に示した半導体装置の平面図である。
第1の実施形態では2個のチップを基板上に積層した半導体装置を例に挙げて説明したが、ここでは3個以上のチップを基板上に積層した半導体装置を例に挙げて説明する。
2 基板
3 第1のチップ
4 第2のチップ
5、6、21、22 バンプ
7 バンプエリア(第1のバンプ領域)
8、9、10 ボンディングパッド
11 電源用バンプ群
12 I/O用バンプ群
13 GND用バンプ群
14、15 バンプ群
16 第3のチップ
17 第4のチップ
18 第5のチップ
19 第6のチップ
20 スルーホール
23 中心線
24 ダミーチップ
25 ダミーバンプエリア(第2のバンプ領域)
26 中間領域
27〜50 バンプ群
Claims (16)
- 第1の半導体素子の上に第2の半導体素子がそれぞれの半導体素子の中心が一致しないで重なり、重なった領域において、前記第2の半導体素子に形成された電極が前記第1の半導体素子に形成された電極にバンプにより接合されている半導体装置において、
前記第2の半導体素子の重心が、前記第1の半導体素子と前記第2の半導体素子を接合する前記バンプの最外周バンプによって囲まれた第一のバンプ領域の内側にあることを特徴とする半導体装置。 - 第1の半導体素子の上に第2の半導体素子がそれぞれの半導体素子の中心が一致しないで、前記第2の半導体素子の一つの端面が前記第1の半導体素子の少なくとも一つの端面からはみ出した状態で重なり、
前記重なった領域において、前記第2の半導体素子に形成された電極が前記第1の半導体素子に形成された電極にバンプにより接合されており、
前記第2の半導体素子のはみ出し領域の下にダミーチップが配置され、かつ前記第2の半導体素子に形成された電極が前記ダミーチップに形成された電極にバンプにより接合されており、
前記第2の半導体素子の重心が、前記第1の半導体素子と前記第2の半導体素子を接合するバンプの最外周バンプによって囲まれた第1のバンプ領域および前記第2の半導体素子と前記ダミーチップを接合するバンプの最外周バンプによって囲まれた第2のバンプ領域の各々の全領域を包含するように、前記第1のバンプ領域の最外周バンプと前記第2のバンプ領域の最外周バンプとを直線で結んでできる最大の範囲となる領域内にあることを特徴とする半導体装置。 - 前記第一のバンプ領域の中心と前記第2の半導体素子の重心が一致している請求項1または2に記載の半導体装置。
- 前記第一のバンプ領域が、入出力用、電源用、GND用の3つのバンプ群からなる請求項1乃至3のいずれか一に記載の半導体装置。
- 前記第2の半導体素子がメモリチップである請求項1乃至4のいずれか一に記載の半導体装置。
- 前記第一のバンプ領域が、前記第2の半導体素子の中心線を基準に少なくとも一軸に対して対称に形成されたバンプ群からなる請求項1乃至3のいずれか一に記載の半導体装置。
- 前記第1の半導体素子の、前記第2の半導体素子が重なっていない領域に複数の外部接続端子が配設され、該複数の外部接続端子の配置が千鳥配列になっている請求項1乃至3のいずれか一に記載の半導体装置。
- 前記第2の半導体素子の上に第3の半導体素子が重ねられ、該第3の半導体素子の重心が前記第2の半導体素子の重心と一致している請求項1乃至7のいずれか一に記載の半導体装置。
- 前記第2の半導体素子の上に複数個の半導体素子が重ねられ、前記複数個の半導体素子の各々の重心が前記第2の半導体素子の重心と一致している請求項1乃至7のいずれか一に記載の半導体装置。
- 前記第2の半導体素子の一つの端面が前記第1の半導体素子の少なくとも一つの端面からはみ出した状態で、前記第1の半導体素子および前記第2の半導体素子が接合されている請求項1,3乃至9のいずれか一に記載の半導体装置。
- 前記ダミーチップが第1の半導体素子の熱膨張係数と近い熱膨張係数を有する材料である、請求項2に記載の半導体装置。
- 前記ダミーチップがSiからなる、請求項11に記載の半導体装置。
- 前記第1の半導体素子の厚みと前記第1の半導体素子に形成された接合前のバンプの高さとを加えた量を最大値とし、接合後における前記第1の半導体素子の裏面と前記第2の半導体素子の表面の間の距離から前記第2の半導体素子に形成された接合前のバンプの高さを引いた量を最小値とし、前記ダミーチップの厚さが前記最大値と前記最小値の間にある、請求項2,11,12のいずれか一に記載の半導体装置。
- 前記ダミーチップの表面に金属膜が形成されている、請求項2,11乃至13のいずれか一に記載の半導体装置。
- 前記金属膜がCr膜の上にAu膜を形成した金属膜である、請求項14に記載の半導体装置。
- 前記ダミーチップの厚みが前記第1の半導体素子の厚みと同等である、請求項2,11,12のいずれか一に記載の半導体装置。
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JP2004317903A JP4580730B2 (ja) | 2003-11-28 | 2004-11-01 | オフセット接合型マルチチップ半導体装置 |
DE102004055215A DE102004055215A1 (de) | 2003-11-28 | 2004-11-16 | Versetzt gebondete Mehrchip-Halbleitervorrichtung |
US10/995,491 US7145247B2 (en) | 2003-11-28 | 2004-11-24 | Offset-bonded, multi-chip semiconductor device |
TW093136257A TWI292616B (en) | 2003-11-28 | 2004-11-25 | Offset-bonded, multi-chip semiconductor device |
CN2004100973854A CN1622326B (zh) | 2003-11-28 | 2004-11-29 | 偏移结合的多芯片半导体器件 |
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JP2004317903A JP4580730B2 (ja) | 2003-11-28 | 2004-11-01 | オフセット接合型マルチチップ半導体装置 |
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JP4580730B2 JP4580730B2 (ja) | 2010-11-17 |
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JP (1) | JP4580730B2 (ja) |
CN (1) | CN1622326B (ja) |
DE (1) | DE102004055215A1 (ja) |
TW (1) | TWI292616B (ja) |
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Also Published As
Publication number | Publication date |
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DE102004055215A1 (de) | 2005-07-07 |
JP4580730B2 (ja) | 2010-11-17 |
US20050121802A1 (en) | 2005-06-09 |
US7145247B2 (en) | 2006-12-05 |
TW200527646A (en) | 2005-08-16 |
CN1622326A (zh) | 2005-06-01 |
CN1622326B (zh) | 2010-07-07 |
TWI292616B (en) | 2008-01-11 |
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