JP2001505955A - 銅層の電解析出方法 - Google Patents
銅層の電解析出方法Info
- Publication number
- JP2001505955A JP2001505955A JP52618198A JP52618198A JP2001505955A JP 2001505955 A JP2001505955 A JP 2001505955A JP 52618198 A JP52618198 A JP 52618198A JP 52618198 A JP52618198 A JP 52618198A JP 2001505955 A JP2001505955 A JP 2001505955A
- Authority
- JP
- Japan
- Prior art keywords
- copper
- bath
- deposition
- copper layer
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/58—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
- C25D5/611—Smooth layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/627—Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/241—Reinforcing the conductive pattern characterised by the electroplating method; means therefor, e.g. baths or apparatus
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/423—Plated through-holes or plated via connections characterised by electroplating method
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.短い調製時間内での銅層の電解析出のための方法にして、次の方法ステップ : a.銅イオン、析出浴の導電性を高める少なくとも1種の化合物、銅層の材料特 性に影響を与えるための少なくとも1種の添加剤、電気化学的に可逆な酸化還元 系の少なくとも1種の補助化合物及び溶媒若しくは溶媒混合物を含有する析出浴 の用意すること、 b.電解析出の際に溶解する少なくとも1つの陽極と導電性サブストレートとを 析出浴に接触させること、 c.上記サブストレートと陽極とを電源に電気接続し、パルス電流又はパルス電 圧法によってサブストレート上に銅層を析出すること を備える方法。 2.電気化学的に可逆な酸化還元系の化合物として、鉄、砒素、セリウム、クロ ム、コバルト、金、マンガン、モリブデン、白金、ルテニウム、サマリウム、チ タン、バナジウム、タングステン及び/又は錫の元素の化合物を用いることを特 徴とする請求項1にしたがう方法。 3.析出溶液が酸化還元系の化合物を析出浴1リットル当たり3〜500mgの 濃度で、好ましくは析出浴1リットル当たり25〜100mgの濃度で含有する ことを特徴とする前記請求項の1つにしたがう方法。 4.銅層の析出のために、時間的に相前後する電流及び電圧パルスがサブストレ ートで異なる電流強さで設定され、その際、パルスの少なくとも1つが陰極に他 の少なくとも1つが陽極に又はゼロに設定されることを特徴とする前記請求項の 1つにしたがう方法。 5.電流又は電圧パルスの長さが0.3ミリ秒から30ミリ秒に設定されること を特徴とする請求項4にしたがう方法。 6.導体プレート表面に銅層を電気分解的に析出するための前記請求項の1つに したがう方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19653681.2 | 1996-12-13 | ||
DE19653681A DE19653681C2 (de) | 1996-12-13 | 1996-12-13 | Verfahren zur elektrolytischen Abscheidung von Kupferschichten mit gleichmäßiger Schichtdicke und guten optischen und metallphysikalischen Eigenschaften und Anwendung des Verfahrens |
PCT/EP1997/006786 WO1998026114A1 (de) | 1996-12-13 | 1997-12-04 | Verfahren zur elektrolytischen abscheidung von kupferschichten |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2001505955A true JP2001505955A (ja) | 2001-05-08 |
JP2001505955A5 JP2001505955A5 (ja) | 2005-05-12 |
JP4221064B2 JP4221064B2 (ja) | 2009-02-12 |
Family
ID=7815786
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52618198A Expired - Lifetime JP4221064B2 (ja) | 1996-12-13 | 1997-12-04 | 銅層の電解析出方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6129830A (ja) |
EP (1) | EP0944749B1 (ja) |
JP (1) | JP4221064B2 (ja) |
KR (1) | KR100546989B1 (ja) |
AT (1) | ATE204035T1 (ja) |
CA (1) | CA2275214C (ja) |
DE (2) | DE19653681C2 (ja) |
WO (1) | WO1998026114A1 (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003041400A (ja) * | 2001-08-01 | 2003-02-13 | Toppan Printing Co Ltd | プリント配線基板の製造装置および製造方法 |
JP2009167506A (ja) * | 2008-01-21 | 2009-07-30 | Ebara Udylite Kk | 酸性電解銅めっき液およびこれを用いる微細配線回路の作製方法 |
JP2014513211A (ja) * | 2011-04-26 | 2014-05-29 | アトーテヒ ドイッチュラント ゲゼルシャフト ミット ベシュレンクテル ハフツング | 銅の電解析出用水性酸浴 |
JP2014177670A (ja) * | 2013-03-14 | 2014-09-25 | Dainippon Printing Co Ltd | インターポーザー基板の製造方法。 |
JP2022522513A (ja) * | 2019-11-21 | 2022-04-19 | エスケー ネクシリス カンパニー リミテッド | 引裂またはシワ不良を防止できる電解銅箔、それを含む電極、それを含む二次電池、およびその製造方法 |
WO2023190805A1 (ja) * | 2022-03-31 | 2023-10-05 | 奥野製薬工業株式会社 | Prパルス電解用銅めっき液、及び、prパルス電解法に依る銅めっき方法 |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19915146C1 (de) * | 1999-01-21 | 2000-07-06 | Atotech Deutschland Gmbh | Verfahren zum galvanischen Bilden von Leiterstrukturen aus hochreinem Kupfer bei der Herstellung von integrierten Schaltungen |
JP4394234B2 (ja) * | 2000-01-20 | 2010-01-06 | 日鉱金属株式会社 | 銅電気めっき液及び銅電気めっき方法 |
US6503375B1 (en) * | 2000-02-11 | 2003-01-07 | Applied Materials, Inc | Electroplating apparatus using a perforated phosphorus doped consumable anode |
JP2001267726A (ja) * | 2000-03-22 | 2001-09-28 | Toyota Autom Loom Works Ltd | 配線基板の電解メッキ方法及び配線基板の電解メッキ装置 |
US6491806B1 (en) * | 2000-04-27 | 2002-12-10 | Intel Corporation | Electroplating bath composition |
US6776893B1 (en) * | 2000-11-20 | 2004-08-17 | Enthone Inc. | Electroplating chemistry for the CU filling of submicron features of VLSI/ULSI interconnect |
EP1310582A1 (en) * | 2001-11-07 | 2003-05-14 | Shipley Company LLC | Process for electrolytic copper plating |
US8002962B2 (en) | 2002-03-05 | 2011-08-23 | Enthone Inc. | Copper electrodeposition in microelectronics |
US7316772B2 (en) * | 2002-03-05 | 2008-01-08 | Enthone Inc. | Defect reduction in electrodeposited copper for semiconductor applications |
DE10259362A1 (de) * | 2002-12-18 | 2004-07-08 | Siemens Ag | Verfahren zum Abscheiden einer Legierung auf ein Substrat |
EP1477588A1 (en) * | 2003-02-19 | 2004-11-17 | Rohm and Haas Electronic Materials, L.L.C. | Copper Electroplating composition for wafers |
DE602005022650D1 (de) * | 2004-04-26 | 2010-09-16 | Rohm & Haas Elect Mat | Verbessertes Plattierungsverfahren |
TW200632147A (ja) * | 2004-11-12 | 2006-09-16 | ||
EP1717351A1 (de) * | 2005-04-27 | 2006-11-02 | Enthone Inc. | Galvanikbad |
US20070158199A1 (en) * | 2005-12-30 | 2007-07-12 | Haight Scott M | Method to modulate the surface roughness of a plated deposit and create fine-grained flat bumps |
US20070178697A1 (en) * | 2006-02-02 | 2007-08-02 | Enthone Inc. | Copper electrodeposition in microelectronics |
CN101416569B (zh) * | 2006-03-30 | 2011-04-06 | 埃托特克德国有限公司 | 用金属填充孔和凹处的电解方法 |
US7887693B2 (en) * | 2007-06-22 | 2011-02-15 | Maria Nikolova | Acid copper electroplating bath composition |
US7905994B2 (en) | 2007-10-03 | 2011-03-15 | Moses Lake Industries, Inc. | Substrate holder and electroplating system |
DE102008031003B4 (de) | 2008-06-30 | 2010-04-15 | Siemens Aktiengesellschaft | Verfahren zum Erzeugen einer CNT enthaltenen Schicht aus einer ionischen Flüssigkeit |
US20100206737A1 (en) * | 2009-02-17 | 2010-08-19 | Preisser Robert F | Process for electrodeposition of copper chip to chip, chip to wafer and wafer to wafer interconnects in through-silicon vias (tsv) |
US8262894B2 (en) | 2009-04-30 | 2012-09-11 | Moses Lake Industries, Inc. | High speed copper plating bath |
EP2392694A1 (en) * | 2010-06-02 | 2011-12-07 | ATOTECH Deutschland GmbH | Method for etching of copper and copper alloys |
PL2620529T3 (pl) * | 2012-01-25 | 2014-09-30 | Atotech Deutschland Gmbh | Sposób wytwarzania matowych warstw miedzianych |
WO2017198722A1 (en) * | 2016-05-19 | 2017-11-23 | Atotech Deutschland Gmbh | Method for monitoring the total amount of brighteners in an acidic copper/copper alloy plating bath and controlled process for plating |
JP6909582B2 (ja) * | 2017-01-18 | 2021-07-28 | 株式会社Jcu | 着色用めっき液および着色方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB662217A (en) * | 1948-10-13 | 1951-12-05 | Westinghouse Electric Int Co | Improvements in or relating to the electrodeposition of copper |
DD215589B5 (de) * | 1983-05-11 | 1994-06-01 | Heinz Dr Rer Nat Liebscher | Verfahren zur elektrolytischen Metallabscheidung bei erzwungener Konvektion |
DD261613A1 (de) * | 1987-06-05 | 1988-11-02 | Leipzig Galvanotechnik | Verfahren zur elektrolytischen kupferabscheidung aus sauren elektrolyten mit dimensionsstabiler anode |
GB8801827D0 (en) * | 1988-01-27 | 1988-02-24 | Jct Controls Ltd | Improvements in electrochemical processes |
CN1045770A (zh) * | 1989-03-18 | 1990-10-03 | 王英 | 用膜法蒸馏技术分离浓缩醋酸铵与氢氧化铵的系统 |
GB8913561D0 (en) * | 1989-06-13 | 1989-08-02 | Learonal Uk Plc | Method of stabilising an organic additive in an electroplating solution |
DE4344387C2 (de) * | 1993-12-24 | 1996-09-05 | Atotech Deutschland Gmbh | Verfahren zur elektrolytischen Abscheidung von Kupfer und Anordnung zur Durchführung des Verfahrens |
JP2866300B2 (ja) * | 1994-03-07 | 1999-03-08 | 生物系特定産業技術研究推進機構 | 運搬作業車 |
JPH0967693A (ja) * | 1995-08-29 | 1997-03-11 | Nikko Gould Foil Kk | 電解銅箔の製造方法 |
-
1996
- 1996-12-13 DE DE19653681A patent/DE19653681C2/de not_active Expired - Fee Related
-
1997
- 1997-12-04 EP EP97952879A patent/EP0944749B1/de not_active Expired - Lifetime
- 1997-12-04 JP JP52618198A patent/JP4221064B2/ja not_active Expired - Lifetime
- 1997-12-04 DE DE59704260T patent/DE59704260D1/de not_active Expired - Lifetime
- 1997-12-04 US US09/319,423 patent/US6129830A/en not_active Expired - Lifetime
- 1997-12-04 CA CA002275214A patent/CA2275214C/en not_active Expired - Fee Related
- 1997-12-04 AT AT97952879T patent/ATE204035T1/de active
- 1997-12-04 WO PCT/EP1997/006786 patent/WO1998026114A1/de not_active Application Discontinuation
- 1997-12-04 KR KR1019997004258A patent/KR100546989B1/ko not_active IP Right Cessation
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003041400A (ja) * | 2001-08-01 | 2003-02-13 | Toppan Printing Co Ltd | プリント配線基板の製造装置および製造方法 |
JP2009167506A (ja) * | 2008-01-21 | 2009-07-30 | Ebara Udylite Kk | 酸性電解銅めっき液およびこれを用いる微細配線回路の作製方法 |
JP2014513211A (ja) * | 2011-04-26 | 2014-05-29 | アトーテヒ ドイッチュラント ゲゼルシャフト ミット ベシュレンクテル ハフツング | 銅の電解析出用水性酸浴 |
JP2014177670A (ja) * | 2013-03-14 | 2014-09-25 | Dainippon Printing Co Ltd | インターポーザー基板の製造方法。 |
JP2022522513A (ja) * | 2019-11-21 | 2022-04-19 | エスケー ネクシリス カンパニー リミテッド | 引裂またはシワ不良を防止できる電解銅箔、それを含む電極、それを含む二次電池、およびその製造方法 |
JP7211669B2 (ja) | 2019-11-21 | 2023-01-24 | エスケー ネクシリス カンパニー リミテッド | 引裂またはシワ不良を防止できる電解銅箔、それを含む電極、それを含む二次電池、およびその製造方法 |
WO2023190805A1 (ja) * | 2022-03-31 | 2023-10-05 | 奥野製薬工業株式会社 | Prパルス電解用銅めっき液、及び、prパルス電解法に依る銅めっき方法 |
Also Published As
Publication number | Publication date |
---|---|
CA2275214A1 (en) | 1998-06-18 |
US6129830A (en) | 2000-10-10 |
KR100546989B1 (ko) | 2006-01-26 |
DE19653681C2 (de) | 2000-04-06 |
EP0944749B1 (de) | 2001-08-08 |
KR20000053278A (ko) | 2000-08-25 |
ATE204035T1 (de) | 2001-08-15 |
DE19653681A1 (de) | 1998-06-18 |
WO1998026114A1 (de) | 1998-06-18 |
DE59704260D1 (de) | 2001-09-13 |
EP0944749A1 (de) | 1999-09-29 |
CA2275214C (en) | 2007-10-02 |
JP4221064B2 (ja) | 2009-02-12 |
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