JP2001156209A - 半導体装置 - Google Patents
半導体装置Info
- Publication number
- JP2001156209A JP2001156209A JP33734299A JP33734299A JP2001156209A JP 2001156209 A JP2001156209 A JP 2001156209A JP 33734299 A JP33734299 A JP 33734299A JP 33734299 A JP33734299 A JP 33734299A JP 2001156209 A JP2001156209 A JP 2001156209A
- Authority
- JP
- Japan
- Prior art keywords
- ground
- ground layer
- semiconductor device
- rewiring
- protruding electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 36
- 239000000758 substrate Substances 0.000 claims abstract description 21
- 230000015572 biosynthetic process Effects 0.000 claims description 15
- 238000007789 sealing Methods 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 2
- 229920001296 polysiloxane Polymers 0.000 abstract 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 12
- 229910052710 silicon Inorganic materials 0.000 description 12
- 239000010703 silicon Substances 0.000 description 12
- 239000004973 liquid crystal related substance Substances 0.000 description 6
- 229910000679 solder Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76885—By forming conductive members before deposition of protective insulating material, e.g. pillars, studs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5222—Capacitive arrangements or effects of, or between wiring layers
- H01L23/5225—Shielding layers formed together with wiring layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/585—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries comprising conductive layers or plates or strips or rods or rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/64—Impedance arrangements
- H01L23/66—High-frequency adaptations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/023—Redistribution layers [RDL] for bonding areas
- H01L2224/0237—Disposition of the redistribution layers
- H01L2224/02377—Fan-in arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05005—Structure
- H01L2224/05008—Bonding area integrally formed with a redistribution layer on the semiconductor or solid-state body, e.g.
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/0502—Disposition
- H01L2224/05022—Disposition the internal layer being at least partially embedded in the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05099—Material
- H01L2224/051—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/05124—Aluminium [Al] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05099—Material
- H01L2224/051—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05144—Gold [Au] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05099—Material
- H01L2224/051—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05147—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05569—Disposition the external layer being disposed on a redistribution layer on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0612—Layout
- H01L2224/0615—Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry
- H01L2224/06154—Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry covering only portions of the surface to be connected
- H01L2224/06155—Covering only the peripheral area of the surface to be connected, i.e. peripheral arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/19015—Structure including thin film passive components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19042—Component type being an inductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19102—Disposition of discrete passive components in a stacked assembly with the semiconductor or solid state device
- H01L2924/19104—Disposition of discrete passive components in a stacked assembly with the semiconductor or solid state device on the semiconductor or solid-state device, i.e. passive-on-chip
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
- Wire Bonding (AREA)
Abstract
いて、シリコン基板の回路素子形成領域内で発生する電
磁ノイズが外部に漏れにくいようにするとともに、外部
からの電磁ノイズの影響を受けにくいようにする。 【解決手段】 シリコン基板11の上面の中央部は回路
素子形成領域12とされ、その外側には複数の信号用の
接続パッド13および1つのグラウンド用の接続パッド
14が設けられている。信号用の接続パッド13の上面
から絶縁膜15の上面にかけて設けられた再配線17の
先端のパッド部上面には突起電極18が設けられてい
る。回路素子形成領域12上の絶縁膜15の上面におい
て信号用の再配線17およびその近傍を除く領域にはグ
ラウンド層19が設けられている。グラウンド層19は
グラウンド用の接続パッド14に再配線20を介して接
続されている。グラウンド層19の上面の所定の箇所に
は突起電極21が設けられている。
Description
の突起電極が設けられた半導体装置に関する。
ze Package)と呼ばれるものがある。図6は従来のこの
ような半導体装置の一例の一部の断面図を示したもので
ある。この半導体装置はシリコン基板(半導体基板)1
を備えている。シリコン基板1は、図7(図6において
再配線6およびその上側のものを省略した状態の平面
図)に示すように、平面正方形状であって、同図におい
て一点鎖線で示すように、上面の四辺部を除く中央部を
回路素子形成領域2とされている。回路素子形成領域2
内には、図示していないが、この半導体装置が液晶表示
パネル駆動用のLSIである場合、発振回路、レギュレ
ータ回路、液晶ドライバ回路などが設けられている。
2の外側には複数の接続パッド3が設けられている。接
続パッド3は、シリコン基板1の上面に設けられた配線
3aの一端部からなり、同配線3aを介して上記液晶ド
ライバ回路などと接続されている。接続パッド3の中央
部を除くシリコン基板1の上面には酸化シリコンなどか
らなる絶縁膜4が設けられ、接続パッド3の中央部が絶
縁膜4に形成された開口部5を介して露出されている。
この露出された接続パッド3の上面から接続パッド3の
内側における絶縁膜4の上面にかけて再配線6が設けら
れている。再配線6の先端のパッド部上面には柱状の突
起電極7が設けられている。突起電極7を除く上面全体
にはエポキシ系樹脂からなる封止膜8が設けられてい
る。
ような半導体装置では、絶縁膜4の上面に再配線6をた
だ単に設けているだけであるので、回路素子形成領域2
内で発生する電磁ノイズが外部に漏れ、また外部からの
電磁ノイズの影響を受けやすいという問題があった。こ
の発明の課題は、回路素子形成領域内で発生する電磁ノ
イズが外部に漏れにくいようにするとともに、外部から
の電磁ノイズの影響を受けにくいようにすることであ
る。
上に形成された複数の接続パッドにそれぞれ再配線およ
び該再配線上に突起電極を形成すると共に前記突起電極
の周囲にグラウンド層を形成し、該グラウンド層上にグ
ラウンド用突起電極を形成したものである。この発明に
よれば、突起電極の周囲にグラウンド層を形成している
ので、このグラウンド層により、回路素子形成領域内で
発生する電磁ノイズが外部に漏れにくいようにすること
ができるとともに、外部からの電磁ノイズの影響を受け
にくいようにすことができる。
おける半導体装置の封止膜を省略した状態の平面図を示
し、図2はその一部の断面図を示したものである。この
半導体装置はシリコン基板(半導体基板)11を備えて
いる。シリコン基板11は、平面正方形状であって、図
7において一点鎖線で示す場合と同様に、上面の四辺部
を除く中央部を回路素子形成領域12とされている。回
路素子形成領域12内には、図示していないが、この半
導体装置が液晶表示パネル駆動用のLSIである場合、
発振回路、レギュレータ回路、液晶ドライバ回路などが
設けられている。
域12の外側には複数の信号用の接続パッド13および
1つのグラウンド用の接続パッド14が設けられてい
る。接続パッド13、14は、シリコン基板11の上面
に設けられた配線13a、14aの一端部からなり、同
配線13a、14aを介して上記液晶ドライバ回路など
と接続されている。接続パッド13、14の中央部を除
くシリコン基板11の上面には酸化シリコンなどからな
る絶縁膜15が設けられ、接続パッド13、14の中央
部が絶縁膜15に形成された開口部16を介して露出さ
れている。
して露出された上面から接続パッド13、14の内側に
おける絶縁膜15の上面にかけて信号用の再配線17が
設けられている。信号用の再配線17の先端のパッド部
上面には信号用の柱状の突起電極18が設けられてい
る。回路素子形成領域12上の絶縁膜15の上面におい
て信号用の再配線17およびその近傍を除く領域にはグ
ラウンド層19が設けられている。グラウンド層19は
グラウンド用の接続パッド14にグラウンド用の再配線
20を介して接続されている。グラウンド層19の上面
の所定の箇所にはグラウンド用の突起電極21が設けら
れている。突起電極18、21を除く上面全体にはエポ
キシ系樹脂からなる封止膜22が設けられている。な
お、グラウンド層19およびグラウンド用の再配線20
は、信号用の再配線17と同一の材料によって信号用の
再配線17の形成と同時に形成されている。
子形成領域12上の絶縁膜15の上面において信号用の
再配線17およびその近傍を除く領域にグラウンド層1
9を設けているので、回路素子形成領域12の大部分が
グラウンド層19によって覆われ、したがって回路素子
形成領域12内で発生する電磁ノイズが外部に漏れにく
いようにすることができるとともに、外部からの電磁ノ
イズの影響を受けにくいようにすることができる。
は、信号用の再配線17の周囲にグラウンド層19が設
けられているので、信号用の再配線17の近傍における
電界の広がりを抑えることができる。この結果、信号伝
達速度の高速化を図ることができ、また隣接する信号用
の再配線17間におけるクロストークを低減することが
できる。
成領域12上の絶縁膜15の上面において信号用の再配
線17およびその近傍を除く領域にグラウンド層19を
設けた場合について説明したが、これに限らず、図3に
示すこの発明の第2実施形態のように、グラウンド層1
9をシリコン基板11の端部まで延出させるようにして
もよい。この場合、グラウンド用の接続パッド14はグ
ラウンド層19によって覆われるので、図1において符
号20で示すグラウンド用の再配線というようなものは
無い。
て、例えば図4に示すこの発明の第3実施形態のよう
に、ある2つの突起電極18a、18bがその間の再配
線17aを介して接続されている場合、グラウンド層は
符号19a、19bで示すように2つに分割される。こ
のような場合、2つのグラウンド層19a、19bを回
路素子形成領域12上において直接接続することはでき
ない。
のグラウンド層19a、19bの上面の各所定の箇所に
グラウンド用の突起電極21a、21bが設けられてい
る。そして、図5に示すように、この半導体装置を回路
基板31上に搭載する。この場合、回路基板31は多層
基板からなり、その上面に形成された複数の接続端子3
1のうえ所定の2つは内部配線33を介して接続されて
いる。
1b、18bは回路基板31の接続端子32に、接続端
子32上に予め設けられた半田(ペースト)34を介し
て接続されている。したがって、2つのグラウンド層1
9a、19bは、その間に突起電極18bなどがあって
も、突起電極21a、半田34、接続端子32、内部配
線33、接続端子32、半田34および突起電極21b
を介して電気的に接続されている。この結果、グラウン
ド層が2つまたはそれ以上に分割されていても、これら
の分割グラウンド層を電気的に接続することができる。
は、ウエハ状態のものから製造されるものであり、封止
膜形成工程後のダイシング工程を経ることにより、各半
導体装置が得られる。
ば、突起電極の周囲にグラウンド層を形成しているの
で、このグラウンド層により、回路素子形成領域内で発
生する電磁ノイズが外部に漏れにくいようにすることが
できるとともに、外部からの電磁ノイズの影響を受けに
くいようにすことができる。また、突起電極の周囲に形
成されたグラウンド層により、再配線の近傍における電
界の広がりを抑えることができ、この結果、信号伝達速
度の高速化を図ることができ、また隣接する再配線間に
おけるクロストークを低減することができる。
封止膜を省略した状態の平面図。
封止膜を省略した状態の平面図。
封止膜を省略した状態の平面図。
状態の一部の断面図。
略した状態の平面図。
Claims (7)
- 【請求項1】 半導体基板上に形成された複数の接続パ
ッドにそれぞれ再配線および該再配線上に突起電極を形
成すると共に前記突起電極の周囲にグラウンド層を形成
し、該グラウンド層上にグラウンド用突起電極を形成し
たことを特徴とする半導体装置。 - 【請求項2】 請求項1記載の発明において、前記半導
体基板上に少なくとも1つのグラウンド用接続パッドが
形成され、該グラウンド用接続パッドに前記グラウンド
層が接続されていることを特徴とする半導体装置。 - 【請求項3】 請求項1記載の発明において、前記グラ
ウンド層は前記再配線と同一の層に位置することを特徴
とする半導体装置。 - 【請求項4】 請求項1記載の発明において、前記グラ
ウンド層は前記半導体基板の端部まで延出されているこ
とを特徴とする半導体装置。 - 【請求項5】 請求項1記載の発明において、前記グラ
ウンド層は複数に分割され、一の分割グラウンド層が前
記グラウンド用接続パッドに接続されているとともに、
各分割グラウンド層上にグラウンド用突起電極が設けら
れていることを特徴とする半導体装置。 - 【請求項6】 請求項1記載の発明において、前記グラ
ウンド層は前記再配線と同一の材料によって前記再配線
の形成と同時に形成されていることを特徴とする半導体
装置。 - 【請求項7】 請求項1〜6のいずれかに記載の発明に
おいて、前記突起電極および前記グラウンド用突起電極
を除く前記半導体基板上面ほぼ全体に封止膜が設けられ
ていることを特徴とする半導体装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33734299A JP3287346B2 (ja) | 1999-11-29 | 1999-11-29 | 半導体装置 |
US09/708,379 US6501169B1 (en) | 1999-11-29 | 2000-11-08 | Semiconductor device which prevents leakage of noise generated in a circuit element forming area and which shields against external electromagnetic noise |
TW089124744A TW464996B (en) | 1999-11-29 | 2000-11-22 | Semiconductor device and its manufacturing process |
KR1020000070417A KR100364058B1 (ko) | 1999-11-29 | 2000-11-24 | 반도체장치 및 그 제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33734299A JP3287346B2 (ja) | 1999-11-29 | 1999-11-29 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2001156209A true JP2001156209A (ja) | 2001-06-08 |
JP3287346B2 JP3287346B2 (ja) | 2002-06-04 |
Family
ID=18307737
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP33734299A Expired - Lifetime JP3287346B2 (ja) | 1999-11-29 | 1999-11-29 | 半導体装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6501169B1 (ja) |
JP (1) | JP3287346B2 (ja) |
KR (1) | KR100364058B1 (ja) |
TW (1) | TW464996B (ja) |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002050898A1 (fr) * | 2000-12-18 | 2002-06-27 | Hitachi, Ltd. | Dispositif a circuit integre semi-conducteur |
JP2005354071A (ja) * | 2004-06-08 | 2005-12-22 | Samsung Electronics Co Ltd | 再配置されたパターンを有する半導体パッケージ及びその製造方法 |
JP2006013205A (ja) * | 2004-06-28 | 2006-01-12 | Akita Denshi Systems:Kk | 半導体装置及びその製造方法 |
JP2006165381A (ja) * | 2004-12-09 | 2006-06-22 | Toshiba Corp | 半導体装置 |
KR100642643B1 (ko) | 2005-03-18 | 2006-11-10 | 삼성전자주식회사 | 내부회로의 전원/접지선들과 직접 접속되는 재배치된전원/접지선들을 갖는 반도체 칩들 및 그 제조방법들 |
JP2006344946A (ja) * | 2005-05-25 | 2006-12-21 | Toshiba Corp | 接続バンプによって引き起こされるインピーダンスばらつきを減ずるために集積回路内で導電体を構成するためのシステムおよび方法 |
US7157794B2 (en) | 2002-04-03 | 2007-01-02 | Oki Electric Industry Co., Ltd. | Semiconductor device that suppresses variations in high frequency characteristics of circuit elements |
JP2009200125A (ja) * | 2008-02-19 | 2009-09-03 | Fuji Electric Device Technology Co Ltd | 半導体装置 |
JP2010272562A (ja) * | 2009-05-19 | 2010-12-02 | Shinko Electric Ind Co Ltd | 電子部品の実装構造 |
EP2256785A3 (en) * | 2001-12-14 | 2011-01-19 | Fujitsu Limited | Electronic Device |
US8110923B2 (en) | 2009-08-17 | 2012-02-07 | Oki Semiconductor Co., Ltd. | Semiconductor device and method of manufacturing the same |
JP2013110375A (ja) * | 2011-11-17 | 2013-06-06 | Samsung Electro-Mechanics Co Ltd | 半導体パッケージ及びこれを含む半導体パッケージモジュール |
JP2014146787A (ja) * | 2013-01-25 | 2014-08-14 | Taiwan Semiconductor Manufactuaring Co Ltd | パッケージ構造、および、その伝送線の形成方法 |
JP2014207462A (ja) * | 2012-03-22 | 2014-10-30 | 株式会社村田製作所 | 半導体装置および半導体モジュール |
CN109841586A (zh) * | 2017-11-29 | 2019-06-04 | 拉碧斯半导体株式会社 | 半导体装置和半导体装置的制造方法 |
JP2022078279A (ja) * | 2017-11-29 | 2022-05-24 | ラピスセミコンダクタ株式会社 | 半導体装置及び半導体装置の製造方法 |
JP7137674B1 (ja) | 2021-08-05 | 2022-09-14 | アオイ電子株式会社 | 半導体装置およびその製造方法 |
Families Citing this family (71)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6642136B1 (en) | 2001-09-17 | 2003-11-04 | Megic Corporation | Method of making a low fabrication cost, high performance, high reliability chip scale package |
US6495442B1 (en) | 2000-10-18 | 2002-12-17 | Magic Corporation | Post passivation interconnection schemes on top of the IC chips |
US8421158B2 (en) | 1998-12-21 | 2013-04-16 | Megica Corporation | Chip structure with a passive device and method for forming the same |
US8178435B2 (en) * | 1998-12-21 | 2012-05-15 | Megica Corporation | High performance system-on-chip inductor using post passivation process |
US7381642B2 (en) | 2004-09-23 | 2008-06-03 | Megica Corporation | Top layers of metal for integrated circuits |
US8021976B2 (en) | 2002-10-15 | 2011-09-20 | Megica Corporation | Method of wire bonding over active area of a semiconductor circuit |
US6303423B1 (en) | 1998-12-21 | 2001-10-16 | Megic Corporation | Method for forming high performance system-on-chip using post passivation process |
US6869870B2 (en) | 1998-12-21 | 2005-03-22 | Megic Corporation | High performance system-on-chip discrete components using post passivation process |
US7372161B2 (en) * | 2000-10-18 | 2008-05-13 | Megica Corporation | Post passivation interconnection schemes on top of the IC chips |
US7271489B2 (en) | 2003-10-15 | 2007-09-18 | Megica Corporation | Post passivation interconnection schemes on top of the IC chips |
US6815324B2 (en) | 2001-02-15 | 2004-11-09 | Megic Corporation | Reliable metal bumps on top of I/O pads after removal of test probe marks |
TWI313507B (en) | 2002-10-25 | 2009-08-11 | Megica Corporatio | Method for assembling chips |
US7902679B2 (en) * | 2001-03-05 | 2011-03-08 | Megica Corporation | Structure and manufacturing method of a chip scale package with low fabrication cost, fine pitch and high reliability solder bump |
US6818545B2 (en) | 2001-03-05 | 2004-11-16 | Megic Corporation | Low fabrication cost, fine pitch and high reliability solder bump |
JP2002353347A (ja) * | 2001-05-24 | 2002-12-06 | Oki Electric Ind Co Ltd | 半導体装置、及びその製造方法 |
DE10142531A1 (de) * | 2001-08-30 | 2003-03-20 | Philips Corp Intellectual Pty | Sensoranordnung aus licht- und/oder röntgenstrahlungsempfindlichen Sensoren |
US6759275B1 (en) | 2001-09-04 | 2004-07-06 | Megic Corporation | Method for making high-performance RF integrated circuits |
US7099293B2 (en) * | 2002-05-01 | 2006-08-29 | Stmicroelectronics, Inc. | Buffer-less de-skewing for symbol combination in a CDMA demodulator |
US7310039B1 (en) | 2001-11-30 | 2007-12-18 | Silicon Laboratories Inc. | Surface inductor |
US6673698B1 (en) | 2002-01-19 | 2004-01-06 | Megic Corporation | Thin film semiconductor package utilizing a glass substrate with composite polymer/metal interconnect layers |
TW544882B (en) | 2001-12-31 | 2003-08-01 | Megic Corp | Chip package structure and process thereof |
TW584950B (en) | 2001-12-31 | 2004-04-21 | Megic Corp | Chip packaging structure and process thereof |
TW503496B (en) | 2001-12-31 | 2002-09-21 | Megic Corp | Chip packaging structure and manufacturing process of the same |
TWI245402B (en) | 2002-01-07 | 2005-12-11 | Megic Corp | Rod soldering structure and manufacturing process thereof |
TW525281B (en) * | 2002-03-06 | 2003-03-21 | Advanced Semiconductor Eng | Wafer level chip scale package |
JP2003297922A (ja) * | 2002-04-02 | 2003-10-17 | Umc Japan | 半導体装置及び半導体装置の製造方法 |
US20030218246A1 (en) * | 2002-05-22 | 2003-11-27 | Hirofumi Abe | Semiconductor device passing large electric current |
US6770971B2 (en) | 2002-06-14 | 2004-08-03 | Casio Computer Co., Ltd. | Semiconductor device and method of fabricating the same |
US6661100B1 (en) * | 2002-07-30 | 2003-12-09 | International Business Machines Corporation | Low impedance power distribution structure for a semiconductor chip package |
US7141883B2 (en) * | 2002-10-15 | 2006-11-28 | Silicon Laboratories Inc. | Integrated circuit package configuration incorporating shielded circuit element structure |
US20040222511A1 (en) * | 2002-10-15 | 2004-11-11 | Silicon Laboratories, Inc. | Method and apparatus for electromagnetic shielding of a circuit element |
JP2004214561A (ja) * | 2003-01-08 | 2004-07-29 | Oki Electric Ind Co Ltd | 半導体装置及びその製造方法 |
JP2004241696A (ja) * | 2003-02-07 | 2004-08-26 | Seiko Epson Corp | 半導体装置及びその製造方法、回路基板並びに電子機器 |
KR100541393B1 (ko) * | 2003-04-26 | 2006-01-10 | 삼성전자주식회사 | 멀티칩 bga 패키지 |
US7319277B2 (en) * | 2003-05-08 | 2008-01-15 | Megica Corporation | Chip structure with redistribution traces |
TWI236763B (en) * | 2003-05-27 | 2005-07-21 | Megic Corp | High performance system-on-chip inductor using post passivation process |
JP3721175B2 (ja) * | 2003-06-03 | 2005-11-30 | 沖電気工業株式会社 | 半導体装置の製造方法 |
TWI241702B (en) * | 2003-07-28 | 2005-10-11 | Siliconware Precision Industries Co Ltd | Ground pad structure for preventing solder extrusion and semiconductor package having the ground pad structure |
US7372153B2 (en) * | 2003-10-07 | 2008-05-13 | Taiwan Semiconductor Manufacturing Co., Ltd | Integrated circuit package bond pad having plurality of conductive members |
US7459790B2 (en) | 2003-10-15 | 2008-12-02 | Megica Corporation | Post passivation interconnection schemes on top of the IC chips |
US7394161B2 (en) | 2003-12-08 | 2008-07-01 | Megica Corporation | Chip structure with pads having bumps or wirebonded wires formed thereover or used to be tested thereto |
TWI245350B (en) * | 2004-03-25 | 2005-12-11 | Siliconware Precision Industries Co Ltd | Wafer level semiconductor package with build-up layer |
JP3885890B2 (ja) * | 2004-04-28 | 2007-02-28 | セイコーエプソン株式会社 | 半導体装置及びその製造方法、回路基板並びに電子機器 |
US7375411B2 (en) * | 2004-06-03 | 2008-05-20 | Silicon Laboratories Inc. | Method and structure for forming relatively dense conductive layers |
KR100583966B1 (ko) | 2004-06-08 | 2006-05-26 | 삼성전자주식회사 | 재배치된 금속 배선들을 갖는 집적회로 패키지들 및 그제조방법들 |
US8067837B2 (en) | 2004-09-20 | 2011-11-29 | Megica Corporation | Metallization structure over passivation layer for IC chip |
US7423346B2 (en) * | 2004-09-09 | 2008-09-09 | Megica Corporation | Post passivation interconnection process and structures |
US7355282B2 (en) | 2004-09-09 | 2008-04-08 | Megica Corporation | Post passivation interconnection process and structures |
US8008775B2 (en) | 2004-09-09 | 2011-08-30 | Megica Corporation | Post passivation interconnection structures |
US7521805B2 (en) * | 2004-10-12 | 2009-04-21 | Megica Corp. | Post passivation interconnection schemes on top of the IC chips |
US8294279B2 (en) | 2005-01-25 | 2012-10-23 | Megica Corporation | Chip package with dam bar restricting flow of underfill |
US8384189B2 (en) | 2005-03-29 | 2013-02-26 | Megica Corporation | High performance system-on-chip using post passivation process |
US7468545B2 (en) * | 2005-05-06 | 2008-12-23 | Megica Corporation | Post passivation structure for a semiconductor device and packaging process for same |
TWI330863B (en) | 2005-05-18 | 2010-09-21 | Megica Corp | Semiconductor chip with coil element over passivation layer |
US7582556B2 (en) | 2005-06-24 | 2009-09-01 | Megica Corporation | Circuitry component and method for forming the same |
JP4774248B2 (ja) * | 2005-07-22 | 2011-09-14 | Okiセミコンダクタ株式会社 | 半導体装置 |
CN1901162B (zh) | 2005-07-22 | 2011-04-20 | 米辑电子股份有限公司 | 连续电镀制作线路组件的方法及线路组件结构 |
US7473999B2 (en) | 2005-09-23 | 2009-01-06 | Megica Corporation | Semiconductor chip and process for forming the same |
US7501924B2 (en) * | 2005-09-30 | 2009-03-10 | Silicon Laboratories Inc. | Self-shielding inductor |
US8749021B2 (en) * | 2006-12-26 | 2014-06-10 | Megit Acquisition Corp. | Voltage regulator integrated with semiconductor chip |
FR2911006A1 (fr) * | 2007-01-03 | 2008-07-04 | St Microelectronics Sa | Puce de circuit electronique integre comprenant une inductance |
US20080191348A1 (en) * | 2007-02-14 | 2008-08-14 | Infineon Technologies Ag | System for distributing electrical power for a chip |
JP2008210933A (ja) * | 2007-02-26 | 2008-09-11 | Casio Comput Co Ltd | 半導体装置 |
WO2009119799A1 (ja) * | 2008-03-28 | 2009-10-01 | 日本電気株式会社 | ループ素子及びノイズ解析装置 |
US20100165585A1 (en) | 2008-12-26 | 2010-07-01 | Megica Corporation | Chip packages with power management integrated circuits and related techniques |
FI20095557A0 (fi) | 2009-05-19 | 2009-05-19 | Imbera Electronics Oy | Valmistusmenetelmä ja elektroniikkamoduuli, joka tarjoaa uusia mahdollisuuksia johdevedoille |
US20110100692A1 (en) * | 2009-11-02 | 2011-05-05 | Roden Topacio | Circuit Board with Variable Topography Solder Interconnects |
JP5486376B2 (ja) * | 2010-03-31 | 2014-05-07 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US8993431B2 (en) | 2010-05-12 | 2015-03-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of fabricating bump structure |
US8648664B2 (en) | 2011-09-30 | 2014-02-11 | Silicon Laboratories Inc. | Mutual inductance circuits |
KR101582548B1 (ko) * | 2012-11-21 | 2016-01-05 | 해성디에스 주식회사 | 인터포져 제조 방법 및 이를 이용한 반도체 패키지 제조 방법 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0793343B2 (ja) | 1987-12-28 | 1995-10-09 | 松下電器産業株式会社 | 半導体装置の製造方法 |
US5285017A (en) * | 1991-12-31 | 1994-02-08 | Intel Corporation | Embedded ground plane and shielding structures using sidewall insulators in high frequency circuits having vias |
JP3285919B2 (ja) | 1992-02-05 | 2002-05-27 | 株式会社東芝 | 半導体装置 |
US6294436B1 (en) * | 1999-08-16 | 2001-09-25 | Infineon Technologies Ag | Method for fabrication of enlarged stacked capacitors using isotropic etching |
-
1999
- 1999-11-29 JP JP33734299A patent/JP3287346B2/ja not_active Expired - Lifetime
-
2000
- 2000-11-08 US US09/708,379 patent/US6501169B1/en not_active Expired - Lifetime
- 2000-11-22 TW TW089124744A patent/TW464996B/zh not_active IP Right Cessation
- 2000-11-24 KR KR1020000070417A patent/KR100364058B1/ko not_active IP Right Cessation
Cited By (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7808107B2 (en) | 2000-12-18 | 2010-10-05 | Renesas Electronics Corporation | Semiconductor integrated circuit device |
US6963136B2 (en) | 2000-12-18 | 2005-11-08 | Renesas Technology Corporation | Semiconductor integrated circuit device |
WO2002050898A1 (fr) * | 2000-12-18 | 2002-06-27 | Hitachi, Ltd. | Dispositif a circuit integre semi-conducteur |
US7982314B2 (en) | 2000-12-18 | 2011-07-19 | Renesas Electronics Corporation | Semiconductor integrated circuit device |
US7547971B2 (en) | 2000-12-18 | 2009-06-16 | Renesas Technology Corp. | Semiconductor integrated circuit device |
EP2256785A3 (en) * | 2001-12-14 | 2011-01-19 | Fujitsu Limited | Electronic Device |
US7157794B2 (en) | 2002-04-03 | 2007-01-02 | Oki Electric Industry Co., Ltd. | Semiconductor device that suppresses variations in high frequency characteristics of circuit elements |
US7545036B2 (en) | 2002-04-03 | 2009-06-09 | Oki Semiconductor Co., Ltd. | Semiconductor device that suppresses variations in high frequency characteristics of circuit elements |
JP2005354071A (ja) * | 2004-06-08 | 2005-12-22 | Samsung Electronics Co Ltd | 再配置されたパターンを有する半導体パッケージ及びその製造方法 |
JP2006013205A (ja) * | 2004-06-28 | 2006-01-12 | Akita Denshi Systems:Kk | 半導体装置及びその製造方法 |
JP2006165381A (ja) * | 2004-12-09 | 2006-06-22 | Toshiba Corp | 半導体装置 |
KR100642643B1 (ko) | 2005-03-18 | 2006-11-10 | 삼성전자주식회사 | 내부회로의 전원/접지선들과 직접 접속되는 재배치된전원/접지선들을 갖는 반도체 칩들 및 그 제조방법들 |
US8115315B2 (en) | 2005-03-18 | 2012-02-14 | Samsung Electronics Co., Ltd. | Semiconductor chips having redistributed power/ground lines directly connected to power/ground lines of internal circuits and methods of fabricating the same |
JP2006344946A (ja) * | 2005-05-25 | 2006-12-21 | Toshiba Corp | 接続バンプによって引き起こされるインピーダンスばらつきを減ずるために集積回路内で導電体を構成するためのシステムおよび方法 |
JP2009200125A (ja) * | 2008-02-19 | 2009-09-03 | Fuji Electric Device Technology Co Ltd | 半導体装置 |
JP2010272562A (ja) * | 2009-05-19 | 2010-12-02 | Shinko Electric Ind Co Ltd | 電子部品の実装構造 |
US8304664B2 (en) | 2009-05-19 | 2012-11-06 | Shinko Electric Industries Co., Ltd. | Electronic component mounted structure |
US8110923B2 (en) | 2009-08-17 | 2012-02-07 | Oki Semiconductor Co., Ltd. | Semiconductor device and method of manufacturing the same |
JP2013110375A (ja) * | 2011-11-17 | 2013-06-06 | Samsung Electro-Mechanics Co Ltd | 半導体パッケージ及びこれを含む半導体パッケージモジュール |
JP2014207462A (ja) * | 2012-03-22 | 2014-10-30 | 株式会社村田製作所 | 半導体装置および半導体モジュール |
US9252132B2 (en) | 2012-03-22 | 2016-02-02 | Murata Manufacturing Co., Ltd. | Semiconductor device and semiconductor module |
US10840201B2 (en) | 2013-01-25 | 2020-11-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and apparatus for transmission lines in packages |
JP2017092479A (ja) * | 2013-01-25 | 2017-05-25 | 台湾積體電路製造股▲ふん▼有限公司Taiwan Semiconductor Manufacturing Company,Ltd. | パッケージ、および、その伝送線の形成方法 |
US10269746B2 (en) | 2013-01-25 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and apparatus for transmission lines in packages |
US11978712B2 (en) | 2013-01-25 | 2024-05-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming semiconductor package transmission lines with micro-bump lines |
JP2014146787A (ja) * | 2013-01-25 | 2014-08-14 | Taiwan Semiconductor Manufactuaring Co Ltd | パッケージ構造、および、その伝送線の形成方法 |
US11004813B2 (en) | 2017-11-29 | 2021-05-11 | Lapis Semiconductor Co., Ltd. | Semiconductor device and manufacturing method of semiconductor device |
JP2019102522A (ja) * | 2017-11-29 | 2019-06-24 | ラピスセミコンダクタ株式会社 | 半導体装置及び半導体装置の製造方法 |
JP7074463B2 (ja) | 2017-11-29 | 2022-05-24 | ラピスセミコンダクタ株式会社 | 半導体装置及び半導体装置の製造方法 |
JP2022078279A (ja) * | 2017-11-29 | 2022-05-24 | ラピスセミコンダクタ株式会社 | 半導体装置及び半導体装置の製造方法 |
JP7303343B2 (ja) | 2017-11-29 | 2023-07-04 | ラピスセミコンダクタ株式会社 | 半導体装置及び半導体装置の製造方法 |
US11742305B2 (en) | 2017-11-29 | 2023-08-29 | Lapis Semiconductor Co., Ltd. | Semiconductor device and manufacturing method of semiconductor device |
CN109841586A (zh) * | 2017-11-29 | 2019-06-04 | 拉碧斯半导体株式会社 | 半导体装置和半导体装置的制造方法 |
JP7137674B1 (ja) | 2021-08-05 | 2022-09-14 | アオイ電子株式会社 | 半導体装置およびその製造方法 |
WO2023013190A1 (ja) * | 2021-08-05 | 2023-02-09 | アオイ電子株式会社 | 半導体装置およびその製造方法 |
JP2023023401A (ja) * | 2021-08-05 | 2023-02-16 | アオイ電子株式会社 | 半導体装置およびその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
TW464996B (en) | 2001-11-21 |
KR100364058B1 (ko) | 2002-12-11 |
JP3287346B2 (ja) | 2002-06-04 |
US6501169B1 (en) | 2002-12-31 |
KR20010051937A (ko) | 2001-06-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3287346B2 (ja) | 半導体装置 | |
USRE41511E1 (en) | Semiconductor device having a thin-film circuit element provided above an integrated circuit | |
JP2002110898A (ja) | 半導体装置 | |
JP2005150717A (ja) | Ic装置とその製造方法 | |
JP2007042769A (ja) | 半導体装置 | |
JPH11260851A (ja) | 半導体装置及び該半導体装置の製造方法 | |
KR20200089970A (ko) | 집적회로 칩과 이를 포함하는 집적회로 패키지 및 디스플레이 장치 | |
JP2002231854A (ja) | 半導体装置およびその製造方法 | |
KR100192631B1 (ko) | 반도체장치 | |
TW200828532A (en) | Multiple chip package | |
JP4045717B2 (ja) | 半導体装置 | |
JP2797598B2 (ja) | 混成集積回路基板 | |
JPH11121477A (ja) | 半導体装置およびその製造方法 | |
JP3555828B2 (ja) | 半導体実装用回路基板を備えた半導体装置 | |
US8809695B2 (en) | Contact structure for an electronic circuit substrate and electronic circuit comprising said contact structure | |
JP4168494B2 (ja) | 半導体装置の製造方法 | |
JP2885786B1 (ja) | 半導体装置の製法および半導体装置 | |
JP3274533B2 (ja) | 半導体素子 | |
JP2005033105A (ja) | 半導体装置及びその製造方法、回路基板並びに電子機器 | |
JP2000068271A (ja) | ウエハ装置およびチップ装置並びにチップ装置の製造方法 | |
KR100325450B1 (ko) | 볼그리드어레이패키지 | |
JP2822990B2 (ja) | Csp型半導体装置 | |
JP2001135777A (ja) | 半導体装置 | |
JP2993480B2 (ja) | 半導体装置 | |
JP2001267489A (ja) | 半導体装置および半導体チップ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
TRDD | Decision of grant or rejection written | ||
R150 | Certificate of patent or registration of utility model |
Ref document number: 3287346 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090315 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090315 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100315 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110315 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110315 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120315 Year of fee payment: 10 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120315 Year of fee payment: 10 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120315 Year of fee payment: 10 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130315 Year of fee payment: 11 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
EXPY | Cancellation because of completion of term |