IL121362A - System for testing point to-point connecting on a circuit board - Google Patents

System for testing point to-point connecting on a circuit board

Info

Publication number
IL121362A
IL121362A IL12136296A IL12136296A IL121362A IL 121362 A IL121362 A IL 121362A IL 12136296 A IL12136296 A IL 12136296A IL 12136296 A IL12136296 A IL 12136296A IL 121362 A IL121362 A IL 121362A
Authority
IL
Israel
Prior art keywords
point
circuit board
testing
point connecting
testing point
Prior art date
Application number
IL12136296A
Other languages
English (en)
Other versions
IL121362A0 (en
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of IL121362A0 publication Critical patent/IL121362A0/xx
Publication of IL121362A publication Critical patent/IL121362A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IL12136296A 1995-12-08 1996-11-13 System for testing point to-point connecting on a circuit board IL121362A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/569,751 US5852617A (en) 1995-12-08 1995-12-08 Jtag testing of buses using plug-in cards with Jtag logic mounted thereon
PCT/US1996/018228 WO1997022013A1 (fr) 1995-12-08 1996-11-13 Test jtag de bus au moyen de cartes enfichables sur lesquelles est montee une logique jtag

Publications (2)

Publication Number Publication Date
IL121362A0 IL121362A0 (en) 1998-01-04
IL121362A true IL121362A (en) 2000-07-26

Family

ID=24276706

Family Applications (1)

Application Number Title Priority Date Filing Date
IL12136296A IL121362A (en) 1995-12-08 1996-11-13 System for testing point to-point connecting on a circuit board

Country Status (11)

Country Link
US (1) US5852617A (fr)
EP (1) EP0808461B1 (fr)
JP (1) JP3699127B2 (fr)
KR (1) KR100232116B1 (fr)
CN (1) CN1089440C (fr)
AU (1) AU7731596A (fr)
DE (1) DE69628143T2 (fr)
IL (1) IL121362A (fr)
RU (1) RU2182711C2 (fr)
TW (1) TW311176B (fr)
WO (1) WO1997022013A1 (fr)

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EP3580575A4 (fr) 2017-02-10 2020-08-19 Checksum LLC Testeur fonctionnel pour cartes de circuits imprimés et systèmes et procédés associés
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TWI736721B (zh) * 2017-12-13 2021-08-21 英業達股份有限公司 連接器的腳位連接測試系統及其方法
CN111370054B (zh) * 2018-12-26 2024-07-05 华为技术有限公司 一种存储卡的测试系统
RU2703493C1 (ru) * 2018-12-28 2019-10-17 федеральное государственное автономное образовательное учреждение высшего образования "Самарский национальный исследовательский университет имени академика С.П. Королёва" Способ локализации дефектов короткого замыкания выводов микросхем JTAG интерфейсом и устройство для его осуществления
RU189608U1 (ru) * 2019-04-09 2019-05-29 Акционерное общество "МЦСТ" Адаптер тестирования канала оперативной памяти третьего поколения
CN110297282B (zh) * 2019-08-06 2021-11-12 深圳面元智能科技有限公司 地震勘探设备测试仪
CN112462246A (zh) * 2019-09-09 2021-03-09 英业达科技有限公司 边界扫描测试系统及其方法
RU194790U1 (ru) * 2019-10-17 2019-12-23 Акционерное общество "МЦСТ" Адаптер тестирования канала оперативной памяти четвертого поколения
CN110824386A (zh) * 2019-10-21 2020-02-21 中车太原机车车辆有限公司 一种用于电力机车电子插件箱的绕接线测试装置
JP7204697B2 (ja) * 2020-03-10 2023-01-16 株式会社東芝 半導体集積回路
CN111487479B (zh) * 2020-04-28 2022-06-03 中科龙人高新技术有限公司 一种工业机器人驱动板检测卡
CN117686892A (zh) * 2022-09-05 2024-03-12 英业达科技有限公司 以待测接脚的测试点进行边界扫描测试的系统及方法
TWI828439B (zh) * 2022-11-24 2024-01-01 英業達股份有限公司 無jtag串接測試電路板的dimm插槽測試系統及其方法
TWI822502B (zh) * 2022-12-01 2023-11-11 英業達股份有限公司 Jtag集線器的jtag連接介面致能與禁能控制系統及其方法
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Also Published As

Publication number Publication date
EP0808461A1 (fr) 1997-11-26
JPH11500831A (ja) 1999-01-19
IL121362A0 (en) 1998-01-04
CN1089440C (zh) 2002-08-21
US5852617A (en) 1998-12-22
TW311176B (fr) 1997-07-21
CN1180412A (zh) 1998-04-29
AU7731596A (en) 1997-07-03
EP0808461B1 (fr) 2003-05-14
KR19980702054A (ko) 1998-07-15
JP3699127B2 (ja) 2005-09-28
KR100232116B1 (ko) 1999-12-01
RU2182711C2 (ru) 2002-05-20
DE69628143T2 (de) 2004-04-01
EP0808461A4 (fr) 1999-04-07
WO1997022013A1 (fr) 1997-06-19
DE69628143D1 (de) 2003-06-18

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